This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.
1/38
M59DR032A, M59DR032B
Figure 2A. FBGA Connections (Top View)
87654321
A
B
C
D
E
F
A13
A14
DDQ
SS
Figure 2B. TSOP Connections
A15
1
A14
A13
A12
A11
A10DQ14
A9
A8
NC
A20
W
RP
12
M59DR032A
V
WP
A19
A18
A17
PP
A7
A6
A5
A4
A3
A2
A1
M59DR032B
13
2425
AI02533B
48
37
36
A8A11
DQ7V
DQ13
PP
RPA18
DQ11
DQ12
DQ4
WPA19
DQ2
DD
A7V
A5A17WA10
DQ0DQ9DQ3DQ6DQ15V
DQ1DQ10V
A4
A2
A1A3A6A20DUA9A12A15
A0EDQ8DQ5DQ14A16
V
SS
G
AI02532C
Table 1. Signal Names
A0-A20Address Inputs
A16
V
DDQ
V
SS
DQ15
DQ7
DQ6
DQ13
DQ5
DQ12
DQ4
V
DD
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
G
V
SS
E
A0
DQ0-DQ15Data Input/Outputs, Command Inputs
E
G
W
RP
WP
V
V
V
V
DD
DDQ
PP
SS
Chip Enable
Output Enable
Write Enable
Reset/Power Down
Write Protect
Circuitry Supp ly Voltage
Input/Output Buffers Supply Voltage
Optional Supply Voltage for
Fast Program & Erase
Ground
NCNot Connected Internally
DUDon’t use as internally connected
2/38
M59DR032A, M59DR032B
Table 2. Absolute Maximum Ratings
SymbolParameterValueUnit
T
A
T
BIAS
T
STG
(3)
V
IO
, V
V
DD
DDQ
V
PP
Note: 1. Except for th e rating "O perating T em perature R ange", stresses abo ve those listed in the T able "Absol ute Maxim um Ratings" may
cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions
above those indi cated in t he Operating sect i ons of thi s specifi cation i s not impl i ed. Exposure to Absolute M aximum Rating c onditions for extended per iods may aff ect device reliabilit y. Refer also to the STMicroel ectronics SURE Program an d other relevan t qual ity docum en ts .
2. Depends on range.
3. Minim um Voltage may undershoot to –2V duri ng transit i on and for less than 20ns.
Ambient Operating Temperature
Temperature Under Bias–40 to 125°C
Storage Temperature–55 to 155°C
Input or Output Voltage
Supply Voltage–0.5 to 2.7V
Program Voltage–0.5 to 13V
DESCRIPTION
The M59DR032 is a 32 Mbit non-volatile Flash
memory that m ay be erased electrically a t block
level and programmed i n-system on a Word-byWord basis using a 1.65V to 2.2V V
the circuitry. For Program and Erase operations
the necessary high voltages are g enerated internally. The device supports asynchronous page
mode from all the blocks of the memory array.
The array matrix organization allows each block to
be erased and reprogrammed without affecting
other blocks. All blocks are protected against programming and erase at Power Up. Blocks can be
unprotected to make changes in the application
and then reprotected.
Instructions for Read/Reset, Auto Select, Write
Configuration Register, Programming, Block
Erase, Bank Erase, Erase Suspend, Erase Resume, Block Protect, Block Unprotect, Block Locking, CFI Query, are written to the memory through
a Command Interface using standard microprocessor write timings.
The device is offered in TSOP48 (12 x 20 mm)
and in FBGA48 0.75 mm ball pitch packages.
When shipped all bits of the M59DR032 device are
at the logical level ‘1’.
Organization
The M59DR032 is organized as 2Mb x16 bits. A0A20 are the address lines, DQ0-DQ15 are the
Data Input/Output. Memory control is provided by
Chip Enable E
W
inputs.
, Output Enable G and Write Enable
(1)
supply for
DD
(2)
–40 to 85°C
Reset RP
–0.5 to V
is used to reset all the memory circuitry
DDQ
+0.5
V
and to set the chip in power down mode if this
function is enabled by a proper setting of the Configuration Register. Erase and Program operations
are controlled by an internal Program/Erase Controller (P/E.C.). Status Register data output on
DQ7 provides a Data Polling signal, DQ6 and DQ2
provide Toggle signals and DQ5 provides error bit
to indicate the state of the P/E.C operations.
