ST STP8NK85Z, STF8NK85Z User Manual

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N-CHANNEL 850V -1.1- 6.7A TO-220/TO -2 20F P
STP8NK85Z
STF8NK85Z
Zener-Protected SuperMESH™MOSFET
Table 1: General Features
TYPE V
STP8NK85Z STF8NK85Z
TYPICAL R
EXTREMELY HIGH dv /d t CAPABILITY
IMPROVED ESD CAPABILITY
100% AVALANCHE RATED
GATE CHARGE MINIMIZED
VERY LOW INTRINSIC CAPACITANCES
VERY GOOD MANUFACTURING
DSS
850 V 850 V
DS
R
DS(on)ID
<1.4 <1.4
6.7A
6.7A
Pw
150 W
35 W
REPEATIBILITY
DESCRIPTION
The SuperMESH™ series is obtained through an extreme optimization of ST’s well established strip-based PowerMESH™ layout. In addition to pushing on-resistance significantly down, special care is taken to ensure a very good dv/dt capability for the most demanding applications. Such series complements ST full range of high voltage MOS­FET s including revolutionary MDmesh™ products.
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
IDEAL FOR OFF-LINE POWER SUPPLIES
SMPS
Figure 1: Package
TO-220 TO-220FP
Figure 2: Internal Schematic Diagram
3
2
1
Table 2: Order Codes
SALES TYPE MARKING PACKAGE PACKAGING
STP8NK85Z P8NK85Z TO-220 TUBE STF8NK85Z F8NK85Z TO-220FP TUBE
Rev. 5
1/12September 2005
STP8NK85Z - STF8NK85Z
Table 3: Absolute Maximum ratings
Symbol Parameter Value Unit
TO-220 TO-220FP
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
V
ESD(G-S)
dv/dt (1) Peak Diode Recovery voltage slope 4.5 V/ns
V
ISO
T
j
T
stg
() Pulse wi dt h l i m i ted by safe operating area
6.7A, di/dt 200A/µs, VDD = 80% V
(1) I
SD
(*) Limited only by maximum temperature allowed
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 kΩ)
850 V
850 V Gate- source Voltage ± 30 V Drain Current (continuous) at TC = 25°C Drain Current (continuous) at TC = 100°C
()
Drain Current (pulsed) 26.7 26.7 (*) A Total Dissipation at TC = 25°C
6.7 6.7 (*) A
4.3 4.3 (*) A
150 35 W Derating Factor 1.20 0.28 W/°C Gate source ESD(HBM-C=100pF, R=1.5KΩ) 4000 KV
Insulation Withstand Voltage (DC) - 2500 V Operating Junction Temperature
Storage Temperature
(BR)DSS
-55 to 150
-55 to 150
°C °C
Table 4: Thermal Data
TO-220 TO-220FP
Rthj-case Thermal Resistance Junction-case Max 0.83 3.6 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 62.5 °C/W
T
l
Maximum Lead Temperature For Soldering
300 °C
Purpose
Table 5: Avalanche Characteristics
Symbol Parameter Max Value Unit
I
AR
E
AS
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
= 25 °C, ID = IAR, VDD = 50 V)
j
6.7 A
350 mJ
Table 6: Gate-Source Zener Diode
Symbol Parameter Test Conditions Min. Typ. Max. Unit
BV
GSO
Gate-Source
Igs=± 1mA (Open Drain) 30 V
Breakdown Voltage
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to protect the devices integrity . These integrated Zener diodes thus avoid the usage of external components.
2/12
STP8NK85Z - STF8NK85Z
ELECTRICAL CHARACTERISTICS (T
=25°C UNLESS OTHERWISE SPECIFIED)
CASE
Table 7: On/Off
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
ID = 1 mA, VGS = 0 850 V
Breakdown Voltage
I
DSS
I
GSS
V
GS(th)
R
DS(on)
Zero Gate Voltage Drain Current (V
GS
= 0)
Gate-body Leaka ge Current (V
DS
= 0) Gate Threshold Voltage Static Drain-source On
V
= Max Rating
DS
V
= Max Rating, TC = 125 °C
DS
V
= ± 20V ±10 µA
GS
V
= VGS, ID = 100µA
DS
33.754.5V
1
50
VGS = 10V, ID = 3.35 A 1.1 1.4
Resistance
Table 8: DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS = 15 V, ID= 3.35 A 6 S
g
fs
C
oss eq.
C
C
C
t
d(on)
t
d(off)
iss oss rss
t
r
t
f
Input Capacitance Output Capacitance Reverse Transfer Capacitance
(3) Equivalent Outpu t
Capacitance Turn-on Delay Time
Rise Time Turn-off Delay Time Fall Time
= 25V, f = 1 MHz, VGS = 0 1870
V
DS
190
44
VGS = 0V, VDS = 0V to 680V 75 pF
= 425 V, ID = 3.35 A
V
DD
R
=4.7Ω VGS = 10 V
G
(see Figure 19)
26 19 58 18
µA µA
pF pF pF
ns ns ns ns
= 680 V, ID = 6.7 A,
t
r(Voff)
t
Q Q Q
t
f c
g gs gd
Fall Time Cross-over Time
Total Gate Charge Gate-Source Charge Gate-Drain Charge
Off-voltage Rise Time
V
DD
RG=4.7Ω, V (see Figure 20)
= 680V, ID = 6.7 A,
V
DD
VGS = 10V (see Figure 22)
GS
= 10V
12 10 24
60 12 35
84
Table 9: Source Drain Diode
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
(2)
SDM
(1)
V
SD
t
rr
Q
rr
I
RRM
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: P ul se duration = 300 µs, duty cycle 1.5 % .
2. Pulse wi dt h l i m ited by safe op erating area.
3. C
Source-drain Current Source-drain Current (pulsed)
Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current
is defined as a constant equivalent capacitance giving the same charging time as C
oss eq.
.
V
DSS
ISD = 6.7 A, VGS = 0 I
SD
VDD = 35V, Tj = 25°C (see Figure 20)
I
SD
V
DD
(see Figure 20)
= 6.7 A, di/dt = 100A/µs
= 6.7 A, di/dt = 100A/µs
= 35V, Tj = 150°C
530
4.5 17
690
6.4 17
when VDS increases from 0 to 80%
oss
6.7
26.7
1.6 V
ns ns ns
nC nC nC
A A
ns
µC
A
ns
µC
A
3/12
STP8NK85Z - STF8NK85Z
Figure 3: Safe Operating Area for TO-220
Figure 4: Safe Operating Area for TO-220FP
Figure 6: Thermal Impedan ce for TO -2 20
Figure 7: Thermal Impedan ce for TO -2 20FP
Figure 5: Output Characteristics
4/12
Figure 8: Transfer Characteristics
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