This document provides electrical specifications, pin assignments, and package diagrams
for the SPC564A80 series of microcontroller units (MCUs). For functional characteristics,
refer to the SPC564A80 Microcontroller Reference Manual.
1.2 Description
The microcontroller’s e200z4 host processor core is built on Power Architecture technology
and designed specifically for embedded applications. In addition to the Power Architecture
technology, this core supports instructions for digital signal processing (DSP).
The SPC564A80 has two levels of memory hierarchy consisting of 8 KB of instruction
cache, backed by 192 KB on-chip SRAM and 4 MB of internal flash memory. The
SPC564A80 includes an external bus interface, and also a calibration bus that is only
accessible when using the calibration tools.
This document describes the features of the SPC564A80 and highlights important electrical
and physical characteristics of the device.
–Up to 2 integer or floating point instructions per cycle
–Up to 4 multiply and accumulate operations per cycle
●Memory organization
–4 MB on-chip flash memory with ECC and Read While Write (RWW)
–192 KB on-chip SRAM with standby functionality (32 KB) and ECC
–8 KB instruction cache (with line locking), configurable as 2- or 4-way
–14 + 3 KB eTPU code and data RAM
–5× 4 crossbar switch (XBAR)
–24-entry MMU
–External Bus Interface (EBI) with slave and master port
●Fail Safe Protection
–16-entry Memory Protection Unit (MPU)
–CRC unit with 3 sub-modules
–Junction temperature sensor
●Interrupts
–Configurable interrupt controller (with NMI)
–64-channel DMA
●Serial channels
–3× eSCI
–3× DSPI (2 of which support downstream Micro Second Channel [MSC])
–3× FlexCAN with 64 messages each
–1× FlexRay module (V2.1) up to 10 Mbit/s with dual or single channel and 128
message objects and ECC
●1 × eMIOS:
●1 × eTPU2 (second generation eTPU)
–32 standard channels
–1× reaction module (6 channels with three outputs per channel)
SPC564A80 devices have a high performance e200z448n3 core processor:
●Dual issue, 32-bit Power Architecture embedded category CPU
●Variable Length Encoding Enhancements
●8 KB instruction cache: 2- or 4- way set associative instruction cache
●Thirty-two 64-bit general purpose registers (GPRs)
●Memory management unit (MMU) with 24-entry fully-associative translation look-aside
buffer (TLB)
●Harvard Architecture: Separate instruction bus and load/store bus
●Vectored interrupt support
●Non-maskable interrupt input
●Critical Interrupt input
●New ‘Wait for Interrupt’ instruction, to be used with new low power modes
●Reservation instructions for implementing read-modify-write accesses
●Signal processing extension (SPE) APU
●Single Precision Floating point (scalar and vector)
●Nexus Class 3+ debug
●Process ID manipulation for the MMU using an external tool
1.5.2 Crossbar Switch (XBAR)
The XBAR multiport crossbar switch supports simultaneous connections between five
master ports and four slave ports. The crossbar supports a 32-bit address bus width and a
64-bit data bus width.
The crossbar allows three concurrent transactions to occur from the master ports to any
slave port but each master must access a different slave. If a slave port is simultaneously
requested by more than one master port, arbitration logic selects the higher priority master
and grants it ownership of the slave port. All other masters requesting that slave port are
stalled until the higher priority master completes its transactions. Requesting masters are
treated with equal priority and are granted access to a slave port in round-robin fashion,
based upon the ID of the last master to be granted access. The crossbar provides the
following features:
●32-bit internal address, 64-bit internal data paths
1.5.3 eDMA
The enhanced direct memory access (eDMA) controller is a second-generation module
capable of performing complex data movements via 64 programmable channels, with
minimal intervention from the host processor. The hardware micro-architecture includes a
DMA engine which performs source and destination address calculations, and the actual
data movement operations, along with an SRAM-based memory containing the transfer
control descriptors (TCD) for the channels. This implementation is utilized to minimize the
overall block size. The eDMA module provides the following features:
●All data movement via dual-address transfers: read from source, write to destination
●Programmable source and destination addresses, transfer size, plus support for
enhanced addressing modes
●Transfer control descriptor organized to support two-deep, nested transfer operations
●An inner data transfer loop defined by a “minor” byte transfer count
●An outer data transfer loop defined by a “major” iteration count
●Channel activation via one of three methods:
–Explicit software initiation
–Initiation via a channel-to-channel linking mechanism for continuous transfers
–Peripheral-paced hardware requests (one per channel)
●Support for fixed-priority and round-robin channel arbitration
●Channel completion reported via optional interrupt requests
●One interrupt per channel, optionally asserted at completion of major iteration count
●Error termination interrupts optionally enabled
●Support for scatter/gather DMA processing
●Ability to suspend channel transfers by a higher priority channel
1.5.4 Interrupt controller
The INTC (interrupt controller) provides priority-based preemptive scheduling of interrupt
requests, suitable for statically scheduled hard real-time systems.
For high priority interrupt requests, the time from the assertion of the interrupt request from
the peripheral to when the processor is executing the interrupt service routine (ISR) has
been minimized. The INTC provides a unique vector for each interrupt request source for
quick determination of which ISR needs to be executed. It also provides an ample number of
priorities so that lower priority ISRs do not delay the execution of higher priority ISRs. To
allow the appropriate priorities for each source of interrupt request, the priority of each
interrupt request is software configurable.
When multiple tasks share a resource, coherent accesses to that resource need to be
supported. The INTC supports the priority ceiling protocol for coherent accesses. By
providing a modifiable priority mask, the priority can be raised temporarily so that all tasks
which share the resource cannot preempt each other.
The INTC provides the following features:
●9-bit vector addresses
●Unique vector for each interrupt request source
●Hardware connection to processor or read from register
●Each interrupt source can assigned a specific priority by software
●Preemptive prioritized interrupt requests to processor
●ISR at a higher priority preempts executing ISRs or tasks at lower priorities
●Automatic pushing or popping of preempted priority to or from a LIFO
●Ability to modify the ISR or task priority to implement the priority ceiling protocol for
accessing shared resources
●Low latency—three clocks from receipt of interrupt request from peripheral to interrupt
request to processor
This device also includes a non-maskable interrupt (NMI) pin that bypasses the INTC and
multiplexing logic.
1.5.5 Memory protection unit (MPU)
The Memory Protection Unit (MPU) provides hardware access control for all memory
references generated in a device. Using preprogrammed region descriptors, which define
memory spaces and their associated access rights, the MPU concurrently monitors all
system bus transactions and evaluates the appropriateness of each transfer. Memory
references with sufficient access control rights are allowed to complete; references that are
not mapped to any region descriptor or have insufficient rights are terminated with a
protection error response.
The MPU has these major features:
●Support for 16 memory region descriptors, each 128 bits in size
–Specification of start and end addresses provide granularity for region sizes from
32 bytes to 4 GB
–MPU is invalid at reset, thus no access restrictions are enforced
–Two types of access control definitions: processor core bus master supports the
traditional {read, write, execute} permissions with independent definitions for
supervisor and user mode accesses; the remaining non-core bus masters (eDMA,
FlexRay, and EBI
1
) support {read, write} attributes
–Automatic hardware maintenance of the region descriptor valid bit removes issues
associated with maintaining a coherent image of the descriptor
–Alternate memory view of the access control word for each descriptor provides an
efficient mechanism to dynamically alter the access rights of a descriptor only
(a)
–For overlapping region descriptors, priority is given to permission granting over
access denying as this approach provides more flexibility to system software
●Support for two XBAR slave port connections (SRAM and PBRIDGE)
–For each connected XBAR slave port (SRAM and PBRIDGE), MPU hardware
monitors every port access using the pre-programmed memory region descriptors
–An access protection error is detected if a memory reference does not hit in any
memory region or the reference is flagged as illegal in all memory regions where it
does hit. In the event of an access error, the XBAR reference is terminated with an
error response and the MPU inhibits the bus cycle being sent to the targeted slave
device
–64-bit error registers, one for each XBAR slave port, capture the last faulting
address, attributes, and detail information
1.5.6 FMPLL
The FMPLL allows the user to generate high speed system clocks from a 4 MHz to 40 MHz
crystal oscillator or external clock generator. Further, the FMPLL supports programmable
frequency modulation of the system clock. The PLL multiplication factor, output clock divider
ratio are all software configurable. The PLL has the following major features:
●Input clock frequency from 4 MHz to 40 MHz
●Reduced frequency divider (RFD) for reduced frequency operation without forcing the
PLL to relock
●Three modes of operation
–Bypass mode with PLL off
–Bypass mode with PLL running (default mode out of reset)
–PLL normal mode
●Each of the three modes may be run with a crystal oscillator or an external clock
reference
●Programmable frequency modulation
–Modulation enabled/disabled through software
–Triangle wave modulation up to 100 kHz modulation frequency
–Programmable modulation depth (0% to 2% modulation depth)
–Programmable modulation frequency dependent on reference frequency
●Lock detect circuitry reports when the PLL has achieved frequency lock and
continuously monitors lock status to report loss of lock conditions
●Clock Quality Module
–Detects the quality of the crystal clock and causes interrupt request or system
reset if error is detected
–Detects the quality of the PLL output clock; if error detected, causes system reset
or switches system clock to crystal clock and causes interrupt request
●Programmable interrupt request or system reset on loss of lock
●Self-clocked mode (SCM) operation
1.5.7 SIU
The SPC564A80 SIU controls MCU reset configuration, pad configuration, external
interrupt, general purpose I/O (GPIO), internal peripheral multiplexing, and the system reset
operation. The reset configuration block contains the external pin boot configuration logic.
