ST M29W400BT, M29W400BB User Manual

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4 Mbit (512Kb x8 or 256Kb x16, Boot Block)
Low Voltage Single Supply Flash Memory
SINGLE 2.7 to 3.6V SUPPLYVOLTAGE for
PROGRAM, ERASE and READ OPERATIONS
ACCESS TIME: 5 5ns
– 10 µs per Byte/ Word typical
11 MEMORY BLOCKS
– 1 Boot Block (Top or Bot tom Location) – 2Parameterand8MainBlocks
PROGRAM/ERASE CONTROLLER
– Em bedded Byte/Word Program algorithm – Em bedded Multi-Block/Chip Erase algorithm – Status Register Polling and Toggle Bits – Ready/Busy Output Pin
ERASE SUSPEND and RESUMEMODES
– Read and Program another Block during
Erase Suspend
UNLOCK BYPASS PROGRAM COMMAND
– Fas ter Production/Batch Programming
TEMPORARY BLOCK UNPROTECTION
MODE
LOW POWER CONSUMPTION
– Standby and Automatic Standby
100,000 PROGRAM/ERASE CYCLES per
BLOCK
20 YEARS DATA RETENTION
– Defec tivity below 1 ppm/year
ELECTRONIC SIGNATURE
– Manuf acturer Code: 0020h – Top Device Co de M29W400BT: 00EEh – Bottom Device Code M29W400BB: 00EFh
M29W400BT
M29W400BB
TSOP48 (N)
12 x 20mm
44
1
SO44 (M)
Figure 1. Logic Diagram
V
CC
18
A0-A17
W
E
G
RP
M29W400BT M29W400BB
FBGA
TFBGA48 (ZA) 6 x 8 ball array
15
DQ0-DQ14
DQ15A–1 BYTE RB
V
SS
AI02934
1/25June 2001
M29W400BT, M29W400BB
Figure 2. TSOP Connections
A15 A14 A13 A12 A11 A10 DQ14
A9
A8 NC NC
RP NC NC RB NC
A17
A7
A6
A5
A4
A3
A2
A1
1
W
12
M29W400BT M29W400BB
13
24 25
48
37 36
AI02935
A16 BYTE V
SS
DQ15A–1 DQ7
DQ6 DQ13 DQ5 DQ12 DQ4 V
CC
DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 G V
SS
E A0
Figure 3. SO Connections
NC RP
A17 A8
A7 A6 A5 A4 A3 A2 A1 A0
V
SS
DQ0 DQ8
DQ9
DQ10
DQ3
DQ11
1 2 3 4 5 6 7 8 9 10 11
M29W400BT M29W400BB
12
E
13 14
G
15 16 17DQ1 18 19 20 21
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 2322
AI02936
WRB
A9 A10 A11 A12 A13 A14 A15 A16 BYTE V
SS
DQ15A–1 DQ7 DQ14 DQ6 DQ13 DQ5DQ2 DQ12 DQ4 V
CC
Table 1. Signal Names
A0-A17 Address Inputs DQ0-DQ7 Data Inputs/Outputs DQ8-DQ14 Data Inputs/Outputs DQ15A–1 Data Input/Output or Address Input E G W RP RB BYTE V
CC
V
SS
NC Not Connected Internally
2/25
Chip Enable Output Enable Write Enable Reset/Block Temporary Unprotect Ready/Busy Output Byte/Word Organization Select Supply Voltage Ground
SUMMARY DESCRIPTION
The M29W400B is a 4 Mbit (512Kb x8 or 256Kb x16) non-volatile memory t hat can be read, erased and reprogrammed. These operations can be per­formed using a single low voltage (2.7 to 3.6V) supply. O n power-up the memory d efau lts to its Read mode where it c an be read in the same way as a ROM or EPROM. The M29W400B is fully backward compatible with the M29W400.
The memory is divided into block s that can be erased independently so it is possible to preserve valid data while old data is erased. Each block can be protected independently to prevent accidental Program or Erase commands from modifying the memory. Program and Erase com mands are w rit­ten to the Com mand Interface of the memory. An on-chip Program/Erase Controller simp lifies the process of programm ing or erasing the memory by taking care of all of the spec ial operations that are required to update the memory contents. The end of a program or erase operation c an be detected and any error c onditions identified. The command set required to contro l the memory is consistent with J E DE C standards.
Figure 4. TFBGA Connections (Top view through package)
M29W400BT, M29W400BB
4321
A
B
C
D
E
F
G
A3
A7
A5
DQ0
RB
NCA17A4
NC
DQ10DQ8E
W A13
RP A8
DQ12
V
CC
A9
DQ14
DQ13DQ11DQ9G
65
A12
A14A10NCNCA6A2
A15A11NCA1
A16DQ7DQ5DQ2A0
BYTE
DQ15
A–1
H
SS
DQ3
The blocks in the memory are asymmetrically ar­ranged, see Tables 3 and 4, Block Addresses. The first or last 64 Kbytes have been divided into four additional blocks. The 16 Kbyte Boot Block can be used for small init ialization code t o start the micro­processor, the t wo 8 Kbyte Parame ter Blocks can be used for parameter storage and the remaining 32K is a small Main Block where the application may be stored.
DQ4
DQ6DQ1V
V
SS
AI03988
Chip Enab le, Output Enable and Write Enable sig­nals control the bus operation of the memory. They allo w simple connection to most micropro­cessors, often without additional logic.
The memory is offered in TSOP48 (12 x 20mm), TFBGA48 (0.8mm pitch) and SO44 packages and it is supplied with all the bits erased (set to ’1’).
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M29W400BT, M29W400BB
Table 2. Absolute Maximum Ratings
(1)
Symbol Parameter Value Unit
T
A
T
BIAS
T
STG
(2)
V
IO
V
CC
V
ID
Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may
cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to A bsolute Maximum Rating condi­tionsforextended periodsmayaffect device reliability.Refer alsotothe STMicroelectronics SUREProgram and otherrelevant qual­ity documents.
