– High voltage inverters specific for LCD TV
– Lighting full bridge topology
– Motor control
DS(on)
max.
I
D
STF16N50U
UltraFAST MESH™ Power MOSFET
Pw
2
1
TO-220FP
Figure 1.Internal schematic diagram
D(2)
Description
G(1)
The device is an N-channel Ultrafast MESHTM.
This technology associates all advantages of
reduced on-resistance. Zener gate protection and
very high dv/dt capability with an extremely
enhanced fast body-drain recovery diode.
The built-in back-to-back Zener diodes have specifically been designed to enhance not only
the device’s ESD capability, but also to make them safely absorb possible voltage transients
that may occasionally be applied from gate to source. In this respect the Zener voltage is
appropriate to achieve an efficient and cost-effective intervention to protect the device’s
integrity. These integrated Zener diodes thus avoid the usage of external components.
Doc ID 17923 Rev 15/12
Electrical characteristicsSTF16N50U
2.1 Electrical characteristics (curves)
Figure 2.Safe operating area Figure 3.Thermal impedance
vs temperatureFigure 7.Static drain-source on resistance
VDSS
AM07152v1
R
DS(on)
(norm)
1.15
1.10
1.05
1.00
0.95
0.90
0.85
0.80
-100
-50
50
0
100
150
T
J
(°C)
6/12Doc ID 17923 Rev 1
(Ω)
0.50
0.49
0.48
0.47
0.46
0.45
0.44
AM07153v1
VGS=10V
4
6
8
2
0
10
I
D
(A)
STF16N50UElectrical characteristics
Figure 8.Gate charge vs gate-source voltage Figure 9.Capacitance variations
V
GS
(V)
DS
V
12
VDD=400V
D
=11A
I
10
8
6
4
AM07154v1
V
GS
450
400
350
300
250
200
150
100
2
0
10
0
20
30
40
50
0
Q
g
(nC)
(pF)
1000
100
10
C
1
0.1
1
10
100
AM07155v1
V
DS
Ciss
Coss
Crss
(V)
Figure 10. Normalized gate threshold voltage
V
vs temperature
GS(th)
(norm)
1.1
1.0
0.9
0.8
0.7
0.6
0.5
0.4
-100
-50
AM07156v1
T
J
50
100
150
0
(°C)
Figure 11. Normalized on resistance vs
temperature
R
DS(on)
(norm)
2.5
2.0
1.5
1.0
0.5
0
-100
-50
50
0
100
150
AM07157v1
T
J
(°C)
Doc ID 17923 Rev 17/12
Test circuitsSTF16N50U
3 Test circuits
Figure 12. Switching times test circuit for
PW
resistive load
VGS
VD
RG
RL
D.U.T.
2200
µF
3.3µF
AM01468v1
V
DD
Figure 14. Test circuit for inductive load
G
25
Ω
switching and diode recovery times
A
D
D.U. T.
S
B
R
FAST
DIODE
G
A
A
L=100µH
B
B
D
G
S
3.3
µF
1000
µF
V
DD
Figure 13. Gate charge test circuit
V
i=20V=VGMAX
PW
2200
µF
1kΩ
12V
IG=CONST
2.7kΩ
47kΩ
47kΩ
100Ω
100nF
D.U.T.
AM01469v1
Figure 15. Unclamped inductive load test
circuit
L
VD
ID
Vi
D.U. T.
2200
µF
3.3µF
1kΩ
VDD
V
VDD
G
Pw
AM01470v1
Figure 16. Unclamped inductive waveformFigure 17. Switching time waveform
V(BR)DSS
VD
IDM
ID
VDD
VDD
AM01472v1
0
0
10%
tdon
ton
90%
tr
10%
tdoff
VDS
90%
V
GS
8/12Doc ID 17923 Rev 1
AM01471v1
toff
tf
90%
10%
AM01473v1
STF16N50UPackage mechanical data
4 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com. ECOPACK
is an ST trademark.
®
packages, depending on their level of environmental compliance. ECOPACK®
Doc ID 17923 Rev 19/12
Package mechanical dataSTF16N50U
Table 9.TO-220FP mechanical data
mm
Dim.
Min.Typ.Max.
A4.44.6
B2.52.7
D2.52.75
E0.450.7
F0.751
F11.151.70
F21.151.70
G4.955.2
G12.42.7
H1010.4
L216
L328.630.6
L49.810.6
L52.93.6
L615.916.4
L799.3
Dia33.2
Figure 18. TO-220FP drawing
L7
A
B
Dia
L6
H
D
L5
F2
F1
E
F
G
G1
L2
L3
10/12Doc ID 17923 Rev 1
L4
7012510_Rev_K
STF16N50URevision history
5 Revision history
Table 10.Document revision history
DateRevisionChanges
09-Sep-20101First release.
Doc ID 17923 Rev 111/12
STF16N50U
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