The pad configuration block controls the static electrical characteristics of I/O pins. The
a. EBI not available on all packages and is not available, as a master, for customer.
GPIO block provides uniform and discrete input/output control of the I/O pins of the MCU.
The reset controller performs reset monitoring of internal and external reset sources, and
drives the RSTOUT
pin. Communication between the SIU and the e200z4 CPU core is via
the crossbar switch. The SIU provides the following features:
●System configuration
–MCU reset configuration via external pins
–Pad configuration control for each pad
–Pad configuration control for virtual I/O via DSPI serialization
●System reset monitoring and generation
–Power-on reset support
–Reset status register provides last reset source to software
–Glitch detection on reset input
–Software controlled reset assertion
●External interrupt
–Rising or falling edge event detection
–Programmable digital filter for glitch rejection
–Critical Interrupt request
–Non-Maskable Interrupt request
●GPIO
–Centralized control of I/O and bus pins
–Virtual GPIO via DSPI serialization (requires external deserialization device)
–Dedicated input and output registers for setting each GPIO and Virtual GPIO pin
●Internal multiplexing
–Allows serial and parallel chaining of DSPIs
–Allows flexible selection of eQADC trigger inputs
–Allows selection of interrupt requests between external pins and DSPI
1.5.8 Flash memory
The SPC564A80 provides up to 4 MB of programmable, non-volatile, flash memory. The
non-volatile memory (NVM) can be used to store instructions or data, or both. The flash
module includes a Fetch Accelerator that optimizes the performance of the flash array to
match the CPU architecture. The flash module interfaces the system bus to a dedicated
flash memory array controller. For CPU ‘loads’, DMA transfers and CPU instruction fetch, it
supports a 64-bit data bus width at the system bus port, and 128- and 256-bit read data
interfaces to flash memory. The module contains a prefetch controller which prefetches
sequential lines of data from the flash array into the buffers. Prefetch buffer hits allow no-wait
responses.
The flash memory provides the following features:
●Supports a 64-bit data bus for instruction fetch, CPU loads and DMA access. Byte,
halfword, word and doubleword reads are supported. Only aligned word and
doubleword writes are supported.
●Fetch Accelerator
–Architected to optimize the performance of the flash
–Configurable read buffering and line prefetch support
●Hardware and software configurable read and write access protections on a per-master
basis
●Interface to the flash array controller pipelined with a depth of one, allowing overlapped
accesses to proceed in parallel for interleaved or pipelined flash array designs
●Configurable access timing usable in a wide range of system frequencies
●Multiple-mapping support and mapping-based block access timing (0-31 additional
cycles) usable for emulation of other memory types
●Software programmable block program/erase restriction control
●Erase of selected block(s)
●Read page size of 128 bits (four words)
●ECC with single-bit correction, double-bit detection
●Program page size of 128 bits (four words) to accelerate programming
●ECC single-bit error corrections are visible to software
●Minimum program size is two consecutive 32-bit words, aligned on a 0-modulo-8 byte
address, due to ECC
●Embedded hardware program and erase algorithm
●Erase suspend, program suspend and erase-suspended program
●Shadow information stored in non-volatile shadow block
●Independent program/erase of the shadow block
1.5.9 BAM
The BAM (Boot Assist Module) is a block of read-only memory that is programmed once by
ST and is identical for all SPC564A80 MCUs. The BAM program is executed every time the
MCU is powered-on or reset in normal mode. The BAM supports different modes of booting.
They are:
●Booting from internal flash memory
●Serial boot loading (A program is downloaded into RAM via eSCI or the FlexCAN and
●Booting from external memory on external bus
The BAM also reads the reset configuration half word (RCHW) from internal flash memory
and configures the SPC564A80 hardware accordingly. The BAM provides the following
features:
●Sets up MMU to cover all resources and mapping of all physical addresses to logical
●Sets up MMU to allow user boot code to execute as either Power Architecture
●Location and detection of user boot code
●Automatic switch to serial boot mode if internal flash is blank or invalid
●Supports user programmable 64-bit password protection for serial boot mode
●Supports serial bootloading via FlexCAN bus and eSCI using standard protocol
●Supports serial bootloading via FlexCAN bus and eSCI with auto baud rate sensing
●Supports serial bootloading of either Power Architecture code (default) or VLE code
●Supports censorship protection for internal flash memory
●Provides an option to enable the core watchdog timer
●Provides an option to disable the system watchdog timer
1.5.10 eMIOS
The eMIOS timer module provides the capability to generate or measure events in
hardware.
The eMIOS module features include:
●Twenty-four 24-bit wide channels
●3 channels’ internal timebases can be shared between channels
●1 Timebase from eTPU2 can be imported and used by the channels
●Global enable feature for all eMIOS and eTPU timebases
●Dedicated pin for each channel (not available on all package types)
Each channel (0–23) supports the following functions:
●General-purpose input/output (GPIO)
●Single-action input capture (SAIC)
●Single-action output compare (SAOC)
●Output pulse-width modulation buffered (OPWMB)
●Input period measurement (IPM)
●Input pulse-width measurement (IPWM)
●Double-action output compare (DAOC)
●Modulus counter buffered (MCB)
●Output pulse width and frequency modulation buffered (OPWFMB)
1.5.11 eTPU2
The eTPU2 is an enhanced co-processor designed for timing control. Operating in parallel
with the host CPU, the eTPU2 processes instructions and real-time input events, performs
output waveform generation, and accesses shared data without host intervention.
Consequently, for each timer event, the host CPU setup and service times are minimized or
eliminated. A powerful timer subsystem is formed by combining the eTPU2 with its own
instruction and data RAM. High-level assembler/compiler and documentation allows
customers to develop their own functions on the eTPU2.
SPC564A80 devices feature the second generation of the eTPU, called eTPU2.
Enhancements of the eTPU2 over the standard eTPU include:
●The Timer Counter (TCR1), channel logic and digital filters (both channel and the
external timer clock input [TCRCLK]) now have an option to run at full system clock
speed or system clock / 2.
●Channels support unordered transitions: transition 2 can now be detected before
transition 1. Related to this enhancement, the transition detection latches (TDL1 and
TDL2) can now be independently negated by microcode.
●A new User Programmable Channel Mode has been added: the blocking, enabling,
service request and capture characteristics of this channel mode can be programmed
via microcode.
●Microinstructions now provide an option to issue Interrupt and Data Transfer requests
selected by channel. They can also be requested simultaneously at the same
instruction.
●Channel Flags 0 and 1 can now be tested for branching, in addition to selecting the
entry point.
●Channel digital filters can be bypassed.
The eTPU2 includes these distinctive features:
●32 channels; each channel associated with one input and one output signal
–Enhanced input digital filters on the input pins for improved noise immunity
–Identical, orthogonal channels: each channel can perform any time function. Each
time function can be assigned to more than one channel at a given time, so each
signal can have any functionality.
–Each channel has an event mechanism which supports single and double action
functionality in various combinations. It includes two 24-bit capture registers, two
24-bit match registers, 24-bit greater-equal and equal-only comparators.
–Input and output signal states visible from the host
●2 independent 24-bit time bases for channel synchronization:
–First time base clocked by system clock with programmable prescale division from
2 to 512 (in steps of 2), or by output of second time base prescaler
–Second time base counter can work as a continuous angle counter, enabling
angle based applications to match angle instead of time
–Both time bases can be exported to the eMIOS timer module
–Both time bases visible from the host
●Event-triggered microengine:
–Fixed-length instruction execution in two-system-clock microcycle
–14 KB of code memory (SCM)
–3 KB of parameter (data) RAM (SPRAM)
–Parallel execution of data memory, ALU, channel control and flow control sub-
instructions in selected combinations
–32-bit microengine registers and 24-bit wide ALU, with 1 microcycle addition and
subtraction, absolute value, bitwise logical operations on 24-bit, 16-bit, or byte
operands, single-bit manipulation, shift operations, sign extension and conditional
execution
–Additional 24-bit Multiply/MAC/Divide unit which supports all signed/unsigned
Multiply/MAC combinations, and unsigned 24-bit divide. The MAC/Divide unit
works in parallel with the regular microcode commands.
