The M29F800D is a 8 Mbit (1Mb x8 or 512Kb x16)
non-volatile memory that can be read, erased and
reprogrammed. These operations can be performed using a single low voltage (5V) supply. On
power-up the memory defaults to its Read mode
where it can be read in the same way as a ROM or
EPROM.
The memory is divided into blocks that can be
erased independently so it is pos sible to pres erve
valid data while old data is erased. Each block can
be protected independently to prev ent accidental
Program or Erase commands from modifying the
memory. Program and Erase com m ands are wri tten to the Command Interface of t he memory. An
on-chip Program/Erase Controller simplifies the
process of programming or erasing the memory by
taking care of all of the special operations that are
required to update the memory contents.
The end of a program or erase operation can be
detected and any error conditions identified. The
Figure 2. Logic DiagramTable 1. Signal Names
command set required to control the memory is
consistent with JEDEC standards.
The blocks in the memory are asymmetrically arranged, see Figures 5 and 6, Block Addresses.
The first or last 64 Kbytes h ave been divided into
four additional blocks. The 16 Kbyte Boot Block
can be used for small initialization code to start the
microprocessor, the two 8 Kbyte Parameter
Blocks can be used for parameter storage and the
remaining 32K is a small Main Block where the application may be stored.
Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory.
They allow simple conne ction to most microprocessors, often without additional logic.
The memory is offered in SO44 a nd TSOP48 (12
x 20mm) pack ages. The m emory is supplied with
all the bits erased (set to ’1’).
A0-A18
W
RP
BYTE
A0-A18Address Inputs
DQ0-DQ7Data Inputs/Outputs
V
CC
19
E
G
M29F800DT
M29F800DB
V
SS
15
DQ0-DQ14
DQ15A–1
RB
AI06148B
DQ8-DQ14Data Inputs/Outputs
DQ15A–1Data Input/Output or Address Input
E
G
W
RP
Note: Al so see Appendix A, Tables 19 and 20 for a full list i ng of the Block Addresses.
AI06152
7/39
M29F800DT, M29F800DB
Figure 6. Block Addresses (x16)
Top Boot Block Addresses (x16)
7FFFFh
7E000h
7DFFFh
7D000h
7CFFFh
7C000h
7BFFFh
78000h
77FFFh
70000h
0FFFFh
08000h
07FFFh
00000h
M29F800DT
8 KWord
4 KWord
4 KWord
16 KWord
32 KWord
32 KWord
32 KWord
Total of 15
32 KWord Blocks
Bottom Boot Block Addresses (x16)
7FFFFh
78000h
77FFFh
70000h
0FFFFh
08000h
07FFFh
04000h
03FFFh
03000h
02FFFh
02000h
01FFFh
00000h
M29F800DB
32 KWord
32 KWord
32 KWord
16 KWord
4 KWord
4 KWord
8 KWord
Total of 15
32 KWord Blocks
Note: Al so see Appendix A, Tables 19 and 20 for a full list i ng of the Block Addresses.
AI06153
8/39
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram, and Table 1, Sign al
Names, for a brief overview of the signals connected to this device.
Address Inputs (A0-A18). The Address Inputs
select the cells i n the memory array to a ccess during Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the internal state machine.
Data Inputs/Outputs (DQ0-DQ7). The Data Inputs/Outputs output the data stored at the selected
address during a Bus Read operation. During Bus
Write operations they represent the commands
sent to the Command Interface of the internal state
machine.
Data Inputs/Outputs (DQ8-DQ14). The Data Inputs/Outputs output the data stored at the selected
address during a Bus Read operation when BYTE
is High, VIH. When BYTE is Low, VIL, these pins
are not used and are high impedance. During Bus
Write operations the Command Register does not
use these bits. When reading t he Status Register
these bits should be ignored.
Data Input/Ou tput or Address Input (DQ15A-1).
When BYTE
is High, VIH, this pin behaves as a
Data Input/Output pin (as DQ8-DQ14). When
is Low, VIL, this pin behaves as an address
BYTE
pin; DQ15A–1 Low will select the LSB of the Word
on the other addresses, DQ15A–1 High will select
the MSB. Throughout the text consider references
to the Data Input/Output to include this pin when
BYTE
is High and ref erences to the Address In-
puts to include this pin when BYTE
is Low except
when stated explicitly otherwise.
Chip Enable (E
). The Chip Enable, E, activates
the memory, allowing Bus Read and Bus Write operations to be performed. When Chip Enable is
High, V
Output Enable (G
, all other pins are ignored.
IH
). The Output Enable, G, con-
trols the Bus Read operation of the memory.
Write Enable (W
). The Write Enable, W, controls
the Bus Write operation of the memory’s Command Interf a c e .
Reset/Block Temporary Unprotect (RP
). The
Reset/Block Temporary Unprotect pin can be
used to apply a Hardware Reset to the memory or
to temporarily unprotect all Blocks that hav e b een
protected.
A Hardware Reset is achieved by holding Reset/
Block Temporary Unprotect Low, V
t
. After Reset/Block Temporary Unprotect
PLPX
goes High, V
, the memory will be ready for Bus
IH
, for at least
IL
M29F800DT, M29F800DB
Read and Bus Write operations after t
t
, whichever occurs last. See the Ready/Busy
RHEL
Output section, Table 15 and Figure 14, Reset/
Temporary Unprotect AC Characteristics for more
details.
Holding RP
at VID will temporarily unprotect the
protected Blocks in the memory. Program and
Erase operations on all blocks will be possible.
The transition from V
t
PHPHH
.
Ready/Busy Output (RB
to VID must be slower than
IH
). The Ready/Busy pin
is an open-drain output that can be used to identify
when the device is performing a Program or Erase
operation. During Program or Erase operations
Ready/Busy is Low, V
. Ready/Busy is high-im-
OL
pedance during Read mode, Auto Select mode
and Erase Suspend mode.
