This document describes the features of the family and options available within the family
members, and highlights important electrical and physical characteristics of the device. To
ensure a complete understanding of the device functionality, refer also to the device
reference manual and errata sheet.
1.2 Description
The SPC560B40x/50x and SPC560C40x/50x is a family of next generation microcontrollers
built on the Power Architecture embedded category.
The SPC560B40x/50x and SPC560C40x/50x family of 32-bit microcontrollers is the latest
achievement in integrated automotive application controllers. It belongs to an expanding
family of automotive-focused products designed to address the next wave of body
electronics applications within the vehicle. The advanced and cost-efficient host processor
core of this automotive controller family complies with the Power Architecture embedded
category and only implements the VLE (variable-length encoding) APU, providing improved
code density. It operates at speeds of up to 64 MHz and offers high performance processing
optimized for low power consumption. It capitalizes on the available development
infrastructure of current Power Architecture devices and is supported with software drivers,
operating systems and configuration code to assist with users implementations.
8/117Doc ID 14619 Rev 9
Table 2.SPC560B40x/50x and SPC560C40x/50x device comparison
Table 2.SPC560B40x/50x and SPC560C40x/50x device comparison
(1)
(continued)
Device
IntroductionSPC560B40x/50x, SPC560C40x/50x
Feature
SPC560B
40L1
SPC560B
40L3
SPC560B
40L5
SPC560C
40L1
SPC560C
40L3
SPC560B
50L1
SPC560B
50L3
SPC560B
50L5
SPC560C
50L1
SPC560C
50L3
SPC560B
50B2
DebugJTAGNexus2+
PackageLQFP64
1. Feature set dependent on selected peripheral multiplexing—table shows example implementation
2. Based on 125 °C ambient operating temperature
3. See the eMIOS section of the device reference manual for information on the channel configuration and functions.
4. IC – Input Capture; OC – Output Compare; PWM – Pulse Width Modulation; MC – Modulus counter
5. SCI0, SCI1 and SCI2 are available. SCI3 is not available.
6. CAN0, CAN1 are available. CAN2, CAN3, CAN4 and CAN5 are not available.
7. CAN0, CAN1 and CAN2 are available. CAN3, CAN4 and CAN5 are not available.
8. I/O count based on multiplexing with peripherals
9. All LQFP64 information is indicative and must be confirmed during silicon validation.
10. LBGA208 available only as development package for Nexus2+
(9)
LQFP100LQFP144LQFP64
(9)
LQFP100LQFP64
(9)
LQFP100LQFP144LQFP64
(9)
LQFP100
LBGA208
(10)
SPC560B40x/50x, SPC560C40x/50xBlock diagram
2 Block diagram
Figure 1 shows a top-level block diagram of the SPC560B40x/50x and SPC560C40x/50x
device series.
Figure 1.SPC560B40x/50x and SPC560C40x/50x block diagram
JTAG port
Nexus port
NMI
Clocks
Interrupt
request
Nexus
Vol ta ge
regulator
FMPLL
RTC
SIUL
Reset control
External
interrupt
request
IMUX
GPIO and
pad control
JTAG
NMI
SIUL
Interrupt requests
from peripheral
blocks
CMU
SWT
36 Ch.
ADC
ECSM
e200z0h
Nexus 2+
CTU
PITSTM
INTC
eMIOS
Instructions
(Master)
Data
(Master)
MPU
registers
Peripheral bridge
2 x
4 x
LINFlex
64-bit 2 x 3 Crossbar Switch
3 x
DSPI
MPU
SRAM
48 KB
SRAM
controller
(Slave)
MC_PCUMC_MEMC_CGMMC_RGM
I2C
Code Flash
512 KB
controller
(Slave)
BAM
6 x
FlexCAN
Data Flash
64 KB
Flash
(Slave)
SSCM
WKPU
I/O
Legend:
ADCAnalog-to-Digital Converter
BAMBoot Assist Module
FlexCAN Controller Area Network
CMUClock Monitor Unit
CTUCross Triggering Unit
DSPIDeserial Serial Peripheral Interface
eMIOSEnhanced Modular Input Output System
FMPLLFrequency-Modulated Phase-Locked Loop
2
CInter-integrated Circuit Bus
I
IMUXInternal Multiplexer
INTCInterrupt Controller
JTAGJTAG controller
LINFlexSerial Communication Interface (LIN support)
ECSMError Correction Status Module
. . .
Doc ID 14619 Rev 911/117
. . .
MC_CGM Clock Generation Module
MC_MEMode Entry Module
MC_PCU Power Control Unit
MC_RGM Reset Generation Module
MPUMemory Protection Unit
NexusNexus Development Interface (NDI) Level
NMINon-Maskable Interrupt
PITPeriodic Interrupt Timer
RTCReal-Time Clock
SIULSystem Integration Unit Lite
SRAMStatic Random-Access Memory
SSCMSystem Status Configuration Module
STMSystem Timer Module
SWTSoftware Watchdog Timer
WKPUWakeup Unit
. . .
. . .
. . .
Interrupt
request with
wakeup
functionality
Block diagramSPC560B40x/50x, SPC560C40x/50x
Ta bl e 3 summarizes the functions of all blocks present in the SPC560B40x/50x and
SPC560C40x/50x series of microcontrollers. Please note that the presence and number of
blocks vary by device and package.
Table 3.SPC560B40x/50x and SPC560C40x/50x series block summary
Clock monitor unit (CMU)Monitors clock source (internal and external) integrity
Cross triggering unit (CTU)
Deserial serial peripheral
interface (DSPI)
Error Correction Status Module
(ECSM)
Enhanced Direct Memory Access
(eDMA)
Enhanced modular input output
system (eMIOS)
BlockFunction
A block of read-only memory containing VLE code which is executed according
to the boot mode of the device
Enables synchronization of ADC conversions with a timer event from the eMIOS
or from the PIT
Provides a synchronous serial interface for communication with external
devices
Provides a myriad of miscellaneous control functions for the device including
program-visible information about configuration and revision levels, a reset
status register, wakeup control for exiting sleep modes, and optional features
such as information on memory errors reported by error-correcting codes
Performs complex data transfers with minimal intervention from a host
processor via “n” programmable channels.
Provides the functionality to generate or measure events
Flash memoryProvides non-volatile storage for program code, constants and variables
FlexCAN (controller area
network)
Frequency-modulated phaselocked loop (FMPLL)
Internal multiplexer (IMUX) SIU
subblock
2
Inter-integrated circuit (I
C™) bus
Supports the standard CAN communications protocol
Generates high-speed system clocks and supports programmable frequency
modulation
Allows flexible mapping of peripheral interface on the different pins of the device
A two wire bidirectional serial bus that provides a simple and efficient method of
data exchange between devices
Interrupt controller (INTC)Provides priority-based preemptive scheduling of interrupt requests
JTAG controller
LINFlex controller
Clock generation module
(MC_CGM)
Provides the means to test chip functionality and connectivity while remaining
transparent to system logic when not in test mode
Manages a high number of LIN (Local Interconnect Network protocol)
messages efficiently with a minimum of CPU load
Provides logic and control required for the generation of system and peripheral
clocks
Provides a mechanism for controlling the device operational mode and mode
Mode entry module (MC_ME)
transition sequences in all functional states; also manages the power control
unit, reset generation module and clock generation module, and holds the
configuration, control and status registers accessible for applications
12/117Doc ID 14619 Rev 9
SPC560B40x/50x, SPC560C40x/50xBlock diagram
Table 3.SPC560B40x/50x and SPC560C40x/50x series block summary (continued)
BlockFunction
Reduces the overall power consumption by disconnecting parts of the device
Power control unit (MC_PCU)
Reset generation module
(MC_RGM)
Memory protection unit (MPU)
from the power supply via a power switching device; device components are
grouped into sections called “power domains” which are controlled by the PCU
Centralizes reset sources and manages the device reset sequence of the
device
Provides hardware access control for all memory references generated in a
device
Nexus development interface
(NDI)
Periodic interrupt timer (PIT)Produces periodic interrupts and triggers
Real-time counter (RTC)
System integration unit (SIU)
Static random-access memory
(SRAM)
System status configuration
module (SSCM)
System timer module (STM)
System watchdog timer (SWT)Provides protection from runaway code
Wakeup unit (WKPU)
Crossbar (XBAR) switch
Provides real-time development support capabilities in compliance with the
IEEE-ISTO 5001-2003 standard
A free running counter used for time keeping applications, the RTC can be
configured to generate an interrupt at a predefined interval independent of the
mode of operation (run mode or low-power mode)
Provides control over all the electrical pad controls and up 32 ports with 16 bits
of bidirectional, general-purpose input and output signals and supports up to 32
external interrupts with trigger event configuration
Provides storage for program code, constants, and variables
Provides system configuration and status data (such as memory size and
status, device mode and security status), device identification data, debug
status port enable and selection, and bus and peripheral abort enable/disable
Provides a set of output compare events to support AUTOSAR and operating
system tasks
The wakeup unit supports up to 18 external sources that can generate
interrupts or wakeup events, of which 1 can cause non-maskable interrupt
requests or wakeup events.
Supports simultaneous connections between two master ports and three slave
ports. The crossbar supports a 32-bit address bus width and a 64-bit data bus
width.
Doc ID 14619 Rev 913/117
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
3 Package pinouts and signal descriptions
3.1 Package pinouts
The available LQFP pinouts and the LBGA208 ballmap are provided in the following figures.
For pin signal descriptions, please refer to the device reference manual (RM0017).