2. Minimum Voltage may undershoot to –2V during transition and for less than 20ns during transitions.
Table 3. Top Boot Block Addresses M29W400BT
Size
#
(Kbytes)
10 16 7C000h-7FFFFh 3E000h-3FFFFh
9 8 7A000h-7BFFFh 3D000h-3DFFFh 8 8 78000h-79FFFh 3C000h-3CFFFh
Ambient Operating Temperature (Temperature Range Option 1) 0 to 70 °C Ambient Operating Temperature (Temperature Range Option 6) –40 to 85 °C Temperature Under Bias –50 to 125 °C Storage Temperature –65 to 150 °C
Input or Output Voltage –0.6 to 4 V Supply Voltage –0.6 to 4 V
Identification Voltage –0.6 to 13.5 V
Table 4. Bottom Boo t B l ock Addresses M29W400BB
Address Range
(x8)
Address Range
(x16)
#
(Kbytes)
Size
Address Range
(x8)
Address Range
(x16)
10 64 70000h-7FFFFh 38000h-3FFFFh
9 64 60000h-6FFFFh 30000h-37FFFh
8 64 50000h-5FFFFh 28000h-2FFFFh 7 32 70000h-77FFFh 38000h-3BFFFh 6 64 60000h-6FFFFh 30000h-37FFFh 5 64 50000h-5FFFFh 28000h-2FFFFh 4 64 40000h-4FFFFh 20000h-27FFFh 3 64 30000h-3FFFFh 18000h-1FFFFh 2 64 20000h-2FFFFh 10000h-17FFFh 1 64 10000h-1FFFFh 08000h-0FFFFh 0 64 00000h-0FFFFh 00000h-07FFFh
7 64 40000h-4FFFFh 20000h-27FFFh
6 64 30000h-3FFFFh 18000h-1FFFFh
5 64 20000h-2FFFFh 10000h-17FFFh
4 64 10000h-1FFFFh 08000h-0FFFFh
3 32 08000h-0FFFFh 04000h-07FFFh
2 8 06000h-07FFFh 03000h-03FFFh
1 8 04000h-05FFFh 02000h-02FFFh
0 16 00000h-03FFFh 00000h-01FFFh
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M29W400BT, M29W400BB
SIGNAL DESCRIPTIONS
See Figure 1, Logic Diagram, and T able 1, Signal Names, for a brief overview of the signals connect­ed to this device.
Address Inputs (A0-A17). The Address Inputs select the cells in the memory array to access dur­ing Bus Read operations. During Bus W r ite opera­tions they control the commands sent to the Command Interface of the internal state machine.
Data I np uts/Ou tputs (DQ0-DQ7). TheDataIn­puts/Outputs output the data stored at the selected address during a Bus Read op eration. During Bus Write op erations they represent the commands sent to the Command Interface of the internal state machine.
Data I np uts/Ou tputs (DQ8-DQ14). The Data In­puts/Outputs output the data stored at the selected address during a Bus Read operation when BYTE is High, VIH. When BYTE is Low, VIL, these pins are not used and are hi gh im pedance. During Bus Write operations the Command Register does not use thes e bits. When reading the Status R egister these bits should be ignored.
Data Input/Output or Address Input (DQ15A-1).
When B Y TE
is High, VIH, this pin behaves as a Data Input/Output pin (as DQ8-DQ14). When BYTE
is Low, VIL, this pin behaves as an address pin; DQ15A–1 L ow will select the LSB of the Word on the other addresses, DQ15A–1 High will select the M SB. Throughout the text c onsider references to the Data Input/Output to include this pin when
is High and references to the Address In-
BYTE puts to include this pin when BYTE
is Low except
when stated explicitly otherwise.
Chip Enable (E
). The Chip Enable, E, activates
thememory,allowingBusReadandBusWriteop­erations to be performed. When Chip Enable is High, V
Output Enable (G
, all other pins are ignored.
IH
). T he Output Enable, G, con-
trols the Bus Read operation of the memory.
WriteEnable(W
). The Write Enable, W, controls
the Bus W rite operation of th e memory’s Com­mand Interface.
Reset/Block Temporary Unprotect (RP
). The Re-
set/Block Temporary Unprotect pin can be us ed to apply a Hardware Res et to the memory or to tem­porarily unprotect all Blocks that h ave been pro­tected.
A Hardware Reset is ac hieved by holding Reset/ Block Temporary Unprotect Low, V
. After Reset/Block Temporary Unprotect
t
PLPX
goes High, V
, the memory will be read y for Bus
IH
Read and Bus Write operations after t
, for at least
IL
PHEL
or
t
, whichever occurs last. See the Ready/Busy
RHEL
Output section, Table 17 and Figure 12, Reset/ Temporary Unprotect A C Characteristics for more details.
Holding RP
at VIDwill temporarily unprotect the protected Blocks in the memory. Program and Erase operations on all blocks will b e possible. The transition from V t
PHPHH
.
Ready/Busy Output (RB
to VIDmust be slower than
IH
). The Ready/Busy pin is an open-drain output that can be used to identify when the memory array can be read. Ready/Busy is high-imp edance during Read mode, Auto Select mode and Erase Suspend mode.
After a Hardware Reset, Bus Read and B us Write operations cannot begin until Ready /Bus y be­comes hi gh-impedance. See Table 17 and Figure 12, R es et /T emporary Unprotect AC Characteris­tics.
During Program or Erase operations Re ady /Busy is Low, V
. Ready/Busy will remain Low during
OL
Read/Reset commands or Hardware Resets until the memory is ready to ente r Read mode.
The use of an open-drain output allows the Ready/ Busy pins from several memories to be connected to a single pull-up resistor. A Low will then indicate that one, or more, of the memories is busy.
Byte/Word Organization Select (BYTE). The Byte/ Word Organization Selec t pin is used to switch be­tween the 8-bit and 16-bit Bus modes of the mem­ory. When Byte/Word Organization Select is Low,
, the memory is in 8-bit mode, when it is High,
V
IL
V
, the mem ory is in 16-bit mode.
IH
Supply Voltage. The VCCSupply Voltage
V
CC
supplies the power for all operations (Read, Pro­gram, Erase etc.).
The Command Interface is disabled when the V
CC
Supply Voltage is less than the Lockout Voltage, V
. This prevents Bus Write operations from ac-
LKO
cidentally damaging the data during power up, power down and power surges. If the Program/ Erase Controller is program min g or erasing during this time then the operation aborts an d the memo­ry contents being altered will be invalid.
