The M29F080D is a 8 Mb it (1Mb x8) non-v olatile
memory that can be read, erased and reprogrammed. These operations can be performed using a single low volta ge 5V supply. On power-up
the memory defaults to its Read mode where it can
be read in the same way as a ROM or EPROM.
The memory is divided into 16 un iform blocks of
64Kbytes (see Figure 5, Block Addresses) that
can be erased in dependently so it is possible to
preserve valid data while old data is erased.
Blocks can be pr otect ed in grou ps of 4 to prevent
accidental Program or Erase commands from
modifying the memory. Program and Erase com mands are written to the Command Interface of
the memory. An on-chip Program/Erase Controller
simplifies the proces s of programming or era sing
the memory by taking care of all of the special operations that are required to upd ate the memory
contents. The end of a program or erase operation
can be detected an d any error conditions identified. The command set required to control the
memory is consistent with JEDEC standards.
M29F080D
Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory.
They allow simple connection to most microprocessors, often without additional logic.
The memory is offered in TSOP40 (10 x 20mm) and
SO44 packages. Access times of 55, 70 and 90ns
are available.
In order to meet environme ntal requirements, ST
offers the M29F080D in ECOPACK
ECOPACK packages are Lead-free. The category
of second Level Interconnect is marked on the
package and on the inner box label, in compliance
with JEDE C Stand ard JESD 97. The m aximum ratings related to soldering conditions are also
marked on the inner box label.
ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com.
The memory is supplied with all the bits erased
(set to ’1’).
®
packages.
Figure 2. Logic DiagramTable 1. Signal Names
A0-A19Address Inputs
DQ0-DQ7Data Inputs/Outputs
E
G
W
RP
RB
V
A13
A14
A15
A16
A17
A18
A19
NC
NC
NC
NC
W
G
RB
DQ7
DQ6DQ2
DQ5
DQ4
V
CC
CC
AI06142
AI06143
6/37
Figure 5. Block Addresses
M29F080D
M29F080D
Block Addresses
0FFFFFh
0F0000h
0EFFFFh
0E0000h
0DFFFFh
0D0000h
0CFFFFh
02FFFFh
020000h
01FFFFh
010000h
00FFFFh
000000h
Note: Also see Appendix A, Table 15 for a full listing of the Block Addresses.
64 KByte
64 KByte
64 KByte
64 KByte
64 KByte
64 KByte
Total of 16
64 KByte Blocks
AI06144
7/37
M29F080D
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diag ra m, an d T ab le 1 , Signal
Names, for a brief overview of the signals connected to this device.
Address Inputs (A0-A19). The Address Inputs
select the cells in the memory array to access during Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the internal state machine.
Data Inputs/Outputs (DQ0-DQ7). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation. During Bus Write
operations they repr esent the commands s ent to
the Command Interface of th e internal state machine.
Chip Enable (E
the memory, allowing Bus Read and Bus Write operations to be performed. When Chip Enable is
High, V
IH
Output Enable (G
trols the Bus Read operation of the memory.
Write Enable (W
the Bus Write operation of the memory’s Command Interface.
Reset/Block Temporary Unprotect (RP). The
Reset/Block Temporary Unprotect pin can be
used to ap p l y a Ha rd w a r e Reset to th e m e mo ry or
to temporarily unprotect a ll Bloc k s that have been
protected.
A Hardware Reset is achieved by holding Reset/
Block Temporary Unp rotect Low, V
. After Reset/Block Temporary Unprotect
t
PLPX
goes High, V
Read and Bus Write operations after t
t
, whichever occurs last. See the Ready/Busy
RHEL
Output section, Table 13 and Figure 13, Reset/
Temporary Unprotect AC Characteristics for more
details.
Holding RP
protected Blocks in the memory. Program and
). The Chip Enable, E, activates
, all other pins are ignored.
). The Output Enable, G, con -
). The Write Enable, W, controls
, for at least
IL
, the memory will be ready fo r Bus
IH
PHEL
at VID will temporarily unprotect the
or
Erase operations on all blocks will be possible.
The transition from V
t
PHPHH
.
Ready/Busy Output (RB
to VID must be slower than
IH
). The Ready/Busy pin
is an open-drain output that can be used to identify
when the device is performing a Program or Erase
operation. During Program or Erase operations
Ready/Busy is Low, V
. Ready/Busy is hig h-im-
OL
pedance during Read mode, Auto Select mode
and Erase Suspend mode.
After a Hardware Reset, Bus Read and Bus Write
operations cannot begin until Ready/Busy becomes high-impedan ce . S ee Tabl e 13 an d F i gure
13, Reset/Temporary Unprotect AC Characteristics.
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
V
Supply Voltage (5V). VCC provides the
CC
power supply for all operations (Read, Program
and Erase).
The Command Interface is disabled when the V
CC
Supply Voltage is le ss than the Lockout Vo ltage,
V
. This prevents Bus Write operations from ac-
LKO
cidentally damaging the data during power up,
power down and power surges. If the Program/
Erase Controller is programming or erasing during
this time then the operation aborts and the memory contents being altered will be invalid.
A 0.1µF capacitor sh ould be connected between
the V
Supply Voltage pin and the VSS Ground
CC
pin to decouple the current surges from the power
supply, see Figure 10, AC Measurement Load Circuit. The PCB track widths must be sufficient to
carry the currents required during program and
erase operations, I
V
Ground. VSS is the referenc e for all volta ge
SS
CC3
.
measurements.