After a Hardware Reset, Bus Read and Bus Write
operations cannot begin until Ready/Busy becomes high-impedance. See Tabl e 15 and Figure
14, Reset/Temporary Unprotect AC Ch aracteristics .
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
Byte/Word Organization Select (BYTE
Byte/Word Organization Select pin is used to
switch between the 8-bit and 16-bit B us m odes of
the memory. When Byte/Word Organization Select is Low, V
it is High, V
Supply Voltage. The VCC Supply Voltage
V
CC
, the memory is in 8-bit mode, when
IL
, the memo ry is in 16-bit mode .
IH
supplies the power for all operations (Read, Program, Erase etc.).
The Command Interface is disabled when the V
Supply Voltage is less than the L ockout Voltage,
. This prevents Bus Write operations from ac-
V
LKO
cidentally damaging the data during power up,
power down and power surges. If the Program/
Erase Controller is programming or erasing during
this time then the operation aborts and the memory contents being altered will be invalid.
A 0.1µF capacitor should be connected between
the V
Supply Voltage pin and the VSS Ground
CC
pin to decouple the current surges from the power
supply. The PCB track widths must be sufficient to
carry the currents required during program and
erase operations, I
Ground. The VSS Ground is the reference for
V
SS
CC3
.
all voltage measurements.
PHEL
). The
or
CC
9/39
M29F800DT, M29F800DB
BUS OPERATIONS
There are five standard bus operations that control
the device. These are Bus Read, Bus Wri te, Output Disable, Standby and Automatic Standby. See
Tables 2 and 3, Bus Operat ions, for a summary.
Typically glitches of less than 5ns on Chip Enable
or Write Enable are ignored by the memory and do
not affect bus operations.
Bus Read. Bus Read operations read from the
memory cells, or specific registers in the Command Interface. A valid Bus Read operation involves setting the desired address on the Address
Inputs, applying a Low sig nal, V
and Output Enable and keeping Write Enable
High, V
. The Data Inputs/Outputs will output the
IH
value, see Figure 11, Read Mode AC Waveforms,
and Table 12, Read AC Characteristics, for details
of when the output becomes valid.
Bus Write. Bus Write operations write to the
Command Interface. A valid Bus Write operation
begins by setting the desire d address on t he Address Inputs. The Address Inputs are latched by
the Command Interface on the falling edge of Chip
Enable or Write Enable, whichever occurs last.
The Data Inputs/Outputs a re latched by the Command Interface on the rising edge of Chip Enable
or Write Enable, whichever occurs first. Output Enable must remain High, V
IH
Write operation. See Figures 12 and 13, Write AC
Waveforms, and Tables 13 and 14, Write AC
Characteristics, for details of the timing requirements.
Output Disa bl e . The Data Inputs/Outputs are in
the high impedance s tate when Output Enable is
High, V
.
IH
Standby. When Chip Enable is High, V
memory enters Standby mode and the Data Inputs/Outputs pins are placed in the high-imped-
, to Chip Enable
IL
, during the whole Bus
, the
IH
ance state. To reduce the S upply Current to the
Standby Supply Current, I
be held within V
± 0.2V. For the Standby current
CC
, Chip Enable should
CC2
level see Table 11, DC Characteristics.
During program or erase operations the memory
will continue to use the Program/Erase Supply
Current, I
, for Program or Erase operations un-
CC3
til the operation completes.
Automatic Standby. If CMOS levels (V
± 0.2V)
CC
are used to drive the bus and the bus is inactive for
150ns or more the memory enters Automatic
Standby where the internal Supply Current is reduced to the Standby Supply Current, I
CC2
. The
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Special Bus Operations. Additional bus operations can be performed to read the Electronic Signature and also to apply and remove Block
Protection. These bus operations are intended for
use by programming equipment and are not usually used in applications. They require V
to be
ID
applied to some pins.
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can be read by applying t he signals
listed in Tables 2 and 3, Bus Operations.
Block Protection and Blocks Unprotection.
Each block can be separately protected against
accidental Program or Erase. Protected blocks
can be unprotected to allow data to be changed.
There are two methods available for protecting
and unprotecting the blocks, one for use on programming equipment and the other for in-system
use. Block Protect and Chip Unprot ec t operat ions
are described in Appendix C.
Table 2. Bus Operations, BYTE
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Note: X = VIL or VIH.
10/39
V
IL
V
IL
V
IH
V
IL
V
IL
= V
IL
Address Inputs
DQ15A–1, A0-A18
V
IL
V
IH
V
IH
XXXHi-ZHi-Z
V
IL
V
IL
V
Cell AddressHi-ZData Output
IH
V
Command AddressHi-ZData Input
IL
V
XHi-ZHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIL, A9 = VID,
V
IH
Others V
IL
IL
or V
or V
IH
IH
Data Inputs/Outputs
DQ14-DQ8DQ7-DQ0
Hi-Z20h
Hi-Z
ECh (M29F800DT)
58h (M29F800DB)
M29F800DT, M29F800DB
Table 3. Bus Operations, BYTE = V
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Note: X = VIL or VIH.
V
IL
V
IL
V
IH
V
IL
V
IL
IH
V
IL
V
IH
V
IH
XXXHi-Z
V
IL
V
IL
V
Cell AddressData Output
IH
V
Command AddressData Input
IL
V
XHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIL, A9 = VID,
V
IH
Others V
COMMAND INTERFACE
All Bus Write operations t o the me mory are in terpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. Failure to observe a valid sequence of Bus
Write operations will result in the memory returning to Read mode. The long command sequences
are imposed to maximize data security.
The address used for the commands changes depending on whether the memory is in 16-bit or 8bit mode. See either Table 4, or 5, de pending on
the configuration that is being used, for a summary
of the commands.
Read/Reset Command. The Read/Reset command returns the memory to its Read mode where
it behaves like a ROM or EPROM, unless otherwise stated. It also resets t he errors in the S tatus
Register. Either one or three Bus Write operations
can be used to issue the Read/Reset command.