Figure 2.LQFP 64-pin configuration
PB[3]
1
PC[9]
2
PA[ 2 ]
3
PA[ 1 ]
4
PA[ 0 ]
5
VSS_HV
6
VDD_HV
7
VSS_HV
8
RESET
9
VSS_LV
10
VDD_LV
11
VDD_BV
12
PC[10]
13
PB[0]
14
PB[1]
15
PC[6]
16
(a)
PB[2]
PC[8]
PC[4]
PC[5]
PH[9]
PC[0]
VSS_LV
VDD_LV
VDD_HV
VSS_HV
PC[1]
PH[10]
PA[ 6 ]
646362616059585756555453525150
LQFP64 Top view
171819202122232425
PA[ 4 ]
PC[7]
PA[ 1 5 ]
PA[ 1 4 ]
PA[ 1 3 ]
PA[ 1 2 ]
VDD_LV
26272829303132
XTAL
EXTAL
VSS_LV
VSS_HV
PB[9]
VDD_HV
PA[ 5 ]
PC[2]
PC[3]
49
PA[ 1 1 ]
48
PA[ 1 0 ]
47
PA[ 9 ]
46
PA[ 8 ]
45
PA[ 7 ]
44
PA[ 3 ]
43
PB[15]
42
PB[14]
41
PB[13]
40
PB[12]
39
PB[11]
38
PB[7]
37
PB[6]
36
PB[5]
35
VDD_HV_ADC
34
VSS_HV_ADC
33
PB[8]
PB[4]
PB[10]
a. All LQFP64 information is indicative and must be confirmed during silicon validation.
14/117Doc ID 14619 Rev 9
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
Note: LBGA208 available only as development package for Nexus 2+.
OSC32
K_EXTALPF[2] PF[6] PD[1] PD[5] PD[6] PD[8] PB[4] T
= Not connected
NC
3.2 Pad configuration during reset phases
All pads have a fixed configuration under reset.
During the power-up phase, all pads are forced to tristate.
Doc ID 14619 Rev 917/117
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
After power-up phase, all pads are forced to tristate with the following exceptions:
●PA[9] (FAB) is pull-down. Without external strong pull-up the device starts fetching from
flash.
●PA[8] (ABS[0]) is pull-up.
●RESET pad is driven low. This is pull-up only after PHASE2 reset completion.
●JTAG pads (TCK, TMS and TDI) are pull-up whilst TDO remains tristate.
●Precise ADC pads (PB[7:4] and PD[11:0]) are left tristate (no output buffer available).
●Main oscillator pads (EXTAL, XTAL) are tristate.
●Nexus output pads (MDO[n], MCKO, EVTO, MSEO) are forced to output.
3.3 Voltage supply pins
Voltage supply pins are used to provide power to the device. Three dedicated
VDD_LV/VSS_LV supply pairs are used for 1.2 V regulator stabilization.
Table 4.Voltage supply pin descriptions
Port pinFunction
Pin number
LQFP64LQFP100LQFP144LBGA208
(1)
C2, D9, E16,
G13, H3,
N9, R5
VDD_HVDigital supply voltage7, 28, 56
15, 37, 70, 8419, 51, 100,
123
G7, G8, G9,
G10, H1,
VSS_HVDigital ground6, 8, 26, 55
14, 16, 35,
69, 83
18, 20, 49,
99, 122
H7, H8, H9,
H10, J7, J8,
J9, J10, K7,
K8, K9, K10
1.2V decoupling pins. Decoupling
VDD_LV
capacitor must be connected between
these pins and the nearest V
(2)
pin.
SS_LV
11, 23, 5719, 32, 8523, 46, 124D8, K4, P7
1.2V decoupling pins. Decoupling
VSS_LV
capacitor must be connected between
these pins and the nearest V
(2)
pin.
DD_LV
10, 24, 5818, 33, 8622, 47, 125C8, J2, N7
VDD_BVInternal regulator supply voltage122024K3
VSS_HV_ADC
VDD_HV_ADC
1. LBGA208 available only as development package for Nexus2+.
2. A decoupling capacitor must be placed between each of the three VDD_LV/VSS_LV supply pairs to ensure stable voltage
(see the recommended operating conditions in the device datasheet for details).
Reference ground and analog ground
for the ADC
Reference voltage and analog supply
for the ADC
335173R15
345274P14
18/117Doc ID 14619 Rev 9
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
3.4 Pad types
In the device the following types of pads are available for system pins and functional port
pins:
S = Slow
M = Medium
F = Fast
I = Input only with analog feature
(b)
(b)(c)
(b)(c)
(b)
J = Input/Output (‘S’ pad) with analog feature
X = Oscillator
3.5 System pins
The system pins are listed in Ta bl e 5 .
Table 5.System pin descriptions
Pin number
Function
System pin
RESET
Bidirectional reset with Schmitt-Trigger characteristics
and noise filter.
Analog output of the oscillator amplifier circuit, when the
EXTAL
XTAL
1. LBGA208 available only as development package for Nexus2+.
2. See the relevant section of the datasheet .
oscillator is not in bypass mode.
Analog input for the clock generator when the oscillator
is in bypass mode.
(2)
Analog input of the oscillator amplifier circuit. Needs to
be grounded if oscillator is used in bypass mode.
(2)
Pad type
I/O direction
LQFP64
LQFP100
LQFP144
RESET configuration
Input, weak
I/OM
pull-up only
91721J1
after PHASE2
I/OXTristate273650N8
IXTristate253448P8
(1)
LBGA208
b. See the I/O pad electrical characteristics in the device datasheet for details.
c. All medium and fast pads are in slow configuration by default at reset and can be configured as fast or medium
(see PCR.SRC in section Pad Configuration Registers (PCR0–PCR122) in the device reference manual).
Doc ID 14619 Rev 919/117
20/117Doc ID 14619 Rev 9
3.6 Functional ports
The functional port pins are listed in Ta bl e 6 .
Table 6.Functional port pin descriptions
(1)
Port pin
PA[0]PCR[0]AF0
PA[1]PCR[1]AF0
PA[2]PCR[2]AF0
PA[3]PCR[3]AF0
PA[4]PCR[4]AF0
PCR
Alternate
AF1
AF2
AF3
—
AF1
AF2
AF3
—
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
function
Function
GPIO[0]
E0UC[0]
CLKOUT
—
WKPU[19]
GPIO[1]
E0UC[1]
—
—
(5)
NMI
WKPU[2]
GPIO[2]
E0UC[2]
—
—
WKPU[3]
GPIO[3]
E0UC[3]
—
—
EIRQ[0]
GPIO[4]
E0UC[4]
—
—
WKPU[9]
(4)
(4)
(4)
(4)
Peripheral
SIUL
eMIOS_0
CGL
—
WKPU
SIUL
eMIOS_0
—
—
WKPU
WKPU
SIUL
eMIOS_0
—
—
WKPU
SIUL
eMIOS_0
—
—
SIUL
SIUL
eMIOS_0
—
—
WKPU
I/O
I/O
O
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
(2)
I/O direction
Pad type
RESET
configuration
LQFP64
Pin number
LQFP100
LQFP144
MTristate51216G4
I
STristate4711F3
I
I
STristate 359F2
I
STristate 436890K15
I
STristate202943N6
I
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(3)
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PA[5]PCR[5]AF0
PA[6]PCR[6]AF0
Doc ID 14619 Rev 921/117
PA[7]PCR[7]AF0
PA[8]PCR[8]AF0
PA[9]PCR[9]AF0
PA[10]PCR[10]AF0
PCR
Alternate
AF1
AF2
AF3
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
N/A
—
AF1
AF2
AF3
N/A
AF1
AF2
AF3
function
(6)
(6)
GPIO[5]
E0UC[5]
GPIO[6]
E0UC[6]
EIRQ[1]
GPIO[7]
E0UC[7]
LIN3TX
EIRQ[2]
GPIO[8]
E0UC[8]
EIRQ[3]
ABS[0]
LIN3RX
GPIO[9]
E0UC[9]
FAB
GPIO[10]
E0UC[10]
SDA
—
—
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
SIUL
eMIOS_0
—
—
SIUL
eMIOS_0
—
—
SIUL
SIUL
eMIOS_0
LINFlex_3
—
SIUL
SIUL
eMIOS_0
—
—
SIUL
BAM
LINFlex_3
SIUL
eMIOS_0
—
—
BAM
SIUL
eMIOS_0
I2C_0
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
O
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
I/O
—
MTristate5179118C11
STristate5280119D11
I
STristate4471104D16
I
SInput, weak
I
I
I
SPull-down4673106C15
I
STristate4774107B16
RESET
pull-up
configuration
LQFP64
4572105C16
Pin number
LQFP100
(3)
LQFP144
LBGA208
22/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PA[11]PCR[11]AF0
PCR
Alternate
AF1
AF2
function
GPIO[11]
E0UC[11]
SCL
AF3
PA[12]PCR[12]AF0
GPIO[12]
AF1
AF2
AF3
—
PA[13]PCR[13]AF0
AF1
SIN_0
GPIO[13]
SOUT_0
AF2
AF3
PA[14]PCR[14]AF0
AF1
AF2
GPIO[14]
SCK_0
CS0_0
AF3
—
PA[15]PCR[15]AF0
AF1
AF2
EIRQ[4]
GPIO[15]
CS0_0
SCK_0
AF3
—
PB[0]PCR[16]AF0
AF1
WKPU[10]
GPIO[16]
CAN0TX
AF2
AF3
—
—
—
—
—
—
—
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
