STB25NM60N
STP25NM60N - STF25NM60N STB25NM60N/-1 - STW25NM60N
N-CHANNEL 600V 0.140Ω -20A TO-220/FP/D²/I²PAK/TO-247 SECOND GENERATION MDmesh™ MOSFET
PRODUCT PREVIEW
Table 1: General Features
TYPE |
VDSS |
RDS(on) |
ID |
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(@Tjmax) |
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STB25NM60N-1 |
650 V |
< 0.170 Ω |
20 A |
STF25NM60N |
650 V |
< 0.170 Ω |
20(*) A |
STP25NM60N |
650 V |
< 0.170 Ω |
20 A |
STW25NM60N |
650 V |
< 0.170 Ω |
20 A |
STB25NM60N |
650 V |
< 0.170 Ω |
20 A |
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■WORLD’S LOWEST ON RESISTANCE
■TYPICAL RDS(on) = 0.140 Ω
■HIGH dv/dt AND AVALANCHE CAPABILITIES
■100% AVALANCHE TESTED
■LOW INPUT CAPACITANCE AND GATE CHARGE
■LOW GATE INPUT RESISTANCE
DESCRIPTION
Figure 1: Package
3
3 |
2 |
2 |
1 |
1 |
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TO-220 |
TO-220FP |
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3
1
D²PAK
1 2 3
3
I²PAK |
2 |
1 |
TO-247
Figure 2: Internal Schematic Diagram
The STP25NM60N is realized with the second generation of MDmesh Technology. This revolutionary MOSFET associates a new vertical structure to the Company's strip layout to yield the world's lowest on-resistance and gate charge. It is therefore suitable for the most demanding high efficiency converters
APPLICATIONS
The MDmesh™ II family is very suitable for increase the power density of high voltage converters allowing system miniaturization and higher efficiencies.
Table 2: Order Code
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SALES TYPE |
MARKING |
PACKAGE |
PACKAGING |
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STB25NM60N-1 |
B25NM60N |
I²PAK |
TUBE |
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STF25NM60N |
F25NM60N |
TO-220FP |
TUBE |
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STP25NM60N |
P25NM60N |
TO-220 |
TUBE |
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STW25NM60N |
W25NM60N |
TO-247 |
TUBE |
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STB25NM60N |
B25NM60N |
D²PAK |
TAPE & REEL |
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Rev. 4 |
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June 2005 |
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1/12 |
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This is preliminary information on a new product now in development. Details are subject to change without notice.
STP25NM60N - STF25NM60N - STB25NM60N/-1 - STW25NM60N
Table 3: Absolute Maximum ratings
Symbol |
Parameter |
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Value |
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Unit |
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TO-220/I²PAK |
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TO-220FP |
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TO-247/D²PAK |
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VDS |
Drain-source Voltage (VGS = 0) |
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600 |
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V |
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VDGR |
Drain-gate Voltage (RGS = 20 kΩ ) |
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600 |
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V |
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VGS |
Gatesource Voltage |
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± 25 |
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V |
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ID |
Drain Current (continuous) at TC = 25°C |
20 |
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20 (*) |
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A |
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ID |
Drain Current (continuous) at TC = 100°C |
12.8 |
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12.8 (*) |
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A |
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IDM (1) |
Drain Current (pulsed) |
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80 |
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80 (*) |
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A |
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PTOT |
Total Dissipation at TC = 25°C |
160 |
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40 |
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W |
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Derating Factor |
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1.28 |
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0.32 |
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W/°C |
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dv/dt (2) |
Peak Diode Recovery voltage slope |
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TBD |
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V/ns |
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Tstg |
Storage Temperature |
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– 55 to 150 |
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°C |
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Tj |
Max. Operating Junction Temperature |
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150 |
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°C |
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(*) Limited only by maximum temperature allowed |
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(1) Pulse width limited by safe operating area |
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(2) ISD ≤ 20 A, di/dt ≤ 400 A/µs, VDD =80% V(BR)DSS. |
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Table 4: Thermal Data |
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TO-220/I²PAK |
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TO-220FP |
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TO-247/D²PAK |
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Rthj-case |
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Thermal Resistance Junction-case Max |
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0.78 |
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3.1 |
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°C/W |
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Rthj-amb |
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Thermal Resistance Junction-ambient Max |
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62.5 |
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°C/W |
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Tl |
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Maximum Lead Temperature For Soldering Purpose |
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300 |
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°C |
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Table 5: Avalanche Characteristics |
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Symbol |
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Parameter |
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Max Value |
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Unit |
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IAS |
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Avalanche Current, Repetitive or Not-Repetitive |
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TBD |
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A |
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(pulse width limited by Tj max) |
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EAS |
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Single Pulse Avalanche Energy |
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TBD |
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mJ |
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(starting Tj = 25 °C, ID = IAS, VDD = 50 V) |
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ELECTRICAL CHARACTERISTICS (TCASE =25°C UNLESS OTHERWISE SPECIFIED) |
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Table 6: On /Off |
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Symbol |