8/37
BUS OPERATIONS
There are five standard bus operations that control
the device. These are Bus Read, Bus Writ e, Output Disable, Standby and Automatic Standby. See
Tables 2, Bus Operations, for a summary. Typically glitches of less than 5ns on Chip Enable or Write
Enable are ignored by the m emo ry and do not affect bus operations.
Bus Read. Bus Read operations read from the
memory cells, or specific registers in the Command Interface. A valid Bus Read operation involves setting the desired address on the Address
Inputs, applying a Low s ig nal, V
, to Chip Enable
IL
and Output Enable and keeping Write Enable
High, V
. The Data Inputs/Outputs will ou tpu t the
IH
value, see Figure 10, Read Mode AC Waveforms,
and Table 10, Read AC Characteristics, for details
of when the output becomes valid.
Bus Write. Bus Write operations write to the
Command Interface. A v alid Bus Write operati on
begins by setting the desired address on the Address Inputs. The Ad dress Inputs are latched b y
the Command Interface on the falling edge of Chip
Enable or Write Enable, whichever occurs last.
The Data Inputs/Outputs ar e latched by the Com mand Interface on the rising ed ge of Chip Enab le
or Write Enable, whichever occurs first. Output Enable must remain High, V
, during the whole Bus
IH
Write operation. See Figures 11 and 12, Write AC
Waveforms, and Tables 11 and 12, Write AC
Characteristics, for details of the timing requirements.
Output Disable. The Data Inputs /Outputs are in
the high impedance state when Output Enable is
High, V
Standby. When Chip Enable is High, V
.
IH
, the
IH
memory enters Standby mode and the Data Inputs/Outputs pins are placed in the high-impedance state. To reduce the Su pply Current to the
Standby Supply Current, I
, Chip Enable should
CC2
M29F080D
be held within V
level see Table 9, DC Characteristics.
During program or eras e operations the memory
will continue to use the Program/Erase Supply
Current, I
CC3
til the operation completes.
Automatic Standby. If CMOS levels (V
are used to drive the bus and the bus is inactive for
300ns or more the memory enters Automatic
Standby where the interna l Supply Current is reduced to the Standby Supply Current, I
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Special Bus Operations
Additional bus operations can be performed to
read the Electronic Signature and also to apply
and remove Block Protection. These bus operations are intended for us e by progr ammin g equip ment and are not usually used in applications.
They require V
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can b e read b y apply ing the sig nals
listed in Tables 2, Bus Operations.
Block Protection andBlocks Unprotection.
Blocks can be protected in groups of 4 against ac-
cidental Program or Erase. See Appendix A, Table
15, Block Addresses, for de tails of which blocks
must be protected to gether a s a g roup. Protec ted
blocks can be unprotected to allow data to be
changed.
There are two methods available for protecting
and unprotecting the b locks, one for use on programming equipment and t he other for in-system
use. Block Protect a nd Chip Unprotect operations
are described in Appendix C.
± 0.2V. For the Standby current
CC
, for Program or Erase operations un-
± 0.2V)
CC
. The
CC2
to be applied to some pins.
ID
Table 2. Bus Operations
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Note: X = VIL or VIH.
V
IL
V
IL
V
IH
V
IL
V
IL
Address Inputs
A0-A19
V
IL
V
IH
V
IH
XXXHi-Z
V
IL
V
IL
V
Cell AddressData Output
IH
V
Command AddressData Input
IL
V
XHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID, Others
V
IH
V
IH
or V
V
IL
IH
A0 = VIH, A1 = VIL,
A9 = VID, Others VIL or V
IH
Data Inputs/Outputs
DQ7-DQ0
20h
F1h
9/37
M29F080D
COMMAND INTERFACE
All Bus Write operations to the memory are interpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. Failure to observe a valid sequence of Bus
Write operation s will result in the memory return ing to Read mode. The long command sequences
are imposed to maximize data security.
Refer to Table 3, Comman ds, in conjunction wi th
the following text descriptions.
Read/Reset Command. The Read/Reset command returns the memory to its Read mode where
it behaves like a ROM or EPROM, unless otherwise stated. It also resets the erro rs in the Status
Register. Either one or three Bus Write operations
can be used to issue the Read/Reset command.
The Read/Reset Command can be issued, between Bus Write cycles before the start of a program or erase operation, to return the device to
read mode. Once th e pro gram or era se oper ation
has started the Read/Reset command is no longer
accepted. The Read/Reset command will not
abort an Erase operation when issued while in
Erase Suspend.
Auto Select Command. The Auto Select command is used to read t he Manu facturer Code, the
Device Code and the Block Protection Status.
Three consecutive Bus Write operations are required to issue the Auto Sel ect command. Once
the Auto Select comman d is issued the memory
remains in Auto Sele ct mode until a Read/Res et
command is issue d. Read CFI Query and Re ad/
Reset commands are accepted in Auto Select
mode, all other commands are ignored.
From the Auto Select mode the Manufacturer
Code can be read using a Bus Read operation
with A0 = V
may be set to either V
Code for STMicroelectronics is 20h.
The Device Code ca n be read using a Bu s Read
operation with A0 = V
address bits may be s et to either V
Device Code for the M29F080D F1h.
The Block Protection Status of each block can be
read using a Bus Read oper ation with A0 = V
A1 = V
the block. The other address bits may be set to either V
IL
then 01h is output on Data Inputs/Outputs DQ0DQ7, otherwise 00h is output.
