The M58BW016B/D is a 16Mbit non-volatile Flash
memory that can be erased electrically at the block
level and programmed in-system on a DoubleWord basis using a 2.7V to 3.6V V
circuit and a V
supply down to 2.4V for the In-
DDQ
put and Output buffers. Optionally a 12V V
supply for the
DD
PP
supply can be used to provide fast program and erase
for a limited time and number of program/erase cycles.
The devices support Asynchronous (Latch Controlled and Page Read) and Synchronous Bus operations. The Synchronous B urst Read Interface
allows a high data trans fer rate controlled by the
Burst Clock, K, signal. It is capable of bursting
fixed or unlimited lengths of data. The burst type,
latency and length are configurable and can be
easily adapted to a large variety of system clock
frequencies and microprocessors. All Writes are
Asynchronous. On power-up the memory defaults
to Read mode with an Asynchronous Bus.
The device has a boot block architecture with an
array of 8 parameter bloc k of 64Kb each and 31
main blocks of 512Kb each. The parameter blocks
can be located at the top of the address space,
M58BW016BT, M58BW016DT or at the bottom,
M58BW016BB, M58BW016DB.
Program and Erase command s are written to the
Command Interface of the memory. An on-chip
Program/Erase Controller simplifies the process of
programming or erasing the memory by taking
care of all of the special operations that are required to update the memory contents. The end of
a Program or Erase operation can be detected and
any error conditions identified in the Status Regis-
ter. The command set required to control the
memory is consistent with JEDEC standards.
Erase can be suspended in order to perform either
Read or Program in any other block and then resumed. Program ca n be s uspended to Read data
in any other block and then resum ed. Eac h block
can be programmed and erased over 100,000 cycles.
All blocks are protected during power-up. The
M58BW016B features four different levels of block
protection to avoid unwanted program/erase operations. The WP
pin offers an hardware protection
on two of the parameter blocks and all of the main
blocks. The Program and Erase commands can
be password protected by the Tuning Protection
command. All Program or Erase operations are
blocked when Reset, RP,
M58BW016D offers the same protection features
with the exception of the Tuning Block Protection
which is disabled in the factory.
A Reset/Power-down mode is entered w hen the
input is Low. In this mode the power consump-
RP
tion is lower than in the normal standby mode, the
device is write protected a nd bo th the Sta tus and
the Burst Configuration Registers are cleared. A
recovery time is required when the RP
High.
The memory is offered in PQFP80 (14 x 20mm)
and LBGA80 (1.0mm pitch) packages and it is
supplied with all the bits erased (set to ’1’).
DQ16-DQ31Data Input/Output
B
E
G
KBurst Clock
L
RValid Data Ready (open drain output)
RP
Data Input/Output, Burst Configuration
Register
Burst Address Advance
Chip Enable
Output Enable
Latch Enable
Reset/Power-down
GD
W
WP
W
GD
WP
V
B
V
SS
V
SSQ
AI04155
DD
V
DDQ
V
DDQIN
V
PP
V
SS
V
SSQ
NCNot Connected Internally
DUDon’t Use as Internally Connected
Write Enable
Output Disable
Write Protect
Supply Voltage
Power Supply for Output Buffers
Power Supply for Input Buffers only
Optional Supply Voltage for Fast
Program and Fast Erase Operations
Ground
Input/Output Ground
7/63
M58BW016BT, M58BW016BB, M58BW016DT, M58BW016DB
Figure 3. LBG A Co nn e ct i ons (Top view thro ugh package)
87654321
A15V
E
F
G
DDQ
SSQ
DDQ
A14A
A13A16B
DQ0DQ3D
V
DD
A12A9
DUDUDQ31DQ30
DQ2DQ28
DQ6DQ25V
DQ10DQ9DQ21
V
PP
A10NC
