ST STP9NK90Z, STF9NK90Z, STW9NK90Z User Manual

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N-CHANNEL 900V - 1.1- 8A TO-220/TO-220FP/TO-247
STP9NK90Z - STF9NK90Z
STW9NK90Z
Zener-Protected SuperMESH™Power MOSFET
TYPE V
STP9NK90Z STF9NK90Z STW9NK90Z
TYPICAL R
100% AVALANCHE TESTED
GATE CHARGE MINIMIZED
VERY LOW INTRINSICCAPACITANCES
VERY GOOD MANUFACTURING
900 V 900 V 900 V
(on) = 1.1
DS
DSS
R
DS(on)
< 1.3 < 1.3 < 1.3
I
D
8A 8A 8A
Pw
160 W
40 W
160 W
REPEATIBILITY
DESCRIPTION
The SuperMESH™ s eries is obtained through an extreme optimization of ST’s well established strip­based PowerMESH™ layout. In addition to pushing on-resistance significantly down, special careis tak­en to ensure a very good dv/dt capability for the most dem anding applications. Such series comple­ments S T full range of high voltage MOSFETs in­cluding revolutionary MDmes h™ products.
TO-220
1
3
2
TO-220FP
TO-247
INTERNAL SCHEMATIC DIAGRAM
3
2
1
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITCH MODE POWER SUPPLIES
DC-AC CONVERTERS FOR WELDING, UPS
AND MO TOR DRIVE
ORDERING INFORMATION
SALES TYPE MARKING PACKAGE PACKAGING
STP9NK90Z P9NK90Z TO-220 TUBE STF9NK90Z F9NK90Z TO-220FP TUBE
STW9NK90Z W9NK90Z TO-247 TUBE
1/11April 2003
STP9NK90Z - STF9NK90Z - STW9NK90Z
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
STP9NK90Z STF9NK90Z STW9NK90Z
V
DS
V
DGR
V
GS
I
D
I
D
IDM()
P
TOT
V
ESD(G-S)
dv/dt (1) Peak Diode Recovery voltage slope 4.5 V/ns
V
ISO
T
j
T
stg
() Pulse width limited by safe operating area (1) I
8A, di/dt 200A/µs, VDD≤ V
SD
(*) Limited only by maximum temperature allowed
Drain-source Voltage (VGS=0) Drain-gate Voltage (RGS=20kΩ)
900 V
900 V Gate- source Voltage ± 30 V Drain Current (continuous) at TC= 25°C Drain Current (continuous) at TC= 100°C
8 8 (*) 8 A
5 5 (*) 5 A Drain Current (pulsed) 32 32 (*) 32 A Total Dissipation at TC= 25°C
160 40 160 W Derating Factor 1.28 0.32 1.28 W/°C Gate source ESD(HBM-C=100pF, R=1.5KΩ) 4KV
Insulation Withstand Voltage (DC) - 2500 - V Operating Junction Temperature
Storage Temperature
(BR)DSS,Tj≤TJMAX.
-55to150
-55to150
°C °C
THERMAL DATA
TO-220 TO-220FP TO-247
Rthj-case Thermal Resistance Junction-case Max 0.78 3.1 0.78 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 62.5 50 °C/W
T
l
Maximum Lead Temperature For Soldering Purpose
300 °C
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
E
AS
Single Pulse Avalanche Energy (starting T
max)
j
= 25 °C, ID=IAR,VDD=50V)
j
8A
300 mJ
GATE-SOURCE ZENER DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
BV
GSO
Gate-Source Breakdown
Igs=± 1mA (Open Drain) 30 V
Voltage
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed t o enhance not only the device’s ESD capability, but also to make them saf ely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to protect the device’ s integrity. These integrated Zener diodes thus avoid the usage of external components.
2/11
STP9NK90Z - S TF9NK9 0Z - STW9NK90Z
ELECTRICAL CHARACTERISTICS (T
=25°C UNLESS OTHERWISE SPECIFIED)
CASE
ON/OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
ID=1mA,VGS= 0 900 V
Breakdown Voltage
I
DSS
I
GSS
V
GS(th)
R
DS(on)
Zero Gate Voltage Drain Current (V
GS
=0)
Gate-body Leakage Current (V
DS
=0) Gate Threshold Voltage Static Drain-source On
V
= Max Rating
DS
VDS= Max Rating, TC= 125 °C V
= ± 20V ±10 µA
GS
V
DS=VGS,ID
= 100µA
3 3.75 4.5 V
1
50
VGS=10V,ID= 3.6 A 1.1 1.3
Resistance
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS=15V,ID= 3.6 A 5.75 S
g
fs
C
oss eq.