The Read/Reset Command can be issued, between Bus Write cycles before the start of a program or erase operation, to return the device to
read mode. Once the program or erase operation
has started the Read/Reset command is no longer
accepted. The Read/Reset command will not
abort an Erase operation when issued while in
Erase Suspend.
Auto Select Command. The Auto Select command is used to read the Manufacturer C ode, t he
Device Code and the Block Protection Status.
Three consecutive Bus Write operations are required to issue the Auto Select command. Once
the Auto Select comma nd is issued the memory
remains in Auto S elect mode until a Read/Reset
command is issued. Read CFI Query and Read/
Reset commands are accepted in Auto Select
mode, all other commands are ignored.
Address Inputs
A0-A18
or V
IL
IH
or V
IL
IH
Data Inputs/Outputs
DQ15A–1, DQ14-DQ0
0020h
22ECh (M29F800DT)
2258h (M29F800DB)
From the Auto Select mode the Manufacturer
Code can be read using a Bus Read operation
with A0 = V
may be set to either V
and A1 = VIL. The other address bits
IL
or VIH. The Manufa cturer
IL
Code for STMicroelectronics is 0020h.
The Device Code can be read using a B us Read
operation with A0 = V
address bits may be set to either V
and A1 = VIL. The other
IH
or VIH.
IL
The Bl ock Prot ection S t atus of each block can be
read using a Bus Read operation with A0 = V
A1 = V
, and A 12 -A 18 specify i n g t he addres s of
IH
the bl ock. The oth er addr ess bit s may b e set t o either V
or VIH. If t h e ad dr ess ed b loc k is pro tec te d
IL
then 01h is output on Data Inputs/Outputs DQ0DQ7, otherwise 00h is output.
Program Command. The Program command
can be used to program a value to one address in
the memory array at a time. The command requires four Bus Write operations, the final write operation latches the address and data in the internal
state machine and starts the Program/Erase Controller.
If the address falls in a pro tected block then the
Program command is ignored, the data remains
unchanged. The Status Register is never read and
no error condition is given.
During the program operat ion the memo ry will ignore all commands. I t is n ot poss ible t o iss ue any
command to abort or pause the operation. Typical
program times are given in Table 6. Bus Read operations during the program o peration will output
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the program operation has completed the
memory will return to the Read mode, unle ss an
error has occurred. When an error occurs the
,
IL
11/39
M29F800DT, M29F800DB
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
Note that the Program command cannot change a
bit set at ’0’ bac k to ’1’. One of the E rase Commands must be used to set all the bits in a block or
in the whole memory from ’0’ to ’1’.
Unlock Bypass Command. The Unlock Bypass
command is used in conjunction with the Unlock
Bypass Program command to program the memory. When the access time to the device is long (as
with some EPROM programmers) considerable
time saving can be made by using these commands. Three Bus Write operations are requ ired
to issue the Unlock Bypass command.
Once the Unlock Bypas s command has bee n issued the memory will only accept the Unloc k Bypass Program command and the Unlock Bypass
Reset command. The memory can be read as if in
Read mode.
Unlock Bypass Program Command. The Unlock Bypass Prog ram comma nd can be used to
program one address in memory at a time. The
command requires two B us Write operations, the
final write operation latches the address and data
in the internal stat e machine and starts th e Program/Erase Controller.
The Program operation using the Unlock Bypass
Program command behaves identically to the Program operation using the Program command. A
protected block cannot be programmed; the operation cannot be aborted and the Status Register is
read. Errors must be reset using the Read/Reset
command, which l eaves the de vice in Unlo ck Bypass Mode. See the Program command for details
on the behavior.
Unlock Bypass Reset Command. The Unlock
Bypass Reset command can be used to return t o
Read/Reset mode from Unlock Bypass Mode.
Two Bus Write operations are required to issue the
Unlock Bypass Reset command. Read/Reset
command does not exit from Unlock Bypass
Mode.
Chip Erase Command. The Chip Erase command can be used to erase the entire chip. Six Bus
Write operations are required to issue the Chip
Erase Command and start the Program/Erase
Controller.
If any blocks are protected then these are ignored
and all the other blocks are erased. If all of the
blocks are protect e d th e Chip Erase op erat i on appears to start but will terminate within about 100µs,
leaving the data unchanged. No error condition is
given when protected blocks are ignored.
During the erase operation the memory will ignore
all commands. It is not possible to issue any command to abort the operation. Typical chip erase
times are given in Table 6. All Bus Read operations during the Chip E rase operation will output
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the Chip Erase operation has completed t he
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read Mode.
The Chip Erase Command sets all of the bits in unprotected blocks of the memory to ’1’. All previous
data is lost.
Block Erase Command. The Block Erase command can be use d to erase a list of one or more
blocks. Six Bus Write operations are required to
select the first block in the list. Each additional
block in the list can be selected by repeating the
sixth Bus Write operation using the address of the
additional block. The Block Erase operation starts
the Program/Erase Controller about 50µs after the
last Bus Write operation. Once the Program/Erase
Controller starts it is not possible to select any
more blocks. Each additional block must therefore
be selected within 50µs of the last block. The 50µs
timer restarts when an additional block is selected.
The Status Register can be read after the sixth
Bus Write operation. See the Status Register for
details on how to identify if the Program/Erase
Controller has started the Block Erase operation.
If any selected blocks are protected then these are
ignored and all the other selected blocks are
erased. If all of the selected blocks are p rotected
the Block Erase operation appears to start but will
terminate within about 100µs, leaving the data unchanged. No error condition is given when protected blocks are ignored.
During the Block Erase operation the me mory wi ll
ignore all commands except the Erase Susp end
command. Typical b lock era se times a re g iven in
Table 6. All Bus Read operations during the Block
Erase ope ra tion will output the S t a tus R e gister on
the Data Inputs/Outputs. See the section on the
Status Register for more details.