DU
DQ1DQ27
DQ5NC
SS
DQ22
A3A6
A4A5A8
DUA7A11A18A17C
DQ26DQ4V
DQ24DQ7V
DQ23DQ8V
A2
A1
A0
DQ29
V
DDQ
SSQ
V
DDQ
H
J
K
V
DDQIN
RP
K
WP
V
B
SS
E
V
DD
GDW
DQ20DQ18DQ19DQ17DQ11DQ12DQ13
DQ16RGLDQ14DQ15
DU
AI04151b
8/63
M58BW016BT, M58BW016BB , M58BW016DT, M58BW016DB
Figure 4. PQFP Connections (Top view through package)
DQ16
DQ17
DQ18
DQ19
V
DDQ
V
SSQ
DQ20
DQ21
DQ22
DQ23
DQ24
DQ25
DQ26
DQ27
V
DDQ
V
SSQ
DQ28
DQ29
DQ30
DQ31
DU
A0
A1
A2
12
24
DD
R
GDWPWDUG
80
1
E
V
73
SS
B
V
NC
L
NC
DDQIN
V
K
RP
65
DQ15
64
DQ14
DQ13
DQ12
V
SSQ
V
DDQ
DQ11
DQ10
DQ9
DQ8
53
DQ7
DQ6
DQ5
DQ4
V
SSQ
V
DDQ
M58BW016BT
M58BW016BB
M58BW016DT
M58BW016DB
DQ3
DQ2
DQ1
DQ0
NC
A18
A17
A16
41
25
32
40
A3
A4
A5
A6
A7
A8
V
SS
V
PP
V
DD
A9
A10
A11
A12
A13
A14
A15
AI04152b
9/63
M58BW016BT, M58BW016BB, M58BW016DT, M58BW016DB
Block Protection
The M58BW016B fe atures four different levels of
block protection. The M58BW016D h as the same
block protection with the exception of th e Tuning
Block Protection, which is disabled in the factory.
■ Write Protect Pin, WP, - When WP is low, V
IL,
all the lockable parameter blocks (two upper
(Top ) or lower (Bottom)) and all the main blocks
are protected. When WP
is high (VIH) all the
lockable parameter blocks a nd all th e main
blocks are unprotected.
■ Reset/Power-Down Pin, RP, - I f the device is
held in reset mode (RP
at VIL), no program or
erase operations can be performed on any
block.
■ Tuning Block Protection: M58BW016B
features a 64 bit password protection for
program and erase operations for a fixed
number of blocks After power-up or reset the
device is tuning protected. An Unlock command
is provided to allow program or erase operations
in all the blocks.
Afte r a de vi c e reset the f irst two k i nds of block p ro tection (W
P, RP) can be combined to give a flexible block protection. They do not affect the Tuning
Block Protection. When the two protections are
disabled, W
P and RP at VIH, the blocks locked by
the Tuning Block Protection cannot be modified.
All blocks are protected during power-up.
Tuning Bloc k P r ote ction. The Tuning Block
Protection is a software feat ure to protect certain
blocks from program or erase operat ions. It allows
the user to lock program and erase operations with
a user definable 64 bit code. It is only available on
the M58BW016B version.
The code is written once in t he Tuning Protection
Register and cannot be erased. When shipped the
flash memory will have the Tuning Protection
Code bits set to ‘1'. The user can program a ‘0’ in
any of the 64 positions. Once programmed it is not
possible to reset a bit to ‘ 1’ a s the c ells cannot be
erased. The Tuning Protection Register can be
programmed at any mom ent (after providing the
correct code), however once all bits are set to ‘0’
the Tuning Protection Code can no longer be altered .
The Tuning Protection Code locks the program
and erase operations of 2 parameter and 24 main
blocks, blocks 0, 1 and 15-38 for the bottom configuration and the blocks 0-23, 37 and 38 for the
top configuration.
The tuning bl ocks are "locke d" if the tuni ng prot ection code has not been provided, and “unlocked"
once the correct code has been provided. The tuning blocks are locked afte r re set o r power-u p . The
tuning protection status can be mon itored in the
Status Register. Refer to the Status Register section.
Refer to the Command Interface section for the
Tuning Protection Block Unlock and Tuning Protection Program commands. See Appendix B, Figure 25, 26 and 27 for suggested flowcharts for
using the Tuning Block Protection commands. For
further information on the Tuning Block Protection
refer to Application Note, AN1361.