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance Reverse Transfer Capacitance
(3) Equivalent Output
=25V,f=1MHz,VGS= 0 2115
V
DS
190
40
VGS=0V,VDS= 0V to 720V 115 pF
Capacitance
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(on)
Q Q Q
Turn-on Delay Time
t
r
g gs gd
Rise Time
Total Gate Charge Gate-Source Charge Gate-Drain Charge
VDD=450V,ID=4A RG= 4.7VGS=10V (Resistive Load see, Figure 3)
=720V,ID=8A,
V
DD
V
=10V
GS
22 13
72 14 38
100
µA µA
pF pF pF
ns ns
nC nC nC
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(off)
Turn-off Delay Time
t
f
Fall Time
VDD= 450 V, ID=4A R
=4.7ΩVGS=10V
G
55 28
(Resistive Load see, Figure 3)
t
r(Voff)
t
f
t
c
Fall Time Cross-over Time
Off-voltage Rise Time
= 720V, ID=8A,
V
DD
RG=4.7Ω, VGS= 10V (Inductive Load see, Figure 5)
53 11 22
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD(1)
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3. C
Source-drain Current
(2)
Source-drain Current (pulsed) Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
is defined as a constant equivalent capacitance giving the same charging time as C
oss eq.
.
V
DSS
ISD= 8 A, VGS=0 I
SD
VDD=50V,Tj= 150°C (see test circuit, Figure 5)
= 8 A, di/dt = 100A/µs
950
10 21
when VDSincreases from 0 to 80%
oss
8
32
1.6 V
ns ns
ns ns ns
A A
ns
µC
A
3/11
STP9NK90Z - STF9NK90Z - STW9NK90Z
Safe Operating F or TO-220
Thermal Impedance For TO-220
Thermal Impedance For TO-220FPSafe Operating Area For TO-220FP
Safe Operating Area For TO-247
4/11
Thermal Impedance For TO-247
STP9NK90Z - S TF9NK9 0Z - STW9NK90Z
Output Characteristics
Transconductance
Transfer Characteristics
Static Drain-source O n Resistance
Gate Charge vs Gate-so urc e V oltage Capacitance V ariations
5/11
STP9NK90Z - STF9NK90Z - STW9NK90Z
Normalized On Resistance vs Tem peratureNormalized Gate Threshold Voltage vs Temp.
Source-drain Diode Forward Characteristics
Maximum Avalanche Energy vs Temperature
Normalized BVDSS vs Temperature
6/11
STP9NK90Z - S TF9NK9 0Z - STW9NK90Z
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 5: Test Circuit For Induct ive Load Switching And Di ode Recovery Times
Fig. 4: Gate Charge test Circuit
7/11
STP9NK90Z - STF9NK90Z - STW9NK90Z
E
P011C
TO-220 MECHANICAL DATA
DIM.
A 4.40 4.60 0.173 0.181 C 1.23 1.32 0.048 0.051 D 2.40 2.72 0.094 0.107
D1 1.27 0.050
E 0.49 0.70 0.019 0.027
F 0.61 0.88 0.024 0.034 F1 1.14 1.70 0.044 0.067 F2 1.14 1.70 0.044 0.067
G 4.95 5.15 0.194 0.203 G1 2.4 2.7 0.094 0.106 H2 10.0 10.40 0.393 0.409 L2 16.4 0.645 L4 13.0 14.0 0.511 0.551 L5 2.65 2.95 0.104 0.116 L6 15.25 15.75 0.600 0.620 L7 6.2 6.6 0.244 0.260 L9 3.5 3.93 0.137 0.154
DIA. 3.75 3.85 0.147 0.151
MIN. TYP. MAX. MIN. TYP. MAX.
mm inch
A
C
D
8/11
L5
Dia.
L7
D1
L6
L2
L9
F1
G1
F
H2
G
F2
L4
STP9NK90Z - S TF9NK9 0Z - STW9NK90Z
TO-220FP MECHANICAL DATA
DIM.
A 4.4 4.6 0.173 0.181 B 2.5 2.7 0.098 0.106
D 2.5 2.75 0.098 0.108
E 0.45 0.7 0.017 0.027
F 0.75 1 0.030 0.039 F1 1.15 1.5 0.045 0.067 F2 1.15 1.5 0.045 0.067
G 4.95 5.2 0.195 0.204
G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409 L2 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 .0385 0.417 L5 2.9 3.6 0.114 0.141 L6 15.9 16.4 0.626 0.645 L7 9 9.3 0.354 0.366
Ø 3 3.2 0.118 0.126
MIN. TYP MAX. MIN. TYP. MAX.
mm. inch
E
A
D
B
L3
L6
L7
¯
F1
F
G1
H
G
F2
123
L2
L5
L4
9/11
STP9NK90Z - STF9NK90Z - STW9NK90Z
TO-247 MECHANICAL DATA
DIM.
A 4.85 5.15 0.19 0.20
A1 2.20 2.60 0.086 0.102
b 1.0 1.40 0.039 0.055 b1 2.0 2.40 0.079 0.094 b2 3.0 3.40 0.118 0.134
c 0.40 0.80 0.015 0.03
D 19.85 20.15 0.781 0.793
E 15.45 15.75 0.608 0.620
e5.45 0.214
L 14.20 14.80 0.560 0.582 L1 3.70 4.30 0.14 0.17 L2 18.50 0.728
øP 3.55 3.65 0.140 0.143 øR 4.50 5.50 0.177 0.216
S5.50 0.216
MIN. TYP MAX. MIN. TYP. MAX.
mm. inch
10/11
STP9NK90Z - S TF9NK9 0Z - STW9NK90Z
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of u se of such inf ormat ion nor for any in fring ement of p aten ts or othe r ri ghts of th ird p arties whic h may resul t f rom its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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