ST M74HCT7007 User Manual

M74HCT7007
HEX BUFFER
HIGH SPEED:
t
= 14ns (TYP.) at VCC=4.5V
PD
LOW POWER DISSIPATION:
I
= 1µA(MAX.) at TA=25°C
CC
COMPA TIBLE WITH TTL OUTPUTS :
V
= 2V (MIN.) VIL = 0.8V (MAX)
IH
BALANCED PROPAGATION DELAYS:
t
t
PLH
SYMMETRICAL OUTPUT IMPEDANCE:
|I
OH
PIN AND FUNCTION COMPATIBLE WITH
PHL
| = IOL = 4mA (MIN)
74 SERIES 7007
DESCRIPTION
The M74HCT7007 is an high speed CMOS HEX BUFFER fabricated with silicon gate C
2
MOS technology. All inputs are equipped with protection circuits against static discharge and transient excess voltage.
TSSOPDIP SOP
ORDER CODES
PACK. TUBE T & R
DIP M74HCT7007B1R
SOP M74HCT7007M1R M74HCT7007RM13TR
TSSOP M74HCT7007TTR
The M74HCT7007 is designed to directly interface
2
HSC
MOS systems with TTL and NMOS
components.
PIN CONNECTION AND IEC LOGIC SYMBOLS
1/8September 2001
M74HCT7007
INPUT AND OUTPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
PIN No SYMBOL NAME AND FUNCTION
1, 3, 5, 9, 1 1,
13
2, 4, 6, 8, 10,
12
7 GND Ground (0V)
14
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
V
V
I
I
OK
I
I
or I
CC
P
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is not implied (*) 500mW at 65
Supply Voltage
CC
DC Input Voltage -0.5 to VCC + 0.5
I
DC Output Voltage -0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current DC Output Current
O
DC VCC or Ground Current
GND
Power Dissipation
D
Storage Temperature
stg
Lead Temperature (10 sec)
L
°C; derate to 300mW by 10 m W/°C from 65 °C to 85°C
1A to 6A Data Inputs
1Y to 6Y Data Outputs
V
CC
Positive Supply Voltage
AY
LL
HH
-0.5 to +7 V V V
± 20 mA ± 20 mA ± 25 mA ± 50 mA
500(*) mW
-65 to +150 °C
300 °C
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Value Unit
2/8
V
V
V T t
r
Supply Voltage
CC
Input Voltage 0 to V
I
Output Voltage 0 to V
O
Operating Temperature
op
, t
Input Rise and Fall Time (VCC = 4.5 to 5.5V)
f
4.5 to 5.5 V
CC CC
-55 to 125 °C 0 to 500 ns
V V
DC SPECIFICATIONS
Symbol Parameter
V
V
V
V
I
I
High Level Input
IH
Voltage
Low Level Input
IL
Voltage
High Level Output
OH
Voltage Low Level Output
OL
Voltage
I
Input Leakage
I
Current Quiescent Supply
CC
Current Additional Worst
CC
Case Supply Current
Test Condition Value
T
= 25°C
V
CC
(V)
A
Min. Typ. Max. Min. Max. Min. Max.
4.5 to
2.0 2.0 2.0 V
5.5
4.5 to
0.8 0.8 0.8 V
5.5
4.5
4.5
5.5
5.5
IO=-20 µA
I
=-4.0 mA
O
IO=20 µA
I
=4.0 mA
O
= VCC or GND
V
I
= VCC or GND
V
I
5.5 Per Input pin
V
= 0.5V or
I
V
= 2.4V
I
4.4 4.5 4.4 4.4
4.18 4.31 4.13 4.10
0.0 0.1 0.1 0.1
0.17 0.26 0.33 0.40 ± 0.1 ± 1 ± 1 µA
2.0 2.9 3.0 mA
Other Inputs at
V
or GND
CC
I
= 0
O
M74HCT7007
-40 to 85°C -55 to 125°C
11020µA
Unit
V
V
AC ELECTRICAL CHARACTERISTICS (C
= 50 pF, Input tr = tf = 6ns)
L
Test Condition Value
Symbol Parameter
t
TLH tTHL
t
PLH tPHL
Output Transition Time
Propagation Delay Time
= 25°C
V
CC
(V)
A
Min. Typ. Max. Min. Max. Min. Max.
4.5 8151923ns
4.5 14 23 29 35 ns
-40 to 85°C -55 to 125°C
Unit
T
CAPACITIVE CHARACTERISTICS
Test Condition Value
T
Symbol Parameter
C
C
Input Capacitance
IN
Power Dissipation
PD
Capacitance (note
V
CC
(V)
= 25°C
A
Min. Typ. Max. Min. Max. Min. Max.
5101010pF
22 pF
1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
-40 to 85°C -55 to 125°C
= CPD x VCC x fIN + ICC/6 (per buffer)
CC(opr)
Unit
3/8
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