10/63
M58BW016BT, M58BW016BB , M58BW016DT, M58BW016DB
Table 2. Top Boot Block Addresses,
M58BW016BT, M58BW016DT
Note: 1. TP = Tuning Protected Block, only available for the
M58BW016B.
12/63
M58BW016BT, M58BW016BB , M58BW016DT, M58BW016DB
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram and Table 1, Signal
Names, for a brief overview of the signals connected to this device.
Address Inputs (A0-A18). The Address Inputs
are used to select the cells to access in the memory array during Bus Read operations either to
read or to program data to. During Bus Write operations they control the commands sent to the
Command Interface of the internal state m ac hine.
Chip Enable must be low when selecting the addresses.
The address inputs are latched on the rising edge
of Latch Enable L
curs first, in a read operation.The address inputs
are latched on the rising edge of Chip Enable,
Write Enable or Latch E nable, whichever occurs
first in a Write operation. The address latch is
transparent when Latch Enable is low, V
dress is internally latched in an E ras e or Program
operation.
Data Inputs/Outputs (DQ0-DQ31). The Data Inputs/Outputs output the data stored at the selected
address during a Bus Read operation, or are used
to input the data during a program operation. During Bus Write operations they repres ent the commands sent to the Command Interface of the
internal state machine. When used to input data or
Write commands they are latched on the rising
edge of Write Enable or Chip Enable, whichever
occurs first.
When Chip Enable and Output Enable are both
low, V
, and Output Disable is at V
IL
outputs data from the memory array, the Electronic Signature, the CFI Information or the contents of
the Status Register. The data bus is high impedance when the device is deselected with Chip Enable at V
at V
, Output Enable at VIH, Outp u t Di sab l e
IH
or Reset/Power-Down at VIL. The Status
IL
Register content is output on DQ0-DQ7 and DQ8DQ31 are at V
Chip Enable (E
vates the memory control logic, input buffers, decoders and sense amplifiers. Chip Enable, E
V
deselects the memory and reduces the power
IH
consumption to the Standby level.
Output Enable (G
the outputs through the data output buffers during
a read operation, whe n Output Disable GD
V
. When Output Enable G is at VIH, the ou tp uts
IH
are high impedance in dependently of Output Disable.
Output Disa bl e (G D
deactivates the data output buffers. When Ou tput
Disable, GD
the Output Enable. When Output Disable, GD
V
, the outputs are high impedance independent-
IL
or Burst Clock K, whichever oc-
. The ad-
IL
the data bus
IH,
.
IL
). The Chip Enable, E, input acti-
, at
). The Output Enable, G, gates
is at
). The Output Disable, GD,
, is at VIH, the outputs are driven by
, is at
ly of Output Enable. The Output Disable pin must
be connected to an external pull-up resistor as
there is no internal pull-up resistor to drive the pin.
Write Enable (W
). The Write Enable, W, input
controls writing to the Command Interface, Input
Address and Data latches. Both addresses and
data can be latched on the rising edge of Write Enable (also see Latch Enable, L
Reset/Power-Down (RP
Down, RP
, is used to apply a hardware reset to the
).
). The Reset/Power-
memory. A hardware reset is achieved by hold ing
Reset/Power-Down Low, V
, for at least t
IL
PLPH
Writing is inhibited to protect data, the Command
Interface and the Program/Erase Controller are reset. The Status Register information is cleared and
power consumption is reduced to deep powerdown level. The device acts as deselected, that is
the data outputs are high impedance.
After Reset/Power-Down goes High, V
IH
, the
memory will be ready for Bus Read operations after a delay of t
t
.
PHWL
If Reset/Power-Down goes low, V
or Bus Write operations after
PHEL
, during a Block
IL
Erase, a Program or a Tuning Protection Program
the operation is aborte d, in a time of t
PLRH
maxi-
mum, and data is altered and may be corrupted.
During Power-up power should be applied simulta-
neously to V
DD
and V
DDQ(IN)
When the supplies are stable RP
Output Enable, G
able, W
, should be held at VIH during power-up.
, Chip Enable, E, and Write En-
with RP held at VIL.
is taken to VIH.