A 0.1µF capacitor should be c onnec ted between the V
Supply Voltage pin and the VSSGround
CC
pin to decouple the current s urges from the power supply. The PCB track widths must be sufficient to carry the c urrent s required during program and erase operations,I
Ground. The VSSGround is the reference for
V
SS
CC3
.
all voltage measurements.
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M29W400BT, M29W400BB
BUS OPERATIONS
Thereare five standard bus operations that control the device. These are Bus Read, Bus Write, Out­Put Disable, Standby and Automat ic Standby. See Tables 5 and 6, Bus Operations, for a summary. Typically glitches of less than 5ns on Chip Enable or Write Enable are ig nored by the memory and do not affect bus operations.
Bus Read. B us Read operations read from the memory cells, or specific registers in the Com­mand Interface. A valid Bus Read ope ra tion in­volves setting the desired address on the Address Inputs, applying a Low sig nal, V
, to Chip Enable
IL
and Output Enable and keeping Write Enable High, V
. The Data Inputs/Outputs will output the
IH
value, see Figure 9, Read Mode AC Waveforms, and Table 14, Read AC Charac teristics, for details of when the output becom es valid.
Bus Write. Bus Write op erations write to the Command Interface. A valid Bus Write o peration begins by setting the desired address on the Ad­dress Inputs. The Addres s Inputs are latched by the Command Interface on the falling edge of Chip
Table 5. Bus Operations, BYTE
Operation E G W
=V
IL
Enable or Write Enable, whichever occurs last. The Data Inputs/Outputs are latched by the Com­mand Interface on the rising edge of Chip Enable orWrite Enable, whichever occurs first.Output En­able must rem ain High, V
, during the whole Bus
IH
Write operation. See Figures 10 and 11, Write AC Waveforms, and Tab les 15 and 16, Write AC Characteristics, for details of the timi ng require­ments.
Output Disable. The Dat a Inputs/Outputs are in the high im pedance state when Output E nable is High, V
.
IH
Standby. When Chip Enable is High, V memory enters St andby mode and th e Data In­puts/Outputs pins are placed in the high-imped­ance state. To reduce the Supply Current to t he Standby Supply Current, I be held within V
±0.2V. For the Standby current
CC
, Chip Enable should
CC2
level see Table 13 , DC Charac teristics. During program or erase operations the memory
will continue to use the Program/Erase Supply Current, I
, for P r ogram or Erase operations un-
CC3
til the operation completes.
Address Inputs
DQ15A–1, A0-A17
Data Inputs/Outputs
DQ14-DQ8 DQ7-DQ0
,the
IH
Bus Read Bus Write Output Disable X Standby Read Manufacturer
Code
Read Device Code
Note: X = VILor VIH.
V
IL
V
IL
V
IH
V
IL
V
IL
V
IL
V
IH
V
IH
X X X Hi-Z Hi-Z
V
IL
V
IL
Table 6. Bus Operations, BYTE =V
Operation E
Bus Read Bus Write Output Disable X Standby Read Manufacturer
Code
Read Device Code
Note: X = VILor VIH.
V
IL
V
IL
V
IH
V
IL
V
IL
G W
V
IL
V
IH
V
IH
X X X Hi-Z
V
IL
V
IL
V
Cell Address Hi-Z Data Output
IH
V
Command Address Hi-Z Data Input
IL
V
X Hi-Z Hi-Z
IH
A0 = VIL,A1=VIL,A9=VID,
V
IH
Others V A0=VIH,A1=VIL,A9=VID,
V
IH
Others VILor V
IH
or V
IL
IH
IH
Address Inputs
A0-A17
V
Cell Address Data Output
IH
V
Command Address Data Input
IL
V
X Hi-Z
IH
A0 = VIL,A1=VIL,A9=VID,
V
IH
Others V A0=VIH,A1=VIL,A9=VID,
V
IH
Others V
or V
IL
IH
or V
IL
IH
Hi-Z 20h
Hi-Z
EEh (M29W400BT) EFh (M29W400BB)
Data Inputs/Outputs
DQ15A–1, DQ14-DQ0
0020h
00EEh (M29W400BT) 00EFh (M29W400BB)
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M29W400BT, M29W400BB
Automatic Standby. If CMOS levels (VCC±0.2V)
are used to drive the bus and the bus is inactive for 150ns or more t he memory enters Automatic Standby where the internal Supply Current is re­duced to t he Standby Supply Current, I
CC2
.The Data Inputs/Outputs will still o utpu t data if a Bus Read operation is in progress.
Special Bus Operations
Additional bus operations can be performed to read the Electronic Signature and also to apply and remove Block Protection. Thes e bus opera­tions are intended for use by programming equip­ment and are not usually used in applications. They require V
to be applie d to some pin s.
ID
Electronic Signature. The memory has two codes, the manufacturer code and the device code, that can be read to identify the memory. These codes can be read by applying the signals listed in Tables 5 and 6, Bus Operations.
Block Protection and Blocks Unprotection. Each block can be separately protected against acci­dental Program or Erase. Protected blocks can be unprotected to allow data to be changed.
There are two methods available for protec ting and unprotecting the blocks, one for use on pro­gramming equipment and the other for in-system use. For further inform ation refer to Appl icati on Note A N 1122, Applying Protection and Unprotec­tion to M29 Series Flash.
COMMAND INTERFACE
All Bus Write operations t o the memory are inter­preted by t he Comman d Interface. Com mands consist of one or more sequential Bus Write oper­ations. Failure to observe a valid sequence of Bus Write operations wil l result in the memory return­ing t o Re ad mode. The long command sequences are imposed to maximize dat a security.
The address used for the co mm ands changes de­pending on whether the memory is in 16-bit or 8­bit mode. See either Table 7, or 8, depending on the configuration that is being used, for a sum­mary of the comm ands .
Read/Reset Command. The Rea d/Reset com­mand returns the memory to its Read mode where it behaves like a ROM or EPROM. It also resets the errors in the Status Register. Either one or three Bus Write operations can be used to issue the Read/Reset command.
If the Read/Reset co mm and is issued during a Block Erase operation or following a Programming or Erase error then the memory will take up to 10µs to abort. During the abort period no valid data can be read from the memory. Issuing a Read/Re­set c ommand during a Block Erase operation wi ll leave invalid data in the m emory.
