Main product characteristics
IF(AV) |
2 x 30 A |
VRRM |
1200 V |
Tj |
150° C |
VF (typ) |
1.30 V |
trr (typ) |
45 ns |
Features and benefits
■Ultrafast, soft recovery
■Very low conduction and switching losses
■High frequency and/or high pulsed current operation
■High reverse voltage capability
■High junction temperature
■Insulated package:
Electrical insulation = 2500 VRMS Capacitance < 45 pF
Description
The high quality design of this diode has produced a device with low leakage current, regularly reproducible characteristics and intrinsic ruggedness. These characteristics make it ideal for heavy duty applications that demand long term reliability.
Such demanding applications include industrial power supplies, motor control, and similar mission-critical systems that require rectification and freewheeling. These diodes also fit into auxiliary functions such as snubber, bootstrap, and demagnetization applications.
The improved performance in low leakage current, and therefore thermal runaway guard band, is an immediate competitive advantage for this device.
K2 |
A2 |
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K1 |
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A1 |
K2 |
A1 |
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STTH6112TV1 STTH6112TV2
A1 |
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K2 |
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A2 |
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K2 |
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ISOTOP
Order codes
Part Number |
Marking |
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STTH6112TV1 |
STTH6112TV1 |
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STTH6112TV2 |
STTH6112TV2 |
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March 2006 |
Rev 1 |
1/8 |
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www.st.com |
8 |
Characteristics |
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STTH6112TV |
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1 |
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Characteristics |
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Table 1. |
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Absolute ratings (limiting values per diode at 25° C, unless otherwise specified) |
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Symbol |
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Parameter |
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Value |
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Unit |
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VRRM |
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Repetitive peak reverse voltage |
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1200 |
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V |
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IF(RMS) |
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RMS forward current |
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100 |
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A |
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IF(AV) |
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Average forward current, δ = 0.5 |
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Tc = 70° C per diode |
30 |
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A |
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IFRM |
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Repetitive peak forward current |
tp = 5 µs, F = 5 kHz square |
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300 |
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A |
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IFSM |
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Surge non repetitive forward |
tp = 10 ms Sinusoidal |
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250 |
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A |
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current |
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Tstg |
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Storage temperature range |
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-65 to + 150 |
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°C |
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Tj |
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Maximum operating junction temperature |
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150 |
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°C |
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Table 2. |
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Thermal parameters |
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Value |
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Rth(j-c) |
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Junction to case |
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Per diode |
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1.16 |
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Total |
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0.63 |
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°C/W |
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Rth(c) |
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Coupling thermal resistance |
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0.1 |
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When the diodes are used simultaneously: |
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∆Tj(diode1) = P(diode1) x Rth(j-c) (per diode) + P(diode2) x Rth(c) |
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Table 3. |
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Static electrical characteristics |
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Symbol |
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Parameter |
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Test conditions |
Min. |
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Typ |
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Max. |
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Unit |
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IR(1) |
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Reverse leakage current |
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Tj = 25° C |
VR = VRRM |
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20 |
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µA |
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Tj = 125° C |
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15 |
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150 |
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Tj = 25° C |
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2.10 |
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Tj = 125° C |
IF = 25 A |
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1.25 |
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1.90 |
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VF(2) |
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Forward voltage drop |
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Tj = 150° C |
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1.20 |
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1.80 |
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V |
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Tj = 25° C |
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2.25 |
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Tj = 125° C |
IF = 30 A |
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1.35 |
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2.05 |
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Tj = 150° C |
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1.30 |
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1.95 |
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1.Pulse test: tp = 5 ms, δ < 2 %
2.Pulse test: tp = 380 µs, δ < 2 %
To evaluate the conduction losses use the following equation:
P = 1.60 x IF(AV) + 0.012 IF2(RMS)
2/8
STTH6112TV |
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Characteristics |
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Table 4. |
Dynamic characteristics |
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Symbol |
Parameter |
Test conditions |
Min. |
Typ |
Max. |
Unit |
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IF = 1 A, dIF/dt = -50 A/µs, |
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115 |
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VR = 30 V, Tj = 25° C |
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trr |
Reverse recovery time |
IF = 1 A, dIF/dt = -100 A/µs, |
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57 |
80 |
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VR = 30 V, Tj = 25° C |
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IF = 1 A, dIF/dt = -200 A/µs, |
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45 |
65 |
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VR = 30 V, Tj = 25° C |
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IRM |
Reverse recovery current |
IF = 30 A, dIF/dt = -200 A/µs, |
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25 |
35 |
A |
VR = 600 V, Tj = 125° C |
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S |
Softness factor |
IF = 30 A, dIF/dt = -200 A/µs, |
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1.5 |
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VR = 600 V, Tj = 125° C |
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tfr |
Forward recovery time |
IF = 30 A dIF/dt = 100 A/µs |
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550 |
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VFR = 1.5 x VFmax, Tj = 25° C |
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VFP |
Forward recovery voltage |
IF = 30 A, dIF/dt = 100 A/µs, |
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V |
Tj = 25° C |
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Figure 1. Conduction losses versus |
Figure 2. Forward voltage drop versus |
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average current |
forward current |
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P(W) |
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80 |
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δ=0.05 |
δ=0.1 |
δ=0.2 |
δ=0.5 |
δ=1 |
70 |
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60
50
40
30
20 |
T |
10 |
IF(AV)(A) |
δ=tp/T |
tp |
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0
0 |
5 |
10 |
15 |
20 |
25 |
30 |
35 |
IFM(A)
200 |
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180 |
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Tj=150°C |
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160 |
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(Maximum values) |
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140 |
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120 |
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Tj=150°C |
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(Typical values) |
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100 |
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80 |
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60 |
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Tj= 25 °C |
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(Maximum values) |
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40 |
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20 |
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VFM(V) |
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0 |
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0.0 |
0.5 |
1.0 |
1.5 |
2.0 |
2.5 |
3.0 |
3.5 |
4.0 |
3/8