In an application, it is recommended to associate
Reset/Power-Down pin, RP
, with the reset sig nal
of the microprocessor. Otherwise, if a reset operation occurs while the memory is performing an
erase or program operation, the memory may output the Status Register information inst ead of being initialized to the default Asynchronous
Random Read.
See Table 21 and F igure 18, Reset, Power-Down
and Power-up Characteristics, for more details.
Latch Enable (L
). The Bus Interface can be con-
figured to latch the Address Input s on the rising
edge of Latch Enable, L
, for Asynchronous Latch
Enable Controlled R ead or W rite or S ynchronous
Burst Read operations. In Synchronous Burst
Read operations the address is latched on the active edge of the Clock whe n Lat ch E na ble is Low,
V
. Once latched, the addresses may change
IL
without affecting the address used by the memory.
When Latch Enable is Low, V
parent. Latch Enable, L
, the latch is trans-
IL
, can remain at VIL for
Asynchronous Random Read and Write operations.
Burst Clock (K). The Burst Clock, K, is used to
synchronize the memory with the external bus dur-
.
13/63
M58BW016BT, M58BW016BB, M58BW016DT, M58BW016DB
ing Synchronous Burst Read operations. Bus signals are latched on the active edge of the Clock.
The Clock can be configured to have an active rising or falling edge. In Synchronous Burst Read
mode the address is latched on the first active
clock edge when Latch Enable is low, V
, or on
IL
the rising edge of Latch Enable, whichever occurs
first.
During Asynchronous bus operations the Clock is
not used.
Burst Address Advance (B
Advance, B
, controls the advancing of the address
). The Burst Address
by the internal address counter during Synchronous Burst Read operations.
Burst Address Advance, B
, is only sampled on the
active clock edge of the Clock when the X-latency
time has expired. If Burst Address Advance is
Low, V
Burst Address Advance is High, V
, the internal address counter advances. If
IL
, the internal
IH
address counter does not change ; the same dat a
remains on the Data Inputs/Outputs and Burst Address Advance is not sampled unt il the Y-latency
expires.
The Burst Address Advance, B
, may be tied to VIL.
Valid Data Ready (R). The Valid Data Ready
output, R, is an open drain output that can be
used, during Synchronous Burst Read operations,
to identify if the memory is ready to output data or
not. The Valid Data Ready output can be conf igured to be active on the clock edge o f the invalid
data read cycle or one cycle before. Valid Data
Ready, at V
available. When Valid Data Ready is Low, V
, indicate s tha t ne w da ta is or will b e
IH
IL
, the
previous data outputs remain active.
In all Asynchronous operations, Valid Data Ready
is high-impedance. It may be tied to other components with the same Valid Data Ready signal to
create a unique syst em Ready signal. The Valid
Data Ready output has an internal pull-up resistor
of around 1 MΩ powered from V
, designers
DDQ
should use an external pull-up res istor of the correct value to meet the external timing requirements for Valid Data Ready going to V
Write Protect (WP
). The Write Protect, WP , pro-
.
IH
vides protection against program o r erase operations. When Write Protect, WP
, is at VIL the first
two (in the bottom configuration) or last two (in the
top configuration) parameter blocks and all main
blocks are locked. When Write Protect WP
all the blocks can be programmed or erased, if
V
IH
is at
no other protection is used.
Supply Voltage (V
). The Supply Voltage, VDD,
DD
is the core power supply. Al l internal c ircuits draw
their current from the V
pin, including the Pro-
DD
gram/Erase Controller.
Output Supply Voltage (V
ply Voltage, V
, is the output buffer power supply
DDQ
). The Output Sup-
DDQ
for all operations (R ead, Pro gram and Era se) used
for DQ0-DQ31 when used as outputs.
Input Supply Voltage (V
ply Voltage, V
, is the power supply for all input
DDIN
signal. Input signals are: K, B
). The Input Sup-
DDQIN
, L, W, GD, G, E, A0-
A18 and D0-D31, when used as inputs.
Program/Erase Supply Voltage (V
gram/Erase Supply Volt age, V
PP
). The Pro-
PP
, is used for program and erase operations. The memory normally
executes program and erase operations at V
PP1
voltage levels. In a manufacturing environment,
programming may be speeded up by applying a
higher voltage level, V
The voltage level V
, to the VPP pin.