Memory Blocks
The device features asymmetrically blocked architecture. M59DR032 has an array of 71 blocks and
is divided into two banks A and B, prov iding D ual
Bank operations. While programming or erasing in
Bank A, read operations are possible into Bank B
or vice versa. The memory also features an erase
suspend allowing to read or program in another
block within the same bank. Once suspended the
erase can be resumed. The Bank Size and Sectorization are summarized in Table 7. Parameter
Blocks are located at the top of the m emory address space for the M59DR032A, and at the bo ttom for the M59DR032B. The memory maps are
shown in Tables 3, 4, 5 and 6.
The Program and Erase operation s are managed
automatically by the P/E.C. Block protection
against Program or Erase provides additional data
security. All blocks are protected at Power Up. Instructions are provided to protect or unprotect any
block in the application. A second register locks
the protection status while WP
is low (see B lock
Locking description). The Reset command does
not affect the configurati on of unprotected blo cks
and the Configuration Register status.
Bank A4 Mbit8 blocks of 4 KWord7 blocks of 32 KWord
Bank B28 Mbit-56 blocks of 32 KWord
SIGNAL DESCRIPTIONS
See Figure 1 and Table 1.
Address Inputs (A0-A20). The address inputs
for the memory array are latched during a write operation on the falling edge of Chip Enable E
Write Enable W
, whichever occurs last.
or
Data Input/Output (DQ0-DQ15). The Input is
data to be programm ed in the memory array or a
command to be written to the Command Interface
(C.I.) Both input data and commands are latc hed
on the rising edge of Write Enable W
. The Ouput
is data from the Memory Array, the Common Flash
Interface, the Electronic Signature Manufacturer
or Device codes, the Block Protection status, the
Configuration Register status or the Status Register Data Polling bit DQ7, the Toggle Bits DQ6 and
DQ2, the Error bit DQ5. The data bus is high impedance when the chip is deselected, Output Enable G
is at VIH, or RP is at VIL.
Chip Enable (E
). The Chip Enable input acti-
vates the memory control logic, input buffers, decoders and sense amplifiers. E
at VIH deselects
the memory and red uces the power consumption
to the standby level. E
can also be used to control
writing to the command register and to the memory array, while W
Output Enable (G
remains at VIL.
). The Output Enable gates the
outputs through the data buffers during a read operation. When G
is at VIH the outputs are High im-
pedance.
Write Enable (W
). This input controls writing to
the Command Register and Data latches. Data are
latched on the rising edge of W
Write Protect (WP
). This input gives an addition-
.
al hardware protection level against program or
erase when pulled at V
, as described in the Block
IL
Lock instruction description.
Reset/Power Down Input (RP
). The RP input
provides hardware reset of the memory (without
affecting the Configuration Register status ), and/
or Power Down functions, depending on the Configuration Register status. Reset/Power Down of
the memory is achieved by pulling RP
least t
. When the reset pul se is given, if the
PLPH
to VIL for at
memory is in Read, Erase Suspend Read or
Standby, it will output new valid data in t
ter the rising edge of RP
. If the memory is in Erase
PHQ7V1
af-
or Program modes, the oper ation will be aborted
and the reset recovery will take a maximum ot
t
. The memory will recover from Power
PLQ7V
Down (when enabled) in t
edge of RP
and V
V
DD
. See Tables 25, 26 and Figure 9.
Supply Voltage (1.65V to 2.2V).
DDQ
PHQ7V2
after the rising
The main power supply for all operations (Read,
Program and Erase). V
and V
DD
must be at
DDQ
the same voltage.
V
Programming Voltage (11.4V to 12.6V ). Used
PP
to provide high voltage for fast factory programming. High voltage on V
pin is required to use
PP
the Double Word Program instruction. It is also
possible to perform word program or erase instructions with V
Ground. VSS is the reference for al l the vol t-
V
SS
pin grounded.
PP
age measurements.
DEVICE OPERATIONS
The following operations can be performed using
the appropriate bus cycles: Read Array (Random,
and Page Modes), Write command, Output Disable, Standby, Reset/Power Down and Block
Locking. See Table 8.