After the Block Erase operation has completed the
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
The Block Erase Command sets all of the bits in
the unprotected selected blocks to ’1’. All previous
data in the selected blocks is lost.
Erase Suspend Command. The Erase Suspend
Command may be used to temporarily suspend a
Block Erase operation and return the memory to
12/39
M29F800DT, M29F800DB
Read mode. The command requires one Bus
Write operation.
The Program/Erase Controller will sus pend within
the Erase Suspend Latency Time (refer to Table 6
for value) of the Erase Suspend Command being
issued. Once the Program/Erase Controller has
stopped the memory will be set to Read mode and
the Erase will be suspended. If the Erase Suspend
command is issued during the period when the
memory is waiting for an additional block (before
the Program/Erase Controller starts) then the
Erase is suspended immediate ly and wi ll start immediately when the Erase Resume Comm and is
issued. It is not possible to select any further
blocks to erase after the Erase Resume.
During Erase Suspend it is possible to Read and
Program cells in blocks that are not being erased;
both Read and Program operations behave as
normal on these blocks. If any attempt is made to
program in a protected block or in the suspended
block then the Program comm and is ignored and
the data remains unchanged. The Status Register
is not read and no error condi tion is given. Reading from blocks that are being erased will output
the Status Register.
It is also possible to issue the Auto Select, Read
CFI Query and Unlock Bypass commands during
an Erase Suspend. The Read/Reset command
must be issued to return the device to Read Array
mode before the Resume command will be accepte d.
Erase Resume Command. The Erase Resume
command must be used to restart the Program/
Erase Controller from Erase Suspend. An erase
can be suspended and resumed more than once.
Read CFI Query Command. The Read CFI
Query Command is used to read data from the
Common Flash Interface (CFI) Memory Area. This
command is valid when the device is ready to read
the array data or when the device is in autoselected mode.
One Bus Write cycle is required to issue the Read
CFI Query Command. Once the command is issued subsequent Bus Read ope rations read from
the Common Flash Interface Mem ory Area. The
Read/Reset command must be issued to return
the device to Read Array mode. See Appendix B,
Tables 21, 22, 23, 24, 25 and for details on the information contained in the Commo n Flash Interface (CFI) memory area.
Block Protect and Chip Unprot ect Commands.
Each block can be separately protected against
accidental Program or E ras e. The whole chip can
be unprotected to allow the data inside t he blo cks
to be changed.
Block Protect and Chip Unprote ct operations are
described in Appendix C.
13/39
M29F800DT, M29F800DB
Table 4. Commands, 16-bit mode, BYTE = V
IH
Bus Write Operations
Command
1st2nd3rd4th5th6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
1X F0
Read/Reset
3555AA2AA55XF0
Auto Select3555AA2AA5555590
Program4555AA2AA55555A0PAPD
Unlock Bypass3555AA2AA5555520
Unlock Bypass
Note: X Don’t Care, PA Program Address, PD Program Data, BA Any address in the Block.
All values in the table are i n hexadecimal.
The Com ma nd In terf ace o nly uses A– 1, A0-A1 0 a nd DQ0-D Q7 to v er ify t he co mm ands ; A1 1-A1 8, DQ8- DQ1 4 and DQ 15 are D on’t
Care. DQ15A–1 is A–1 when BYTE
is VIL or DQ15 when BYTE is VIH.
14/39
M29F800DT, M29F800DB
Table 5. Commands, 8-bit mode, BYTE = V
IL
Bus Write Operations
Command
1st2nd3rd4th5th6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
1X F0
Read/Reset
3AAAAA55555XF0
Auto Select3AAAAA55555AAA90
Program4AAAAA55555AAAA0PAPD
Unlock Bypass3AAAAA55555AAA20
Unlock Bypass
Note: X Don’t Care, PA Program Address, PD Program Data, BA Any address in the Block.
All values in the table are i n hexadecimal.
The Com ma nd In terf ace o nly uses A– 1, A0-A1 0 a nd DQ0-D Q7 to v er ify t he co mm ands ; A1 1-A1 8, DQ8- DQ1 4 and DQ 15 are D on’t
Care. DQ15A–1 is A–1 when BYTE
is VIL or DQ15 when BYTE is VIH.
Table 6. Program, Erase Times and Progra m, Erase Endu ran ce Cycle s
ParameterMin
Typ
(1, 2)
Chip Erase12
Block Erase (64 Kbytes)0.8
Erase Suspend Latency Time30µs
Program (Byte or Word)10
Chip Program (Byte by Byte)12
Chip Program (Word by Word)6
Program/Erase Cycles (per Block)100,000cycles
Data Retention20years
Note: 1. Typical val ues measure d at room temperature and nominal voltages.
2. Sampled, but not 100% tested.
3. Maximum value mea sured at worst cas e conditions for both temperature and V
4. Maximum value mea sured at worst cas e conditions for both temperature and V
after 100,0 0 program/er ase cycles.
CC
.
CC
Max
60
6
200
60
30
(4)
(3)
(3)
(3)
(3)
(2)
Unit
µs
s
s
s
s
15/39
M29F800DT, M29F800DB
STATUS REGISTER
Bus Read operations from any address always
read the Status Register during Program and
Erase operations. It is also read during Erase Suspend when an address within a block being erased
is accessed.
The bits in the Status Register are summarized in
Table 7, Status Register Bits.
Data Polling Bit (DQ7). The Data Polling Bit can
be used to identify whether the Program/Erase
Controller has successfully completed its operation or if it has responded to an Erase Suspend.
The Data Polling Bit is output on DQ7 when the
Status Register is read.
During Program operations the Data Polling Bit
outputs the complement of the bit being programmed to DQ7. After successful completion of
the Program operation the memory returns to
Read mode and Bus Read operations from the address just programmed o utput DQ7, not its complement.
During Er ase ope rations the Data Polling Bit ou t-
puts ’0’, the complement of the erased state of
DQ7. After successful completion of the Erase operation the memory returns to Read Mode.