PPH
may be applied for a total
PPH
of 80 hours over a maximum of 1000 cycles.
Stressing the device beyond these limits could
damage the device.
Ground (V
reference for the internal supply voltage V
Ground V
input supplies V
connect V
and V
SS
is the reference for the o utput and
SSQ
DDQ,
and V
SS
). The Ground VSS is the
SSQ
and V
together.
SSQ
. It is essent ia l t o
DDQIN
DD
. The
Note: A 0.1µF capacitor should be connected
between the Supply Voltages, V
V
and the Grounds, VSS and V
DDIN
DD
SSQ
, V
and
DDQ
to decouple the current surges from the power supply.
The PCB track widths must be sufficient to carry the currents req uired during all o perations
of the parts, see Table 15, DC Chara cteristics,
for maximum current supply requirem ents.
Don’t Use (DU). This pin should not be used as it
is internally connected. Its voltage level can be between V
SS
and V
or leave it unconnected.
DDQ
Not Connected (NC). This pin is not physically
connected to the device.
14/63
M58BW016BT, M58BW016BB , M58BW016DT, M58BW016DB
BUS OPERATIONS
Each bus operations that controls the memory is
described in this section, see Tables 4, 5 and 6
Bus Operations, for a summary. The bus operation
is selected through the Burst Configuration Register; the bits in this register are described at the end
of this section.
On Power-up or after a Hardware Reset the memory defaults to Asynchronous Bus Read and Asynchronous Bus Write, n o other bus operation can
be performed until the Burst Control Register has
been configured.
The Electronic Signature, CFI or Status Register
will be read in a synchronous m ode rega rdless of
the Burst Control Register settings.
Typically glitches of less than 5ns on Chip Enable
or Write Enable are ignored by the memory and do
not affect bus operations.
Asynchronous Bus Operation s
For asynchronous bus operations refer to Tabl e 4
together with the following text.
Asynchronous Bus Read. Asynchronous Bus
Read operations read from the memory cells, or
specific registers (Electronic Signature, Status
Register, CFI and Burst Configuration Register) in
the Command Interface. A valid bus ope ration involves setting the desired address on the Address
Inputs, applying a Low sig nal, V
and Output Enable and keeping Write Enable and
Output Disable High, V
. The Data Inputs/Out-
IH
puts will output the value, see Figure 9, Asynchronous Bus Read AC Waveforms, and Table 16,
Asynchronous Bus Read AC Characteristics, for
details of when the output becomes valid.
Asynchronous Read is the default read mode
which the device enters on power-up or on return
from Reset/Power-Down.
Asynchronous Latch Controlled Bus Read.
Asynchronous Latch Controlled Bus Read operations read from the memory cells or specific registers in the Command Interface. The address is
latched in the memory before the value is ou tput
on the data bu s, allowing the address to cha nge
during the cycle without affecting the address that
the memo r y uses.
A valid bus operation i nvolves set ting the des ired
address on the Address Inputs, setting Chip Enable and Latch Enable Low, V
Enable High, V
; the address is latched on the ris-
IH
ing edge of Latch Enabl e. Once latched, the Address Inputs can change. Set Output Enable Low,
, to read the data on the Data Inputs/Outputs;
V
IL
see Figure 1, Asynchronous Latch Controlled Bus
Read AC Waveforms and Table 17, Asynchronous Latch Controlled Bus Read AC Charac teristics for details on when the output becomes valid.
, to Chip Enable
IL
and keeping Write
IL
Note that, since the Latch Enable input is transparent when set Low, V
, Asynchronous Bus Read
IL
operations can be performed when the memory is
configured for Asynchronous Latch Enable bus
operations by holding Latch Enable Low, V
throughout the bus operation.
Asynchro nous Page Read. Asynchronous
Page Read operations are used to read from several addresses within the same memory page.
Each memory page i s 4Do uble-Words and is addressed by the address inputs A0 and A1.
Data is read internally and stored in the Page Buffer. Valid bus operations are the same as Asynchronous Bus Read operations but with different
timings. The first read operation within the page
has identical timings, subsequent reads within the
same page have much sh orter access t i mes. If the
page changes then the normal, longer timings apply again. Page Read does not support Latched
Controlled Read.