Program Command. The Program command
can be used to program a value to one address in
the memory array at a time. The command requires four Bus Write operations, the final write operation latches the address and data in the internal
state machine and starts the Program/Erase Controller.
and A1 = VIL. The other address bits
IL
, and A12-A19 specifying the address of
IH
or VIH. The Manufacturer
IL
and A1 = VIL. The other
IH
or VIH. The
IL
or VIH. If the addressed block is protected
IL
If the address falls in a protect ed block then the
Program command is ignored, the data remains
unchanged. The Status Register is never read and
no error condition is given.
During the program operation th e memory will ig nore all commands. It is no t possib le to is sue any
command to abort or pause the operation. Typical
program times are given in Table 4. Bus Read operations during the p rogram operation will output
the Status Register on the Data Inputs/Outputs.
See the section on the Status Register for more
details.
After the program operation has completed the
memory will return to the Read mode, unless an
error has occurred. When an error occurs the
memory will continue to output the Statu s Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
Note that the Program command cannot change a
bit set at ’0’ back t o ’1’. One of the Erase Commands must be used to set all the bits in a block or
in the whole memory from ’0’ to ’1’.
Unlock Bypass Command. The Unlock Bypass
command is used in conjunction with the Unlock
Bypass Program command to program the memory. When the cycle time to th e device is long (as
with some EPROM programmers) considerable
time saving can be made by using these commands. Three Bu s Write operations are r equired
to issue the Unlock Bypass command.
Once the Unlock Bypass c ommand has been issued the memory will only accept the Unlock Bypass Program com mand and the Unlock B ypass
Reset command. The memory can be read as if in
Read mode.
Unlock Bypass Program Command. The Unlock Bypass Program command can be used to
program one address in the memory array at a
time. The command requires two Bus Write operations, the final write operation latches the address and data in the int ernal state machine and
starts the Program/Erase Controller.
The Program operation us ing the Unlock Bypass
Program command behaves identically to the Pro-
,
gram operation using the Program command. A
protected block cannot be progra mme d; the op eration cannot be aborted and the Status Register is
read. Errors must be reset using th e Read/Reset
command, which leav es the device in Unlock Bypass Mode. See the Program command for details
on the behavior.
Unlock Bypass Reset Command. The Unlock
Bypass Reset comm and can b e used to return to
Read/Reset mode from Unlock Bypass Mode.
Two Bus Write operations are required to issue the
Unlock Bypass Reset command. Read/Reset
10/37
M29F080D
command does not exit from Unlock Bypass
Mode.
Chip Erase Command. The Chip Erase command can be used to erase the entire chip. Six Bus
Write operations are required to issue the Chip
Erase Command and start the Program/Erase
Controller.
If any blocks are protected then these are ignored
and all the other blocks are erased. If all of the
blocks are protected the Chip Erase operation appears to start but will terminate within about 100µs,
leaving the data unc hanged . No er ror con dition is
given when protected blocks are ignored.
During the erase operation the memory will ignore
all commands, includin g the Er ase S usp end command. It is not po ssible to issue any co mmand to
abort the operation. Typ ical chip erase times ar e
given in Table 4. All Bus Read ope rations during
the Chip Erase operation will output the Status
Register on the Data Inputs/Outputs. See the section on the Status Register for more details.
After the Chip Erase o per at ion has c om ple ted the
memory will return to the Read Mode, unless an
error has occurred. When an error occurs the
memory will continue to output the Statu s Register. A Read/Reset command must be issued to reset the error condition and return to Read Mode.
The Chip Erase Command sets all of the bits in unprotected blocks of the memory to ’1’. All previous
data is lost.
Block Erase Command. The Block Erase command can be used to erase a l ist of one or more
blocks. Six Bus W rite operations are required to
select the first block in the list. Each additional
block in the list can be select ed by repeating the
sixth Bus Write operation using the address of the
additional block. The Bloc k Er as e op erati on st ar ts
the Program/Erase Controller about 50µs after the
last Bus Write operation. Once the Program/Erase
Controller starts it is not possible to select any
more blocks. Each additional block must therefore
be selected within 50µs of the last block. The 50µs
timer restarts when an additional block is selected.
The Status Register can be read after the sixth
Bus Write operation. See the Status Register section for details on how to identify if the Program/
Erase Controller has started the Block Erase operation.
If any selected blocks are protected then these are
ignored and all the other selected blocks are
erased. If all of the sel ected blocks are pr otected
the Block Erase operation appears to start but will
terminate within about 100µs, leaving the data unchanged. No error condition is given when protected blocks are ignored.
During the Block Eras e o perat ion the memory will
ignore all comman ds except the Erase Suspe nd
command. Typical block eras e times a re given in
Table 4. All Bus Read operations during the Block
Erase operation will output the Status Register on
the Data Inputs/Outputs. S ee the section on the
Status Register for more details.
After the Block Erase operation has completed the
memory will return to the Read Mode, unless an
error has occurred. When an error occurs the
memory will continue to output the Statu s Register. A Read/Reset command must be issued to reset the error conditio n and return to Read mode.
The Block Erase Comma nd sets all of the bits in
the unprotected selected blocks to ’1’. All previous
data in the selected blocks is lost.
Erase Suspend Command. The Erase S u sp en d
Command may be used to tempor arily suspend a
Block Erase operation a nd return the memory to
Read mode. The command requires one Bus
Write operation.