Read. Read operations are used to output the
contents of the Memory Array, the Electronic Signature, the Status Register, the CFI, the Block
Protection Status or the Configuration Register
status. Read operation of the memory array is performed in asynchronous page mode, that provides
fast access time. Data is internally read and stored
in a page buffer. The page has a size of 4 words
and is addressed by A0-A1 address inputs. Read
operations of the Electroni c Signature, th e Status
Register, the CFI, the Block Protection Status, the
Configuration Register status and the Security
Code are performed as single asyncronous read
cycles (Random Read). Both Chip Enabl e E
Output Enable G
must be at VIL in order to read the
and
output of the memory.
Write. Write operations are u sed to give Instruc-
tion Commands to the memory or to latch Input
Data to be programmed. A write operation is initiated when Chip Enable E
at V
with Output Enable G at VIH. Addresses are
IL
latched on the falling edge of W
and Write Enable W are
or E whichever occurs last. Commands and Input Data are latched
on the rising edge of W
Noise pulses of less than 5ns typical on E
signals do not start a write cycle.
G
or E whichever occurs first.
, W and
6/38
M59DR032A, M59DR032B
Table 8. User Bus Operations
(1)
OperationEGWRPWPDQ15-DQ0
Write
Output Disable
Standby
V
IL
V
IL
V
IH
Reset / Power DownXXX
Block Locking
Note: 1. X = Don’t care.
V
IL
V
IH
V
IH
V
IL
V
IH
XX
XX
V
V
V
V
V
Table 9. Read Electronic Signature (AS and Read CFI instructions)
CodeDeviceE
Manufacturer Code
M59DR032A
Device Code
M59DR032B
GWA0A1A7-A2
V
V
V
IL
IL
V
V
IL
IL
V
V
IL
IL
V
IH
IL
V
V
IH
IH
V
V
IH
IH
V
V
V
0Don’t Care00h20h
IL
0Don’t Care00hA0h
IL
0Don’t Care00hA1h
IL
Table 10. Read Block Protection (AS and Read CFI instructions)
Table 11. Read Configuration Register (AS and Read CFI instructions)
RP
FunctionEGWA0A1A7-A2Other AddressesDQ10
V
V
V
V
Reset
Reset/Power Down
IL
IL
IH
IH
V
V
V
IL
IL
V
IH
IH
Dual Bank Operations. The Dual Bank allows to
read data from one bank of memory while a program or erase operation is in progress in the other
bank of the memory. Read and Write cycles can
be initiated for simultaneous operations in different
banks without any d elay. Status Register du ring
Program or Erase must be monitored using an address within the bank being modified.
Output Disa bl e . The data outputs are high impedance when the Output Enable G
Write Enable W
at VIH.
is at VIH with
Standby. The memory is in standby when Chip
Enable E
is at VIH and the P/E.C. is idle. The power consumption is reduced to the standby level
and the outputs are high impedance, independent
of the Output Enable G
or Write Enable W input s.
V
V
0Don’t Care0Don’t Care
IH
0Don’t Care1Don’t Care
IH
Automatic Standby. When in Read mode, after
150ns of bus inactivity and when CMOS levels are
driving the addresses, the chip automatically enters a pseudo-standby mode where consumption
is reduced to the CMOS standby value, while outputs still drive the bus.
Power Down. The memory is in Power Down
when the Configuration Register is set for Power
Down and RP
is at VIL. The power consumption is
reduced to the Power Down level, and Outputs are
in high impedance, independent of the Chip Enable E
, Output Enable G or Write Enable W inputs.
Block Locking. Any combination of blocks can
be temporarily protected against Program or
Erase by setting the lock register and pulling WP
to VIL (see Block Lock instruction).
DQ9-DQ0
DQ15-DQ11
7/38
M59DR032A, M59DR032B
INSTRUCTIONS AND COMMANDS
Seventeen instructions are defined (see Table
14A), and the internal P /E.C. automatically handles all timing and verification of the Pr ogram and
Erase operations. The Status Register Dat a Polling, Toggle, Error bits can be read at any time, during programming or erase, to monitor the progress
of the operation.
Instructions, made up of one or more com mands
written in cycles, can be given to the Program/
Erase Controller through a Command Interface
(C.I.). The C.I. latches comma nds written to the
memory. Commands are made of address and
data sequences. Two Coded Cycles unlock the
Command Interface. They are followed by an input
command or a confirmation command. The Coded
Sequence consists of writing the dat a AAh at the
address 555h during the f irst cycle and the data
55h at the address 2AAh during the second cycle.