See Figure 11, Asynchronous Page Read AC
Waveforms and Table 18, Asynchronous Page
Read AC Characteristics for details on when the
outputs become valid.
Asynchronous Bus Write. Asynchronous Bus
Write operations write to the Command Interface
in order to send commands to the memory or to
latch addresses and in put data to program. Bus
Write operations are asynchronous, the clock, K,
is don’t care during Bus Write operations.
A valid Asynchronous Bus Write operation begins
by setting the desired address on the A ddress Inputs, and setting Chip Enable, Write Enable and
Latch Enable Low, V
, or Output Disable Low, VIL. The Address In-
V
IH
, and Output Enable High,
IL
puts are latched by the Command Interface on the
rising edge of Chip Enable or Write Enable, whichever occurs first. Commands and Input Data are
latched on the rising edge of Chip Enable, E
Write Enable, W
, whichever occurs first. Output
, or
Enable must remain High, and Output Disable
Low, during the whole Asynchronous Bus Write
operation.
See Figure 12, Asynchronous Write AC Waveforms, and Table 19, Asynchronous Write and
Latch Controlled Write AC Characteristics, for details of the timing requirements.
Asynchronous Latch Controlled Bus Write.
Asynchronous Latch Controlled Bus W rite operations write to the Command Interface in order to
send commands to the memory or to latch addresses and input data t o p rogram . Bus W r ite operations are asynchronous, the clock , K, is don’t
care during Bus Write operations.
A valid Asynchronous Latch Controlled Bus Write
operation begins by setting the desired address on
IL
15/63
M58BW016BT, M58BW016BB, M58BW016DT, M58BW016DB
the Address Inputs and pulsing Latch Enable Low,
V
. The Address Inputs are latched by the Com-
IL
mand Interface on the rising edge of Latch Enable,
Write Enable or Chip Enable, whichever occurs
first. Commands and Input Data are latched on the
rising edge of Chip Enable, E
, or Write Enable, W,
whichever occurs first. Output Enable must remain
High, and Output Disable Low, during the whole
Asynchronous Bus Write operation.
See Figure 13, Asynchronous Latch Controlled
Write AC Waveforms, and Table 19, Asynchronous Write and Latch Controlled Write AC Characteristics, for details of the timing requirements.
Output Disa bl e . The data outputs are high impedance when the Output Ena ble, G
Output Disable, GD
, is at VIL.
Standby. When Chip Enable is High, V
, is at VIH or
, and the
IH
Program/Erase Controller is idle, t he memory enters Standby mode, the power consumption is reduced to the standby level and the Data Inputs/
Outputs pins are placed in the high impedance
state regardless of Output Enable, Write Enable or
Output Disable inputs.
Automatic Low Power. If there is no change in
the state of the bus for a short period of time during
Asynchronous Bus Re ad operations the memory
enters Auto Low Pow er mode where the internal
Supply Current is reduced to the Auto-Standby
Supply Current. The Data Inputs/Outputs will still
output data if a Bus Read operation is in progress.
Automatic Low Power is only available in Asynchronous Read modes.
Power-Down. The memory is in Power-down
when Reset/Power-Down, RP
, is at VIL. The power consumption is reduced to the power-down level and the outputs are high impedance,
independent of the Chip Enable, E
G
, Out p ut D i sa bl e, G D , or Write E nable, W, inputs.
, Output Enable,
Electronic Signature. Two codes identifying the
manufacturer and the device can be read from the
memory allowing programming equipment or applications to automat ically match their interface to
the characteristics of the memory. The Electronic
Signature is output by giving the Read E lectronic
Signature command. The manufacturer code is
output when all the Address inputs are at V
device code is output when A1 is at V
other address pins are at V
. See Table 5. Issue
IL
IH
. The
IL
and all the
a Read Memory Array command to return to Read
mode.
For synchronous bus operat ions refer to Table 6
together with the following text.