The Program/Erase Control ler will sus pend with in
15µs of the Erase Suspend Command being issued. Once the Program/Erase Controller has
stopped the memory will be set to Read mode and
the Erase will be suspended. If the Erase Suspend
command is issued during the period when the
memory is waiting for an additiona l block (before
the Program/Erase Controller starts) then the
Erase is suspende d i mme di atel y and will start immediately when the Eras e Resume Command is
issued. It is not possible to select any further
blocks to erase after the Erase Resume.
11/37
M29F080D
During Erase Suspend i t is possible to Read and
Program cells in blocks that are not being erased;
both Read and Program operations behave as
normal on these blocks. I f any atte mpt is made to
program in a protected bloc k or in the susp ended
block then the Program command is ignored and
the data remains unchanged. The Status Register
is not read and no error c ondition is gi ven. Read ing from blocks that are being erased will output
the Status Register.
It is also possible to iss ue the Auto Select, Read
CFI Query and Unlock Bypass com mands during
an Erase Suspend. The Read/Reset command
must be issued to return the device to Read Array
mode before the Resume command will be accepted.
Erase Resume Command. The Erase Resume
command must be used to restart the Program/
Erase Controller after an Erase Suspend. The device must be in Read Array mode before t he Resume command will be accepted. An erase can be
suspended and resumed more than once.
Read CFI Query Command. The Read CFI
Query Command is used to read data from the
Common Fl ash In ter face (CFI) Memor y Ar ea. Th is
command is valid when the device is in the Read
Array mode, or when the device is in Autoselected
mode.
One Bus Write cycle is required to issue the Read
CFI Query Command . Once the command is issued subsequent Bus Read operatio ns read from
the Common Flash Interface Memory Area.
The Read/Reset command must be issue d to return the device to the previous mode (the Read Array mode or Autoselected mode). A second Read/
Reset command would be needed if the d evice i s
to be put in the Read Array mode from Autoselected mode.
See Appendix B, Tables 16, 17, 18, 19, 20 and 21
for details on the information contained in the
Common Flash Interface (CFI) memory area.
Block Protect and Chip Unprotect Com-
mands. Groups of blocks can be protected
against accidental Progr am or Er as e. The Pr o tec tion Groups are show n in Appendix A, Table 15.
The whole chip ca n be unprotected to allow the
data inside the blocks to be changed.
Block Protect an d Chip Unprotect ope rations are
described in Appendix C.
12/37
M29F080D
Table 3. Commands
Bus Write Operations
Command
1X F0
Read/Reset
3555 AA2AA 55 X F0
Auto Select3555AA2AA5555590
Program4555AA2AA55555A0PAPD
Unlock Bypass3555AA2AA5555520
Unlock Bypass
Note: X Don’t Care, PA Program Address, PD Program Data, BA Any address in th e Block. All values in the table are in hexadecimal.
1st2nd3rd4th5th6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Table 4. Program, Erase Times and Program, Erase Endurance Cycles
ParameterMin
Typ
(1)
Chip Erase121260s
Block Erase (64 Kbytes)0.86s
Program (Byte)10200µs
Chip Program (Byte by Byte)1260s
Program/Erase Cycles (per Block)100,000cycles
Note: 1. TA = 25°C, VCC = 5V.
Typical after
100k W/E Cycles
(1)
MaxUnit
13/37
M29F080D
STATUS REGISTER
Bus Read operations from any address always
read the Status Register during Program and
Erase operations. It is also read during Erase Suspend when an address within a block being erased
is accessed.
The bits in the Status R egi st er are s umm ar iz ed in
Table 5, Status Register Bits.
Data Polling Bit (DQ7). The Data Polling Bit can
be used to identify whether the Program/Erase
Controller has successfully completed its operation or if it has respond ed to an Erase Suspend.
The Data Polling Bit is output on DQ7 whe n the
Status Register is read.
During Program operations the Data Polling Bit
outputs the complement of the bit being programmed to DQ7. After successful completion of
the Program operation the memory returns to
Read mode and Bus Read operations from the address just programm ed output DQ7, not its complement.
During Erase operations the Data Polli ng Bit outputs ’0’, the complement of the erased state of
DQ7. After su ccess ful co mpl etion of t he Er ase o peration the memory returns to Read Mode.
In Erase Suspend mode the Data Polli ng Bit will
output a ’1’ during a Bus Rea d operation withi n a
block being erased. The Data Polling Bit will
change from a ’0’ to a ’1’ when the Program/Erase
Controller has suspended the Erase operation.
Figure 6, Data Polling Flowc hart, gives an exam ple of how to use the Data Po lling Bit. A Valid Address is the address being programmed or an
address within the block being erased.
Toggle Bit (DQ6). The Toggle Bit can be used to
identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Erase Suspend. The To ggle Bit is
output on DQ6 when the Status Register is read.
During Program and Er ase oper ations the Togg le
Bit changes from ’0’ to ’1 ’ to ’0’, etc., with succes sive Bus Read operations at any address. After
successful completion of the operation the memory returns to Read mode.
During Erase Suspend mode the Toggle Bit will
output when addressing a cell within a block being
erased. The Toggle Bit will stop toggling when the
Program/Erase Controller has suspended the
Erase operation.
If any attempt is made to era se a protec te d bl oc k,
the operation is aborted, no er ror is signalled and
DQ6 toggles for approximately 100µs. If any attempt is made to program a protected blo ck or a
suspended block, the operatio n is abor ted, no er-
ror is signalled and DQ6 toggles for approximately
1µs.
Figure 7, Data To ggle Flowchart, gives an example of how to use the Data Toggle Bit.
