The VNP49N04 is a monolithic device made
using STMicroelectronics VIPower Technology,
intended for replacement of standard power
MOSFETS in DC to 50 KHz applications.
Built-in thermal shut-down, linear current limita-
BLOCK DIAGRAM
3
2
1
TO-220
tion and overvoltage clamp protect the chip in
harshenviroments.
Faultfeedbackcan be detectedby monitoringthe
voltageat theinput pin.
March 2004
1/11
VNP49N04
ABSOLUTEMAXIMUMRATING
SymbolParameterValueUnit
V
V
V
P
T
THERMAL DATA
R
thj-case
R
thj-amb
Drain-source Volta ge (Vin= 0)Int er nall y ClampedV
DS
Input Voltage18V
in
I
Drain CurrentInternally LimitedA
D
I
Reverse DC Output Current-50A
R
Elect r o st at ic Disc harge (C= 100 pF, R=1 . 5 KW)2000V
esd
Tot al Dissipat ion at Tc=25oC125W
tot
T
Oper at i ng Junct ion Temper at ureInternally Limited
j
T
Case Operating TemperatureInternally Limited
c
St orage Temperature-55 t o 150
stg
Ther mal Resis t an ce Ju nct io n- caseMax
Ther mal Resis t an ce Ju nct io n- ambientMax
1
62.5
o
o
o
C
o
C
o
C
C/W
C/W
ELECTRICAL CHARACTERISTICS (T
=25oC unless otherwise specified)
case
OFF
SymbolParameterTest Condition sMin.Typ .Max.Unit
V
CLAMP
Drain-source Clamp
ID= 200 mAVin= 0364248V
Volt age
V
CLTH
Drain-source Clamp
ID=2mA Vin=035V
Thr eshold Vol ta ge
V
INCL
Input-Source Reverse
Iin=-1mA-1-0.3V
Clamp Volt age
I
I
DSS
ISS
Zer o I npu t V olt age
Drain Current (V
in
Supply Current from
=0)
=13V Vin=0
V
DS
V
=25V Vin=0
DS
50
200
VDS=0V Vin= 10 V250500mA
Input Pin
ON (*)
SymbolParameterTest Condition sMin.Typ .Max.Unit
V
IN(th)
Input Threshold
VDS=VinID+Iin=1mA0.83V
Volt age
R
DS(on)
St at ic Drain-s ourc e On
Resistance
Vin=10V ID=25A
=5VID=25A
V
in
0.02
0.025
DYNAMIC
mA
mA
W
W
SymbolParameterTest Condition sMin.Typ .Max.Unit
g
(* )Forward
fs
VDS=13VID=25A2530S
Tr ansc on ductance
C
Out put Capacit anc eVDS=13V f=1MHz Vin= 011001500pF
During normal operation, the Input pin is
electrically connected to the gate of the internal
power MOSFET. The device then behaves like a
standard power MOSFET and can be used as a
switch from DC to 50 KHz. The only difference
from the user s standpoint is that a small DC
current (I
) flows into the Input pin in order to
iss
supplythe internalcircuitry.
The device integrates:
- OVERVOLTAGECLAMPPROTECTION:
internally set at 42V, along with the rugged
avalanchecharacteristicsofthePower
MOSFET stage give this device unrivalled
ruggedness and energy handling capability.
This feature is mainly important when driving
inductiveloads.
-
LINEAR CURRENT LIMITER CIRCUIT: limits
the drain current Id to Ilim whatever the Input
pin voltage. When the current limiter is active,
the device operates in the linear region, so
power dissipation may exceed the capability of
theheatsink.Bothcaseandjunction
temperatures increase, and if this phase lasts
long enough, junction temperature may reach
the overtemperaturethreshold T
jsh
.
- OVERTEMPERATURE AND SHORT CIRCUIT
PROTECTION: these are based on sensing
the chip temperatureand are not dependent on
the input voltage. The location of the sensing
element on the chip in the power stage area
ensures fast, accurate detection of the junction
temperature. Overtemperaturecutout occurs at
minimum 150
restarted when the chip temperature falls
below135
o
C. The device is automatically
o
C.
- STATUS FEEDBACK: In the case of an
overtemperature fault condition, a Status
Feedback is provided through the Input pin.
The internal protection circuit disconnects the
input from the gate and connects it instead to
ground via an equivalent resistance of 100 W.
The failure can be detected by monitoring the
voltage at the Input pin, which will be close to
ground potential.
Additional features of this device are ESD
protection according to the Human Body model
and the ability to be driven from a TTL Logic
circuit (with a small increase in R
DS(on)
).
4/11
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