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Parameter |
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Test Conditions |
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Value |
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Unit |
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Min. |
Typ. |
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Max. |
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V(BR)DSS |
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Drain-source Breakdown |
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ID = 1 mA, VGS = 0 |
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600 |
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V |
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Voltage |
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dv/dt(2) |
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Drain Source Voltage |
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Vdd=TBD, Id=TBD, Vgs=TBD |
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TBD |
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V/ns |
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Slope |
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IDSS |
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Zero Gate Voltage |
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VDS = Max Rating |
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1 |
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µA |
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Drain Current (VGS = 0) |
VDS = Max Rating, TC = 125°C |
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10 |
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µA |
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IGSS |
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Gate-body Leakage |
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VGS = ± 20 V |
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100 |
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nA |
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Current (VDS = 0) |
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VGS(th) |
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Gate Threshold Voltage |
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VDS = VGS, ID = 250 µA |
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2 |
3 |
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4 |
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V |
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RDS(on |
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Static Drain-source On |
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VGS = 10 V, ID = 10 A |
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0.140 |
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0.170 |
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Ω |
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Resistance |
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(2) Characteristic value at turn off on inductive load
2/12
STP25NM60N - STF25NM60N - STB25NM60N/-1 - STW25NM60N
ELECTRICAL CHARACTERISTICS (CONTINUED)
Table 7: Dynamic
Symbol |
Parameter |
Test Conditions |
Min. |
Typ. |
Max. |
Unit |
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gfs (1) |
Forward Transconductance |
VDS = 15V , ID= 10A |
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17 |
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S |
Ciss |
Input Capacitance |
VDS = 25 V, f = 1 MHz, |
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2565 |
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pF |
Coss |
Output Capacitance |
VGS = 0 |
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511 |
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pF |
Crss |
Reverse Transfer |
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77 |
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pF |
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Capacitance |
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COSS eq (3). |
Equivalent Output |
VGS = 0 V, VDS = 0 to 480 V |
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TBD |
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pF |
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Capacitance |
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RG |
Gate Input Resistance |
f=1 MHz Gate DC Bias = 0 |
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2 |
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Ω |
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Test Signal Level = 20mV |
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Open Drain |
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td(on) |
Turn-on Delay Time |
VDD = 300 V, ID = 10 A, |
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TBD |
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ns |
tr |
Rise Time |
RG = 4.7 Ω, VGS = 10 V |
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TBD |
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ns |
td(off) |
Turn-off-Delay Time |
(see Figure 4) |
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TBD |
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ns |
tf |
Fall Time |
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TBD |
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ns |
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Qg |
Total Gate Charge |
VDD = 480 V, ID = 20 A, |
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93 |
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nC |
Qgs |
Gate-Source Charge |
VGS = 10 V |
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TBD |
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nC |
Qgd |
Gate-Drain Charge |
(see Figure 7) |
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TBD |
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nC |
Table 8: Source Drain Diode
Symbol |
Parameter |
Test Conditions |
Min. |
Typ. |
Max. |
Unit |
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ISD |
Source-drain Current |
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20 |
A |
ISDM (2) |
Source-drain Current (pulsed) |
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80 |
A |
VSD (1) |
Forward On Voltage |
ISD = 20 |
A, VGS = 0 |
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1.3 |
V |
trr |
Reverse Recovery Time |
ISD = 25 |
A, di/dt = 100 A/µs |
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TBD |
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ns |
Qrr |
Reverse Recovery Charge |
VDD = 100V |
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TBD |
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µC |
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IRRM |
Reverse Recovery Current |
(see Figure 5) |
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TBD |
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A |
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trr |
Reverse Recovery Time |
ISD = 25 |
A, di/dt = 100 A/µs |
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TBD |
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ns |
Qrr |
Reverse Recovery Charge |
VDD = 100V, Tj = 150°C |
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TBD |
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µC |
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IRRM |
Reverse Recovery Current |
(see Figure 5) |
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TBD |
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A |
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(1)Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
(2)Pulse width limited by safe operating area.
(3)Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS.
3/12
STP25NM60N - STF25NM60N - STB25NM60N/-1 - STW25NM60N
Figure 3: Unclamped Inductive Load Test Circuit
Figure 4: Switching Times Test Circuit For Resistive Load
Figure 6: Unclamped Inductive Wafeform
Figure 7: Gate Charge Test Circuit
Figure 5: Test Circuit For Inductive Load Switching and Diode Recovery Times
4/12 |