Error Bit (DQ5). The Error Bit can be used to
identify errors detected by the Program/Erase
Controller. The Error Bit is set to ’1’ when a Program, Block Erase or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Reset command mus t be issu ed
before other comma nds are issued. The Error bit
is output on DQ5 when the Status Register is read.
Note that the Program command cannot change a
bit set to ’0’ back to ’1’ and attempting to do so will
set DQ5 to ‘1’. A Bus Read ope ration to that address will show the bi t is st ill ‘0 ’. On e of the Er as e
commands must be used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Erase Timer Bi t (DQ3). The Eras e Timer Bit can
be used to identify the start of Program/Erase
Controller operation during a Block Erase command. Once the Program/Erase Controller starts
erasing the Erase Timer Bit is set to ’1’. Before the
Program/Erase Cont roller starts the Erase Timer
Bit is set to ’0’ and additiona l blocks t o be erased
may be written to the Command Interface. The
Erase Timer Bit is output on DQ3 when the Status
Register is read.
Alternative Toggle Bit (DQ2). The Alternative
Toggle Bit can be u sed to monitor the Program/
Erase controller d uring Eras e operations. The Alternative Toggle Bit is output on DQ2 when the
Status Register is read.
During Chip Erase and Block Erase operations the
Toggle Bit changes from ’0 ’ to ’1’ to ’0’, etc., wi th
successive Bus Rea d operations from ad dresses
within the blocks being eras ed. A protected bl ock
is treated the sam e as a block no t being erased.
Once the operation completes the memory returns
to Read mode.
During Erase Suspend the Alternative Toggle Bit
changes from ’0’ to ’1’ to ’0’, etc. with successive
Bus Read operations from addresses within the
blocks being erased . Bus Read operations to addresses within blocks not b ei ng e rase d wi ll output
the memory cell data as if in Read mode.
After an Erase o per at ion th at ca us es th e Er ror B it
to be set the Alternative Toggle Bit can be used to
identify which block or blocks have caused the error. The Alternative Toggle Bit changes from ’0’ to
’1’ to ’0’, etc. with successive Bus Read Operations from addresses with in blocks that have not
erased correctly. Th e Alternative Toggle B it does
not change if the addressed block has erased correctly.
14/37
M29F080D
Table 5. Status Register Bits
OperationAddressDQ7DQ6DQ5DQ3DQ2
ProgramAny AddressDQ7Toggle0––0
Program During Erase
Suspend
Any AddressDQ7
Program ErrorAny AddressDQ7
Chip EraseAny Address0Toggle01Toggle0
Block Erase before
timeout
Erasing Block0Toggle00Toggle0
Non-Erasing Block0Toggle00No Toggle0
Erasing Block0Toggle01Toggle0
Block Erase
Non-Erasing Block0Toggle01No Toggle0
Erasing Block1No Toggle0–Toggle1
Erase Suspend
Non-Erasing BlockData read as normal1
Good Block Address0Toggle11No Toggle0
Erase Error
Faulty Block Address0Toggle11Toggle0
Note: Unspecified data bits should be ignored.
Toggle0––0
Toggle1––0
RB
Figure 6. Data Polling FlowchartFigure 7. Data Toggle Flowchart
DQ5 & DQ6
READ DQ6
NO
READ DQ6
START
READ
DQ6
=
TOGGLE
YES
DQ5
= 1
YES
TWICE
DQ6
=
TOGGLE
YES
NO
NO
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
NO
DQ5
= 1
YES
READ DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
FAILPASS
AI05278
FAILPASS
AI05279
15/37
M29F080D
MAXIMUM RATING
Stressing the device above the ra ting l isted in the
Absolute Maximum Ratin gs table ma y cause per manent damage to the device. Expos ure to Ab so lute Maximum Rating conditions for extended
periods may affect device reliability. These are
stress ratings only and operation of th e device at
Table 6. Absolute Maximum Ratings
SymbolParameterMinMaxUnit
T
BIAS
T
STG
V
IO
V
CC
V
ID
Note: 1. Minimum Voltage may undershoot to –2V or overshoot to VCC +2Vduring transition for a maximum of 20ns.
Temperature Under Bias–50125°C
Storage Temperature
Input or Output Voltage
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Refer also to the STMicroelectronics
SURE Program and o ther relevant quality documents.
–65150°C
V
–0.6
CC
+ 0.6
V
16/37
M29F080D
DC AND AC PARAMETERS
This section summ arizes the operating measurement conditions, and th e DC and AC c haracteris tics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Table 7. Operating and AC Measurement Conditions
Parameter
MinMaxMinMax
V
Supply Voltage
CC
Ambient Operating Temperature– 4085– 4085°C
Load Capacitance (CL)
Input Rise and Fall Times1010ns
Input Pulse Voltages0 to 30.45 to 2.4V
Input and Output Timing Ref. Voltages1.50.8 and 2.0V
4.55.54.55.5V
Conditions summarized in Table 7, Operating and
AC Measurement Conditions. Designers should
check that the oper ating conditi ons in thei r circuit
match the operating conditions when relying on
the quoted parameters.
M29F080D
30100pF
Unit55 70/ 90
Figure 8. AC Measurement I/O WaveformFigure 9. AC Measurement Load Circuit
1.3V
High Speed (55ns)
V
3V
0V
Standard (70, 90ns)
2.4V
0.45V
1.5V
2.0V
0.8V
AI05276
CC
DEVICE
UNDER
TEST
0.1µF
CL includes JIG capacitance
1N914
3.3kΩ
CL
Table 8. Device Capacitance
SymbolParameterTest ConditionMinMaxUnit
C
IN
C
OUT
Note: Sampled only, not 100% tested.