In Erase Suspend mode the Data Polling Bit will
output a ’1’ during a Bus Read operation within a
block being erased. The Data Polling Bit will
change from a ’0’ to a ’1’ when the Program/Erase
Controller has suspended the Erase operation.
Figure 7, Data Polling Flowchart, gives an example of how to use the Data Polling Bit. A Valid Address is the address being programmed or an
address within the block being erased.
Toggle Bit (DQ6). The Toggle Bit can be used to
identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Erase Suspen d. The Toggle Bit is
output on DQ6 when the Status Register is read.
During Program and Erase operations the Toggle
Bit changes from ’0’ to ’ 1’ to ’ 0’, et c., with su ccessive Bus Read operations at any address. After
successful completion of the operation the memory returns to Read mode.
During Erase Suspend mode the Toggle Bit will
output when addressing a cell within a block being
erased. The Toggle Bit will stop toggling when the
Program/Erase Controller has suspended the
Erase operation.
If any attempt is made to erase a protected bl ock,
the operation is abort ed, no error is signalle d and
DQ6 toggles for approximately 100µs. If any attempt is made to program a protected block or a
suspended block, the operation is abort ed, no er-
ror is signalled and DQ6 toggles for approximately
1µs.
Figure 8, Data Toggle Flowchart, g ives an example of how to use the Data Toggle Bit.
Error Bit (DQ5). The Error Bit can be used to
identify errors detected by the Program/Erase
Controller. The Error B it is set to ’1’ when a Program, Block Erase or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Rese t command must be issued
before other commands are issued. The E rror bit
is output on DQ5 when the Status Register is read.
Note that the Program command cannot change a
bit set to ’0’ back to ’1’ and attempting to do so will
set DQ5 to ‘1’. A Bus Read operation to that address will s h ow the bit is s ti ll ‘0’. One of t h e E r as e
commands must b e used to set all the bits in a
block or in the whole memory from ’0’ to ’1’
Erase Timer Bit (DQ3). The Erase Timer Bit can
be used to identify the start of Program/Erase
Controller operation during a Block Erase command. Once the Program/Erase Controller starts
erasing the Erase Timer Bit is set to ’1’. Before the
Program/Erase Controller starts the Erase Timer
Bit is set to ’0’ and additional block s to be erased
may be written to the Command Interface. The
Erase Timer Bit is output on DQ3 when the Status
Register is read.
Alternative Toggle Bit (DQ2). The Alternative
Toggle Bit can be used to monitor the Program/
Erase controller during Erase operations. The Alternative Toggle Bit is output on DQ2 when the
Status Register is read.
During Chip Erase and Block Erase operations the
Toggle Bit changes from ’0’ to ’1’ to ’0’, etc., with
successive Bus Read operations from addresses
within the blocks being erased. A protected block
is treated the same as a block not being erased.
Once the operation completes the memory returns
to Read mode.
During Erase Suspend the Alternative Toggle Bit
changes from ’0’ to ’1’ to ’0’, etc. with successive
Bus Read operations from addresses within the
blocks being erased. Bus Read operations to addresses within blocks not being erased will ou tput
the memory cell data as if in Read mode.
After an Erase operation that c auses t he Error Bit
to be set the Alternative Toggle Bit can be used to
identify which block or blocks have caused the error. The Alternative Toggle Bit changes from ’0’ to
’1’ to ’0’, etc. with successive Bus Re ad Operations from addresses within blocks that have not
erased correctly. The Alternative Togg le Bit does
not change if the addressed block has erased correctly.
16/39
M29F800DT, M29F800DB
Table 7. Status Register Bits
OperationAddre ssDQ7DQ6DQ5DQ3DQ2
ProgramAny AddressDQ7Toggle0––0
Program During Erase
Suspend
Any AddressDQ7
Program ErrorAny AddressDQ7
Toggle0––0
Toggle1––0
Chip EraseAny Address0Toggle01Toggle0
Block Erase before
timeout
Erasing Block0Toggle00Toggle0
Non-Erasing Block0Toggle00No Toggle0
RB
Block Erase
Erasing Block0Toggle01Toggle0
Non-Erasing Block0Toggle01No Toggle0
Erasing Block1No Toggle0–Toggle1
Erase Suspend
Non-Erasing BlockData read as normal1
Good Block Address0Toggle11No Toggle0
Erase Error
Faulty Block Address0Toggle11Toggle0
Note: U nspecified da ta bits should be i gnored.
Figure 7. Dat a Po ll i ng Fl o wc h a rtFi gure 8. Data Toggl e Fl owchart
READ DQ6
DQ5 & DQ6
TOGGLE
NO
READ DQ6
TOGGLE
START
READ
DQ6
=
DQ5
= 1
TWICE
DQ6
=
NO
YES
YES
NO
YES
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
DATA
NO
DQ5
READ DQ7
at VALID ADDRESS
DQ7
DATA
FAILPASS
= 1
YES
=
NO
YES
YES
=
NO
AI03598
FAILPASS
AI01370C
17/39
M29F800DT, M29F800DB
MAXIMUM RATING
Stressing the device ab ove the rating listed in the
Absolute Maximum Ratings" table may cause permanent damage to the device. Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability. These are
stress ratings only and operation of the dev ice at
Table 8. Absolute Maximum Ratings
SymbolParameterMinMaxUn it
T
BIAS
T
STG
V
IO
V
CC
V
ID
Note: 1. Minimum voltage may un dershoot to –2V during transi tion and for less t han 20ns during transitions .
2. Maximum voltage may overshoot to V
Temperature Under Bias–50125°C
Storage Temperature–65150°C
Input or Output Voltage
Supply Voltage–0.66V
Identification Voltage–0.613.5V
(1,2)
+2V durin g transition and for less than 20ns during trans i tions.
CC
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Refer also to the STMicroelectronics
SURE Program and ot her relevant quality documents.
