These devices utilizes the latest advanced design
rules of ST’s proprietary STripFET™ technology.
It is ideal in high performanc e DC-DC converter
applications where efficiency is to be achieved at
very high output currents.
Figure 5.TransconductanceFigure 6.Static Drain-Source on Resistance
5/14
2 Electric al characteristicsSTB120NH03L - STP120NH03L
Figure 7.Gate Charge vs Gate-Source Voltage Figure 8.Capacitance Variations
Figure 9.Normalized Gate Threshold Volt ag e
vs Temperature
Figure 11. Source-drain Diode Forward
Characteristics
Figure 10. Normalized on Resistance vs
Temperature
Figure 12. Normalized Breakdown Vo l tage vs
Temperature
6/14
STB120NH03L - STP120NH03L3 Test circuits
3 Test circuits
Figure 13. Switching Times Test Circuit For
Resistive Load
Figure 15. Test Circuit For Inductive Load
Switching and Diode Recovery
Times
Figure 14. Gate Charge Test Circuit
Figure 17. Unclamped Inductive Load Test
Circuit
Figure 16. Unclamped Inductive Waveform
7/14
4 Package mechani cal dataSTB120NH03L - STP120NH03L
4 P ack age mechanical da ta
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a Lead-free second level interconnect . The category of
second level interconnect is marked on the package and on the inner box label, in compliance
with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also
marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are
available at: www.st.com
8/14
STB120NH03L - STP120NH03L4 Package mechanical data
Table 7.TO-220 Mechanical Data
Dimensions
Ref.
Min. Typ. Max. Min. Typ. Max.
A 4.40 4.60 0.173 0.181
b 0.61 0.88 0.024 0.035
b1 1.15 1.70 0.045 0.067
c 0.49 0.70 0.019 0.028
D 15.25 15.75 0.600 0.620
E 10.0 10.40 0.394 0.409
Figure 20. Buck Converter: Power Losses Estimation
The power losses associated with the FETs in a Synchronous Buck converter can be estimated
using the equations shown in the table below. The formulas give a good approximation, for the
sake of performance comparison, of how different pairs of devices affect the converter
efficiency. However a very important parameter, the working temperature, is not considered.
The real device behavior is really dependent on how the heat generated inside the devices is
removed to allow for a safer working junction temperature.
The low side (SW2) device requires:
●Ver y low R
●Small Qgls to reduce the gate charge losses
●Small Coss to reduce losses due to output capacitance
●Small Qrr to reduce losses on SW1 during its turn-on
●The Cgd/Cgs ratio lower than Vth/Vgg ratio especially with low drain to source
●voltage to avoid the cross conduction phenomenon;
to reduce conduction losses
DS(on)
The high side (SW1) device requires:
●Small Rg and Ls to allow higher gate current peak and to limit the voltage feedback on the
gate
●Small Qg to have a faster commutation and to reduce gate charge losses
●Low R
to reduce the conduction losses.
DS(on)
11/14
5 Appendix ASTB120NH03L - STP120NH03L
R
)
R
V
f
V
f
V
f
Q
f
Q
2
f
2
f
Table 9.Power losses calculation
High Side Switching (SW1)Low Side Switch (SW2)
Pconduction
Pswitching Zero Voltage Switching
Recovery
(1)
Pdiode
ConductionNot applicable
Pgate(Q
1. Dissipated by SW1 during turn-on
P
Qoss
)
G
Table 10.Paramiters meaning
2
LDS(on)SW1
+
gd(SW1)gsth(SW1)in
Not applicable
ggg(SW1)
oss(SW1)in
2
1(*I *
δ
δ
*I *
I
L
*f*)Q(Q*
I
g
rr(SW2)in
*V*
*Q*V
oss(SW2)in
−
LDS(on)SW2
*Q*
*t*I*
deadtimeLf(SW2)
*V*
gggls(SW2)
*Q*V
ParameterMeaning
dDuty-cycle
Q
gsth
Q
gls
PconductionOn state los ses
PswitchingOn-off transition losses
PdiodeConduction and rever se recovery diode losses
PgateGate drive losses
P
Qoss
Post threshold gate charge
Third quadrant gate charge
Output capacitance losses
12/14
STB120NH03L - STP120NH03L6 Revision History
6 R evi sion History
DateRevisionDescription of changes
12-Dec-20051First release
13/14
6 Revision Hist orySTB120NH03L - STP120NH03L
I
s
o
d
b
ct
t
ot
a
nformation furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequence
f use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is grante
y implic ation or otherwise under any patent or patent righ ts of STMicroelectronics. Sp ecifications mentioned in this publicati on are subje
o change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are n
uthoriz ed for use as critical components in l i fe support devices or systems without express wr i tt en approval of STMi croelectron ics.
The ST logo is a registered tra dem ark of STMicroe l ectronics.
All other nam es are the prope rty of their respective owners