Input Capacitanc e
Output Capacitance
V
V
OUT
IN
= 0V
= 0V
6pF
12pF
OUT
AI05277
17/37
M29F080D
Table 9. DC Characteristics
SymbolParameterTest ConditionMinMaxUnit
I
I
CC1
I
CC2
I
CC3
I
LO
Input Leakage Current
LI
Output Leakage Current
Supply Current (Read)
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
0V ≤ V
≤ V
IN
CC
0V ≤ V
= VIL, G = VIH, f = 6MHz
E
E
= VCC ± 0.2V,
RP
≤ V
OUT
CC
E
= V
IH
= VCC ±0.2V
±1µA
±1µA
20mA
2mA
150µA
(1)
Supply Current (Program/Erase)
I
CC4
V
V
V
Input Low Voltage–0.50.8V
IL
Input High Voltage2
IH
Output Low Voltage
OL
Output High Voltage TTL
V
OH
V
I
ID
V
LKO
Note: 1. Sampled only, not 100% tested.
Output High Voltage CMOS
Identification Voltage11.512.5V
ID
Identification Current
Program/Erase Lockout Supply
(1)
Voltage
Program/Erase
Controller active
I
= 5.8mA
OL
I
= –2.5mA
OH
= –100µAVCC – 0.4
I
OH
A9 = V
ID
20mA
V
+ 0.5
CC
0.45V
2.4V
100µA
3.24.2V
V
V
18/37
Figure 10. Read AC Waveforms
M29F080D
tAVAV
A0-A19
tAVQVtAXQX
E
tELQV
tELQXtEHQZ
G
tGLQXtGHQX
DQ0-DQ7
VALID
tGLQV
Table 10. Read AC Characteristics
SymbolAltParameterTest Condition
E
t
AVAV
t
AVQV
t
ELQX
t
ELQV
t
GLQX
t
GLQV
t
EHQZ
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
Note: 1. Sampled only, not 100% tested.
t
Address Valid to Next Address Valid
RC
t
Address Valid to Output Valid
ACC
(1)
t
(1)
(1)
(1)
Chip Enable Low to Output Transition
LZ
t
Chip Enable Low to Output Valid
CE
t
Output Enable Low to Output Transition
OLZ
t
Output Enable Low to Output Valid
OE
t
Chip Enable High to Ou tput Hi-Z
HZ
t
Output Enable High to Output Hi-Z
DF
Chip Enable, Output Enable or Address
t
OH
Transition to Output Transition
= VIL,
G
= V
E
= VIL,
G
= V
G
= V
G
= V
E
= V
E
= V
G
= V
E
= V
IL
IL
IL
IL
IL
IL
IL
IL
tEHQX
tGHQZ
VALID
AI06145
M29F080D
Unit
5570/ 90
Min5570ns
Max5570ns
Min00ns
Max5570ns
Min00ns
Max3030ns
Max1820ns
Max1820ns
Min00ns
19/37
M29F080D
Figure 11. Write AC Waveforms, Write Enable Controlled
tAVAV
A0-A19
tAVWL
E
VALID
tWLAX
tWHEH
tELWL
G
tWLWHtGHWL
W
tDVWH
DQ0-DQ7
V
CC
RB
tVCHEL
VALID
tWHRL
Table 11. Write AC Characteristics, Write Enable Controlled
SymbolAltParameter
t
AVAV
t
ELWL
t
WLWH
t
DVWH
t
WHDX
t
WHEH
t
WHWL
t
AVWL
t
WLAX
t
GHWL
t
WHGL
t
WHRL
t
VCHEL
Note: 1. Sampled only, not 100% tested.
(1)
t
WC
t
CS
t
WP
t
DS
t
DH
t
CH
t
WPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCSVCC
Address Valid to Next Address ValidMin5570ns
Chip Enable Low to Write Enable LowMin00ns
Write Enable Low to Write Enable HighMin4545ns
Input Valid to Write Enable HighMin4545ns
Write Enable High to Input TransitionMin00ns
Write Enable High to Chip Enable HighMin00ns
Write Enable High to Write Enable LowMin2020ns
Address Valid to Write Enable LowMin00ns
Write Enable Low to Address TransitionMin4545ns
Output Enable High to Write Enable LowMin00ns
Write Enable High to Output Enable LowMin00ns
Program/Erase Valid to RB LowMax3030ns
High to Chip Enable Low
Min5050µs
tWHGL
tWHWL
tWHDX
AI06146
M29F080D
Unit
5570/ 90
20/37
Figure 12. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A19
tAVEL
W
VALID
M29F080D
tELAX
tEHWH
tWLEL
G
tELEHtGHEL
E
tDVEH
DQ0-DQ7
V
CC
RB
tVCHWL
VALID
tEHRL
Table 12. Write AC Characteristics, Chip Enable Controlled
SymbolAltParameter
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
(1)
t
EHRL
t
VCHWL
Note: 1. Sampled only, not 100% tested.