(4)
SIUL
eMIOS_0
I2C_0
—
SIUL
—
—
—
DSPI0
SIUL
DSPI_0
—
—
SIUL
DSPI_0
DSPI_0
—
SIUL
SIUL
DSPI_0
DSPI_0
—
WKPU
SIUL
FlexCAN_0
—
—
I/O
I/O
I/O
—
I/O
—
—
—
I/O
O
—
—
I/O
I/O
I/O
—
I/O
I/O
I/O
—
I/O
O
—
—
STristate4875108B15
STristate223145T7
I
MTristate213044R7
MTristate192842P6
I
MTristate182740R6
I
MTristate142331N3
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PB[1]PCR[17]AF0
PB[2]PCR[18]AF0
Doc ID 14619 Rev 923/117
PB[3]PCR[19]AF0
PB[4]PCR[20]AF0
PB[5]PCR[21]AF0
PB[6]PCR[22]AF0
PCR
Alternate
AF1
AF2
AF3
—
—
AF1
AF2
AF3
AF1
AF2
AF3
—
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
function
GPIO[17]
WKPU[4]
CAN0RX
GPIO[18]
LIN0TX
SDA
GPIO[19]
SCL
WKPU[11]
LIN0RX
GPIO[20]
GPI[0]
GPIO[21]
GPI[1]
GPIO[22]
GPI[2]
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
(4)
(4)
SIUL
—
—
—
WKPU
FlexCAN_0
SIUL
LINFlex_0
I2C_0
—
SIUL
—
I2C_0
—
WKPU
LINFlex_0
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
I/O
—
—
—
I/O
O
I/O
—
I/O
—
I/O
—
—
—
—
—
—
—
—
—
—
STristate152432N1
I
I
MTristate64100144B2
STristate 111C3
I
I
I
ITristate 325072T16
I
I
ITristate355375R16
I
I
ITristate 365476P15
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
24/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PB[7]PCR[23]AF0
PCR
Alternate
function
GPIO[23]
AF1
AF2
AF3
—
PB[8]PCR[24]AF0
GPI[3]
GPIO[24]
AF1
AF2
AF3
—
—
PB[9]PCR[25]AF0
ANS[0]
OSC32K_XTAL
GPIO[25]
AF1
AF2
AF3
—
—
PB[10]PCR[26]AF0
ANS[1]
OSC32K_EXTAL
GPIO[26]
AF1
AF2
AF3
PB[11]
(8)
PCR[27]AF0
—
—
AF1
ANS[2]
WKPU[8]
GPIO[27]
E0UC[3]
AF2
AF3
—
CS0_0
ANS[3]
—
—
—
—
—
—
—
—
—
—
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
(4)
(7)
(7)
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SXOSC
SIUL
—
—
—
ADC
SXOSC
SIUL
—
—
—
ADC
WKPU
SIUL
eMIOS_0
—
DSPI_0
ADC
—
—
—
—
—
—
I/O
—
—
—
I/O
I/O
—
—
—
I/O
I/O
—
I/O
I
ITristate 375577P16
I
I
ITristate303953R9
I
I
ITristate293852T9
I
JTristate314054P9
I
I
JTristate385981N13
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
PCR
Alternate
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
PCR[32]AF0
AF1
AF2
AF3
PCR[33]AF0
AF1
AF2
AF3
function
GPIO[28]
E0UC[4]
CS1_0
ANX[0]
GPIO[29]
E0UC[5]
CS2_0
ANX[1]
GPIO[30]
E0UC[6]
CS3_0
ANX[2]
GPIO[31]
E0UC[7]
CS4_0
ANX[3]
GPIO[32]
GPIO[33]
TDO
Doc ID 14619 Rev 925/117
Port pin
PB[12]PCR[28]AF0
PB[13]PCR[29]AF0
PB[14]PCR[30]AF0
PB[15]PCR[31]AF0
(9)
PC[0]
(9)
PC[1]
—
—
—
—
—
TDI
—
—
—
Function
(10)
Peripheral
SIUL
eMIOS_0
—
DSPI_0
ADC
SIUL
eMIOS_0
—
DSPI_0
ADC
SIUL
eMIOS_0
—
DSPI_0
ADC
SIUL
eMIOS_0
—
DSPI_0
ADC
SIUL
—
JTAGC
—
SIUL
—
JTAGC
—
I/O
I/O
—
O
I/O
I/O
—
O
I/O
I/O
—
O
I/O
I/O
—
O
I/O
—
—
I/O
—
O
—
(2)
Pad type
I/O direction
RESET
configuration
LQFP64
Pin number
LQFP100
LQFP144
JTristate 396183M16
I
JTristate 406385M13
I
JTristate416587L16
I
JTristate426789L13
I
MInput, weak
5987126A8
pull-up
I
MTristate 54 82121C9
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(3)
LBGA208
26/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PC[2]PCR[34]AF0
PCR
Alternate
AF1
AF2
function
GPIO[34]
SCK_1
CAN4TX
AF3
—
PC[3]PCR[35]AF0
AF1
AF2
EIRQ[5]
GPIO[35]
CS0_1
MA[0]
AF3
—
—
—
PC[4]PCR[36]AF0
CAN1RX
CAN4RX
EIRQ[6]
GPIO[36]
AF1
AF2
AF3
—
—
PC[5]PCR[37]AF0
AF1
AF2
SIN_1
CAN3RX
GPIO[37]
SOUT_1
CAN3TX
AF3
—
PC[6]PCR[38]AF0
AF1
EIRQ[7]
GPIO[38]
LIN1TX
AF2
AF3
—
—
—
—
—
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
(11)
(11)
(11)
(11)
SIUL
DSPI_1
FlexCAN_4
—
SIUL
SIUL
DSPI_1
ADC
—
FlexCAN_1
FlexCAN_4
SIUL
SIUL
—
—
—
DSPI_1
FlexCAN_3
SIUL
DSPI1
FlexCAN_3
—
SIUL
SIUL
LINFlex_1
—
—
I/O
I/O
O
—
I/O
I/O
O
—
I/O
—
—
—
I/O
O
O
—
I/O
O
—
—
MTristate5078117A11
I
STristate4977116B11
I
I
I
MTristate 62 92131B7
I
I
MTristate 61 91130A7
I
STristate162536R2
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PC[7]PCR[39]AF0
PC[8]PCR[40]AF0
Doc ID 14619 Rev 927/117
PC[9]PCR[41]AF0
PC[10]PCR[42]AF0
PC[11]PCR[43]AF0
PCR
Alternate
AF1
AF2
AF3
—
—
AF1
AF2
AF3
AF1
AF2
AF3
—
—
AF1
AF2
AF3
AF1
AF2
AF3
—
—
—
function
GPIO[39]
LIN1RX
WKPU[12]
GPIO[40]
LIN2TX
GPIO[41]
LIN2RX
WKPU[13]
GPIO[42]
CAN1TX
CAN4TX
MA[1]
GPIO[43]
CAN1RX
CAN4RX
WKPU[5]
—
—
—
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
(11)
(11)
(4)
(4)
(4)
SIUL
—
—
—
LINFlex_1
WKPU
SIUL
LINFlex_2
—
—
SIUL
—
—
—
LINFlex_2
WKPU
SIUL
FlexCAN_1
FlexCAN_4
ADC
SIUL
—
—
—
FlexCAN_1
FlexCAN_4
WKPU
I/O
—
—
—
I/O
O
—
—
I/O
—
—
—
I/O
O
O
O
I/O
—
—
—
STristate172637P3
I
I
STristate 6399143A1
STristate 222B1
I
I
MTristate132228M3
STristate—2127M4
I
I
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
28/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PC[12]PCR[44]AF0
PCR
Alternate
AF1
function
GPIO[44]
E0UC[12]
AF2
AF3
—
PC[13]PCR[45]AF0
AF1
AF2
SIN_2
GPIO[45]
E0UC[13]
SOUT_2
AF3
PC[14]PCR[46]AF0
AF1
AF2
GPIO[46]
E0UC[14]
SCK_2
AF3
—
PC[15]PCR[47]AF0
AF1
AF2
EIRQ[8]
GPIO[47]
E0UC[15]
CS0_2
AF3
PD[0]PCR[48]AF0
GPIO[48]
AF1
AF2
AF3
—
PD[1]PCR[49]AF0
GPI[4]
GPIO[49]
AF1
AF2
AF3
—
GPI[5]
—
—
—
—
—
—
—
—
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
SIUL
eMIOS_0
—
—
DSPI_2
SIUL
eMIOS_0
DSPI_2
—
SIUL
eMIOS_0
DSPI_2
—
SIUL
SIUL
eMIOS_0
DSPI_2
—
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
I/O
I/O
—
—
I/O
I/O
O
—
I/O
I/O
I/O
—
I/O
I/O
I/O
—
—
—
—
—
—
—
MTristate—97141B4
I
STristate—98142A2
STristate — 3 3 C1
I
MTristate — 4 4 D3
I
ITristate—4163P12
I
I
ITristate—4264T12
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PD[2]PCR[50]AF0
PD[3]PCR[51]AF0
Doc ID 14619 Rev 929/117
PD[4]PCR[52]AF0
PD[5]PCR[53]AF0
PD[6]PCR[54]AF0
PD[7]PCR[55]AF0
PCR
Alternate
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
function
GPIO[50]
GPI[6]
GPIO[51]
GPI[7]
GPIO[52]
GPI[8]
GPIO[53]
GPI[9]
GPIO[54]
GPI[10]
GPIO[55]
GPI[11]
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
I
ITristate—4365R12
I
I
ITristate—4466P13
I
I
ITristate—4567R13
I
I
ITristate—4668T13
I
ITristate—4769T14
I
I
I
ITristate—4870R14
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
30/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PD[8]PCR[56]AF0
PCR
Alternate
function
GPIO[56]
AF1
AF2
AF3
—
PD[9]PCR[57]AF0
GPI[12]
GPIO[57]
AF1
AF2
AF3
—
PD[10]PCR[58]AF0
GPI[13]
GPIO[58]
AF1
AF2
AF3
—
PD[11]PCR[59]AF0
GPI[14]
GPIO[59]
AF1
AF2
AF3
PD[12]
(8)
PCR[60]AF0
—
AF1
AF2
GPI[15]
GPIO[60]
CS5_0
E0UC[24]
AF3
—
PD[13]PCR[61]AF0
AF1
AF2
ANS[4]
GPIO[61]
CS0_1
E0UC[25]
AF3
—
ANS[5]
—
—
—
—
—
—
—
—
—
—
—
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SIUL
—
—
—
ADC
SIUL
DSPI_0
eMIOS_0
—
ADC
SIUL
DSPI_1
eMIOS_0
—
ADC
—
—
—
—
—
—
—
—
—
—
—
—
I/O
O
I/O
—
I/O
I/O
I/O
—
I
ITristate—4971T15
I
I
ITristate—5678N15
I
I
ITristate—5779N14
I
I
ITristate—5880N16
I
JTristate—6082M15
I
JTristate—6284M14
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PD[14]PCR[62]AF0
PD[15]PCR[63]AF0
Doc ID 14619 Rev 931/117
PE[0]PCR[64]AF0
PE[1]PCR[65]AF0
PE[2]PCR[66]AF0
PE[3]PCR[67]AF0
PCR
Alternate
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
—
—
AF1
AF2
AF3
AF1
AF2
AF3
—
AF1
AF2
AF3
function