V
–0.6
CC
+0.6
V
18/39
M29F800DT, M29F800DB
DC AND AC PARAMETERS
This section summarizes t he operating m easurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Table 9. Operating and AC Measurement Conditions
Parameter
MinMaxMinMax
V
Supply Voltage
CC
Ambient Operating Temperature (range 1)070070°C
Ambient Operating Temperature (range 3)–40125–40125°C
Ambient Operating Temperature (range 6)–4085–4085°C
Load Capacitance (C
Input Rise and Fall Times1010ns
Input Pulse Voltages0 to 30.45 to 2.4V
Input and Output Timing Ref. Voltages1.50.8 and 2.0V
)
L
Conditions summarized in Table 9, Operating and
AC Measurement Conditions. Designers should
check that the operating cond itions in their circuit
match the operating conditions when relying on
the quoted parameters.
M29F800D
4.55.54.55.5V
30100pF
Unit5570/ 90
Figure 9. AC Measurement I/O WaveformFigure 10. AC Measurement Load Circuit
High Speed (55ns)
3V
0V
Standard (70, 90ns)
2.4V
0.45V
1.5V
2.0V
0.8V
AI05276
V
CC
DEVICE
UNDER
TEST
0.1µF
CL includes JIG capacitance
1.3V
1N914
3.3kΩ
CL
Table 10. Device Capacitance
SymbolParameterTest ConditionMinMaxUnit
C
IN
C
OUT
Note: S am pled only, not 100% tested.
Input Capacitance
Output Capacitance
V
V
OUT
IN
= 0V
= 0V
6pF
12pF
OUT
AI05277
19/39
M29F800DT, M29F800DB
Table 11. DC Characteristics
SymbolParameterTest ConditionMinMaxUnit
I
LI
I
LO
I
CC1
I
CC2
I
CC3
I
CC4
V
IL
V
IH
V
OL
V
OH
V
ID
I
ID
V
LKO
Note: 1. Sampled only, not 100% tested.
Input Leakage Current
Output Leakage Current
Supply Current (Read)
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
(1)
Supply Current (Program/Erase)
Input Low Voltage–0.50.8V
Input High Voltage
Output Low Voltage
Output High Voltage TTL CMOS
Identification Voltage11.512.5V
Identification Current
Program/Erase Lockout Supply
Voltage
0V ≤ V
0V ≤ V
E
= VIL, G = VIH,
IN
OUT
≤ V
≤ V
f = 6MHz
E
= V
IH
E
= VCC ±0.2V,
RP
= VCC ±0.2V
Program/Erase
Controller active
I
= 5.8mA
OL
I
= –2.5mA
OH
A9 = V
ID
CC
CC
±1
±1
µA
µA
20mA
2mA
150
µA
20mA
2V
CC
+ 0.5
0.45V
2.4V
100
µA
3.24 .2V
V
20/39
Figure 11. Read Mode AC Waveforms
A0-A18/
A–1
tAVQVtAXQX
E
G
DQ0-DQ7/
DQ8-DQ15
tBHQV
BYTE
tELBL/tELBHtBLQZ
M29F800DT, M29F800DB
tAVAV
VALID
tELQVtEHQX
tELQXtEHQZ
tGLQXtGHQX
tGLQV
tGHQZ
VALID
AI06154
Table 12. Read AC Characteristics
SymbolAltParameterTest Condition
E
t
AVAV
t
AVQV
(1)
t
ELQX
t
ELQV
(1)
t
GLQX
t
GLQV
(1)
t
EHQZ
(1)
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
t
ELBL
t
ELBH
t
BLQZ
t
BHQV
Note: 1. Sampled only, not 100% tested.
t
RC
t
ACC
t
LZ
t
CE
t
OLZ
t
OE
t
HZ
t
DF
t
OH
t
ELFL
t
ELFH
t
FLQZ
t
FHQV
Address Valid to Next Address Valid
Address Valid to Output Valid
Chip Enable Low to Output Transition
Chip Enable Low to Output Valid
Output Enable Low to Output Transition
Output Enable Low to Output Valid
Chip Enable High to Output Hi-Z
Output Enable High to Output Hi-Z
Chip Enable, Output Enable or Address
Transition to Output Transition
Chip Enable to BYTE Low or HighMax55ns
BYTE Low to Output Hi-ZMax2530ns
BYTE High to Output ValidMax3040ns
= VIL,
G
= V
E
= VIL,
G
= V
G
= V
G
= V
E
= V
E
= V
G
= V
E
= V
IL
IL
IL
IL
IL
IL
IL
IL
M29F800D
Unit
5570/ 90
Min5570ns
Max5570ns
Min00ns
Max5570ns
Min00ns
Max3030ns
Max1820ns
Max1820ns
Min00ns
21/39
M29F800DT, M29F800DB
Figure 12. Write AC Waveforms, Write Enable Controlled
tAVAV
A0-A18/
A–1
tAVWL
E
VALID
tWLAX
tWHEH
tELWL
G
tWLWHtGHWL
W
tDVWH
DQ0-DQ7/
DQ8-DQ15
V
CC
RB
tVCHEL
VALID
tWHRL
Table 13. Write AC Characteristics, Write Enable Controlled
SymbolAltParameter
t
AVAV
t
ELWL
t
WLWH
t
DVWH
t
WHDX
t
WHEH
t
WHWL
t
AVWL
t
WLAX
t
GHWL
t
WHGL
(1)
t
WHRL
t
VCHEL
Note: 1. Sampled only, not 100% tested.