t
WC
t
WS
t
CP
t
DS
t
DH
t
WH
t
CPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCSVCC
Address Valid to Next Address ValidMin5570ns
Write Enable Low to Chip Enable LowMin00ns
Chip Enable Low to Chip Enable HighMin4545ns
Input Valid to Chip Enable HighMin4545ns
Chip Enable High to Input TransitionM in00ns
Chip Enable High to Write En able HighMin00n s
Chip Enable High to Chip Enable LowMin2020ns
Address Valid to Chip Enable LowMin00ns
Chip Enable Low to Address TransitionMin4545ns
Output Enable High Chip Enable LowMin00ns
Chip Enable High to Output Enable LowMin00ns
Program/Erase Valid to RB LowMax3030ns
High to Write Enable Low
Min5050µs
tEHGL
tEHEL
tEHDX
AI06147
M29F080D
Unit
5570/ 90
21/37
M29F080D
Figure 13. Reset/Block Temporary Unprotect AC Waveforms
E, G
W,
tPHWL, tPHEL, tPHGL
RB
RP
Table 13. Reset/Block Temporary Unprotect AC Characteristics
SymbolAltParameter
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1)
t
RHWL
(1)
t
RHEL
(1)
t
RHGL
t
PLPX
(1)
t
t
PLYH
t
PHPHH
Note: 1. Sampled only, not 100% tested.
(1)
READY
t
RP High to Write Enable Low, Chip Enable Low,
t
RH
Output Enable Low
RB High to Write Enable Low, Chip Enable Low,
t
RB
Output Enable Low
t
RP Pulse WidthMin500500ns
RP
RP Low to Read ModeMax1010µs
RP Rise Time to V
VIDR
tPLPX
ID
tPLYH
Min5050ns
Min00ns
Min500500ns
tRHWL, tRHEL, tRHGL
tPHPHH
AI02931B
M29F080D
Unit
5570/ 90
22/37
PACKAGE MECHANICAL
TSOP40 – 40 lead Plastic Thin Small Outline, 10 x 20mm, Package Outline
A2
M29F080D
Note: Drawing is not to scale.
1N
N/2
TSOP-a
D1
DIE
E
A
D
C
e
B
CP
LA1α
TSOP40 – 40 lead Plastic Thin Small Outline, 10 x 20mm, Package Mechanical Data
Blank = Standard Packing
T = Tape & Reel Packing
E = ECOPACK Package, Standard Packing
F = ECOPACK Package, Tape & Reel Packing
Devices are shipped from the factory with the memory content bits erased to ’1’.
For a list of availa ble opt ion s (Spe ed, Pac k age , et c... ) or for fu r ther i nfo rm ati on o n a ny aspec t o f th is de vice, please contact the ST Sales Office nearest to you.
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the de vice to de termine
various electrical a nd timing parameters, density
information and functions su pported by the mem ory. The system can interface easily with the device, enabling the so ftwar e to u pgr ade it se lf wh en
necessary.
When the CFI Query Command is issued th e de-
is read from the memory. Tables 16, 17, 18, 19, 20
and 21 show the addresses us ed to retrieve the
data.
The CFI data structure also contains a security
area where a 64 bit unique security number is written (see Table 21, Security Code area). Thi s area
can be accessed onl y in Read mode by the final
user. It is imposs ible to chang e the secur ity num ber after it has been written b y ST. Issu e a Read
command to return to Read mode.
vice enters CFI Query mode and the data structure
Table 16. Query Structure Overview
AddressSub-section NameDescription
10hCFI Query Identification StringCommand set ID and algorithm data offset
1BhSystem Interface InformationDevice timing & voltage information
27hDevice Geometry DefinitionFlash device layout
40h
61hSecurity Code Area64 bit unique device number
Note: Query data are always presented on the lowest order data outputs.
Primary Algorithm-specific Extended Query
table
Additional informatio n spe ci fic to the Pr im ary
Algorithm (optio na l)
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
Logic Supply Maximum Program/Erase voltage
V
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
V
[Programming] Supply Minimum Program/Erase voltage
PP
00h not supported
[Programming] Supply Maximum Program/Erase voltage
V
PP
00h not supported
Typical timeout per single byte program = 2
n
µs
Typical timeout for minimum size write buffer program = 2
Typical tim eo ut pe r indiv idu al block erase = 2
Typical tim eo ut for full chip erase = 2
n
Maximum timeout for byte program = 2
Maximum timeout for write buffer program = 2
Maximum timeout per individual block erase = 2
Maximum timeout for chip erase = 2
n
times typical
n
ms
ms
n
times typical
n
times typical
n
times typical
n
µs
see note (1)
256µs
see note (1)
4.5V
5.5V
NA
NA
16µs
NA
1s
NA
8s
28/37
M29F080D
Table 19. Device Geometry Definition
AddressDataDescriptionValue
27h14h
28h
29h
2Ah
2Bh
2Ch01h
2Dh
2Eh
2Fh
30h
00h
00h
00h
00h
0Fh
00h
00h
01h
Device Size = 2
Flash Device Interface Code description
Maximum number of bytes in multi-byte program or page = 2
Number of Erase Block Regions within the device.
It specifies the number of regio n s within the device containing contiguous
Erase Blocks of the same size.
Region 1 Information
Number of identical size erase block = 000Fh+1
Region 1 Information
Block size in Region 1 = 0100h * 256 byte
00 = required, 01= not required
Silicon Revision Number (bits 7 to 2)
00 = not supported, 01 = Read only, 02 = Read and Write
00 = not supported, x = number of blocks per group
00 = not supported, 01 = supported
04 = M29W400B mode
"P"
Yes
2
4
yes
4
Table 21. Security Code Area
AddressDataDescription
61hXX
62hXX
63hXX
64hXX
65hXX
66hXX
67hXX
68hXX
64 bit: unique device number
30/37
APPENDIX C. BLOCK PROTECTION
Block protection can be used to prevent any operation from modifying the data stored in the memory. The blocks are protected in groups, refer to
Appendix A, Table 15 for detai ls of the Protecti on
Groups. Once protected, Program and Er ase operations within the pr otected group fail to change
the data.