GPIO[62]
CS1_1
E0UC[26]
ANS[6]
GPIO[63]
CS2_1
E0UC[27]
ANS[7]
GPIO[64]
E0UC[16]
CAN5RX
WKPU[6]
GPIO[65]
E0UC[17]
CAN5TX
GPIO[66]
E0UC[18]
SIN_1
GPIO[67]
E0UC[19]
SOUT_1
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
(11)
(4)
(11)
SIUL
DSPI_1
eMIOS_0
—
ADC
SIUL
DSPI_1
eMIOS_0
—
ADC
SIUL
eMIOS_0
—
—
FlexCAN_5
WKPU
SIUL
eMIOS_0
FlexCAN_5
—
SIUL
eMIOS_0
—
—
DSPI_1
SIUL
eMIOS_0
DSPI_1
—
I/O
O
I/O
—
I/O
O
I/O
—
I/O
I/O
—
—
I/O
I/O
O
—
I/O
I/O
—
—
I/O
I/O
O
—
JTristate—6486L15
I
JTristate—6688L14
I
STristate—610F1
I
I
MTristate—812F4
MTristate—89128D7
I
MTristate—90129C7
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
32/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PE[4]PCR[68]AF0
PCR
Alternate
AF1
AF2
function
GPIO[68]
E0UC[20]
SCK_1
AF3
—
PE[5]PCR[69]AF0
AF1
AF2
AF3
PE[6]PCR[70]AF0
AF1
AF2
AF3
PE[7]PCR[71]AF0
AF1
AF2
AF3
PE[8]PCR[72]AF0
AF1
AF2
AF3
PE[9]PCR[73]AF0
EIRQ[9]
GPIO[69]
E0UC[21]
CS0_1
MA[2]
GPIO[70]
E0UC[22]
CS3_0
MA[1]
GPIO[71]
E0UC[23]
CS2_0
MA[0]
GPIO[72]
CAN2TX
E0UC[22]
CAN3TX
GPIO[73]
AF1
AF2
E0UC[23]
AF3
—
—
—
WKPU[7]
CAN2RX
CAN3RX
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
(12)
(11)
(4)
(12)
(11)
SIUL
eMIOS_0
DSPI_1
—
SIUL
SIUL
eMIOS_0
DSPI_1
ADC
SIUL
eMIOS_0
DSPI_0
ADC
SIUL
eMIOS_0
DSPI_0
ADC
SIUL
FlexCAN_2
eMIOS_0
FlexCAN_3
SIUL
—
eMIOS_0
—
WKPU
FlexCAN_2
FlexCAN_3
I/O
I/O
I/O
—
I/O
I/O
I/O
O
I/O
I/O
O
O
I/O
I/O
O
O
I/O
O
I/O
O
I/O
—
I/O
—
MTristate—93132D6
I
MTristate—94133C6
MTristate—95139B5
MTristate—96140C4
MTristate—913G2
STristate—1014G1
I
I
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PE[10]PCR[74]AF0
PE[11]PCR[75]AF0
Doc ID 14619 Rev 933/117
PE[12]PCR[76]AF0
PE[13]PCR[77]AF0
PE[14]PCR[78]AF0
PE[15]PCR[79]AF0
PCR
Alternate
AF1
AF2
AF3
—
AF1
AF2
AF3
—
—
AF1
AF2
AF3
—
—
AF1
AF2
AF3
AF1
AF2
AF3
—
AF1
AF2
AF3
function
GPIO[74]
LIN3TX
CS3_1
EIRQ[10]
GPIO[75]
CS4_1
LIN3RX
WKPU[14]
GPIO[76]
E1UC[19]
SIN_2
EIRQ[11]
GPIO[77]
SOUT2
E1UC[20]
GPIO[78]
SCK_2
E1UC[21]
EIRQ[12]
GPIO[79]
CS0_2
E1UC[22]
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
(4)
(13)
SIUL
LINFlex_3
DSPI_1
—
SIUL
SIUL
—
DSPI_1
—
LINFlex_3
WKPU
SIUL
—
eMIOS_1
—
DSPI_2
SIUL
SIUL
DSPI_2
eMIOS_1
—
SIUL
DSPI_2
eMIOS_1
—
SIUL
SIUL
DSPI_2
eMIOS_1
—
I/O
O
O
—
I/O
—
O
—
I/O
—
I/O
—
I/O
O
I/O
—
I/O
I/O
I/O
—
I/O
I/O
I/O
—
STristate—1115G3
I
STristate—1317H2
I
I
STristate—76109C14
I
I
STristate——103D15
STristate——112C13
I
MTristate——113A13
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
34/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PF[0]PCR[80]AF0
PCR
Alternate
AF1
AF2
function
GPIO[80]
E0UC[10]
CS3_1
AF3
—
PF[1]PCR[81]AF0
AF1
AF2
ANS[8]
GPIO[81]
E0UC[11]
CS4_1
AF3
—
PF[2]PCR[82]AF0
AF1
AF2
ANS[9]
GPIO[82]
E0UC[12]
CS0_2
AF3
—
PF[3]PCR[83]AF0
AF1
AF2
ANS[10]
GPIO[83]
E0UC[13]
CS1_2
AF3
—
PF[4]PCR[84]AF0
AF1
AF2
ANS[11]
GPIO[84]
E0UC[14]
CS2_2
AF3
—
PF[5]PCR[85]AF0
AF1
AF2
ANS[12]
GPIO[85]
E0UC[22]
CS3_2
AF3
—
ANS[13]
—
—
—
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
SIUL
eMIOS_0
DSPI_1
—
ADC
SIUL
eMIOS_0
DSPI_1
—
I
SIUL
eMIOS_0
DSPI_2
—
ADC
SIUL
eMIOS_0
DSPI_2
—
ADC
SIUL
eMIOS_0
DSPI_2
—
ADC
SIUL
eMIOS_0
DSPI_2
—
ADC
I/O
I/O
O
—
I/O
I/O
O
—
I/O
I/O
I/O
—
I/O
I/O
O
—
I/O
I/O
O
—
I/O
I/O
O
—
JTristate——55N10
I
JTristate ——56P10
I
JTristate ——57T10
I
JTristate——58R10
I
JTristate——59N11
I
JTristate ——60P11
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PF[6]PCR[86]AF0
PF[7]PCR[87]AF0
Doc ID 14619 Rev 935/117
PF[8]PCR[88]AF0
PF[9]PCR[89]AF0
PF[10]PCR[90]AF0
PF[11]PCR[91]AF0
PCR
Alternate
AF1
AF2
AF3
—
AF1
AF2
AF3
—
AF1
AF2
AF3
AF1
AF2
AF3
—
—
AF1
AF2
AF3
AF1
AF2
AF3
—
function
GPIO[86]
E0UC[23]
ANS[14]
GPIO[87]
ANS[15]
GPIO[88]
CAN3TX
CS4_0
CAN2TX
GPIO[89]
CS5_0
CAN2RX
CAN3RX
GPIO[90]
GPIO[91]
WKPU[15]
—
—
—
—
—
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
(14)
(15)
(15)
(14)
(4)
SIUL
eMIOS_0
—
—
ADC
SIUL
—
—
—
ADC
SIUL
FlexCAN_3
DSPI_0
FlexCAN_2
SIUL
—
DSPI_0
—
FlexCAN_2
FlexCAN_3
SIUL
—
—
—
SIUL
—
—
—
WKPU
I/O
I/O
—
—
I/O
—
—
—
I/O
O
O
O
I/O
—
O
—
I/O
—
—
—
I/O
—
—
—
JTristate ——61T11
I
JTristate——62R11
I
MTristate——34P1
STristate——33N2
I
I
MTristate——38R3
STristate——39R4
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
36/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PF[12]PCR[92]AF0
PCR
Alternate
AF1
function
GPIO[92]
E1UC[25]
AF2
AF3
PF[13]PCR[93]AF0
AF1
GPIO[93]
E1UC[26]
AF2
AF3
—
PF[14]PCR[94]AF0
AF1
AF2
AF3
PF[15]PCR[95]AF0
WKPU[16]
GPIO[94]
CAN4TX
E1UC[27]
CAN1TX
GPIO[95]
AF1
AF2
AF3
—
—
—
PG[0]PCR[96]AF0
AF1
AF2
CAN1RX
CAN4RX
EIRQ[13]
GPIO[96]
CAN5TX
E1UC[23]
AF3
PG[1]PCR[97]AF0
GPIO[97]
AF1
AF2
E1UC[24]
AF3
—
—
CAN5RX
EIRQ[14]
—
—
—
—
—
—
—
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
(11)
(11)
(11)
(11)
(4)
SIUL
eMIOS_1
—
—
SIUL
eMIOS_1
—
—
WKPU
SIUL
FlexCAN_4
eMIOS_1
FlexCAN_4
SIUL
—
—
—
FlexCAN_1
FlexCAN_4
SIUL
SIUL
FlexCAN_5
eMIOS_1
—
SIUL
—
eMIOS_1
—
FlexCAN_5
SIUL
I/O
I/O
—
—
I/O
I/O
—
—
I/O
O
I/O
O
I/O
—
—
—
I/O
O
I/O
—
I/O
—
I/O
—
MTristate——35R1
STristate——41T6
I
MTristate——102D14
STristate——101E15
I
I
I
MTristate — — 98E14
STristate — — 97E13
I
I
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PG[2]PCR[98]AF0
PG[3]PCR[99]AF0
Doc ID 14619 Rev 937/117
PG[4]PCR[100]AF0
PG[5]PCR[101]AF0
PG[6]PCR[102]AF0
PG[7]PCR[103]AF0
PCR
Alternate
AF1
AF2
AF3
AF1
AF2
AF3
—
AF1
AF2
AF3
AF1
AF2
AF3
—
AF1
AF2
AF3
AF1
AF2
AF3
function
GPIO[98]
E1UC[11]
GPIO[99]
E1UC[12]
WKPU[17]
GPIO[100]
E1UC[13]
GPIO[101]
E1UC[14]
WKPU[18]
GPIO[102]
E1UC[15]
GPIO[103]
E1UC[16]
—
—
—
—
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
(4)
(4)
SIUL
eMIOS_1
—
—
SIUL
eMIOS_1
—
—
WKPU
SIUL
eMIOS_1
—
—
SIUL
eMIOS_1
—
—
WKPU
SIUL
eMIOS_1
—
—
SIUL
eMIOS_1
—
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
MTristate — — 8 E4
STristate — — 7 E3
I
MTristate — — 6 E1
STristate — — 5 E2
I
MTristate——30M2
MTristate——29M1
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
38/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PG[8]PCR[104]AF0
PCR
Alternate
AF1
function
GPIO[104]
E1UC[17]
AF2
AF3
—
PG[9]PCR[105]AF0
AF1
CS0_2
EIRQ[15]
GPIO[105]
E1UC[18]
AF2
AF3
PG[10]PCR[106]AF0
AF1
SCK_2
GPIO[106]
E0UC[24]
AF2
AF3
PG[11]PCR[107]AF0
AF1
GPIO[107]
E0UC[25]
AF2
AF3
PG[12]PCR[108]AF0
AF1
GPIO[108]
E0UC[26]
AF2
AF3
PG[13]PCR[109]AF0
AF1
GPIO[109]
E0UC[27]
AF2
AF3
PG[14]PCR[110]AF0
AF1
GPIO[110]
E1UC[0]
AF2
AF3
—
—
—
—
—
—
—
—
—
—
—
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(2)
Function
Peripheral
Pad type
I/O direction
SIUL
eMIOS_1
—
DSPI_2
SIUL
SIUL
eMIOS_1
—
DSPI_2
SIUL
eMIOS_0
—
—
SIUL
eMIOS_0
—
—
SIUL
eMIOS_0
—
—
SIUL
eMIOS_0
—
—
SIUL
eMIOS_1
—
—
I/O
I/O
—
I/O
I/O
I/O
—
I/O
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
—
—
STristate——26L2
I
STristate——25L1
STristate——114D13
MTristate——115B12
MTristate — — 92K14
MTristate — — 91K16
STristate——110B14
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
Table 6.Functional port pin descriptions (continued)
(1)
Port pin