Synchron ous Burst Read. Synchronous Burst
Read operations are used to read from the memory at specific times synchronized to an external reference clock. The burst type, length and latency
can be configured. The different configurations for
Synchronous Burst Read operations are described in the Burst Configuration Register section. Refer to Figures 5 and 6 for examples of
synchronous burst operations.
In continuous burst read, one burst read operation
can access the entire memory sequentially by
keeping the Burst Address Advance B
at VIL for
the appropriate number of clock cycles. At the end
of the memory address space the burst read restarts from the beginning at address 000000h.
A valid Synchronous Burst Read operation begins
when the Burst Clock is active and Chip Enable
and Latch Enable are Low, V
. The burst start ad-
IL
dress is latched and loaded into the internal Burst
Address Counter on the valid Burst Clock K edge
(rising or falling depending on the value of M6) or
on the rising edge of Latch Enable, whichever occurs first.
After an initial memory latency time, the memory
outputs data each clock cycl e (or two clock cycl e s
depending on the value of M9). The Burst Address
Advance B input controls the memory burst output.
The second burst output is on the next clock val id
edge after the Burst Address Advance B
has been
pulled Low.
Valid Data Ready, R, monitors if the memory burst
boundary is exceeded and the Burst Controller of
the microprocessor needs to insert wait states.
V
IL
V
IL
V
IL
V
IL
V
IH
V
IH
V
IH
V
IH
V
IH
V
IH
V
IH
V
IH
00000h00000020h
00001h00008836h
00001h00008835h
00005h
BCR
When Valid Data Ready is Low on the active clock
edge, no new data is available and the me mory
does not increment the internal address counter at
the active clock edge even if Burst Address Advance, B
, is Low.
Valid Data Ready may be configured (by bit M8 of
Burst Configuration Register) to be valid immediately at the valid clock edge or one data cycle before the valid clock edge.
Synchronous Burst Read will be suspended if
Burst Address Advance, B
If Output Enable is at V
V
, the last data is still valid.
IH
If Output Enable, G
GD
, is at VIL, but the Burst Address Advance, B, is
the internal Burst Address Cou nter is incre-
at V
IL
, goes High, VIH.
and Output Disable is at
IL
, is at VIH or Output Disable,
mented at each Burst Clock K valid edge.
The Synchronous Burst Read timing diagrams
and AC Characteristics a re described in the AC
and DC Parameters section. See Figures 14 , 15,
16 and 17, and Table 20.
Synchronous Burst Read Suspend. During a
Synchronous Burst Read operation it is possible to
suspend the operation, freeing the data bus for
other higher priority devices.
A valid Synchronous Burst Read operation is suspended when b oth Output Enable an d Burst Address Advance are H igh, V
Advance going High, V
and the Output Enable going High, V
. The Burst Address
IH
, stops the burst counter
IH
, inhibits the
IH
data outputs. The Synchronous Burst Read operation can be resumed by setting Output Enable
Low.
(2)
17/63
M58BW016BT, M58BW016BB, M58BW016DT, M58BW016DB
Table 6. Synchronous Burst Read Bus Operations
Bus OperationStepEGGDRP
Address Latch
Read
Synchronous Burst
Read
Read Suspend
Read Resume
Burst Address Advance
Read Abort, E
Read Abort, RP
Note: 1. X = Don't Care, VIL or VIH.
2. M15 = 0, Bit M15 i s in the Burst Configuration Register.
3. T = transition, see M6 in the Burst Configuration Reg i st er for details on t he active edge of K.
V
ILVIH
VILVILVIHV
VILV
IH
VILVILVIHV
VILV
V
IH
IH
XX
XXX
V
X
IH
IH
V
X
IH
IH
V
X
IH
V
IH
V
IL
(3)
LB
K
V
T
T
X
T
T
XAddress Input
IL
V
V
IH
IL
V
IHVIH
V
V
IH
IL
V
V
IH
IL
A0-A18
DQ0-DQ31
Data Output
High Z
Data Output
High Z
XXXHigh Z
XXXHigh Z
18/63
M58BW016BT, M58BW016BB , M58BW016DT, M58BW016DB
Burst Configuration Register
The Burst Configuration Register is used to configure the type of bus access that the memory will
perform.