t
WC
t
CS
t
WP
t
DS
t
DH
t
CH
t
WPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address ValidMin5570ns
Chip Enable Low to Write Enable LowMin00ns
Write Enable Low to Write Enable HighMin4545ns
Input Valid to Write Enable HighMin4545ns
Write Enable High to Input TransitionMin00ns
Write Enable High to Chip Enable HighMin00ns
Write Enable High to Write Enable LowMin2020ns
Address Valid to Write Enable LowMin00ns
Write Enable Low to Address TransitionMin4545ns
Output Enable High to Write Enable LowMin00ns
Write Enable High to Output Enable LowMin00ns
Program/Erase Valid to RB LowMax3030ns
VCC High to Chip Enable Low
tWHGL
tWHWL
tWHDX
AI06155
M29F800D
Unit
5570/ 90
Min5050µs
22/39
Figure 13. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A18/
A–1
tAVEL
W
VALID
M29F800DT, M29F800DB
tELAX
tEHWH
tWLEL
G
tELEHtGHEL
E
tDVEH
DQ0-DQ7/
DQ8-DQ15
V
CC
RB
tVCHWL
VALID
tEHRL
Table 14. Write AC Characteristics, Chip Enable Controlled
SymbolAltParameter
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
(1)
t
EHRL
t
VCHWL
Note: 1. Sampled only, not 100% tested.
t
WC
t
WS
t
CP
t
DS
t
DH
t
WH
t
CPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address ValidMin5570ns
Write Enable Low to Chip Enable LowMin00ns
Chip Enable Low to Chip Enable HighMin4545ns
Input Valid to Chip Enable HighMin4545ns
Chip Enable High to Input TransitionMin00ns
Chip Enable High to Write Enable HighMin00ns
Chip Enable High to Chip Enable LowMin2020ns
Address Valid to Chip Enable LowMin00ns
Chip Enable Low to Address TransitionMin4545ns
Output Enable High Chip Enable LowMin00ns
Chip Enable High to Output Enable LowMin00ns
Program/Erase Valid to RB LowMax3030ns
VCC High to Write Enable Low
tEHGL
tEHEL
tEHDX
AI06156
M29F800D
Unit
5570/ 90
Min5050µs
23/39
M29F800DT, M29F800DB
Figure 14. Reset/Block Temporary Unprotect AC Wavefo rms
E, G
W,
tPHWL, tPHEL, tPHGL
RB
RP
Table 15. Reset/Block Temporary Unprotect AC Characteristics
SymbolAltParameter
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1)
t
RHWL
(1)
t
RHEL
(1)
t
RHGL
t
PLPX
(1)
t
PLYH
(1)
t
PHPHH
Note: 1. Sampled only, not 100% tested.
t
RH
t
RB
t
RP
t
READY
t
VIDR
tPLPX
tPLYH
RP High to Write Enable Low, Chip Enable Low,
Output Enable Low
RB High to Write Enable Low, Chip Enable Low,
Output Enable Low
RP Pulse WidthMin500500ns
RP Low to Read ModeMax1010µs
RP Rise Time to V
ID
tRHWL, tRHEL, tRHGL
tPHPHH
AI06870
M29F800D
Unit
5570/ 90
Min5050ns
Min00ns
Min500500ns
24/39
M29F800DT, M29F800DB
PACKAGE MECHANICAL
Figure 15. SO44 - 44 lead Plastic Small Outline, 525 mils body width, Package Outline
A2
A
C
b
e
CP
D
N
E
EH
1
Note: Drawing is not to scale.
LA1α
SO-d
Table 16. SO44 – 44 lead Plastic Small Outline, 525 mils body width, Package Mechanical Data
Blank = Standard Packing
T = Tape & Reel Packing
E = Lead-free Package, Standard Packing
F = Lead-free Package, Tape & Reel Packing
Devices are shipped from the factory with the memory content bits erased to ’1’.
For a list of available options (Speed, Package, etc.) or for further information on any aspect of this device,
please contact the ST Sales Office nearest to you.
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the device to det ermine
various electrical and t iming parameters, density
information and functions supported by the memory. The system can interface easily with the device, enabling the software to upgrade itself when
necessary.
When the CFI Query Command is issued the device enters CFI Query mode and the data structure
Table 21. Query Structure Overview
Address
x16x8
10h20hCFI Query Identification StringCommand set ID and algorithm data offset
1Bh36hSystem Interface InformationDevice timing & voltage information
61hC2hSecurity Code Area64 bit unique device number
Note: Query data are always presented on the lowest order data outputs.
Primary Algorithm-specific Extended
Query table
Sub-section NameDescription
is read from the memory. Tables 21, 22, 23, 24, 25
and 26 show the address es used to retrieve the
data.
The CFI data structure also contains a security
area where a 64 bit unique security number is written (see Table 26, Security Code area). This area
can be accessed only in Read mode by the final
user. It is impossible to change t he secu rity number after it has been written by ST. Issue a Read
command to return to Read mode.
Additional information specific to the Primary
Algorithm (optional)
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
V
Logic Supply Maximum Program/Erase voltage
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
[Programming] Supply Minimum Program/Erase voltage
V
PP
V
[Programming] Supply Maximum Program/Erase voltage
PP
Typical timeout per single byte/word program = 2
Typical timeout for minimum size write buffer program = 2
Typical timeout per individual block erase = 2
Typical timeout for full chip erase = 2
Maximum timeout for byte/word program = 2
Maximum timeout for write buffer program = 2
Maximum timeout per individual block erase = 2
Maximum timeout for chip erase = 2
n
ms
n
ms
n
times typical
n
n
times typical
n
µs
n
µs
times typical
n
times typical
4.5V
5.5V
NA
NA
16µs
NA
1s
see note (1)
256µs
NA
8s
see note (1)
30/39
Table 24. Device Geometry Definition
Address
x16x8
27h4Eh0014h
DataDesc riptionValue
Device Size = 2
n
in number of bytes
M29F800DT, M29F800DB
1 MByte
28h
29h
2Ah
2Bh
2Ch58h0004h
2Dh
2Eh
2Fh
30h
31h
32h
33h
34h
35h
36h
37h
38h
39h
3Ah
3Bh
3Ch
50h
52h
54h
56h
5Ah
5Ch
5Eh
60h
62h
64h
66h
68h
6Ah
6Ch
6Eh
70h
72h
74h
76h
78h
0002h
0000h
0000h
0000h
0000h
0000h
0040h
0000h
0001h
0000h
0020h
0000h
0000h
0000h
0080h
0000h
000Eh
0000h
0000h
0001h
Flash Device Interface Code description
Maximum number of bytes in multi-byte program or page = 2
Number of Erase Block Regions within the device.