Auto Select Command. The Aut o Selec t com­mand is used to read the Manufacturer C ode, the Device Code and t he Block Protection Stat us. Three consecutive Bus Write operations are re­quired to issue the Auto Select command. Once the Auto Select command is issued the memory remains in Auto Select mode until another com­mand is issued.
From the Auto Select mode the Manufacturer Code can be read using a Bus Read operation with A0 = V
may be set to either V
and A1 = VIL. Th e other address bits
IL
or VIH. The Manufacturer
IL
Code for STMicroelectronics is 0020h. The D evice Code can be read using a Bus Read
operation with A0 = V address bits may be set to either V
and A1 = VIL. The other
IH
or VIH.The
IL
Device Code for the M29W400BT is 00EEh and for the M29W400BB is 00EFh.
The Block Protection Status of each block can be read using a Bus Read op eration with A0 = V A1 = V
, and A12-A17 specifying the address of
IH
IL
the bl oc k. The other address bits may be set to ei­ther V
or VIH. If the addressed block is protected
IL
then 01h is output on Dat a Inputs/Outputs D Q0­DQ7, otherwise 00h is output.
Program Command. The Program command can be used to program a value to one address in the memory array at a time. The command re­quires four Bus Write operations, the final write op­eration latches t he address and data in the internal state machine and starts t he Program/Erase Con­troller.
If the address fa lls in a protected bloc k then the Program command i s ignored, the d ata remains unchanged. The Status R egister is never read and no error condition is given.
During the program operation the memory will ig­nore all commands. It is not possible to issue any command to abort or paus e the operation. Typical program times are given in Table 9. Bus Read op­erations during the program operation will output the Status Register on the Data Inputs/Outputs. See the section on the Status Register for more details.
After the program operation has completed the memory will return to the Read mode, unless an error has occurred. When an error occurs the memory will continue t o output the Status Regis­ter. A Read/Reset command must be issued to re­set the error condition and return t o Read mode.
Note that the Program command cannot change a bit set at ’0’ back to ’1. One of the Er as e Com­mands must be used to s et all the bit s in a block or in the whole mem ory from ’ 0’ to ’1’.
,
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M29W400BT, M29W400BB
Table 7. Commands, 16-bit mode, BYTE =V
IH
Bus Write Operations
Command
Read/Reset
1X F0 3 555 AA 2AA 55 X F0
1st 2nd 3rd 4th 5th 6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Auto Select 3 555 AA 2AA 55 555 90 Program 4 555 AA 2AA 55 555 A0 PA PD Unlock Bypass 3 555 AA 2AA 55 555 20 Unlock Bypass
Program
2X A0PAPD
Unlock Bypass Reset 2 X 90 X 00 Chip Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 555 10 Block Erase 6+ 555 AA 2AA 55 555 80 555 AA 2AA 55 BA 30 Erase Suspend 1 X B0 Erase Resume 1 X 30
Table 8. Commands, 8-bit mode, BYTE =V
IL
Bus Write Operations
Command
Read/Reset
1X F0 3 AAA AA 555 55 X F0
1st 2nd 3rd 4th 5th 6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Auto Select 3 AAA AA 555 55 AAA 90 Program 4 AAA AA 555 55 AAA A0 PA PD Unlock Bypass 3 AAA AA 555 55 AAA 20 Unlock Bypass
Program
2X A0PAPD
Unlock Bypass Reset 2 X 90 X 00 Chip Erase 6 AAA AA 555 55 AAA 80 AAA AA 555 55 AAA 10 Block Erase 6+ AAA AA 555 55 AAA 80 AAA AA 555 55 BA 30 Erase Suspend 1 X B0 Erase Resume 1 X 30
Note: X Don’t Care, PA Program Address, PD Program Data, BA Any address in the Block. All values in the table are in hexadecimal.
The Command Interface only uses A–1, A0-A10and DQ0-DQ7 to verify the commands; A11-A17, DQ8-DQ14 and DQ15 are Don’t Care. DQ15A–1 is A–1 when BYTE
Read/Reset. After a Read/Reset command, read the memory as normal until another command is issued. Auto Select. After an Auto Select command, read Manufacturer ID, Device ID or Block Protection Status. Program, Unlock Bypass Program, Chip Erase, Block Erase. After these commands read the Status Register until the Program/Erase
Controller completes and the memory returns to Read Mode. Add additional Blocks during Block Erase Command with additional Bus Write Operations until Timeout Bit is set.
Unlock Bypass. After the Unlock Bypass command issue Unlock Bypass Program orUnlock Bypass Reset commands. Unlock Bypass Reset. After the Unlock Bypass Reset command read the memory as normal until another command is issued. Erase Suspend. After the Erase Suspend command read non-erasing memory blocks as normal, issue Auto Select and Program commands
on non-erasing blocks as normal. Erase Resume. After the Erase Resume command the suspended Erase operation resumes, read the Status Register until the Program/
Erase Controller completes and the memory returns to Read Mode.
is VILor DQ15 when BYTE is VIH.
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M29W400BT, M29W400BB
Unlock Bypass Command. The Unlock Bypass
command is used in conjunction with the Unlock Bypass Program comm and to program the memo­ry. When the access time to the device is long (as with some EPROM prog ramm ers ) c ons iderable time saving can be made by us ing these com­mands. Three Bus Write operations ar e required to issue the Unl oc k Bypass c ommand.
Once the Unlock Bypass comm and has been is­sued the m emory will only accept the Unlock By­pass Program command and the Unlock Bypass Reset command. The memory can be read as if in Read mode.
Unlock Bypass P rog ram Command. The Un- lock Bypas s Program command can be used to program on e address in memory at a time. The command requires two Bus Write operations, the final write operation latches t he address and data in the internal state machine and starts the Pro­gram/Erase Controller.
The Program operation using the Unlock Bypass Program command behaves identically to the Pro­gram o peration using the Program command. A protected block cannot be programmed; the oper­ation cannot be aborted and the Status Register is read. Errors must be reset using the Read/Reset command, which leaves the device in Unlock By­pass Mode. See the Program comm and for details on the behavior.
Unlock Bypass Reset Command. The Unlock Bypass Reset command can be used to return to Read/Reset mode from Unlock Bypass Mode. Two Bus Write operations are required to issue the Unlock Bypass R es et command.