PG[15]PCR[111]AF0
PH[0]PCR[112]AF0
Doc ID 14619 Rev 939/117
PH[1]PCR[113]AF0
PH[2]PCR[114]AF0
PH[3]PCR[115]AF0
PH[4]PCR[116]AF0
PH[5]PCR[117]AF0
PCR
Alternate
AF1
AF2
AF3
AF1
AF2
AF3
—
AF1
AF2
AF3
AF1
AF2
AF3
AF1
AF2
AF3
AF1
AF2
AF3
AF1
AF2
AF3
function
GPIO[111]
E1UC[1]
GPIO[112]
E1UC[2]
SIN1
GPIO[113]
E1UC[3]
SOUT1
GPIO[114]
E1UC[4]
SCK_1
GPIO[115]
E1UC[5]
CS0_1
GPIO[116]
E1UC[6]
GPIO[117]
E1UC[7]
—
—
—
—
—
—
—
—
—
—
—
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
(2)
Function
Peripheral
Pad type
I/O direction
SIUL
eMIOS_1
—
—
SIUL
eMIOS_1
—
—
DSPI_1
SIUL
eMIOS_1
DSPI_1
—
SIUL
eMIOS_1
DSPI_1
—
SIUL
eMIOS_1
DSPI_1
—
SIUL
eMIOS_1
—
—
SIUL
eMIOS_1
—
—
I/O
I/O
—
—
I/O
I/O
—
—
I/O
I/O
O
—
I/O
I/O
I/O
—
I/O
I/O
I/O
—
I/O
I/O
—
—
I/O
I/O
—
—
MTristate——111B13
MTristate — — 93F13
I
MTristate — — 94F14
MTristate — — 95F16
MTristate — — 96F15
MTristate — —134A6
STristate — —135B6
RESET
configuration
LQFP64
Pin number
LQFP100
(3)
LQFP144
LBGA208
40/117Doc ID 14619 Rev 9
Table 6.Functional port pin descriptions (continued)
Pin number
LQFP100
I/O
I/O
—
O
I/O
I/O
O
O
I/O
I/O
O
O
I/O
—
—
I/O
—
—
(2)
Pad type
I/O direction
RESET
configuration
LQFP64
MTristate — —136D5
MTristate — —137C5
MTristate — —138A5
SInput, weak
6088127B8
pull-up
I
SInput, weak
6081120B9
pull-up
I
(1)
Port pin
PH[6]PCR[118]AF0
PH[7]PCR[119]AF0
PH[8]PCR[120]AF0
(9)
PH[9]
(9)
PH[10]
1. Alternate functions are chosen by setting the values of the PCR.PA bitfields inside the SIUL module. PCR.PA = 00 → AF0; PCR.PA = 01 → AF1; PCR.PA = 10 → AF2;
PCR.PA = 11 → AF3. This is intended to select the output functions; to use one of the input functions, the PCR.IBE bit must be written to ‘1’, regardless of the values
selected in the PCR.PA bitfields. For this reason, the value corresponding to an input only function is reported as “—”.
2. Multiple inputs are routed to all respective modules internally. The input of some modules must be configured by setting the values of the PSMIO.PADSELx bitfields inside
the SIUL module.
3. LBGA208 available only as development package for Nexus2+.
4. All WKPU pins also support external interrupt capability. See wakeup unit chapter for further details.
5. NMI has higher priority than alternate function. When NMI is selected, the PCR.AF field is ignored.
6. “Not applicable” because these functions are available only while the device is booting. Refer to BAM chapter of the reference manual for details.
7. Value of PCR.IBE bit must be 0.
PCR
Alternate
AF1
AF2
AF3
AF1
AF2
AF3
AF1
AF2
AF3
PCR[121]AF0
AF1
AF2
AF3
PCR[122]AF0
AF1
AF2
AF3
function
Function
GPIO[118]
E1UC[8]
—
MA[2]
GPIO[119]
E1UC[9]
CS3_2
MA[1]
GPIO[120]
E1UC[10]
CS2_2
MA[0]
GPIO[121]
—
TCK
—
GPIO[122]
—
TMS
—
Peripheral
SIUL
eMIOS_1
—
ADC
SIUL
eMIOS_1
DSPI_2
ADC
SIUL
eMIOS_1
DSPI_2
ADC
SIUL
—
JTAGC
—
SIUL
—
JTAGC
—
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
(3)
LQFP144
LBGA208
8. Be aware that this pad is used on the SPC560B64L3 and SPC560B64L5 to provide VDD_HV_ADC and VSS_HV_ADC1. Therefore, you should be careful in ensuring
compatibility between SPC560B40x/50x and SPC560C40x/50x and SPC560B64.
9. Out of reset all the functional pins except PC[0:1] and PH[9:10] are available to the user as GPIO.
PC[0:1] are available as JTAG pins (TDI and TDO respectively).
PH[9:10] are available as JTAG pins (TCK and TMS respectively).
If the user configures these JTAG pins in GPIO mode the device is no longer compliant with IEEE 1149.1-2001.
10. The TDO pad has been moved into the STANDBY domain in order to allow low-power debug handshaking in STANDBY mode. However, no pull-resistor is active on the
TDO pad while in STANDBY mode. At this time the pad is configured as an input. When no debugger is connected the TDO pad is floating causing additional current
consumption. To avoid the extra consumption TDO must be connected. An external pull-up resistor in the range of 47–100 kΩ should be added between the TDO pin and
VDD. Only in case the TDO pin is used as application pin and a pull-up cannot be used then a pull-down resistor with the same value should be used between TDO pin and
GND instead.
11. Available only on SPC560Cx versions and SPC560B50B2 devices.
12. Not available on SPC560B40L3 and SPC560B40L5 devices.
13. Not available in 100 LQFP package.
14. Available only on SPC560B50B2 devices.
15. Not available on SPC560B44L3 devices.
Doc ID 14619 Rev 941/117
SPC560B40x/50x, SPC560C40x/50xPackage pinouts and signal descriptions
Package pinouts and signal descriptionsSPC560B40x/50x, SPC560C40x/50x
3.7 Nexus 2+ pins
In the LBGA208 package, eight additional debug pins are available (see Tab le 7 ).
Table 7.Nexus 2+ pin descriptions
Debug
pin
MCKOMessage clock outOF———T4
MDO0Message data out 0OM———H15
MDO1Message data out 1OM———H16
MDO2Message data out 2OM———H14
MDO3Message data out 3OM———H13
EVTIEvent inIMPull-up——K1
EVTOEvent outOM———L4
MSEOMessage start/end outOM———G16
1. LBGA208 available only as development package for Nexus2+.
This section contains electrical characteristics of the device as well as temperature and
power considerations.
This product contains devices to protect the inputs against damage due to high static
voltages. However, it is advisable to take precautions to avoid applying any voltage higher
than the specified maximum rated voltages.
To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (V
or V
). This could be done by the internal pull-up and pull-down, which is provided by the
SS
product for most general purpose pins.
The parameters listed in the following tables represent the characteristics of the device and
its demands on the system.
In the tables where the device logic provides signals with their respective timing
characteristics, the symbol “CC” for Controller Characteristics is included in the Symbol
column.
In the tables where the external system must provide signals with their respective timing
characteristics to the device, the symbol “SR” for System Requirement is included in the
Symbol column.
Caution:All LQFP64 information is indicative and must be confirmed during silicon validation.
4.2 Parameter classification
The electrical parameters shown in this supplement are guaranteed by various methods. To
give the customer a better understanding, the classifications listed in Ta bl e 8 are used and
the parameters are tagged accordingly in the tables where appropriate.
Table 8.Parameter classifications
Classification tagTag description
DD
PThose parameters are guaranteed during production testing on each individual device.
C
T
DThose parameters are derived mainly from simulations.
Those parameters are achieved by the design characterization by measuring a statistically
relevant sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical
devices under typical conditions unless otherwise noted. All values shown in the typical
column are within this category.