Instructi ons a re co mpose d of up to si x cycles. The
first two cycles input a Coded Sequence to the
Command Interface which is common to all instructions (see Table 14A). T he third cycle inputs
the instruction set-up command. Subseq uent cycles output the addressed data, Elect ronic Signature, Block Protection, Configuration Register
Status or CFI Query for Read operations. In order
to give additional data protection, the instructions
for Block Erase and Bank Erase require further
command inputs. For a Program instruction, the
fourth command cycle inputs the address and data
to be programmed. For a Double Word Programming instruction, the fourth and fifth co mmand cycles input the address and data to be
programmed. For a Block Eras e and Bank Erase
instructions, the fourth and fifth cycles input a further Coded Sequence before the Erase confirm
command on the sixth cycle. Any combination of
blocks of the same memory bank can be erased.
Erasure of a memory block may be suspended, in
order to read data from another block or to program data in another block, and then resumed.
When power is first applied the command interface
is reset to Read Array.
Command sequencing must be followed exactly.
Any invalid combination of commands will reset
the device to Read Array. The inc reased number
of cycles has been chosen to ensure maximum
data security.
Read/Reset (RD) Instruction. The Read/Reset
instruction consists of one write cycle giving the
command F0h. It can be optionally preceded by
the two Coded Cycles. Subsequent read operations will r ead the memory array a ddressed and
output the data read.
CFI Query (RCFI) Instruction. Common Flash
Interface Query mode is entered writing 98h at address 55h. The CFI data structure gives information on the device, such as the sectorization, the
command set and some el ectrical specifications.
Tables 15, 16, 17 and 18 show the addresses
used to retrieve each data. The CFI data structure
contains also a se curity area; in this section, a 64
bit unique security number is written, starting at
address 80h. This area can be accessed only in
read mode by the final user and there are no ways
of changing the code after it has been written by
ST. Write a read instruction (RD) to return to Read
mode.
Table 12. Commands
Hex CodeCommand
00hBypass Reset
10hBank Erase Confir m
20hUnlock Bypass
30hBlock Erase Resume/Confirm
40hDouble Word Program
Block Unprotect, or
Block Lock, or
Write Configuration Register
Read Electronic Signature, or
Block Protection Status, or
Configuration Register Status
8/38
M59DR032A, M59DR032B
Auto Select (AS) Instruction. This instruction
uses two Coded Cycles followed by one write cycle giving the command 90h to address 555h for
command set-up. A subsequent read will output
the Manufacturer or the Device Code (Electronic
Signature), the Block Protection status or the Configuration Register status depending on the levels
of A0 and A1 (see Tables 9, 10 and 11). A7-A2
must be at V
, while other address input are ig-
IL
nored. The bank address is don’t care for this instruction. The Electronic Signature can be read
from the memory allowing programming equipment or applications to automatically match their
interface to the characteristics of M59DR032. The
Manufacturer Code is output when the address
lines A0 and A1 are at V
put when A0 is at V
, the Device Code is out-
IL
with A1 at VIL.
IH
The codes are output on DQ0-DQ7 with DQ8DQ15 at 00h. The AS instruction also allows the
access to the Block Protection Status. After giving
the AS inst ructio n, A 0 is s et to V
with A1 at VIH,
IL
while A12-A20 define t he address of the block to
be verified. A read in these conditions will output a
01h if the block is protected and a 00h if the block
is not protected.
The AS Instruction finally allows the access to the
Configuration Register status if both A0 and A1
are set to V
is active as RP
. If DQ10 is '0' only the Reset function
IH
is set to VIL (default at power-up).
If DQ10 is '1' both the Reset and the Power Down
functions will be achieved by pulling RP
to VIL. The
other bits of the Configuration Register are reserved and must be ignored. A reset command
puts the device in read array mode.
Write Configuration Register (CR) Instruction. This instruction uses t wo Coded Cyc les fol-
lowed by one write cycle giving the command 60h
to address 555h. A further write cycle giving the
command 03h writes the conte nts of address bi ts
A0-A15 to the 16 bits configuration register. Bits
written by inputs A0-A9 and A11-A15 are reserved
for future use. Address input A10 defines the status of the Reset/Power Down functions. It must be
set to V
V
IH
to enable only the Reset function and to
IL
to enable also the Power Down function. At
Power Up all the Con figuration Register bits are
reset to '0'.