It specifies the number of regions within the device containing
contiguous Erase Blocks of the same size.
Region 1 Information
Number of identical size erase block = 0000h+1
Region 1 Information
Block size in Region 1 = 0040h * 256 byte
Region 2 Information
Number of identical size erase block = 0001h+1
Region 2 Information
Block size in Region 2 = 0020h * 256 byte
Region 3 Information
Number of identical size erase block = 0000h+1
Region 3 Information
Block size in Region 3 = 0080h * 256 byte
Region 4 Information
Number of identical-size erase block = 000Eh+1
Region 4 Information
Block size in Region 4 = 0100h * 256 byte
x8, x16
Async.
n
NA
4
1
16 Kbyte
2
8 Kbyte
1
32 Kbyte
15
64 Kbyte
31/39
M29F800DT, M29F800DB
Table 25. Primary Algorithm-Specific Extended Qu ery Ta bl e
Address
x16x8
DataDescriptionValue
40h80h0050h
41h82h0052h"R"
42h84h0049h"I"
43h86h0031hMajor version number, ASCII"1"
44h88h0030hMinor version number, ASCII"0"
45h8Ah0000hAddress Sensitive Unlock (bits 1 to 0)
46h8Ch0002hErase Suspend
47h8Eh0001hBlock Protection
48h90h0001hTemporary Block Unprotect
49h92h0004hBlock Protect /Unprotect
4Ah94h0000hSimultaneous Operations, 00 = not supportedNo
4Bh96h0000hBurst Mode, 00 = not supported, 01 = supportedNo
4Ch98h0000hPage Mode, 00 = not supported, 01 = 4 page word, 02 = 8 page wordNo
Block protection can be used to prevent any operation from modifying the data s tored in the Flash.
Each Block can be protected individually. Once
protected, Program and Erase operations on the
block fail to change the data.
There are three techniques that can be used to
control Block Protection, these are the Programmer technique, the In-System technique and Temporary Unprotection. Temporary Unprotection is
controlled by the Reset/B lock Temporary Unprotection pin, RP
; this is described in the Signal De-
scriptions section.
Unlike the Command Interface of the Program/
Erase Controller, the techniques for protecting and
unprotecting blocks change between different
Flash memory suppliers. For example , the techniques for AMD parts will not work on STMicroelectronics parts. Care should be taken when
changing drivers for one part to work on another.
Programm er Technique
The Programmer techniq ue uses high (V
) volt-
ID
age levels on some of the bus pins. These cannot
be achieved using a standard microprocessor bus,
therefore the technique is recommended on ly for
use in Programming Equipment.
To protect a block follow the flowchart in Figure 17,
Programmer Equipment Block Prot ect Flowchart.
To unprotect the whole chip it is necessary to protect all of the blocks f irst, then all blocks can be unprotected at the same time. To unprotect the chip
follow Figure 18, Programmer Equipment Chip
Unprotect Flowchart. Table 27, Programmer
M29F800DT, M29F800DB
Technique Bus Operations, gives a summary of
each operation.
The timing on these flowcharts is critical. Care
should be taken to en sure that, where a pau se is
specified, it is followed as closely as possible. Do
not abort the procedure be fore reaching the end.
Chip Unprotect can take several seconds and a
user message should be provided to show that the
operation is progressing.
In-System Technique
The In-System technique requires a high volt age
level on the Reset/Blocks Temporary Unprotect
pin, RP
maximum ratings of the components on the microprocessor bus, therefore this technique is suitable
for use after the Flash has been fitted to the system.
To protect a block follow the flowchart in Figure 19,
In-System Block Protect Flowchart. To unprotect
the whole chip it is ne cessary to protect all of the
blocks first, then all the blocks can be unprotected
at the same time. To unprotect the chip follow Figure 20, In-System Chip Unprotect Flowchart.
The timing on these flowcharts is critical. Care
should be taken to en sure that, where a pau se is
specified, it is followed as closely as possible. Do
not allow the microprocessor to s ervice interrupts
that will upset the timing and do not abort the procedure before reaching the end. Chip Unprotect
can take several seconds and a user message
should be provided to show that the operation is
progressing.
. This can be achieved without violating the
Table 27. Programmer Technique Bus Op erati ons , BYTE
Description of Ready/Busy signal clarified (and Figure 14 modified)
Clarified allowable commands during block erase
Clarified the mode the device returns to in the CFI Read Query command section
Revision numbering modified: a minor revision will be indicated by incrementing the digit
after the dot, and a major revision, by incrementing the digit before the dot (revision
version 03 equals 3.0).
Erase Suspend Latency Time (typical) and Data Retention parameters added to Table 6,
Program, Erase Times and Program, Erase Endurance Cycles, and notes added to the
table. Logic Diagram and Data Toggle Flowchart corrected.
Lead-free package options E and F added to Table 18, Ordering Information Scheme.
Document promoted to full datasheet.
TSOP48 package information updated (see Figure 16 and Table 17). Cross-references
updated on page 29, COMMON FLASH INTERFACE (CFI) Appendix. T emperature range
3 added.
38/39
M29F800DT, M29F800DB
Information furnishe d is bel i eved to be accurate and reliable. However, STMicroelectroni cs assumes no resp onsibility for t he consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise unde r any patent or patent ri ghts of STMicroelectronics. Speci fications me ntioned in th i s publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as crit i cal component s in l i fe support dev i ces or systems wi t hout express written approv al of STMicroelectronics.
The ST log o i s registered trademark of STM i croelect ronics
All other nam es are the property of their respective owners