Note:The classification is shown in the column labeled “C” in the parameter tables where
Bit values in the Non-Volatile User Options (NVUSRO) Register control portions of the
device configuration, namely electrical parameters such as high voltage supply and
oscillator margin, as well as digital functionality (watchdog enable/disable after reset).
For a detailed description of the NVUSRO register, please refer to the device reference
manual.
4.3.1 NVUSRO[PAD3V5V] field description
The DC electrical characteristics are dependent on the PAD3V5V bit value. Ta bl e 9 shows
how NVUSRO[PAD3V5V] controls the device configuration.
Table 9.PAD3V5V field description
(1)
Value
0High voltage supply is 5.0 V
1High voltage supply is 3.3 V
1. Default manufacturing value is ‘1’. Value can be programmed by customer in Shadow Flash.
Description
4.3.2 NVUSRO[OSCILLATOR_MARGIN] field description
The fast external crystal oscillator consumption is dependent on the
OSCILLATOR_MARGIN bit value. Ta bl e 1 0 shows how NVUSRO[OSCILLATOR_MARGIN]
controls the device configuration.
Table 10.OSCILLATOR_MARGIN field description
(1)
Value
0Low consumption configuration (4 MHz/8 MHz)
1High margin configuration (4 MHz/16 MHz)
1. Default manufacturing value is ‘1’. Value can be programmed by customer in Shadow Flash.
Description
4.3.3 NVUSRO[WATCHDOG_EN] field description
The watchdog enable/disable configuration after reset is dependent on the
WATCHDOG_EN bit value. Tab le 1 1 shows how NVUSRO[WATCHDOG_EN] controls the
device configuration.
Table 11.WATCHDOG_EN field description
(1)
Value
Description
0Disable after reset
1Enable after reset
1. Default manufacturing value is ‘1’. Value can be programmed by customer in Shadow Flash.
Note:Stresses exceeding the recommended absolute maximum ratings may cause permanent
damage to the device. This is a stress rating only and functional operation of the device at
these or any other conditions above those indicated in the operational sections of this
specification are not implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability. During overload conditions (V
the voltage on pins with respect to ground (V
1. 100 nF capacitance needs to be provided between each VDD/VSS pair.
2. 330 nF capacitance needs to be provided between each V
3. 400 nF capacitance needs to be provided between V
depending on external regulator characteristics).
4. 100 nF capacitance needs to be provided between V
5. Full electrical specification cannot be guaranteed when voltage drops below 3.0 V. In particular, ADC electrical
characteristics and I/Os DC electrical specification may not be guaranteed. When voltage drops below V
reset.
6. Guaranteed by device validation.
SR Digital ground on VSS_HV pins—00V
Voltage on VDD_HV pins with respect to ground
(2)
(3)
(4)
SR
SR
SR
SR
SR
SR
SR
SR
)
(V
SS
Voltage on VSS_LV (low voltage digital supply)
pins with respect to ground (V
Voltage on VDD_BV pin (regulator supply) with
respect to ground (V
SS
)
Voltage on VSS_HV_ADC (ADC reference) pin
with respect to ground (V
Voltage on VDD_HV_ADC pin (ADC reference)
with respect to ground (V
Voltage on any GPIO pin with respect to ground
)
(V
SS
Injected input current on any pin during overload
condition
Absolute sum of all injected input currents during
overload condition
1. 100 nF capacitance needs to be provided between each VDD/VSS pair.
2. Full device operation is guaranteed by design when the voltage drops below 4.5 V down to 3.0 V. However, certain analog
electrical characteristics will not be guaranteed to stay within the stated limits.
3. 330 nF capacitance needs to be provided between each V
4. 100 nF capacitance needs to be provided between V
depending on external regulator characteristics).
5. 100 nF capacitance needs to be provided between V
3. Junction-to-ambient thermal resistance determined per JEDEC JESD51-3 and JESD51-6. Thermal test board meets
JEDEC specification for this package.
4. Junction-to-board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification for
the specified package.
5. Junction-to-case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is
used for the case temperature. Reported value includes the thermal resistance of the interface layer.
4.6.2 Power considerations
The average chip-junction temperature, TJ, in degrees Celsius, may be calculated using
Equation 1:
Equation 1 T
= TA + (PD x R
J
θJA
)
Where:
T
is the ambient temperature in °C.
A
R
is the package junction-to-ambient thermal resistance, in °C/W.
θJA
P
is the sum of P
D
P
is the product of I
INT
INT
and P
and VDD, expressed in watts. This is the chip internal
DD
I/O (PD
= P
INT
+ P
I/O
).
power.
P
represents the power dissipation on input and output pins; user determined.
I/O
Most of the time for the applications, P
P
may be significant, if the device is configured to continuously drive external modules
I/O
I/O< PINT
and may be neglected. On the other hand,
and/or memories.
An approximate relationship between P
Equation 2 P
= K / (TJ + 273 °C)
D
and TJ (if P
D
is neglected) is given by:
I/O
Therefore, solving equations Equation 1 and Equation 2:
Equation 3 K = P
x (TA + 273 °C) + R
D
θJA
x P
2
D
Where:
K is a constant for the particular part, which may be determined from Equation 3
by measuring P
of P
and TJ may be obtained by solving equations Equation 1 and Equation 2
D
iteratively for any value of T
(at equilibrium) for a known TA. Using this value of K, the values
Ta bl e 2 4 provides the weight of concurrent switching I/Os.
Due to the dynamic current limitations, the sum of the weight of concurrent switching I/Os on
a single segment must not exceed 100% to ensure device functionality.
4.9.1 Voltage regulator electrical characteristics
The device implements an internal voltage regulator to generate the low voltage core supply
V
common I/O supply V
●HV—High voltage external power supply for voltage regulator module. This must be
●BV—High voltage external power supply for internal ballast module. This must be
●LV—Low voltage internal power supply for core, FMPLL and flash digital logic. This is
from the high voltage ballast supply V
DD_LV
. The following supplies are involved:
DD
provided externally through V
provided externally through V
V
.
DD
power pin.
DD
power pin. Voltage values should be aligned with
DD_BV
. The regulator itself is supplied by the
DD_BV
generated by the internal voltage regulator but provided outside to connect stability
capacitor. It is further split into four main domains to ensure noise isolation between
critical LV modules within the device:
–LV_COR—Low voltage supply for the core. It is also used to provide supply for
FMPLL through double bonding.
–LV_CFLA—Low voltage supply for code flash module. It is supplied with dedicated
ballast and shorted to LV_COR through double bonding.
–LV_DFLA—Low voltage supply for data flash module. It is supplied with dedicated
ballast and shorted to LV_COR through double bonding.
–LV_PLL—Low voltage supply for FMPLL. It is shorted to LV_COR through double
The internal voltage regulator requires external capacitance (C
DD_LV
REGn
V
DD_LV
DEVICE
C
DEC2
V
DD
V
SS
(supply/IO decoupling)(LV_COR/LV_PLL)
) to be connected to the
device in order to provide a stable low voltage digital supply to the device. Capacitances
should be placed on the board as near as possible to the associated pins. Care should also
be taken to limit the serial inductance of the board to less than 5 nH.
Each decoupling capacitor must be placed between each of the three V
pairs to ensure stable voltage (see Section 4.5: Recommended operating conditions).
The internal voltage regulator requires controlled slew rate of V
When STANDBY mode is used, further constraints apply to the V
guarantee correct regulator functionality during STANDBY exit. This is described on
Figure 11.
STANDBY regulator constraints should normally be guaranteed by implementing equivalent
of CSTDBY capacitance on application board (capacitance and ESR typical values), but
would actually depend on exact characteristics of application external regulator.
maximum slope
DD_BV
d
VDD
td
POWER UPPOWER DOWN
FUNCTIONAL RANGE
DD/VDD_BV
in order to
Figure 11. VDD and VDD_BV supply constraints during STANDBY mode exit
1. VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified.
2. This capacitance value is driven by the constraints of the external voltage regulator supplying the V
value is in the range of 470 nF.
3. This value is acceptable to guarantee operation from 4.5 V to 5.5 V.
4. External regulator and capacitance circuitry must be capable of providing I
operating range.
5. In-rush average current is seen only for short time (maximum 20 µs) during power-up and on standby exit. It is dependant
on the sum of the C
6. The duration of the in-rush current depends on the capacitance placed on LV pins. BV decoupling capacitors must be sized
accordingly. Refer to I
SR —
CC D
CC D
The |Δ
component used for the V
Ultra low power regulator current
provided to V
Ultra low power regulator module
current consumption
DD_LV
domain
I
ULPREG
TA = 55 °C
I
ULPREG
TA = 55 °C
In-rush average current on
V
capacitances.
REGn
MREG
VDD(STDBY)
during power-up
DD_BV
value for minimum amount of current to be provided in cc.
| and dVDD(STDBY)/dt system requirement can be used to define the
DD
(5)
supply generation. The following two examples describe how to
———5mA
= 5 mA;
= 0 mA;
———
while maintaining supply V
DD_BV
——
2—
—
voltage. A typical
DD_BV
DD_BV
100
300
(6)
in
calculate capacitance size:
µA
mA
Example 1 No regulator (worst case)
The |Δ
VDD(STDBY)
resistance of the regulator stability capacitor when the I
V
domain during the standby exit. It is thus possible to define the maximum equivalent
DD_LV
resistance ESR
ESR
STDBY
The dVDD(STDBY)/dt parameter can be seen as the V
pin (excluding ESR drop) while providing the I
| parameter can be seen as the V
(MAX) of the total capacitance on the V
STDBY
(MAX) = |Δ
VDD(STDBY)
|/I
DD_BV
voltage drop through the ESR
DD
current required to load
DD_BV
supply:
DD
= (30 mV)/(300 mA) = 0.1Ω
voltage drop at the capacitance
DD
supply required to load V
DD_BV
(d)
DD_LV
domain
during the standby exit. It is thus possible to define the minimum equivalent capacitance
C
C
(MIN) of the total capacitance on the V
STDBY
STDBY
(MIN) = I
/dVDD(STDBY)/dt = (300 mA)/(15 mV/µs) = 20 µF
DD_BV
DD
supply:
This configuration is a worst case, with the assumption no regulator is available.