Chip Erase Command. The Chip Erase com­mandcanbeusedtoerasetheentirechip.SixBus Write operations are required to issue the Chip Erase Command and start the Program /Erase Controller.
If any blocks are protected then these are ignored and all the other blocks are erased. If all of the blocks are protected the Chip Erase ope ration ap­pears to start but will terminate within about 100µs, leaving the data unchange d. No error condition is given when protected blocks are ignored.
During t he erase operat ion the mem ory willignore all commands. It is not possible to issue any com­mand to abort the operation. Typical chip erase times are given in Table 9. All Bus Read opera­tions during the Chip E ras e operation will output the Status R egister on the Data Inputs/Outputs. See the section on the Status Register for more details.
After the Chip Erase operation has c ompleted the memory will return to the Read Mode, unless an error has occurred. When an error occurs the memory will continue t o output the Status Regis­ter. A Read/Reset command must be issued to re­set the error condition and return t o Read Mode.
TheChip Erase Command sets all of the bit s in un­protected blocks of the mem ory to ’1’. All previous data is lost.
Block Erase Command. TheBlockErasecom­mandcanbeusedtoerasealistofoneormore blocks. Six Bus Write operations are required to select the first block in the list. Each additional block in the list can be selected by r epeating the sixth B us Write operation us ing the address of the additional block. The Block Eras e operation starts the Program/E rase Controller about 50µs after the last Bus Write operat ion. Once the Program/Erase Controller starts it is not possible to select any more blocks. E ac h additional block must therefore be selected within 50µs of the last block. The 50µs timer restarts when an additional block is selected. The Status R egister can be read after the sixth Bus Write operation. See the Status Register for details on how to i dentify if the Program/Erase Controller has started the Block Erase operation.
If any s elected blocks are protected then these are ignored and all the ot her selected blocks are erased. If all of the selected blocks are protected the Block Erase operation appears to start but will terminate within about 100µs, leaving the data un­changed. No error condition is given when prot ec t­ed blocks are ignored.
During the Blo ck Erase operation the memory will ignore all commands except the Erase Suspend and Read/Reset commands. Typical bl oc k erase times are given in Table 9. All Bus Read opera­tions during the Block Erase operation will output the Status Register on the Data Inputs/Outputs. See the section on the Status Register for more details.
After the Block Erase ope ra tion has completed the memory will return to the Read Mode, unless an error has occurred. When an error occurs the memory will continue t o output the Status Regis­ter. A Read/Reset command must be issued to re­set the error condition and return to Read mode. The Block Erase Command sets all of t he bits in the unprotec ted selected blocks to ’1’. All previous data in the selected blocks is lost.
9/25
M29W400BT, M29W400BB
Erase Suspend Command. The Eras e Su sp end
Command m ay be used to temporarily suspend a Block Erase operation and return the m emory to Read mode. The co mm and requires one Bus Write operation.
The Program/Erase Controller will suspend within 15µs of the Erase Suspend Command being is­sued. Once the Program/Erase Controller has stopped t he memory will be set to R ead mode and the Erase wil l be suspended. If the Erase Suspend command is issued during the period when the memory is waiting for an additional block (before the Program/Erase Controller starts) then the
During Erase Suspend it is possible to Read and Program cells in blocks that are not being erased; both Read and Program operations behave as normal on t hes e blocks. Reading from blocks that are being erased will output the Status Register. It is also possibl e to enter the Auto Select mode: the memory will behave as in the Auto Select mode on all blocks until a R ead/ Res et command returns the memory to Eras e Suspend mode.
Erase Resume Com m and . The Erase Resume command must be used to restart the Program/ Erase Controller from Era se Suspend. An erase
can be suspen ded and resumed more than once. Erase is su sp ended immediately and will start im­mediately when the Erase Resume Command is issued. It will not be possible to select any further blocks for erasure after the Erase Resume.
Table 9. Program, Erase Times and Program, Erase Endurance Cycles
= 0 to 70°C or –40 to 85 °C)
(T
A
Parameter Min
Chip Erase (All bits in the memory set to ‘0’) 2.5 2.5 sec Chip Erase 6 6 35 sec Block Erase (64 Kbytes) 0.8 0.8 6 sec Program (Byte or Word) 10 10 200 µs
Typ
(1)
Typical after
100k W/E Cycles
(1)
Max Unit
Chip Program (Byte by Byte) 5.5 5.5 30 sec Chip Program (Word by Word) 2.8 2.8 15 sec Program/Erase Cycles (per Block) 100,000 cycles
Note: 1. TA=25°C,VCC=3.3V.
10/25
M29W400BT, M29W400BB
STATUS REGISTER
Bus Read operations from any address always read the Status R egister during Program and Erase operations. It is also read during Erase Sus ­pend when an address w ithin a block being erased is accessed.
The bits in the Status Register are summarized in Table 10, Status Register Bits.
Data P olling Bit (DQ7). The Data Polling Bit can be used to identify whether the Program/Erase Controller has succes sfull y completed its opera­tion or if it has responded to an Erase S us pend. The Data Polling Bit is output on DQ7 when the Status Register is read.
During Program operations the Data Polling Bit outputs the com plement of the bit being pro­grammed to DQ7. After successful completion of the Program operation the memory returns to Read mod and Bus Read operations from the ad­dress just programmed output DQ7, no t its com­plemente.
During Erase operations the Data Polling Bit out­puts ’0’, the complement of t he eras ed state of DQ7. After successful completion of the Erase op­eration the memory returns to Read Mode.
In Erase Suspend m ode the Data Polling Bit will output a ’1’ during a Bus Read operation within a block being erased. The Data Polling Bit will change from a ’0’ to a ’1’ when the Program/Erase Controller has suspended the Erase operation.
Figure 5, Data Polling Flowchart, gives an exam­ple of how to us e the Data Polling Bit. A V alid Ad-
dress is the address being program med or an
address within the block being erased.
Toggle Bit (DQ6). The Toggle Bit can be us ed to
identify wheth er the Program/Erase Controller has
successfully completed its operation or if it has re-
sponded to an Erase Suspend. The Toggle Bit is
output on DQ6 when the Status R egister is read.
During Program and Erase operations the Toggle
Bit changes from ’0’ to ’1’ to ’0’, etc., with succes-
sive Bus Read operations at any address. After
successful completion of the operation the memo-
ry returns to Read mode.