Enter Bypass Mode (EBY) Instruction. This instruction uses the two Coded cycles f ollowed by
one write cycle giving the command 20h to address 555h for mode set-up. Once in Bypass
mode, the device will accept the Exit Bypass
(XBY) and Program or Double Word Program in
Bypass mode (PGBY, DPGBY) commands. The
Bypass mode allows to reduce the overall programming time when large memory arrays need to
be programmed.
Exit B y pa ss Mode (XBY) Ins t r u c t i o n. This instruction uses two write cycles. The first inputs to
the memory the command 90h and the second inputs the Exit Bypass mode confirm (00h). After the
XBY instruction, the device resets to Read Memory Array mode.
Program in Bypass Mode (PGBY) Instruction. This instruction uses two write cycles. The
Program command A0h is written to any Address
on the first cycle and the second write cycle latches the Address on t he falling e dge of W or E and
the Data to be written on the rising edge and starts
the P/E.C. Read operations within the same bank
output the Status Regist er bits after th e programming has started. Memory programming is made
only by writing '0' in place of '1'. Status bits D Q6
and DQ7 determine if programming is on-going
and DQ5 allows verification of any possible error.
Program (PG) Instruction. This ins truction uses
four write cycles. The Program command A0h is
written to address 555h on the third cycle after two
Coded Cycles. A fourth write operation latches the
Address and the Dat a to be writte n a nd starts the
P/E.C. Read operations within the same bank output the Status Register bits after the programming
has started. Memory program ming is made only
by writing '0' in place of '1'. Status bits DQ6 and
DQ7 determine if programming is on-going and
DQ5 allows verification of any possible error. Programming at an address not in blocks being
erased is also possible during erase suspend.
Double Word Program (DPG) Instruction. This
feature is offered to improve the programming
throughput, writing a page of two adjacent words
in parallel. High voltage (11.4V to 12.6V) on V
PP
pin is required. This instruction uses five write cycles. The double word program command 40h is
written to address 555h on the third cycle after two
Coded Cycles. A fourth write cycle latches the address and data to be written to the first location. A
fifth write cycle latches the new data to be written
to the second location and starts the P/E.C.. Note
that the two locations must have the same address
except for the address bit A0. The Double Word
Program can be executed in Bypass mode (DPGBY) to skip the two coded cycles at the beginning
of each command.
Note: 1. All bl ocks are protected at pow er-up, so the default con figuratio n i s 001 or 101 according to WP status.
2. Current state a nd Next state gi ves the pr ot ection sta t us of a block . The protec tion status is defined by the write pr otect pin and by
DQ1 (= 1 for a loc ked block) an d DQ0 (= 1 for a prot ected block ) as read in the A ut oselect inst ruction with A1 = V
3. Next state is the protection status of a block after a Protect or Unprotect or Lock command has been issued or after WP
its logic value.
4. A WP
transition to VIH on a locked block will restore the previous DQ0 value, giving a 111 or 110.
Program/Erase
Allowed
Block Protect (BP), Blo ck Unprotect (BU),
Block Lock (BL) Instructions. All blocks are
protected at power-up. Each block of the array has
two levels of protection against program or erase
operation. The first level is set by the Block Protect
instruction; a protected block cannot be programmed or erased until a Block Unprotect instruction is given for that block. A second l evel of
protection is set by the Block Lock instruction, and
requires the use of the WP
following scheme:
– when WP
is at VIH, the Lock status is overridden
and all blocks can be protected or unprotected;
– when WP
is at VIL, Lock status is enabled; the
locked blocks are protected, regardless of their
previous protect state, and protection status
cannot be changed. Bloc ks that are not locked
can still change their protection status, and program or erase accordingly;
– the lock status is cleared for all blocks at power
up; once a block ha s been locke d state can be
cleared only with a reset command. The protection and lock status can be monit ored for each
block using the Autoselect (AS) instruction. Protected blocks will output a ‘1’ on DQ0 and locked
blocks will output a ‘1’ on DQ1.
Refer to Table 13 for a list of the protection states.