●Resource sharing features support channel use of common channel registers, memory
and microengine time:
–Hardware scheduler works as a “task management” unit, dispatching event
service routines by predefined, host-configured priority
–Automatic channel context switch when a “task switch” occurs, that is, one function
thread ends and another begins to service a request from other channel: channelspecific registers, flags and parameter base address are automatically loaded for
the next serviced channel
calculator), runs concurrently with eTPU2 normal operation
1.5.12 Reaction module
The reaction module provides the ability to modulate output signals to manage closed loop
control without CPU assistance. It works in conjunction with the eQADC and eTPU2 to
increase system performance by removing the CPU from the current control loop.
The reaction module has the following features:
●Six reaction channels
●Each channel output is a bus of three signals, providing ability to control 3 inputs.
●Each channel can implement a peak and hold waveform, making it possible to
implement up to six independent peak and hold control channels
Target applications include solenoid control for direct injection systems and valve control in
automatic transmissions
1.5.13 eQADC
The enhanced queued analog to digital converter (eQADC) block provides accurate and fast
conversions for a wide range of applications. The eQADC provides a parallel interface to two
on-chip analog to digital converters (ADC), and a single master to single slave serial
interface to an off-chip external device. Both on-chip ADCs have access to all the analog
channels.
The eQADC prioritizes and transfers commands from six command conversion command
‘queues’ to the on-chip ADCs or to the external device. The block can also receive data from
the on-chip ADCs or from an off-chip external device into the six result queues, in parallel,
independently of the command queues. The six command queues are prioritized with
Queue_0 having the highest priority and Queue_5 the lowest. Queue_0 also has the added
ability to bypass all buffering and queuing and abort a currently running conversion on either
ADC and start a Queue_0 conversion. This means that Queue_0 will always have a
deterministic time from trigger to start of conversion, irrespective of what tasks the ADCs
were performing when the trigger occurred. The eQADC supports software and external
hardware triggers from other blocks to initiate transfers of commands from the queues to the
on-chip ADCs or to the external device. It also monitors the fullness of command queues
and result queues, and accordingly generates DMA or interrupt requests to control data
movement between the queues and the system memory, which is external to the eQADC.
The ADCs also support features designed to allow the direct connection of high impedance
acoustic sensors that might be used in a system for detecting engine knock. These features
include differential inputs; integrated variable gain amplifiers for increasing the dynamic
range; programmable pull-up and pull-down resistors for biasing and sensor diagnostics.
The eQADC also integrates a programmable decimation filter capable of taking in ADC
conversion results at a high rate, passing them through a hardware low pass filter, then
down-sampling the output of the filter and feeding the lower sample rate results to the result
FIFOs. This allows the ADCs to sample the sensor at a rate high enough to avoid aliasing of
out-of-band noise; while providing a reduced sample rate output to minimize the amount
DSP processing bandwidth required to fully process the digitized waveform.
The eQADC provides the following features:
●Dual on-chip ADCs
–2 × 12-bit ADC resolution
–Programmable resolution for increased conversion speed (12-bit, 10-bit, 8-bit)
12-bit conversion time: 938 ns (1 M sample/sec)
10-bit conversion time: 813 ns (1.2 M sample/second)
8-bit conversion time: 688 ns (1.4 M sample/second)
–Up to 10-bit accuracy at 500 KSample/s and 8-bit accuracy at 1 MSample/s
–Differential conversions
–Single-ended signal range from 0 to 5 V
–Variable gain amplifiers on differential inputs (×1, ×2, ×4)
–Sample times of 2 (default), 8, 64 or 128 ADC clock cycles
–Provides time stamp information when requested
–Allows time stamp information relative to eTPU clock sources, such as an angle
clock
–Parallel interface to eQADC CFIFOs and RFIFOs
–Supports both right-justified unsigned and signed formats for conversion results
●40 single-ended input channels, expandable to 56 channels with external multiplexers
(supports four external 8-to-1 muxes)
●8 channels can be used as 4 pairs of differential analog input channels
●Differential channels include variable gain amplifier for improved dynamic range
●Differential channels include programmable pull-up and pull-down resistors for biasing
and sensor diagnostics (200 kΩ, 100 kΩ, 5kΩ)
●Additional internal channels for monitoring voltages (such as core voltage, I/O voltage,
LVI voltages, etc.) inside the device
●An internal bandgap reference to allow absolute voltage measurements
●Silicon die temperature sensor
–Provides temperature of silicon as an analog value
–Prefill mode to precondition the filter before the sample window opens
–Supports Multiple Cascading Decimation Filters to implement more complex filter
designs
–Optional Absolute Integrators on the output of Decimation Filters
●Full duplex synchronous serial interface to an external device
–Free-running clock for use by an external device
–Supports a 26-bit message length
●Priority based queues
–Supports six queues with fixed priority. When commands of distinct queues are
bound for the same ADC, the higher priority queue is always served first
–Queue_0 can bypass all prioritization, buffering and abort current conversions to
start a Queue_0 conversion a deterministic time after the queue trigger
–Supports software and hardware trigger modes to arm a particular queue
–Generates interrupt when command coherency is not achieved
●External hardware triggers
–Supports rising edge, falling edge, high level and low level triggers
–Supports configurable digital filter
1.5.14 DSPI
The deserial serial peripheral interface (DSPI) block provides a synchronous serial interface
for communication between the SPC564A80 MCU and external devices. The DSPI supports
pin count reduction through serialization and deserialization of eTPU and eMIOS channels
and memory-mapped registers. The channels and register content are transmitted using a
SPI-like protocol. This SPI-like protocol is completely configurable for baud rate, polarity and
phase, frame length, chip select assertion, etc. Each bit in the frame may be configured to
serialize either eTPU channels, eMIOS channels or GPIO signals. The DSPI can be
configured to serialize data to an external device that implements the Microsecond Bus
protocol. There are three identical DSPI blocks on the SPC564A80 MCU. The DSPI pins
support 5 V logic levels or Low Voltage Differential Signalling (LVDS) to improve high speed
operation.
DSPI module features include:
●Selectable LVDS pads working at 40 MHZ for SOUT and SCK pins for DSPI_B and
●3 sources of serialized data: eTPU_A, eMIOS output channels and memory-mapped
●4 destinations for deserialized data: eTPU_A and eMIOS input channels, SIU external
●32-bit DSI and TSB modes require 32 PCR registers, 32 GPO and GPI registers in the
●The DSPI Module can generate and check parity in a serial frame
DSPI_C
register in the DSPI
Interrupt input request, memory-mapped register in the DSPI
SIU to select either GPIO, eTPU or eMIOS bits for serialization
Three enhanced serial communications interface (eSCI) modules provide asynchronous
serial communications with peripheral devices and other MCUs, and include support to
interface to Local Interconnect Network (LIN) slave devices. Each eSCI block provides the
following features:
●Full-duplex operation
●Standard mark/space non-return-to-zero (NRZ) format
●13-bit baud rate selection
●Programmable 8-bit or 9-bit, data format
●Programmable 12-bit or 13-bit data format for Timed Serial Bus (TSB) configuration to
support the Microsecond bus standard
●Automatic parity generation
●LIN support
–Autonomous transmission of entire frames
–Configurable to support all revisions of the LIN standard
–Automatic parity bit generation
–Double stop bit after bit error
–10- or 13-bit break support
●Separately enabled transmitter and receiver
●Programmable transmitter output parity
●2 receiver wake-up methods:
–Idle line wake-up
–Address mark wake-up
●Interrupt-driven operation with flags
●Receiver framing error detection
●Hardware parity checking
●1/16 bit-time noise detection
●DMA support for both transmit and receive data
–Global error bit stored with receive data in system RAM to allow post processing of
errors
1.5.16 FlexCAN
The SPC564A80 MCU includes three controller area network (FlexCAN) blocks. The
FlexCAN module is a communication controller implementing the CAN protocol according to
Bosch Specification version 2.0B. The CAN protocol was designed to be used primarily as a
vehicle serial data bus, meeting the specific requirements of this field: real-time processing,
reliable operation in the EMI environment of a vehicle, cost-effectiveness and required
bandwidth. Each FlexCAN module contains 64 message buffers.
The SPC564A80 includes one dual-channel FlexRay module that implements the FlexRay
Communications System Protocol Specification, Version 2.1 Rev A. Features include:
●Single channel support
●FlexRay bus data rates of 10 Mbit/s, 8 Mbit/s, 5 Mbit/s, and 2.5 Mbit/s supported
●128 message buffers, each configurable as:
–Receive message buffer
–Single buffered transmit message buffer
–Double buffered transmit message buffer (combines two single buffered message
buffer)
●2 independent receive FIFOs
–1 receive FIFO per channel
–Up to 255 entries for each FIFO
●ECC support
1.5.18 System timers
The system timers include two distinct types of system timer:
●Periodic interrupts/triggers using the Periodic Interrupt Timer (PIT)
●Operating system task monitors using the System Timer Module (STM)
Periodic interrupt timer (PIT)
The PIT provides five independent timer channels, capable of producing periodic interrupts
and periodic triggers. The PIT has no external input or output pins and is intended to provide
system ‘tick’ signals to the operating system, as well as periodic triggers for eQADC queues.