The Burst Configuration Register is set through
the Command Interface and will retain its information until it is re-configured, the device is reset, or
the device goes into Reset/Power-Down mode.
The Burst Configuration Register bits are described in Table 7. They specify the selection of
the burst length, burst type, burst X and Y latencies and the Read operat ion. Refer to Figures 5
and 6 for examples of synchronous bu rst c onfigurations.
Read Select Bit (M15). The Read Select bit,
M15, is used to switch between asynchronous and
synchronous Bus Read operations. When the
Read Select bit is set to ’1’, Bus Read operations
are asynchronous; when the Read Select but is
set to ’0’, Bus Read operations are synchronous.
On reset or power-up the Read Sel ect bit is set
to’1’ for asynchronous accesses.
X-Latency Bits (M14-M11). The X-Latency bits
are used during Synchronous Bus Read operations to set the number of clock cycles between
the address being latched and the first data becoming available. For correct operation the X-Latency bits can only assume the values in Table 7,
Burst Configuration Register. The X -Latency bits
should also be selected in conjunction with Table ,
Burst Performance to ensure valid settings.
Y-Latency Bit (M9). The Y-Latency bit is used
during Synchronous Bus Read operations to set
the number of clock cycles between consecutive
reads. The Y-Latency value depends on both the
X-Latency value and the setting in M9.
When the Y-Latency is 1 the data changes each
clock cycle; when the Y-Latency is 2 the data
changes every seco nd clock cycle. See Tab le 7,
Burst Configuration Register and Table , Burst
Performance, for valid co mbinations of the Y-Latency, the X-Latency and the Clock frequency.
Valid Data Ready Bit (M8). The Valid Data
Ready bit controls the timing of the Valid Data
Ready output pin, R. When the Valid Data Ready
bit is ’0’ the Valid Data Ready output pin is driven
Low for the active clock edge when invalid data is
output on the bus. When the Valid Data Ready bit
is ’1’ the Valid Data Ready output pin is driven Low
one clock cycle prior to invalid data being output
on the bus.
Burst Type Bit ( M7 ). The Burst Type bit is used
to configure the sequence of addresses read as
sequential or interleaved. When the Burst Type bit
is ’0’ the memory outputs from interleaved addresses; when the Burst Type bit is ’1’ the memory
outputs from sequential addresses. See Tables 8,
Burst Type Definition, for the sequence of addresses output from a given starting address in
each mode.
Valid Clock Edge Bit (M6). The Valid Clock
Edge bit, M6, is used to configure the ac tive edge
of the Clock, K, during Synchronous Burst Read
operations. When the Valid Clock Edge bit is ’0’
the falling edge of the Clock is the active edge;
when the Valid Clock Edge bit is ’1’ the rising edge
of the Clock is active.
Wrap Burst Bit (M3). The burst reads can be
confined inside the 4 or 8 Double-Word boundary
(wrap) or overcome the boundary (no wrap). The
Wrap Burst bit is used to select between wrap and
no wrap. When the Wrap Burst bit is set to ‘0’ the
burst read wraps; when it is set to ‘1’ the burst read
does not wrap.
Burst Length Bit (M2-M0). The Burst Length bits
set the maximum number of Double-Words that
can be output during a Synchronous Burst Read
operation before the address wraps. Burst lengths
of 4 or 8 are available for both the Sequential and
Interleaved burst types, and a continuous burst is
available for the Sequential type.
Table 7, Burst Configuration Register gives the
valid combinations of the Burst Length bits that the
memory accepts; Table 8, Burst Type Def inition,
gives the sequence of addresses output from a
given starting address for each length.
If either a Continuous or a No Wrap Burst Read
has been initiated the device will output data synchronously. Depending on the starting address,
the device activates the Valid Data Ready output
to indicate that a delay is necessary before the
data is output. If t he st arting a ddres s is aligned to
an 8 Double Word boundary, the continuous burst
mode will run without activating the Valid Data
Ready output. If the starting address is not aligned
to an 8 Double Word boundary, Valid Data Ready
is activated to indicate that the device needs an internal delay to read the successive words in the array.
M10, M5 an d M4 are reserved for future use.
19/63
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