Block Erase (BE) Instruction. This instruction
uses a minimum of six write cycles. The Erase
Set-up command 80h is written to ad dress 555h
on third cycle after the two Coded cycles. The
Block Erase Confirm command 30h is similarly
written on the sixth cycle after another two Coded
cycles and an address within the block to be
erased is given and latched into the memory.
(1)
ProtectUnprotectLockWP transition
pin, according to t he
Next State After Event
(3)
111 or 110
IH
Additional block Erase Confirm commands and
block addresses can be written subsequently to
erase other blocks i n paral l el, wit h out fu rthe r Co ded cycles. All blocks must belong to the same
bank of memory; if a new block belonging to the
other bank is given, the operation is aborted. The
erase will start after an erase timeout period of
100µs. Thus, additional Erase Confirm commands
for other blocks must be given within this delay.
The input of a new Erase Confirm command will
restart the timeout period. The status of the in ternal timer can be monitored through the level of
DQ3, if DQ3 is '0' the Block Erase Command has
been given and the timeout is running, if DQ3 is '1',
the timeout has expired and the P/E.C. is erasing
the Block(s). If the second command given is not
an erase confirm or if the Coded cycles are wrong,
the instruction aborts, and the device is reset to
Read Array. It is not necessary to program the
block with 00h as the P/E.C. will do t his a uto matically before erasing to FFh. Read operations within the same bank, after the sixth rising edge of W
or E, output the status register bits.
During the execution of the erase by the P/E.C.,
the memory accepts only the Erase Suspend ES
instruction; the Read/Reset RD instruction is accepted during the 100µs time-out period. Data
Polling b it DQ7 retur ns '0' while the erasur e is in
progress and '1' when it has com pleted. The Toggle bit DQ6 toggles during the erase operation,
and stops when erase is completed.
After completion the Status Re gister bit DQ5 returns '1' if there has been an erase failure. In such
a situation, the Toggle bit DQ2 can be used to determine which block is not correctly erased. In the
case of erase failure, a Read/Reset RD instruction
is necessary in order to reset the P/E.C.
(4)
and A0 = VIL.
has changed
10/38
M59DR032A, M59DR032B
Bank Erase (BKE) Instruction. This instruction
uses six write cycles and is used to e rase all the
blocks belonging to the selected bank. The Erase
Set-up command 80h is written to ad dress 555h
on the third cycle after the two Coded cycles. The
Bank Erase Confirm command 10h is similarly
written on the sixth cycle after another two Coded
cycles at an address within the selected bank. If
the second command gi ven is not an erase confirm or if the Coded cy cles are wrong, the instruction aborts and the device is reset to Read A rray.
It is not necessary to program the array with 00h
first as the P/E.C. will automatically do this before
erasing it to FFh. Read operations within the same
bank after the sixth rising edge of W
or E output
the Status Register bits. During the execution of
the erase by the P/E.C., Data Polling bit DQ7 returns ’0’, then ’1’ on completion. The Toggle bit
DQ6 toggles during erase operation and stops
when erase is completed. After completion the
Status Register bit DQ5 returns ’1’ if there has
been an Erase Failure.
Erase Suspend (ES) Instruction. In a dual bank
memory the Erase Suspend instruction is used to
read data within the bank where erase is in
progress. It is also possible to program data in
blocks not being erased.
The Erase Suspend in struction con sists o f writing
the command B0h without any s pecific address.
No Coded Cycles are requ ired. Erase s uspend is
accepted only during the Block Erase i nstruction
execution. The Toggle bit DQ6 stops toggling
when the P/E.C. is suspended within 15µs after
the Erase Suspend (ES) command has been written. The device will then automatically be set to
Read Memory Array mode. When erase is suspended, a Read from blocks being erased will output DQ2 toggling and DQ 6 at '1'. A Read from a
block not being erased returns valid data. During
suspens ion the memory w ill respond only to the
Erase Resume ER and the Program PG instructions. A Program operation can be initiated during
erase suspend in one of the blocks not being
erased. It will result in DQ6 toggling when the data
is being programmed.
Erase Resume (ER) Instruction. If an Erase
Suspend instruction was previously exec uted, the
erase operation may be resumed by giving the
command 30h, at an address within the bank being erased and without any Coded Cycle.