Of the five channels in the PIT, four are clocked by the system clock and one is clocked by
the crystal clock. This one channel is also referred to as Real-Time Interrupt (RTI) and is
used to wake up the device from low power stop mode.
The following features are implemented in the PIT:
●5 independent timer channels
●Each channel includes 32-bit wide down counter with automatic reload
●4 channels clocked from system clock
●1 channel clocked from crystal clock (wake-up timer)
●Wake-up timer remains active when System STOP mode is entered; used to restart
system clock after predefined time-out period
●Each channel optionally able to generate an interrupt request or a trigger event (to
trigger eQADC queues) when timer reaches zero
System timer module (STM)
The System Timer Module (STM) is designed to implement the software task monitor as
defined by AUTOSAR
(b)
. It consists of a single 32-bit counter, clocked by the system clock,
b. AUTOSAR: AUTomotive Open System ARchitecture (see www.autosar.org)
and four independent timer comparators. These comparators produce a CPU interrupt when
the timer exceeds the programmed value.
The following features are implemented in the STM:
●One 32-bit up counter with 8-bit prescaler
●Four 32-bit compare channels
●Independent interrupt source for each channel
●Counter can be stopped in debug mode
1.5.19 Software watchdog timer (SWT)
The Software Watchdog Timer (SWT) is a second watchdog module to complement the
standard Power Architecture watchdog integrated in the CPU core. The SWT is a 32-bit
modulus counter, clocked by the system clock or the crystal clock, that can provide a system
reset or interrupt request when the correct software key is not written within the required
time window.
The following features are implemented:
●32-bit modulus counter
●Clocked by system clock or crystal clock
●Optional programmable watchdog window mode
●Can optionally cause system reset or interrupt request on timeout
●Reset by writing a software key to memory mapped register
●Enabled out of reset
●Configuration is protected by a software key or a write-once register
1.5.20 Cyclic redundancy check (CRC) module
The CRC computing unit is dedicated to the computation of CRC off-loading the CPU. The
CRC features:
●Support for CRC-16-CCITT (x25 protocol):
16
–X
●Support for CRC-32 (Ethernet protocol):
–X
●Zero wait states for each write/read operations to the CRC_CFG and CRC_INP
The ECSM provides a myriad of miscellaneous control functions regarding program-visible
information about the platform configuration and revision levels, a reset status register, a
software watchdog timer, wakeup control for exiting sleep modes, and information on
platform memory errors reported by error-correcting codes and/or generic access error
information for certain processor cores.
The SPC564A80 device features an external bus interface that is available in PBGA324 and
calibration packages.
The EBI supports operation at frequencies of system clock /1, /2 and /4, with a maximum
frequency support of 80 MHz. Customers running the device at 120 MHz or 132 MHz will
use the /2 divider, giving an EBI frequency of 60 MHz or 66 MHz. Customers running the
device at 80 MHz will be able to use the /1 divider to have the EBI run at the full 80 MHz
frequency.
Features include:
●1.8 V to 3.3 V ± 10% I/O (1.6 V to 3.6 V)
●Memory controller with support for various memory types
●16-bit data bus, up to 22-bit address bus
●Pin muxing included to support 32-bit muxed bus
●Selectable drive strength
●Configurable bus speed modes
●Bus monitor
●Configurable wait states
1.5.23 Calibration EBI
The Calibration EBI controls data transfer across the crossbar switch to/from memories or
peripherals attached to the calibration tool connector in the calibration address space. The
Calibration EBI is only available in the calibration tool.
The power management controller contains circuitry to generate the internal 3.3 V supply
and to control the regulation of 1.2 V supply with an external NPN ballast transistor. It also
contains low voltage inhibit (LVI) and power-on reset (POR) circuits for the 1.2 V supply, the
3.3 V supply, the 3.3 V/5 V supply of the closest I/O segment (VDDEH1) and the 5 V supply
of the regulators (VDDREG).
1.5.25 Nexus port controller
The NPC (Nexus Port Controller) block provides real-time Nexus Class3+ development
support capabilities for the SPC564A80 Power Architecture-based MCU in compliance with
the IEEE-ISTO 5001-2003 and 2010 standards. MDO port widths of 4 pins and 12 pins are
available in all packages.
1.5.26 JTAG
The JTAGC (JTAG Controller) block provides the means to test chip functionality and
connectivity while remaining transparent to system logic when not in test mode. Testing is
performed via a boundary scan technique, as defined in the IEEE 1149.1-2001 standard. All
data input to and output from the JTAGC block is communicated in serial format. The JTAGC
block is compliant with the IEEE 1149.1-2001 standard and supports the following features:
●IEEE 1149.1-2001 Test Access Port (TAP) interface 4 pins (TDI, TMS, TCK, and TDO)
●A 5-bit instruction register that supports the following IEEE 1149.1-2001 defined
●A 5-bit instruction register that supports the additional following public instructions:
–ACCESS_AUX_TAP_NPC
–ACCESS_AUX_TAP_ONCE
–ACCESS_AUX_TAP_eTPU
–ACCESS_CENSOR
●3 test data registers to support JTAG Boundary Scan mode
–Bypass register
–Boundary scan register
–Device identification register
●A TAP controller state machine that controls the operation of the data registers,
instruction register and associated circuitry
●Censorship Inhibit Register
–64-bit Censorship password register
–If the external tool writes a 64-bit password that matches the Serial Boot password
stored in the internal flash shadow row, Censorship is disabled until the next
system reset.
1.5.27 Development Trigger Semaphore (DTS)
SPC564A80 devices include a system development feature, the Development Trigger
Semaphore (DTS) module, that enables software to signal an external tool by driving a
persistent (affected only by reset or an external tool) signal on an external device pin. There
ADC– Analog to Digital Converter
ADCi– ADC interface
AMux– Analog Multiplexer
BAM– Boot Assist Module
CRC– Cyclic Redundancy Check unit
DEC– Decimation Filter
DTS– Development Trigger Semaphore
DSPI– Deserial/Serial Peripheral Interface
EBI – External Bus Interface
ECSM – Error Correction Status Module
eDMA – Enhanced Direct Memory Access
eMIOS – Enhanced Modular Input Output System
eSCI– Enhanced Serial Communications Interface
eTPU2 – Second gen. Enhanced Time Processing Unit
FlexCAN– Controller Area Network (FlexCAN)
FMPLL – Frequency-Modulated Phase Locked Loop
RAM
14 KB Code
RAM
3 KB Data
eTPU2
32
Channel
Nexus
Class 1
REACM
Figure 1.SPC564A80 series block diagram
I/O Bridge
STM
PIT
BAM
PMC
DTS
CRC
FMPLL
LEGEND
JTAG– IEEE 1149.1 test controller
MMU– Memory Management Unit
MPU– Memory Protection Unit
PMC– Power Management Controller
PIT– Periodic Interrupt Timer
RCOSC – low-speed RC oscillator
REACM – Reaction module
SIU– System Integration Unit
SPE– Signal Processing Extension
SRAM – Static RAM
STM– System Timer Module
SWT– Software Watchdog Timer
VGA– Variable Gain Amplifier
VLE– Variable Length (instruction) Encoding
XOSC – XTAL Oscillator
e200z4 coreExecutes programs and interrupt handlers.
Enhanced direct memory access (eDMA)
Enhanced modular input-output system
(eMIOS)
BlockFunction
Block of read-only memory containing executable code that searches
for user-supplied boot code and, if none is found, executes the BAM
boot code resident in device ROM.
Transfers data across the crossbar switch to/from peripherals
attached to the calibration tool connector.
Provides a synchronous serial interface for communication with
external devices.
Performs complex data movements with minimal intervention from
the core.
Provides the functionality to generate or measure events.
performs output waveform generation, and accesses shared data
without host intervention.
The Error Correction Status Module supports a number of
Error Correction Status Module (ECSM)
miscellaneous control functions for the platform, and includes
registers for capturing information on platform memory errors if errorcorrecting codes (ECC) are implemented
External bus interface (EBI)
Enables expansion of internal bus to enable connection of external
memory or peripherals.
Flash memoryProvides storage for program code, constants, and variables.
FlexRay
Provides high-speed distributed control for advanced automotive
applications.
Interrupt controller (INTC)Provides priority-based preemptive scheduling of interrupt requests.
JTAG controller
Memory protection unit (MPU)
Provides the means to test chip functionality and connectivity while
remaining transparent to system logic when not in test mode.