During Eras e Suspend mode the Toggle Bit will
output when addres sing a cell within a block being
erased. The Toggle Bit will stop toggling when the
Program/Erase Controller has suspended the
Erase operation.
Figure 6, Data Toggle Flowchart, gives an exam-
ple of how to use the Data Toggle Bit.
Error B it (DQ5). TheErrorBitcanbeusedto
identify errors detected by the Program/Erase
Controller. The Error Bit is set to ’1’ when a Pro-
gram, Block Er as e or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Reset command must be issued
before other commands are issued. The Error bit
is output on DQ5 when the Status Register is read.
Note that the Program command cannot change a
bit set at ’0’ back to ’1’ and attempting to do so may
or may not set D Q5 a t ’1’. In both cases, a succes-
sive Bus Read operation will show the bit is still ’0’.
One of the Erase commands must be used to set
all the bits in a blo ck or in the whole memory from
’0’ to ’1’.
Table 10. Status Register Bits
Operation Address DQ7 DQ6 DQ5 DQ3 DQ2 RB
Program Any Address DQ7 Toggle 0 0 Program During Erase
Suspend Program Error Any Address DQ7 Chip Erase Any Address 0 Toggle 0 1 Toggle 0
Block Erase before timeout
Block Erase
Erase Suspend
Erase Error
Note: Unspecified data bits should be ignored.
Any Address DQ7
Erasing Block 0 Toggle 0 0 Toggle 0
Non-Erasing Block 0 Toggle 0 0 No Toggle 0
Erasing Block 0 Toggle 0 1 Toggle 0
Non-Erasing Block 0 Toggle 0 1 No Toggle 0
Erasing Block 1 No Toggle 0 Toggle 1
Non-Erasing Block Data read as normal 1
Good Block Address 0 Toggle 1 1 No Toggle 0
Faulty Block Address 0 Toggle 1 1 Toggle 0
Toggle 0 0
Toggle 1 0
11/25
M29W400BT, M29W400BB
Figure 5. Data Polling Flowchart
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
DATA
NO
DQ5
READ DQ7
at VALID ADDRESS
DQ7
DATA
FAIL PASS
= 1
YES
=
NO
YES
YES
=
NO
AI03598
Figure 6. Data Toggle Flowchart
START
READ
DQ5 & DQ6
READ DQ6
DQ6
=
TOGGLE
NO
DQ5
= 1
READ DQ6
TWICE
DQ6
=
TOGGLE
FAIL PASS
NO
YES
YES
NO
YES
AI01370B
Erase Timer Bit (DQ3). The Erase Timer Bit can be used to identify the start of P r ogram/Erase Controller operation during a Block Er ase com­mand. Once the P rogram/E r as e Controller starts erasing the Erase Timer Bit is set to ’1’. Before the Program/Erase Contro ller s tarts the Erase Timer Bit is set to ’0’ and additional b locks to be erased may be written to the Command I nterface. The Erase Timer Bit is output on DQ3 when the Status Register is read.
Alternative Toggle Bit (DQ2). The Alternative Toggle Bit can be use d to monitor the Program/ Erase c ontroller during E ras e operations. The Al­ternative T oggle Bit is output on DQ2 when t he Status Register is read.
During Chip Erase and Block Erase operations t he Toggle Bit changes from ’0’ to ’1’ to ’0’, etc., with successive Bus R ead operations from address es
12/25
withintheblocks being erased. Once the operation
completes the memory ret urns to Read mode.
During Erase Suspend the Alternative Toggle Bit
changes from ’0’ to ’1’ to ’0’, etc. with s uc c es s ive
Bus Read operations from addresses within the
blocks being erased. Bus Read operations to ad-
dresses within blocks not being erased will output
the memory cell data as if in Read mode.
After an Eras e operation that c aus es the Error Bit
tobesettheAlternativeToggleBitcanbeusedto
identify which block or blocks have caused the er-
ror. The Alternative Toggle Bit changes from ’0’ to
’1’ to ’0’, etc. with suc c es sive Bus Read Opera-
tions from addresses within blocks that have not
erased correctly. The Alternative Toggle Bit does
not change if the addressed block has erased c or-
rectly.
M29W400BT, M29W400BB
Table 11. AC M easurement Cond ition s
Parameter
55 70 90 / 120
Supply Voltage
V
CC
Load Capacitance (C
)
L
3.0 to 3.6V 2.7 to 3.6V 2.7 to 3.6V 30pF 30pF 100pF
Input Rise and Fall Times 10ns 10ns 10ns Input Pulse Voltages 0 to 3V 0 to 3V 0 to 3V Input and Output Timing Ref. Voltages 1.5V 1.5V 1.5V
M29W400B
Figure 7. AC Testing Input Output Waveform
3V
1.5V
0V
AI01417
Figure 8. AC Testing Load Circuit
0.8V
1N914
3.3k
DEVICE
UNDER
TEST
CL = 30pF or 100pF
CL includes JIG capacitance
Table 12. Capacitance
(T
=25°C,f=1MHz)
A
Symbol Parameter Test Condition Min Max Unit
V
V
IN
OUT
=0V
=0V
6pF
12 pF
C
IN
C
OUT
Note: Sampled only, not 100% tested.
Input Capacitance Output Capacitance
OUT
AI02762
13/25
M29W400BT, M29W400BB
Table 13. DC Characteristics
(T
= 0 to 70°C or –40 to 85 °C)
A
Symbol Parameter Test Condition Min
Typ.
(2)
Max Unit
I
Input Leakage Current
LI
I
I
CC1
I
CC2
I
CC3
V
V V V
V
V
LKO
Note: 1. Sampled only, not 100% tested.
Output Leakage Current
LO
Supply Current (Read)
Supply Current (Standby)
(1)
Supply Current (Program/Erase)
Input Low Voltage –0.5 0.8 V
IL
Input High Voltage
IH
Output Low Voltage
OL
Output High Voltage IOH= –100µA
OH
Identification Voltage 11.5 12.5 V
ID
I
Identification Current
ID
Program/Erase Lockout Supply
(1)
Voltage
2. T
=25°C,VCC=3.3V.