Example 2 Simplified regulator
The regulator should be able to provide significant amount of the current during the standby
exit process. For example, in case of an ideal voltage regulator providing 200 mA current, it
is possible to recalculate the equivalent ESR
d. Based on typical time for standby exit sequence of 20 µs, ESR(MIN) can actually be considered at ~50 kHz.
based on the regulator characteristics as well as the board V
4.9.2 Low voltage detector electrical characteristics
The device implements a Power-on Reset (POR) module to ensure correct power-up
initialization, as well as four low voltage detectors (LVDs) to monitor the V
voltage while device is supplied:
●POR monitors V
reset state (refer to RGM Destructive Event Status (RGM_DES) Register flag F_POR
in device reference manual)
●LVDHV3 monitors V
to RGM Destructive Event Status (RGM_DES) Register flag F_LVD27 in device
reference manual)
●LVDHV5 monitors V
RGM Functional Event Status (RGM_FES) Register flag F_LVD45 in device reference
manual)
●LVDLVCOR monitors power domain No. 1 (refer to RGM Destructive Event Status
(RGM_DES) Register flag F_LVD12_PD1 in device reference manual
●LVDLVBKP monitors power domain No. 0 (refer to RGM Destructive Event Status
(RGM_DES) Register flag F_LVD12_PD0 in device reference manual)
during the power-up phase to ensure device is maintained in a safe
DD
to ensure device reset below minimum functional supply (refer
DD
when application uses device in the 5.0 V ± 10% range (refer to
DD
(MAX) should be calculated
plane characteristics.
DD
and the V
DD
DD_LV
Note:When enabled, power domain No. 2 is monitored through LVDLVBKP.
Table 28.Power consumption on VDD_BV and VDD_HV (continued)
Value
SymbolCParameterConditions
(1)
MinTypMax
P
DT
I
DDSTDBY2
CC
STANDBY2 mode
DT
current
(9)
Slow internal RC oscillator
(128 kHz) running
DT
PT
T
DT
I
DDSTDBY1
CC
current
(10)
STANDBY1 mode
DT
Slow internal RC oscillator
(128 kHz) running
DT
DT
1. VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified.
2. --------Running consumption does not include I/Os toggling which is highly dependent on the application. The given value is
thought to be a worst case value with all peripherals running, and code fetched from code flash while modify operation
ongoing on data flash. Notice that this value can be significantly reduced by application: switch off not used peripherals
(default), reduce peripheral frequency through internal prescaler, fetch from RAM most used functions, use low power
mode when possible.
3. Higher current may be sinked by device during power-up and standby exit. Please refer to in rush current on Table 26.
4. RUN current measured with typical application with accesses on both flash and RAM.
5. Only for the “P” classification: Data and Code Flash in Normal Power. Code fetched from RAM: Serial IPs CAN and LIN in
loop back mode, DSPI as Master, PLL as system Clock (4 x Multiplier) peripherals on (eMIOS/CTU/ADC) and running at
max frequency, periodic SW/WDG timer reset enabled.
6. Data Flash Power Down. Code Flash in Low Power. SIRC (128 kHz) and FIRC (16 MHz) on. 10 MHz XTAL clock.
FlexCAN: instances: 0, 1, 2 ON (clocked but not reception or transmission), instances: 4, 5, 6 clock gated. LINFlex:
instances: 0, 1, 2 ON (clocked but not reception or transmission), instance: 3 clock gated. eMIOS: instance: 0 ON (16
channels on PA[0]–PA[11] and PC[12]–PC[15]) with PWM 20 kHz, instance: 1 clock gated. DSPI: instance: 0 (clocked but
no communication). RTC/API ON. PIT ON. STM ON. ADC ON but not conversion except 2 analog watchdog.
7. Only for the “P” classification: No clock, FIRC (16 MHz) off, SIRC (128 kHz) on, PLL off, HPvreg off, ULPVreg/LPVreg on.
All possible peripherals off and clock gated. Flash in power down mode.
8. When going from RUN to STOP mode and the core consumption is > 6 mA, it is normal operation for the main regulator
module to be kept on by the on-chip current monitoring circuit. This is most likely to occur with junction temperatures
exceeding 125 °C and under these circumstances, it is possible for the current to initially exceed the maximum STOP
specification by up to 2 mA. After entering stop, the application junction temperature will reduce to the ambient level and
the main regulator will be automatically switched off when the load current is below 6 mA.
9. Only for the “P” classification: ULPreg on, HP/LPVreg off, 32 KB RAM on, device configured for minimum consumption, all
possible modules switched off.
10. ULPreg on, HP/LPVreg off, 8 KB RAM on, device configured for minimum consumption, all possible modules switched off.
= 25 °C—30100
T
A
=55°C—75—
A
= 85 °C—180700
A
= 105 °C—3151000
A
= 125 °C—5601700
A
T
= 25 °C—2060
A
=55°C—45—
A
= 85 °C—100350
A
= 105 °C—165500
A
= 125 °C—280900
A
Unit
µA
µA
4.11 Flash memory electrical characteristics
4.11.1 Program/Erase characteristics
Ta bl e 2 9 shows the program and erase characteristics.
3. The maximum program and erase times occur after the specified number of program/erase cycles. These maximum values
are characterized but not guaranteed.
4. Actual hardware programming times. This does not include software overhead.
Table 30.Flash module life
Double word (64 bits) program time
16 KB block preprogram and erase time—3005005000ms
CC C
32 KB block preprogram and erase time—4006005000ms
128 KB block preprogram and erase time—80013007500ms
CC D Erase suspend latency——3030µs
(4)
—2250500µs
(1)
Initial
max
(2)
Max
(3)
Value
SymbolCParameterConditions
Unit
MinTypMax
Unit
Number of program/erase cycles
P/ECC C
Retention CC C
1. Ambient temperature averaged over duration of application, not to exceed recommended product operating temperature
range.
per block over the operating
temperature range (T
)
J
Minimum data retention at 85 °C
average ambient temperature
16 KB blocks100000——
128 KB blocks1000100000—
Blocks with
0–1000 P/E cycles
Blocks with
(1)
1001–10000 P/E cycles
Blocks with
10001–100000 P/E cycles
20——
10——
5——
ECC circuitry provides correction of single bit faults and is used to improve further
automotive reliability results. Some units will experience single bit corrections throughout
the life of the product with no impact to product reliability.
Table 31.Flash read access timing
SymbolCParameterConditions
f
READ
CC
P
Maximum frequency for Flash reading
2 wait states64
C0 wait states20
(1)
MaxUnit
cycles32 KB blocks10000 100000—
years
MHzC1 wait state40
1. VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified.
Susceptibility tests are performed on a sample basis during product characterization.
4.12.1 Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user apply EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
●Software recommendations: The software flowchart must include the management of
runaway conditions such as:
–Corrupted program counter
–Unexpected reset
–Critical data corruption (control registers...)
●Prequalification trials: Most of the common failures (unexpected reset and program
counter corruption) can be reproduced by manually forcing a low state on the reset pin
or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When
unexpected behavior is detected, the software can be hardened to prevent
unrecoverable errors occurring (see application note Software Techniques For Improving Microcontroller EMC Performance (AN1015)).
The product is monitored in terms of emission based on a typical application. This emission
test conforms to the IEC 61967-1 standard, which specifies the general conditions for EMI
measurements.
Table 34.EMI radiated emission measurement
Symbol CParameterConditions
—SR — Scan range—0.150—1000 MHz
SR — Operating frequency——64—MHz
f
CPU
V
1. EMI testing and I/O port waveforms per IEC 61967-1, -2, -4.
2. For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your local
SR — LV operating voltages——1.28—V
DD_LV
= 5V, TA=25°C,
V
DD
S
CC T Peak level
EMI
marketing representative.
LQFP144 package
Test conforming to IEC 61967-2,
= 8 MHz/f
f
OSC
= 64 MHz
CPU
(1)(2)
No PLL frequency
modulation
±2% PLL frequency
modulation
Value
Unit
MinTyp Max
——18 dBµV
——14 dBµV
4.12.3 Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test
conforms to the AEC-Q100-002/-003/-011 standard. For more details, refer to the
application note Electrostatic Discharge Sensitivity Measurement (AN1181).
Table 35.ESD absolute maximum ratings
Symbol CRatingsConditionsClassMax valueUnit
V
ESD(HBM)
V
ESD(MM)
V
ESD(CDM)
1. All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits.
2. A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device specification
requirements. Complete DC parametric and functional testing shall be performed per applicable device specification at
room temperature followed by hot temperature, unless specified otherwise in the device specification.
Two complementary static tests are required on six parts to assess the latch-up
performance:
●A supply overvoltage is applied to each power supply pin.
●A current injection is applied to each input, output and configurable I/O pin.
These tests are compliant with the EIA/JESD 78 IC latch-up standard.
Table 36.Latch-up results
SymbolCParameterConditionsClass
T
= 125 °C
LUCCT Static latch-up class
A
conforming to JESD 78
II level A
4.13 Fast external crystal oscillator (4 to 16 MHz) electrical
characteristics
The device provides an oscillator/resonator driver. Figure 13 describes a simple model of
the internal oscillator driver and provides an example of a connection for an oscillator or a
resonator.
Ta bl e 3 7 provides the parameter description of 4 MHz to 16 MHz crystals used for the
Figure 13. Crystal oscillator and resonator connection scheme
EXTAL
C1
EXTAL
Crystal
XTAL
V
DD
I
R
DEVICE
C2
DEVICE
Notes:
1. XTAL/EXTAL must not be directly used to drive external circuits
2. A series resistor may be required, according to crystal oscillator supplier recommendations.
Table 37.Crystal description
Nominal
frequency
(MHz)
NDK crystal
reference
4NX8045GB3002.68591.0212.93
8
XTAL
EXTAL
Resonator
XTAL
DEVICE
Crystal
equivalent
series
resistance
ESR Ω
Crystal
motional
capacitance
) fF
(C
m
Crystal
motional
inductance
(Lm) mH
Load on
xtalin/xtalout
C1 = C2
(1)
(pF)
3002.46160.7173.01
Shunt
capacitance
between
xtalout
and xtalin
(2)
(pF)
C0
101502.9386.6152.91
121203.1156.5152.93
NX5032GA
161203.9025.3103.00
1. The values specified for C1 and C2 are the same as used in simulations. It should be ensured that the testing includes all
the parasitics (from the board, probe, crystal, etc.) as the AC / transient behavior depends upon them.