Provides hardware access control for all memory references
generated.
Nexus port controller (NPC)
Provides real-time development support capabilities in compliance
with the IEEE-ISTO 5001-2003 standard.
Table 3.SPC564A80 series block summary (continued)
BlockFunction
Reaction Module (REACM)
System Integration Unit (SIU)
Static random-access memory (SRAM)Provides storage for program code, constants, and variables.
System timers
Temperature sensorProvides the temperature of the device as an analog value.
Works in conjunction with the eQADC and eTPU2 to increase system
performance by removing the CPU from the current control loop.
Controls MCU reset configuration, pad configuration, external
interrupt, general purpose I/O (GPIO), internal peripheral
multiplexing, and the system reset operation.
Includes periodic interrupt timer with real-time interrupt; output
compare timer and system watchdog timer.
Doc ID 15399 Rev 833/157
Pinout and signal descriptionSPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7
2 Pinout and signal description
This section contains the pinouts for all production packages for the SPC564A80 family of
devices.
Caution:Any pins labeled “NC” are to be left unconnected. Any connection to an external circuit or
voltage may cause unpredictable device behavior or damage.
34/157Doc ID 15399 Rev 8
SPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7Pinout and signal description
(see signal details, pin 21)
(see signal details, pin 22)
(see signal details, pin 23)
(see signal details, pin 24)
(see signal details, pin 25)
(see signal details, pin 26)
(see signal details, pin 27)
(see signal details, pin 28)
(see signal details, pin 30)
(see signal details, pin 32)
(see signal details, pin 34)
(see signal details, pin 35)
(see signal details, pin 36)
(see signal details, pin 37)
(see signal details, pin 38)
(see signal details, pin 39)
(see signal details, pin 40)
1. For each pin in the table, each line in the Function column is a separate function of the pin. For all I/O pins the selection of primary pin function or secondary function or
GPIO is done in the SIU except where explicitly noted. See the Signal details table for a description of each signal.
2. The P/A/G column indicates the position a signal occupies in the muxing order for a pin—Primary, Alternate 1, Alternate 2, Alternate 3, or GPIO. Signals are selected by
setting the PA field value in the appropriate PCR register in the SIU module. The PA field values are as follows: P - 0b0001, A1 - 0b0010, A2 - 0b0100, A3 - 0b1000, or G 0b0000. Depending on the register, the PA field size can vary in length. For PA fields having fewer than four bits, remove the appropriate number of leading zeroes from
these values.
3. The Pad Configuration Register (PCR) PA field is used by software to select pin function.
4. Values in the PCR No. column refer to registers in the System Integration Unit (SIU). The actual register name is “SIU_PCR” suffixed by the PCR number. For example,
PCR[190] refers to the SIU register named SIU_PCR190.
5. The VDDE and VDDEH supply inputs are broken into segments. Each segment of slow I/O pins (VDDEH) may have a separate supply in the 3.3 V to 5.0 V range (10%/+5%). Each segment of fast I/O (VDDE) may have a separate supply in the 1.8 V to 3.3 V range (+/- 10%).
6. See Table 5 for details on pad types.
7. The Status During Reset pin is sampled after the internal POR is negated. Prior to exiting POR, the signal has a high impedance. Terminology is O - output, I - input, Up weak pull up enabled, Down - weak pull down enabled, Low - output driven low, High - output driven high. A dash for the function in this column denotes that both the input
and output buffer are turned off. The signal name to the left or right of the slash indicates the pin is enabled.
8. Output only.
9. When used as ETRIG, this pin must be configured as an input. For GPIO it can be configured either as an input or output.
10. Maximum frequency is 50 kHz.
11. The SIU_PCR219 register is unusual in that it controls pads for two separate device pins: GPIO[219] and MCKO. See the SPC564A80 Microcontroller Reference Manual
(SIU chapter) for details.
12. Multivoltage pads are automatically configured in low swing mode when a JTAG or Nexus function is selected, otherwise they are high swing.
13. On LQFP176 and LBGA208 packages, this pin is tied low internally.
14. Nexus multivoltage pads default to 5 V operation until the Nexus module is enabled.
15. EVTO
16. Do not connect pin directly to a power supply or ground.
17. This signal name is used to support legacy naming.
18. During and just after POR negates, internal pull resistors can be enabled, resulting in as much as 4 mA of current draw. The pull resistors are disabled when the system
Doc ID 15399 Rev 872/157
19. For pins AN12-AN15, if the analog features are used the VDDEH7 input pins should be tied to VDDA because that segment must meet the VDDA specification to support
20. Do not use VRC33 to drive external circuits.
21. VDDA0 and VDDA1 are shorted together internally in BGA packages. In the QFP package the two pads are double bonded on one pin called VDDA.
22. VSSA0 and VSSA1 are shorted together internally in BGA packages. In the QFP package the two pads are double bonded on one pin called VSSA.
23. VDDE2 and VDDE3 are shorted together in all production packages.
24. VDDE2 and VDDE3 are shorted together in all production packages.
25. VDDEH1A, VDDEH1B, and VDDEH1AB are shorted together in all production packages. The separation of the signal names is present to support legacy naming, however
26. VDDEH4, VDDEH4A, VDDEH4B, and VDDEH4AB are shorted together in all production packages. The separation of the signal names is present to support legacy
27. VDDEH6, VDDEH6A, VDDEH6B, and VDDEH6AB are shorted together in all production packages. The separation of the signal names is present to support legacy
should be clamped to 3.3 V to prevent possible damage to external tools that only support 3.3 V.
clock propagates through the device.
analog input function.
they should be considered as the same signal in this document.
naming, however they should be considered as the same signal in this document.
naming, however they should be considered as the same signal in this document.
SPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7Pinout and signal description
SPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7Pinout and signal description
Table 5.Pad types
Pad TypeNameI/O Voltage Range
Slowpad_ssr_hv3.0V - 5.5 V
Mediumpad_msr_hv3.0 V- 5.5 V
Fastpad_fc3.0 V - 3.6 V
(1),(2)
MultiV
Analogpad_ae_hv0.0 - 5.5 V
LVDSpad_lo_lv—
1. Multivoltage pads are automatically configured in low swing mode when a JTAG or Nexus function is
selected, otherwise they are high swing.
2. VDDEH7 supply cannot be below 4.5 V when in low-swing mode.
pad_multv_hv
3.0 V - 5.5 V (high swing mode)
3.0 V - 3.6 V (low swing mode)
2.5 Signal details
Table 6.Signal details
SignalModule or FunctionDescription
CLKOUTClock Generation
SPC564A80 clock output for the external/calibration bus
interface
ENGCLKClock GenerationClock for external ASIC devices
EXTALClock Generation
Input pin for an external crystal oscillator or an external clock
source based on the value driven on the PLLREF pin at reset.
PLLREF is used to select whether the oscillator operates in xtal
mode or external reference mode from reset. PLLREF=0
selects external reference mode. On the 324BGA package,
PLLREF is bonded to the ball used for PLLCFG[0] for
compatibility with previous devices .
For the 176-pin QFP and 208-ball BGA packages:
0: External reference clock is selected.
1: XTAL oscillator mode is selected
PLLREF
Clock Generation
Reset/Configuration
For the 324 ball BGA package:
If RSTCFG is 0:
0: External reference clock is selected.
1: XTAL oscillator mode is selected.
If RSTCFG is 1, XTAL oscillator mode is selected.
XTALClock GenerationCrystal oscillator input
DSPI_B_SCK_LVDSDSPI_B_SCK_LVDS+
DSPI_B_SOUT_LVDSDSPI_B_SOUT_LVDS+
DSPILVDS pair used for DSPI_B TSB mode transmission
DSPILVDS pair used for DSPI_B TSB mode transmission
Doc ID 15399 Rev 873/157
Pinout and signal descriptionSPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7
Table 6.Signal details (continued)
SignalModule or FunctionDescription
DSPI_C_SCK_LVDSDSPI_C_SCK_LVDS+
DSPI_C_SOUT_LVDSDSPI_C_SOUT_LVDS+
PCS_B[0]
PCS_C[0]
PCS_D[0]
PCS_B[1:5]
PCS_C[1:5]
PCS_D[1:5]
SCK_B
SCK_C
SCK_D
SIN_B
SIN_C
SIN_D
SOUT_B
SOUT_C
SOUT_D
DSPILVDS pair used for DSPI_C TSB mode transmission
DSPI LVDS pair used for DSPI_C TSB mode transmission
DSPI_B - DSPI_D
DSPI_B - DSPI_D
DSPI_B - DSPI_D
DSPI_B - DSPI_DDSPI data in
DSPI_B - DSPI_DDSPI data out
Peripheral chip select when device is in master mode—slave
select when used in slave mode
Peripheral chip select when device is in master mode—not
used in slave mode
DSPI clock—output when device is in master mode; input when
in slave mode
The ADDR[10:31] signals specify the physical address of the
bus transaction.