A
0V V
0V V
E
=VIL,G=VIH, f = 6MHz
E
RP
V
IN
CC
V
OUT
=VCC± 0.2V,
=VCC± 0.2V
CC
Program/Erase
Controller active
I
= 1.8mA
OL
A9 = V
ID
±1 ±1
410mA
30 100
20 mA
0.7V
CC
VCC+ 0.3
0.45 V
V
–0.4
CC
100
1.8 2.3 V
µA µA
µA
V
V
µA
14/25
Table 14. Read AC Chara cteri stics
(T
= 0 to 70°C or –40 to 85 °C)
A
Symbol Alt Parameter Test Condition
=VIL,
t
t
t
ELQX
AVAV
AVQV
(1)
t
RC
t
ACC
t
Address Valid to Next Address Valid
Address Valid to Output Valid
Chip Enable Low to Output
LZ
Transition
E
G =V
E
=VIL,
G =V
=V
G
IL
IL
IL
M29W400BT, M29W400BB
M29W400B
Unit
55 70 90 / 120
Min 55 70 90 ns
Max 55 70 90 ns
Min 0 0 0 ns
t
t
ELQV
(1)
(1)
(1)
t
t
ELFL
t
ELFH
t
FLQZ
t
FHQV
t
GLQX
t
GLQV
t
EHQZ
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
t
ELBL
t
ELBH
t
BLQZ
t
BHQV
Note: 1. Sampled only, not 100% tested.
Chip Enable Low to Output Valid
CE
Output Enable Low to Output
OLZ
Transition
t
Output Enable Low to Output Valid
OE
t
Chip Enable High to Output Hi-Z
HZ
t
Output Enable High to Output Hi-Z
DF
Chip Enable, Output Enable or
t
Address Transition to Output
OH
Transition
Chip Enable to BYTE Low or High Max 5 5 5 ns
BYTE Low to Output Hi-Z Max 25 25 30 ns BYTE High to Output Valid Max 30 30 40 ns
Figure 9. Read Mode AC W aveforms
A0-A17/ A–1
tAVQV tAXQX
tAVAV VALID
G
=V
=V
E
E
=V
G
=V
E
=V
Max 55 70 90 ns
IL
Min 0 0 0 ns
IL
Max 30 30 35 ns
IL
Max 20 25 30 ns
IL
Max 20 25 30 ns
IL
Min 0 0 0 ns
E
G
DQ0-DQ7/ DQ8-DQ15
BYTE
tELQV tEHQX
tELQX tEHQZ
tGLQX tGHQX
tGLQV
tBHQV
tELBL/tELBH tBLQZ
tGHQZ
VALID
AI02907
15/25
M29W400BT, M29W400BB
Table 15. Write AC Characteristics, Write Enable Controlled
(T
= 0 to 70°C or –40 to 85 °C)
A
Symbol Alt Parameter
t
AVAV
t
ELWL
t
WLWH
t
DVWH
t
WHDX
t
WHEH
t
WHWL
t
AVWL
t
WLAX
t
GHWL
t
WHGL
(1)
t
WHRL
t
VCHEL
Note: 1. Sampled only, not 100% tested.
t
WC
t
CS
t
WP
t
DS
t
DH
t
CH
t
WPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address Valid Min 55 70 90 ns Chip Enable Low to Write Enable Low Min 0 0 0 ns Write Enable Low to Write Enable High Min 40 45 45 ns Input Valid to Write Enable High Min 25 30 45 ns Write Enable High to Input Transition Min 0 0 0 ns Write Enable High to Chip Enable High Min 0 0 0 ns Write Enable High to Write Enable Low Min 30 30 30 ns Address Valid to Write Enable Low Min 0 0 0 ns Write Enable Low to Address Transition Min 40 45 45 ns Output Enable High to Write Enable Low Min 0 0 0 ns Write Enable High to Output Enable Low Min 0 0 0 ns
Program/Erase Valid to RB Low Max 30 30 35 ns VCCHigh to Chip Enable Low
M29W400B
Unit
55 70 90 / 120
Min50505s
Figure 10. Write AC Waveforms, Write Enab le Controlled
tAVAV
A0-A17/ A–1
E
G
W
DQ0-DQ7/ DQ8-DQ15
V
CC
RB
tAVWL
tELWL
tVCHEL
VALID
tWLWHtGHWL
tDVWH
tWLAX
tWHEH
tWHGL
tWHWL
tWHDX
VALID
16/25
tWHRL
AI01869C
Table 16. Write AC Characteristics, Chip Enable Controlled
(T
= 0 to 70°C or –40 to 85 °C)
A
Symbol Alt Parameter
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
(1)
t
EHRL
t
VCHWL
Note: 1. Sampled only, not 100% tested.
t
WC
t
WS
t
CP
t
DS
t
DH
t
WH
t
CPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address Valid Min 55 70 90 ns Write Enable Low to Chip Enable Low Min 0 0 0 ns Chip Enable Low to Chip Enable High Min 40 45 45 ns Input Valid to Chip Enable High Min 25 30 45 ns Chip Enable High to Input Transition Min 0 0 0 ns Chip Enable High to Write Enable High Min 0 0 0 ns Chip Enable High to Chip Enable Low Min 30 30 30 ns Address Valid to Chip Enable Low Min 0 0 0 ns Chip Enable Low to Address Transition Min 40 45 45 ns Output Enable High Chip Enable Low Min 0 0 0 ns Chip Enable High to Output Enable Low Min 0 0 0 ns
Program/Erase Valid to RB Low Max 30 30 35 ns VCCHigh to Write Enable Low
M29W400BT, M29W400BB
M29W400B
Unit
55 70 90 / 120
Min50505s
Figure 11. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A17/ A–1
W
G
E
DQ0-DQ7/ DQ8-DQ15
V
CC
RB
tAVEL
tWLEL
tVCHWL
VALID
tELEHtGHEL
tDVEH
tELAX
tEHWH
tEHGL
tEHEL
tEHDX
VALID
tEHRL
AI01870C
17/25
M29W400BT, M29W400BB
Table 17. Reset/Block Temporary Unprotect AC Character istics
(T
= 0 to 70°C or –40 to 85 °C)
A
Symbol Alt Parameter
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1)
t
RHWL
(1)
t
RHEL
(1)
t
RHGL
t
PLPX
(1)
t
PHPHH
(1)
t
PLYH
Note: 1. Sampled only, not 100% tested.