2. The value of C0 specified here includes 2 pF additional capacitance for parasitics (to be seen with bond-pads, package,
etc.).
1. VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified. Values are specified for no neighbor
GPIO pin activity. If oscillator is enabled (OSC32K_XTAL and OSC32K_EXTAL pins), neighboring pins should not toggle.
2. Start-up time has been measured with EPSON TOYOCOM MC306 crystal. Variation may be seen with other crystal.
SR — Slow external crystal oscillator frequency—3232.76840kHz
CC T Oscillation amplitude——2.1—V
CC T Oscillation bias current——2.5—µA
CC T
CC T Slow external crystal oscillator start-up time———2
Slow external crystal oscillator
consumption
———8µA
(2)
4.15 FMPLL electrical characteristics
The device provides a frequency-modulated phase-locked loop (FMPLL) module to
generate a fast system clock from the main oscillator driver.
1. VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified.
2. PLLIN clock retrieved directly from FXOSC clock. Input characteristics are granted when oscillator is used in functional
mode. When bypass mode is used, oscillator input clock should verify f
3. Frequency modulation is considered ±4%.
4. Short term jitter is measured on the clock rising edge at cycle n and n+4.
frequency modulation
CC
VCO frequency with frequency
C
modulation
SR — System clock frequency———64MHz
CC P Free-running frequency—20—150MHz
CC P FMPLL lock timeStable oscillator (f
CC — FMPLL short term jitter
CC — FMPLL long term jitter
(4)
f
maximum –4—4%
sys
= 16 MHz (resonator),
f
PLLIN
f
@ 64 MHz, 4000 cycles
PLLCLK
CC C FMPLL consumptionTA = 25 °C——4mA
—256—512
—245—533
= 16 MHz)—40100µs
PLLIN
——10ns
PLLIN
and Δ
PLLIN
.
Unit
MHz
4.16 Fast internal RC oscillator (16 MHz) electrical characteristics
The device provides a 16 MHz fast internal RC oscillator. This is used as the default clock at
the power-up of the device.
To preserve the accuracy of the A/D converter, it is necessary that analog input pins have
low AC impedance. Placing a capacitor with good high frequency characteristics at the input
pin of the device can be effective: the capacitor should be as large as possible, ideally
infinite. This capacitor contributes to attenuating the noise present on the input pin;
furthermore, it sources charge during the sampling phase, when the analog signal source is
a high-impedance source.
A real filter can typically be obtained by using a series resistance with a capacitor on the
input pin (simple RC filter). The RC filtering may be limited according to the value of source
impedance of the transducer or circuit supplying the analog signal to be measured. The filter
at the input pins must be designed taking into account the dynamic characteristics of the
input signal (bandwidth) and the equivalent input impedance of the ADC itself.
In fact a current sink contributor is represented by the charge sharing effects with the
sampling capacitance: C
being substantially a switched capacitance, with a frequency
S
equal to the conversion rate of the ADC, it can be seen as a resistive path to ground. For
instance, assuming a conversion rate of 1 MHz, with C
330 kΩ is obtained (R
= 1 / (fc*CS), where fc represents the conversion rate at the
EQ
equal to 3 pF, a resistance of
S
considered channel). To minimize the error induced by the voltage partitioning between this
resistance (sampled voltage on C
) and the sum of RS + RF + RL + RSW + RAD, the external
S
circuit must be designed to respect the Equation 4:
A second aspect involving the capacitance network shall be considered. Assuming the three
capacitances C
, CP1 and C
F
are initially charged at the source voltage VA (refer to the
P2
equivalent circuit in Figure 19): A charge sharing phenomenon is installed when the
sampling phase is started (A/D switch close).
Figure 21. Transient behavior during sampling phase
V
CS
V
A
V
A2
V
A1
Voltage transient on C
1
2
S
t
s
ΔV < 0.5 LSB
τ1 < (RSW + RAD) CS << t
τ2 = RL (CS + CP1 + CP2)
t
s
In particular two different transient periods can be distinguished:
1.A first and quick charge transfer from the internal capacitance C
sampling capacitance C
occurs (CS is supposed initially completely discharged):
S
and CP2 to the
P1
considering a worst case (since the time constant in reality would be faster) in which
C
is reported in parallel to C
P2
C
are in series, and the time constant is
S
(call CP = CP1 + CP2), the two capacitances CP and
P1
Equation 5
CPC
•
τ
R
1
+()=
SWRAD
--------------------- -
•
CPCS+
S
Equation 5 can again be simplified considering only CS as an additional worst
condition. In reality, the transient is faster, but the A/D converter circuitry has been
designed to be robust also in the very worst case: the sampling time t
longer than the internal time constant:
Equation 6
τ1R
The charge of C
voltage V
86/117Doc ID 14619 Rev 9
A1
and CP2 is redistributed also on CS, determining a new value of the
2. A second charge transfer involves also C
capacitance) through the resistance R
and C
were in parallel to CP1 (since the time constant in reality would be faster), the
S
(that is typically bigger than the on-chip
F
: again considering the worst case in which CP2
L
time constant is:
Equation 8
τ2R
<C
L
++()•
SCP1CP2
In this case, the time constant depends on the external circuit: in particular imposing
that the transient is completed well before the end of sampling time t
R
sizing is obtained:
L
, a constraints on
s
Equation 9
10 τ
•10 R
2
Of course, R
combination with R
definitively bigger than C
shall be sized also according to the current limitation constraints, in
L
(source impedance) and RF (filter resistance). Being CF
S
, CP2 and CS, then the final voltage V
P1
charge transfer transient) will be much higher than V
(charge balance assuming now C
CSC
L
already charged at VA1):
S
++()••=t
P1CP2
. Equation 10 must be respected
A1
<
s
(at the end of the
A2
Equation 10
V
A2CSCP1CP2CF
+++()•VAC
•V
+CP1CP2+C
F
A1
+()•=
S
The two transients above are not influenced by the voltage source that, due to the presence
of the R
C
with respect to the ideal source VA; the time constant RFCF of the filter is very high with
S
respect to the sampling time (t
filter, is not able to provide the extra charge to compensate the voltage drop on
FCF
). The filter is typically designed to act as anti-aliasing.
s
Figure 22. Spectral representation of input signal
Calling f0 the bandwidth of the source signal (and as a consequence the cut-off frequency of
the anti-aliasing filter, f
least 2f
; it means that the constant time of the filter is greater than or at least equal to twice
0
the conversion period (t
), according to the Nyquist theorem the conversion rate fC must be at
F
). Again the conversion period tc is longer than the sampling time ts,
c
which is just a portion of it, even when fixed channel continuous conversion mode is
selected (fastest conversion rate at a specific channel): in conclusion it is evident that the
time constant of the filter R
charge level on C
cannot be modified by the analog signal source during the time in which
S
is definitively much higher than the sampling time ts, so the
FCF
the sampling switch is closed.
The considerations above lead to impose new constraints on the external circuit, to reduce
the accuracy error due to the voltage drop on C
above, it is simple to derive Equation 11 between the ideal and real sampled voltage on C
; from the two charge balance equations
S
S
Equation 11
V
A2
----------- V
A
C
+C
P1CP2
------------------------------------------------------- -=
C
+CFC
P1CP2
+
F
++
S
:
From this formula, in the worst case (when V
assuming to accept a maximum error of half a count, a constraint is evident on C
1. VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified.
2. Analog and digital V
3. V
4. Duty cycle is ensured by using system clock without prescaling. When ADCLKSEL = 0, the duty cycle is ensured by internal
5. During the sampling time the input capacitance C
6. This parameter does not include the sampling time t
7. Total Unadjusted Error: The maximum error that occurs without adjusting Offset and Gain errors. This error is a
may exceed V
AINx
will be clamped respectively to 0x000 or 0x3FF.
divider by 2.
resistance of the analog source must allow the capacitance to reach its final voltage level within ts. After the end of the
sampling time ts, changes of the analog input voltage have no effect on the conversion result. Values for the sample clock
t
depend on programming.
s
the result’s register with the conversion result.
combination of Offset, Gain and Integral Linearity errors.
Total unadjusted error
for extended channel
TWith current injection−44
must be common (to be tied together externally).
SS
and V
SS_ADC
7
Without current injection−31 3
limits, remaining on absolute maximum ratings, but the results of the conversion
DD_ADC
can be charged/discharged by the external source. The internal
S
, but only the time for determining the digital result and the time to load
2. Maximum value is reached when CSn pad is configured as SLOW pad while SCK pad is configured as MEDIUM. A positive value means that SCK starts before CSn is
asserted. DSPI2 has only SLOW SCK available.
3. Maximum value is reached when CSn pad is configured as MEDIUM pad while SCK pad is configured as SLOW. A positive value means that CSn is deasserted before
SCK. DSPI0 and DSPI1 have only MEDIUM SCK available.
4. The t
5. The t
6. This delay value corresponds to SMPL_PT = 00b which is bit field 9 and 8 of the DSPI_MCR.
7. SCK and SOUT configured as MEDIUM pad.
CSC
and internal SCK must be higher than Δt
ASC
internal SCK must be higher than Δt
SR D Data hold time for inputs
HI
(7)
CC D Data valid after SCK edge
Slave mode2
Master mode——32——50
Slave mode——52——160
(7)
CC D Data hold time for outputs
Master mode0——0——
Slave mode8——13——
= 10 to 50 pF, SlewIN = 3.5 to 15 ns.
L
delay value is configurable through a register. When configuring t
delay value is configurable through a register. When configuring t
to ensure positive t
CSC
to ensure positive t
ASC
ASCext
CSCext
.
.
(6)
(using PCSSCK and CSSCK fields in DSPI_CTARx registers), delay between internal CS
CSC
(using PASC and ASC fields in DSPI_CTARx registers), delay between internal CS and