ADDR[10:31]EBI
ALEEBI
BDIP
[0:3]EBI
CS
DATA[0:31]EBI
OE
EBI
EBI
The 26 address lines correspond to bits 3-31 of the EBI’s 32-bit
internal address bus.
ADDR[15:31] can be used as Address and Data signals when
configured appropriately for a multiplexed external bus. This
allows 32-bit data operations, or 16-bit data operations without
using DATA[0:15] signals.
The Address Latch Enable (ALE) signal is used to demultiplex
the address from the data bus. It is asserted while the least
significant 16 bits of the address are present in the multiplexed
address/data bus.
is asserted to indicate that the master is requesting
BDIP
another data beat following the current one.
CSx is asserted by the master to indicate that this transaction is
targeted for a particular memory bank on the Primary external
bus.
The DATA[0:31] signals contain the data to be transferred for
the current transaction.
is used to indicate when an external memory is permitted to
OE
drive back read data. External memories must have their data
output buffers off when OE is negated. OE is only asserted for
chip-select accesses.
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SPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7Pinout and signal description
Table 6.Signal details (continued)
SignalModule or FunctionDescription
RD_WR
TA
TS
WE
[2:3]EBI
[0:3]/BE[0:3]EBI
WE
eMIOS[0:23]eMIOSeMIOS I/O channels
AN[0:39]eQADCSingle-ended analog inputs for analog-to-digital converter
FCKeQADCeQADC free running clock for eQADC SSI.
MA[0:2]eQADC
EBI
EBI
EBI
RD_WR
access or a write access.
TA
(and completed the access) for a write cycle, or returned data
for a read cycle. If the transaction is a burst read, TA
for each one of the transaction beats. For write transactions, TA
is only asserted once at access completion, even if more than
one write data beat is transferred.
The Transfer Start signal (TS
indicate the start of a transfer.
Write enables are used to enable program operations to a
particular memory. WE[2:3] are only asserted for write
accesses
Write enables are used to enable program operations to a
particular memory. These signals can also be used as byte
enables for read and write operation by setting the WEBS bit in
the appropriate EBI Base Register (EBI_BRn). WE
only asserted for write accesses. BE[0:3] are asserted for both
read and write accesses
These three control bits are output to enable the selection for
an external Analog Mux for expansion channels.
indicates whether the current transaction is a read
is asserted to indicate that the slave has received the data
is asserted
) is asserted by the SPC564A80 to
[0:3] are
REFBYPCeQADCBypass capacitor input
SDIeQADCSerial data in
SDOeQADCSerial data out
SDSeQADCSerial data select
VRHeQADCVoltage reference high input
VRLeQADCVoltage reference low input
SCI_A_RX
SCI_B_RX
SCI_C_RX
SCI_A_TX
SCI_B_TX
SCI_C_TX
ETPU_A[0:31]eTPUeTPU I/O channel
eSCI_A - eSCI_CeSCI receive
eSCI_A - eSCI_CeSCI transmit
Doc ID 15399 Rev 875/157
Pinout and signal descriptionSPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7
Table 6.Signal details (continued)
SignalModule or FunctionDescription
RCH0_[A:C]
RCH1_[A:C]
RCH2_[A:C]
RCH3_[A:C]
eTPU2
Reaction Module
RCH4_[A:C]
RCH5_[A:C]
TCRCLKAeTPU2Input clock for TCR time base
CAN_A_TX
CAN_B_TX
CAN_C_TX
CAN_A_RX
CAN_B_RX
CAN_C_RX
FlexCan_A -
FlexCAN_C
FlexCAN_A -
FlexCAN_C
eTPU2 reaction channels. Used to control external actuators,
e.g., solenoid control for direct injection systems and valve
control in automatic transmissions
FlexCAN transmit
FlexCAN receive
FR_A_RX
FR_B_RX
FR_A_TX_EN
FR_B_TX_EN
FR_A_TX
FR_B_TX
FlexRayFlexRay receive (Channels A, B)
FlexRayFlexRay transmit enable (Channels A, B)
FlexRayFlexray transmit (Channels A, B)
JCOMPJTAGEnables the JTAG TAP controller.
TCKJTAGClock input for the on-chip test logic.
TDIJTAGSerial test instruction and data input for the on-chip test logic.
TDOJTAGSerial test data output for the on-chip test logic.
TMSJTAGControls test mode operations for the on-chip test logic.
is an input that is read on the negation of RESET to
EVTI
enable or disable the Nexus Debug port. After reset, the EVTI
EVTI
Nexus
pin is used to initiate program synchronization messages or
generate a breakpoint.
EVTO
Nexus
MCKONexus
Output that provides timing to a development tool for a single
watchpoint or breakpoint occurrence.
MCKO is a free running clock output to the development tools
which is used for timing of the MDO and MSEO
signals.
Trace message output to development tools. This pin also
MDO[0:11]
(1)
Nexus
indicates the status of the crystal oscillator clock following a
power-on reset, when MDO[0] is driven high until the crystal
oscillator clock achieves stability and is then negated.
MSEO
[0:1]
(1)
Nexus
Output pin—Indicates the start or end of the variable length
message on the MDO pins
Nexus Ready Output (RDY) is an output that indicates to the
RDY
Nexus
development tools the data is ready to be read from or written
to the Nexus read/write access registers.
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SPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7Pinout and signal description
Table 6.Signal details (continued)
SignalModule or FunctionDescription
Two BOOTCFG signals are implemented in SPC564A80
MCUs.
The BAM program uses the BOOTCFG0 bit to determine
where to read the reset configuration word, and whether to
initiate a FlexCAN or eSCI boot.
The BOOTCFG1 pin is sampled during the assertion of the
RSTOUT signal, and the value is used to update the RSR and
the BAM boot mode
BOOTCFG[0:1]SIU - Configuration
WKPCFGSIU - Configuration
ETRIG[2:3]SIU - eQADC TriggersExternal signal eTRIGx triggers eQADC CFIFOx
GPIO[206] ETRIG0
(Input)
GPIO[207] ETRIG1
(Input)
SIU - eQADC TriggersExternal signal eTRIGx triggers eQADC CFIFOx
SIU - eQADC TriggersExternal signal eTRIGx triggers eQADC CFIFOx
See the SPC564A80 Microcontroller Reference Manual for
more information.
The following values are for BOOTCFG[0:1}:
00:Boot from internal flash memory
01:FlexCAN/eSCI boot
10:Boot from external memory using EBI
11:Reserved
Note: For the 176-pin QFP and 208-ball BGA packages
BOOTCFG[0] is always 0 since the EBI interface is not
available.
The WKPCFG pin is applied at the assertion of the internal
reset signal (assertion of RSTOUT
cycles before the negation of the RSTOUT
The value is used to configure whether the eTPU and eMIOS
pins are connected to internal weak pull up or weak pull down
devices after reset. The value latched on the WKPCFG pin at
reset is stored in the Reset Status Register (RSR), and is
updated for all reset sources except the Debug Port Reset and
Software External Reset.
0:Weak pulldown applied to eTPU and eMIOS pins at reset
1:Weak pullup applied to eTPU and eMIOS pins at reset.
), and is sampled 4 clock
pin.
Doc ID 15399 Rev 877/157
Pinout and signal descriptionSPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7
[0:15] pins connect to the SIU IRQ inputs. IMUX Select
[0:15] pins as inputs to the
IRQs.
See the SPC564A80 Microcontroller Reference Manual for
more information.
Non-Maskable Interrupt
Configurable general purpose I/O pins. Each GPIO input and
output is separately controlled by an 8-bit input (GPDI) or
output (GPDO) register. Additionally, each GPIO pins is
configured using a dedicated SIU_PCR register.
The GPIO pins are generally multiplexed with other I/O pin
functions.
See The SPC564A80 Microcontroller Reference Manual for
more information.
–
The RESET
pin is an active low input. The RESET pin is
asserted by an external device during a power-on or external
reset. The internal reset signal asserts only if the RESET
pin
asserts for 10 clock cycles. Assertion of the RESET pin while
the device is in reset causes the reset cycle to start over.
The RESET
pin has a glitch detector which detects spikes
greater than two clock cycles in duration that fall below the
switch point of the input buffer logic of the VDDEH input pins.
The switch point lies between the maximum VIL and minimum
VIH specifications for the VDDEH input pins.
Used to enable or disable the PLLREF and the BOOTCFG[0:1]
configuration signals.
0:Get configuration information from BOOTCFG[0:1] and
RSTCFGSIU - Reset
PLLREF
1:Use default configuration of booting from internal flash with
crystal clock source
For the 176-pin QFP and 208-ball BGA packages RSTCFG is
always 0, so PLLREF and BOOTCFG signals are used.