t
t
VIDR
t
READY
Figure 12. Reset/B lock Temporary Unprotect AC Waveforms
RP High to Write Enable Low, Chip Enable
RH
Low, Output Enable Low
RB High to Write Enable Low, Chip Enable
t
RB
Low, Output Enable Low
t
RP Pulse Width Min 500 500 500 ns
RP
RP Rise Time to V
ID
RP Low to Read Mode
Min 50 50 50 ns
Min 0 0 0 ns
Min 500 500 500 ns
Max10101s
M29W400B
Unit
55 70 90 / 120
W,
RB
RP
E, G
tPHWL, tPHEL, tPHGL
tRHWL, tRHEL, tRHGL
tPLPX
tPHPHH
tPLYH
AI02931
18/25
M29W400BT, M29W400BB
Table 18. Ordering Informa tion Scheme
Example: M29W400BB 55 N 1 T
Device Type
M29
Operating Voltage
W=V
Device Function
400B = 4 Mbit (x8/x16), Boot Block
Array Matrix
T=TopBoot B = Bottom Boot
Speed
55 = 55 ns 70 = 70 ns 90 = 90 ns 120 = 120 ns
= 2.7 to 3.6V
CC
Package
N = TSOP48: 12 x 20 mm M = SO44 ZA = TFBGA48: 0.8mm pitch
Temperature Range
1 = 0 to 70 °C 6 = –40 to 85 °C
Option
T = Tape & Reel Packing
Table 19. Daisy Chain Ordering Scheme
Example: M29 DCL1-4 T
Device Type
M29
Daisy Chain
DCL1-4 = Daisy Chain Level 1 for 4 Mbit parts
Option
T = Tape & Reel Packing
Devices are shipped from the fa ctory with the memory c ontent bits erased to ’1’. For a list of available options (Speed, Package, etc...) or for further information on any as pect of this de-
vice, please contact the ST Sales Of fice nearest to you.
19/25
M29W400BT, M29W400BB
Table 20. Revision History
Date Version Revision Details
July 1999 -01 First Issue
-02 Chip Erase Max. specification added Block Erase Max. specification added
9/21/99
10/04/99
-03 FBGA Connections change
1/21/00 -04 FBGA Package removed 2/01/00 -05 TSOP48 Package mechanical data change
-06 Document type: from Preliminary Data to Data Sheet
3/09/00
4/18/00 -07 Status Register section clarification 2/09/01 -08 TFBGA48 package added
-09 TFBGA48 package mechanical outline and data changed
6/21/01
Program Max. specification added Chip Program Max. specification added
Typ. specification added
I
CC1
I
Typ. specification added
CC2
Test Condition change
I
CC
Status Register bit DQ5 clarification Data Polling Flowchart diagram change Data Toggle Flowchart diagram change
Daisy Chain commercial code defined TFBGA48 Daisy Chain diagrams, Package and PCB Connections added
20/25
M29W400BT, M29W400BB
Table 21. TSOP 48 - 48 lead Plastic Thin Smal l Outline, 12 x 20mm , Package Mechanical D ata
Symbol
Typ Min Max Typ Min Max
A 1.20 0.0472 A1 0.05 0.15 0.0020 0.0059 A2 0.95 1.05 0.0374 0.0413
B 0.17 0.27 0.0067 0.0106
C 0.10 0.21 0.0039 0.0083
D 19.80 20.20 0.7795 0.7953 D1 18.30 18.50 0.7205 0.7283
E 11.90 12.10 0.4685 0.4764
e 0.50 0.0197
L 0.50 0.70 0.0197 0.0279
α
N48 48 CP 0.10 0.0039
mm inches
Figure 13. TSOP48 - 48 lead Plastic Thin Small Outline, 12 x 20mm , Package Outline
A2
1 N
e
E
B
N/2
D1
D
DIE
A
CP
C
TSOP-a
Drawing is not to scale.
LA1 α
21/25
M29W400BT, M29W400BB
Table 22. TFBGA48 - 6 x 8 bal l array, 0. 8 m m pitch, Package Mechanical Data
Symbol
Typ Min Max Typ Min Max
A 1.200 0.0472 A1 0.200 0.0079 A2 1.000 0.0394
b 0.400 0.350 0.450 0.0157 0.0138 0.0177
D 6.000 5.900 6.100 0.2362 0.2323 0.2402 D1 4.000 0.1575
ddd 0.100 0.0039
E 9.000 8.900 9.100 0.3543 0.3504 0.3583 E1 5.600 0.2205
e 0.800 0.0315 – FD 1.000 0.0394 – FE 1.700 0.0669 – SD 0.400 0.0157 – SE 0.400 0.0157
millimeters inches
Figure14.TFBGA48-6x8ballarray,0.8mmpitch,PackageOutline,Bottomview
D
FD
FE
BALL "A1"
E1E
eb
A
D1
SD
SE
e
A2
A1
ddd
Drawing is not to scale.
22/25
BGA-Z00
M29W400BT, M29W400BB
Figure 15. TFBGA48 Daisy Chain - Packag e C onnections (Top view through package)
12 6
A
B
C
D
E
F
G
H
543
AI04893
Figure 16. TFBGA48 Daisy Chain - PCB Connections (Top view through package)
START
POINT
12 6
A
B
C
D
E
F
G
543
END
POINT
H
AI04892
23/25
M29W400BT, M29W400BB
Table 23. SO44 - 44 lead P lastic Small Outline, 525 mils body width , Package Mechanical Data
Symbol
Typ Min Max Typ Min Max
A 2.42 2.62 0.0953 0.1031 A1 0.22 0.23 0.0087 0.0091 A2 2.25 2.35 0.0886 0.0925
B 0.50 0.0197
C 0.10 0.25 0.0039 0.0098
D 28.10 28.30 1.1063 1.1142
E 13.20 13.40 0.5197 0.5276
e 1.27 0.0500
H 15.90 16.10 0.6260 0.6339
L 0.80 0.0315
α
N44 44
CP 0.10 0.0039
mm inches
Figure 17. SO44 - 4 4 lead Plastic S m all Outline, 525 mils body w id th, Package Outline
A2
A
C
B
e
CP
D
N
E
H
1
LA1 α
SO-b
Drawing is not to scale.
24/25
M29W400BT, M29W400BB
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use ofsuchinformation nor for any infringement of patents orotherrights ofthird parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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