There are three techniques that can be used to
control Block Pro tection, these are the Programmer technique, the In-System technique and Temporary Unprotection. Temporary Unprotection is
controlled by the Reset/Block Temporary Unprotection pin, RP
; this is described in the Si gna l De -
scriptions section.
To protect the Extended Block issue the Enter Ex-
tended Block command and then use either the
Programmer or In-System technique. Once protected issue the Exit Extended Bl oc k co mma nd to
return to read mode. The Exte nded Block pro tection is irreversible , once protected the protection
cannot be undone.
Programmer Technique
The Programmer techniqu e uses high (V
) volt-
ID
age levels on some of the bus pins. These cannot
be achieved using a standard microprocessor bus,
therefore the technique is re commended only for
use in Programming Equipment.
To protect a group of blocks follow the flowchart in
Figure 14, Programme r Equipment Block Pr otect
Flowchart. To unprotect the whole chip it is necessary to protect all of the groups first, then all
groups can be unpr otected at the same time . To
unprotect the chip fo llow Figure 15, Programmer
Equipment Chip Unprotect Flowchart. Table 22,
M29F080D
Programmer Techn ique Bus Operations, gives a
summary of each operation.
The timing on these flowcharts is critical. Care
should be taken to ensure th at, where a paus e is
specified, it is followe d as closely as possible. Do
not abort the procedure befor e reaching the end.
Chip Unprotect can take several seconds and a
user message should be provided to show that the
operation is progressing.
In-System Technique
The In-System technique r equires a high voltage
level on the Reset/Blocks Temporary Unprotect
pin, RP
maximum ratings of the components on the microprocessor bus, therefore this technique is suitable
for use after the memory has been fitted to the system.
To protect a group of blocks follow the flowchart in
Figure 16, In-System Block Protect Flowc hart. To
unprotect the whole chip it is necessary to prote ct
all of the groups first, then al l the groups can be
unprotected at the same time. To unprotect the
chip follow Figure 17, In-System Chip Unprotect
Flowchart.
The timing on these flowcharts is critical. Care
should be taken to ensure th at, where a paus e is
specified, it is followe d as closely as possible. Do
not allow the microproce ssor to servi ce interrupts
that will upset the timing and do not abort the procedure before reaching the end. Chip Unprotect
can take several seconds and a user message
should be provided to show that the operation is
progressing.
. This can be achieved without violating the
Table 22. Programmer Technique Bus Operations, BYTE
OperationEGW
Block (Group)
(1)
Protect
Chip Unprotect
Block (Group)
Protection Verify
Block (Group)
Unprotection Verify
Note: 1. Block Protection Groups are shown in Appendix A, Table 15.
VILVIDVIL Pulse
V
IDVIDVIL
V
V
IL
VILV
Pulse
V
IL
IL
IH
V
IH
A9 = V
A0 = VIL, A1 = VIH, A6 = VIL, A9 = VID,
A0 = VIL, A1 =VIH, A6 = VIH, A9 = VID,
Address Inputs
A0-A19
, A12-A19 Block Address
ID
Others = X
A9 = V
, A12 = VIH, A15 = VIH
ID
Others = X
A12-A19 Block Address
Others = X
A12-A19 Block Address
Others = X
= VIH or V
IL
Data Inputs/Outputs
DQ15A–1, DQ14-DQ0
X
X
Pass = XX01h
Retry = XX00h
Retry = XX01h
Pass = XX00h
31/37
M29F080D
Figure 14. Programmer Equipment Group Protect Flowchart
START
ADDRESS = GROUP ADDRESS
W = V
IH
n = 0
G, A9 = VID,
E = V
IL
Wait 4µs
W = V
IL
Wait 100µs
W = V
IH
VerifyProtectSet-upEnd
E, G = VIH,
A0, A6 = VIL,
A1 = V
IH
E = V
IL
Wait 4µs
G = V
IL
Wait 60ns
Read DATA
DATA
=
01h
YES
A9 = V
IH
E, G = V
IH
PASS
NO
++n
= 25
A9 = V
E, G = V
NO
YES
IH
IH
Note: Block Protection Groups are shown in Append ix A, Ta ble 15.
Note: Block Protection Groups are shown in Append ix A, Ta ble 15.
DATA
=
00h
YESNO
LAST
GROUP
RP = V
ISSUE READ/RESET
COMMAND
PASS
NO
YES
IH
AI05577
35/37
M29F080D
REVISION HISTORY
Table 23. Document Revision History
DateVersionRevision Details
03-Dec-2001-01First Issue
Description of Re ad y/B us y sign al cla r ifi ed (and Fig ur e 13 mo difi ed )
05-Apr-2002-02
19-Sep-20053.0
Clarified allowable commands during block erase
Clarified the mode the device returns to in the CFI Read Query command section
Table 14. Ordering Information Scheme: standard package added and ECOP A CK version
added for both standard package and Tape & Reel packing.
Datasheet status changed to FULL DATASHEET.
36/37
M29F080D
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of use of such information nor for any infrin gement of patent s or other rights of third parties which ma y result from it s use. No license is granted
by implication or otherwi se under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without not ice. This pub licat ion su persed es and repl aces all in format ion previou sly su pplie d. STMicroele c tronic s prod ucts a re no t
authorized for use as critical compone nts in life support devices or systems without express written approval of STMicroelectronics.
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