The RSTOUT pin is an active low output that uses a push/pull
configuration. The RSTOUT pin is driven to the low state by the
RSTOUTSIU - Reset
MCU for all internal and external reset sources. There is a
delay between initiation of the reset and the assertion of the
RSTOUT pin.
1. Do not connect pin directly to a power supply or ground.
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SPC564A74B4, SPC564A74L7, SPC564A80B4, SPC564A80L7Pinout and signal description
Table 7.Power/ground segmentation
Power SegmentVoltageI/O Pins Powered by Segment
VDDE2 1.8 V - 3.3 VCS0, CS1, CS2, CS3,RD_WR, BDIP, WE0, WE1, OE, TS, TA
This section contains detailed information on power considerations, DC/AC electrical
characteristics, and AC timing specifications for the SPC564A80 series of MCUs.
The electrical specifications are preliminary and are from previous designs, design
simulations, or initial evaluation. These specifications may not be fully tested or guaranteed
at this early stage of the product life cycle, however for production silicon these
specifications will be met. Finalized specifications will be published after complete
characterization and device qualifications have been completed.
In the tables where the device logic provides signals with their respective timing
characteristics, the symbol “CC” for Controller Characteristics is included in the Symbol
column.
In the tables where the external system must provide signals with their respective timing
characteristics to the device, the symbol “SR” for System Requirement is included in the
Symbol column.
3.1 Parameter classification
The electrical parameters shown in this supplement are guaranteed by various methods. To
give the customer a better understanding, the classifications listed in Ta bl e 8 are used and
the parameters are tagged accordingly in the tables where appropriate.
Table 8.Parameter classifications
Classification tagTag description
PThose parameters are guaranteed during production testing on each individual device.
C
T
DThose parameters are derived mainly from simulations.
Those parameters are achieved by the design characterization by measuring a statistically
relevant sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical
devices under typical conditions unless otherwise noted. All values shown in the typical
column are within this category.
Note:The classification is shown in the column labeled “C” in the parameter tables where
1. Functional operating conditions are given in the DC electrical specifications. Absolute maximum ratings are stress ratings
only, and functional operation at the maxima is not guaranteed. Stress beyond the listed maxima may affect device
reliability or cause permanent damage to the device.
2. Allowed 2 V for 10 hours cumulative time, remaining time at 1.2 V +10%.
3. The V
4. Allowed 5.3 V for 10 hours cumulative time, remaining time at 3.3 V +10%.
5. Allowed 5.9 V for 10 hours cumulative time, remaining time at 5 V +10%.
6. All functional non-supply I/O pins are clamped to V
7. AC signal overshoot and undershoot of up to 2.0 V of the input voltages is permitted for an accumulative duration of 60
8. Internal structures hold the voltage greater than –1.0 V if the injection current limit of 2 mA is met.
9. Internal structures hold the input voltage less than the maximum voltage on all pads powered by V
10. Internal structures hold the input voltage less than the maximum voltage on all pads powered by V
11. Total injection current for all pins (including both digital and analog) must not exceed 25 mA.
12. Total injection current for all analog input pins must not exceed 15 mA.
13. Solder profile per IPC/JEDEC J-STD-020D.
14. Moisture sensitivity per JEDEC test method A112.
FLASH
devices only.
hours over the complete lifetime of the device (injection current not limited for this duration).
maximum injection current specification is met (2 mA for all pins) and V
maximum injection current specification is met (2 mA for all pins) and V
SR Storage temperature range–55.0150.0
Maximum solder
SR
temperature
supply is connected to V
(13)
(14)
in the package substrate. This specification applies to calibration package
1. Thermal characteristics are targets based on simulation that are subject to change per device characterization.
2. Junction-to-Ambient Thermal Resistance determined per JEDEC JESD51-3 and JESD51-6. Thermal test board meets
JEDEC specification for this package.
3. Junction-to-Board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification
for the specified package.
4. Junction-to-Case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is
used for the case temperature. Reported value includes the thermal resistance of the interface layer.
5. Thermal characterization parameter indicating the temperature difference between the package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written
as Psi-JT.
Table 11.Thermal characteristics for 208-pin LBGA
CCD Junction-to-Case
CCD
Junction-to-Package Top, Natural
Convection
SymbolCParameterConditionsValueUnit
R
θJA
R
θJA
CCD
CCD
Junction-to-Ambient, Natural
Convection
Junction-to-Ambient, Natural
Convection
(2),(3)
(2),(4)
One layer board - 1s39°C/W
Four layer board - 2s2p24°C/W
R
θJMA
R
θJMA
R
θJB
R
θJC
Ψ
JT
1. Thermal characteristics are targets based on simulation that are subject to change per device characterization.
2. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
3. Per SEMI G38-87 and JEDEC JESD51-2 with the single-layer board horizontal.
4. Per JEDEC JESD51-6 with the board horizontal.
5. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured
on the top surface of the board near the package.
6. Indicates the average thermal resistance between the die and the case top surface as measured by the cold plate method
(MIL SPEC-883 Method 1012.1) with the cold plate temperature used for the case temperature.
7. Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written
as Psi-JT.
1. Thermal characteristics are targets based on simulation that are subject to change per device characterization.
2. Junction-to-Ambient Thermal Resistance determined per JEDEC JESD51-3 and JESD51-6. Thermal test board meets
JEDEC specification for this package.
3. Junction-to-Board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification
for the specified package.
4. Junction-to-Case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is
used for the case temperature. Reported value includes the thermal resistance of the interface layer.
5. Thermal characterization parameter indicating the temperature difference between the package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written
as Psi-JT.
CCD Junction-to-Ambient, Natural Convection
CCD Junction-to-Ambient, Natural Convection
CCD Junction-to-Moving-Air, Ambient
CCD Junction-to-Moving-Air, Ambient
CCD Junction-to-Board
CCD Junction-to-Case
CCD
Junction-to-Package Top, Natural
Convection
(3)
(4)
(5)
(2)
(2)
(2)
Single layer board - 1s31°C/W
(2)
Four layer board - 2s2p23°C/W
at 200 ft./min., single
layer board
at 200 ft./min., four layer
board 2s2p
23°C/W
17°C/W
11°C/W
7°C/W
2°C/W
3.3.1 General notes for specifications at maximum junction temperature
An estimation of the chip junction temperature, TJ, can be obtained from the equation:
Equation 1 T
where:
T
A
R
θJA
P
= power dissipation in the package (W)
D
The thermal resistance values used are based on the JEDEC JESD51 series of standards
to provide consistent values for estimations and comparisons. The difference between the
values determined for the single-layer (1s) board compared to a four-layer board that has
two signal layers, a power and a ground plane (2s2p), demonstrate that the effective thermal
resistance is not a constant. The thermal resistance depends on the:
●Construction of the application board (number of planes)
●Effective size of the board which cools the component
●Quality of the thermal and electrical connections to the planes
●Power dissipated by adjacent components
Connect all the ground and power balls to the respective planes with one via per ball. Using
fewer vias to connect the package to the planes reduces the thermal performance. Thinner
planes also reduce the thermal performance. When the clearance between the vias leave
the planes virtually disconnected, the thermal performance is also greatly reduced.
As a general rule, the value obtained on a single-layer board is within the normal range for
the tightly packed printed circuit board. The value obtained on a board with the internal
planes is usually within the normal range if the application board has:
●One oz. (35 micron nominal thickness) internal planes
●Components are well separated
●Overall power dissipation on the board is less than 0.02 W/cm
2
The thermal performance of any component depends on the power dissipation of the
surrounding components. In addition, the ambient temperature varies widely within the
application. For many natural convection and especially closed box applications, the board
temperature at the perimeter (edge) of the package is approximately the same as the local
air temperature near the device. Specifying the local ambient conditions explicitly as the
board temperature provides a more precise description of the local ambient conditions that
determine the temperature of the device.
At a known board temperature, the junction temperature is estimated using the following
equation:
Equation 2 T
= TB + (R
J
θJB
* PD)
where:
T
= board temperature for the package perimeter (oC)
B
R
= junction-to-board thermal resistance (oC/W) per JESD51-8S
θJB
P
= power dissipation in the package (W)
D
When the heat loss from the package case to the air does not factor into the calculation, an
acceptable value for the junction temperature is predictable. Ensure the application board is
similar to the thermal test condition, with the component soldered to a board with internal
planes.
The thermal resistance is expressed as the sum of a junction-to-case thermal resistance
plus a case-to-ambient thermal resistance:
Equation 3 R
θJA
= R
θJC
+ R
θCA
where:
R
= junction-to-ambient thermal resistance (oC/W)
θJA
R
= junction-to-case thermal resistance (oC/W)
θJC
R
= case to ambient thermal resistance (oC/W)
θCA
R
is device related and is not affected by other factors. The thermal environment can be
θJC
controlled to change the case-to-ambient thermal resistance, R
. For example, change
θCA
the air flow around the device, add a heat sink, change the mounting arrangement on the
printed circuit board, or change the thermal dissipation on the printed circuit board
surrounding the device. This description is most useful for packages with heat sinks where
90% of the heat flow is through the case to heat sink to ambient. For most packages, a
better model is required.
A more accurate two-resistor thermal model can be constructed from the junction-to-board
thermal resistance and the junction-to-case thermal resistance. The junction-to-case
thermal resistance describes when using a heat sink or where a substantial amount of heat
is dissipated from the top of the package. The junction-to-board thermal resistance
describes the thermal performance when most of the heat is conducted to the printed circuit
board. This model can be used to generate simple estimations and for computational fluid
dynamics (CFD) thermal models.
To determine the junction temperature of the device in the application on a prototype board,
use the thermal characterization parameter (Ψ
) to determine the junction temperature by
JT
measuring the temperature at the top center of the package case using the following
equation:
Equation 4 T
= TT + (ΨJT x PD)
J
where:
T
= thermocouple temperature on top of the package (oC)
T
Ψ
= thermal characterization parameter (oC/W)
JT
P
= power dissipation in the package (W)
D
The thermal characterization parameter is measured in compliance with the JESD51-2
specification using a 40-gauge type T thermocouple epoxied to the top center of the
package case. Position the thermocouple so that the thermocouple junction rests on the
package. Place a small amount of epoxy on the thermocouple junction and approximately 1
mm of wire extending from the junction. Place the thermocouple wire flat against the
package case to avoid measurement errors caused by the cooling effects of the
thermocouple wire.
References:
Semiconductor Equipment and Materials International
3081 Zanker Road
San Jose, CA 95134
USA
(408) 943-6900
MIL-SPEC and EIA/JESD (JEDEC) specifications are available from Global Engineering
Documents at 800-854-7179 or 303-397-7956.
JEDEC specifications are available on the WEB at http://www.jedec.org.
●C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an
Automotive Engine Controller Module,” Proceedings of SemiTherm, San Diego, 1998,
pp. 47-54.
●G. Kromann, S. Shidore, and S. Addison, “Thermal Modeling of a PBGA for Air-Cooled
Applications”, Electronic Packaging and Production, pp. 53-58, March 1998.
●B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal
Resistance and Its Application in Thermal Modeling,” Proceedings of SemiTherm, San
Diego, 1999, pp. 212-220.
1. EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03 and IEC 61967-2.
Range
MHz
MHz
Level
(Max)
20
13
Unit
dBμV
dBμV
3.5 Electrostatic discharge (ESD) characteristics
Table 14.ESD ratings
SymbolParameterConditionsValueUnit
—SRESD for Human Body Model (HBM)—2000V
R1SR
CSR—100pF
—SR
—SRNumber of pulses per pin
—SRNumber of pulses—1—
1. All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits.
2. Device failure is defined as: “If after exposure to ESD pulses, the device does not meet the device specification
requirements, which includes the complete DC parametric and functional testing at room temperature and hot
temperature.”
2. Min range is extended to 10% since Lvi1p2 is reprogrammed from 1.2 V to 1.16 V after power-on reset.
3. LVI for falling supply is calculated as LVI rising – LVI hysteresis.
4. Lvi1p2 tracks DC target variation of internal Vdd regulator. Minimum and maximum Lvi1p2 correspond to minimum and
maximum Vdd DC target respectively.
5. Minimum loading (<10 mA) for reading trim values from flash, powering internal RC oscillator, and IO consumption during
POR.
6. No external load is allowed, except for use as a reference for an external tool.
7. This value is valid only when the internal regulator is bypassed. When the internal regulator is enabled, the maximum
external load allowed on the Nexus pads is 30 pF at 40 MHz.
8. Lvi3p3 tracks DC target variation of internal Vdd33 regulator. Minimum and maximum Lvi3p3 correspond to minimum and
maximum Vdd33 DC target respectively.
Nominal POR for rising 5 V
DDREG
supply
V
Variation of POR for rising
DDREG
supply
5V V
Nominal POR for falling 5 V
V
DDREG
supply
Variation of POR for falling
DDREG
supply
5V V
—2.67—V
Por5V_r
- 35%
Por5V_r
Por5V_r
+ 50%
V
—2.47—V
Por5V_f
- 35%
Por5V_f
Por5V_f
+ 50%
V
3.6.1 Regulator Example
In designs where the SPC564A80 microcontroller’s internal regulators are used, a ballast is
required for generation of the 1.2 V internal supply. No ballast is required when an external
The resistor may or may not be
required. This depends on the
allowable power dissipation of
the npn bypass transistor
device. The resistor may be
used to limit the in-rush current
at power on.
Rc
Creg
V
DDREG
The bypass transistor
MUST be operated out
of saturation region.
Mandatory decoupling
Cc
Re
Keep parasitic inductance
under 20nH
V
RCCTL
Rb
Cb
MCU
V
DD
capacitor network
V
SS
CeCd
VRCCTL capacitor and resistor is required
Figure 8.Core voltage regulator controller external components preferred
The following NPN transistors are recommended for use with the on-chip voltage regulator
controller: ON Semiconductor
TM
BCP68T1 or NJD2873 as well as Philips SemiconductorTM
BCP68. The collector of the external transistor is preferably connected to the same voltage
supply source as the output stage of the regulator.
Table 18.Recommended operating characteristics
SymbolParameterValueUnit
(β)DC current gain (Beta)60 – 550—
h
FE
P
I
CMaxDC
VCE
V
1. Adjust resistor at bipolar transistor collector for 3.3 V/5.0 V to avoid VCE < VCE
Absolute minimum power dissipation
D
Minimum peak collector current1.0A
Collector-to-emitter saturation voltage200 – 600
SAT
Base-to-emitter voltage0.4 – 1.0V
BE
3.7 Power up/down sequencing
There is no power sequencing required among power sources during power up and power
down, in order to operate within specification.
Although there are no power up/down sequencing requirements to prevent issues such as
latch-up or excessive current spikes the state of the I/O pins during power up/down varies
according to Ta bl e 1 9 for all pins with fast pads, and Tab le 2 0 for all pins with medium, slow,
and multi-voltage pads.
Table 19.Power sequence pin states (fast pads)
>1.0
(1.5 preferred)
(1)
.
SAT
W
mV
V
DDE
V
RC33
V
DD
LOWXXLOW
V
DDE
V
DDE
V
DDE
Table 20.Power sequence pin states (medium, slow, and multi-voltage pads)
speed with no undesirable behavior, but the accuracy will be degraded.
3. The V
only.
4. V
5. Power supply for multi-voltage pads cannot be below 4.5 V when in low-swing mode.
6. The slew rate (SRC) setting must be 0b11 when in low-swing mode.
7. While in low-swing mode there are no restrictions in transitioning to high-swing mode.
8. Pin in low-swing mode can accept a 5 V input.
9. All V
10. Bypass mode, system clock at 1 MHz (using system clock divider), PLL shut down, CPU running simple executive code,
4 x ADC conversion every 10 ms, 2 x PWM channels 1 kHz, all other modules stopped.
11. Bypass mode, system clock at 1 MHz (using system clock divider), CPU stopped, PIT running, all other modules stopped.
12. This current will be consumed for external regulation and internal regulation, when 3.3V regulator is switched off by shadow
flash
13. If 1.2V and 3.3V internal regulators are on,then iddreg=70mA
If supply is external that is 3.3V internal regulator is off, then iddreg=15mA
14. Power requirements for each I/O segment are dependent on the frequency of operation and load of the I/O pins on a
particular I/O segment, and the voltage of the I/O segment. See Table 22 for values to calculate power dissipation for
specific operation. The total power consumption of an I/O segment is the sum of the individual power consumptions for
each pin on the segment.
15. Absolute value of current, measured at V
16. Weak pull up/down inactive. Measured at V
17. Maximum leakage occurs at maximum operating temperature. Leakage current decreases by approximately one-half for
each 8 to 12
18. Applies to CLKOUT, external bus pins, and Nexus pins.
19. Applies to the FCK, SDI, SDO, and SDS
20. This programmable option applies only to eQADC differential input channels and is used for biasing and sensor
diagnostics.
supply is connected to VDD in the package substrate. This specification applies to calibration package devices
DDF
is only available in the calibration package.
FLASH
values 100% tested with ± 2 mA load except where noted.
OL/VOH
o
C, in the ambient temperature range of 50 to 125 oC. Applies to analog pads.
Slew rate on power
supply pins
is supplied externally, after disabling the internal regulator (V
RC33
≤ 4.75 V but with derated accuracy. This means the ADC will continue to function at full
DDA
and VIH.
IL
DDE
pins.
= 3.6 V and V
——25V/ms
= 0).
DDREG
= 5.25 V. Applies to fast, slow, and medium pads.
DDEH
C
100/157Doc ID 15399 Rev 8
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