The M28W640FCT and M28W640FCB are 64
Mbit (4 Mbit x 16) non-volatile Flash memories that
can be erased electricall y at block level and programmed in-system on a Word-by-Word basis using a 2.7V to 3.6V V
a 1.65V to 3.6V V
pins. An optional 12V V
ed to speed up customer programming.
The devices fe ature an asymmetric al blocked architecture. They have an array of 135 blocks: 8
Parameter Blocks of 4 KWord and 127 Main
Blocks of 32 KWord. The M28W640FCT has the
Parameter Blocks at the top of the memory address space while the M28 W640FCB locates the
Parameter Blocks starting from the bottom. The
memory maps are shown in Figure 5., Block Ad-
dresses.
The M28W640FCT and M28W640FCB feature an
instant, individual block locking scheme that allows any block to be locked or unlocked with no latency, enabling instant c ode and data protection.
All blocks have three levels of protection. They can
be locked and locked-down individually preventing
any accidental program ming or erasure. There i s
an additional hardware protection against program
and erase. When V
tected against program or erase. All blocks are
locked at Power Up.
Each block can be erased separately. Erase can
be suspended in order to perform either read or
program in any other block and then resumed.
Program can be susp ended to read data in any
other block and then resumed. Each block can be
programmed and erased over 100,000 cycles.
The device includ es a 192 bi t Protecti on Registe r
to increase the protection of a system design. The
Protection Register is divided into a 64 bit segment
and a 128 bit segment. Th e 64 bit segment contains a unique device number written by ST, while
the second one is one-time-pr ogrammabl e by the
user. The user programmable segment can be
permanently protected. Figure 6., shows the Protection Register Memory Map.
Program and Erase co mmands are writte n to the
Command Interface of the memory. An on-chip
Program/Erase Controller takes care of the timings necessary for program and erase operations.
The end of a program or erase operation c an be
detected and any error conditions identified. The
command set required to control the memory is
consistent with JEDEC standards.
The memory is offered i n TSOP48 (12 X 20mm)
and TFBGA48 (6.39 x 10.5mm, 0.75mm pitch)
packages and is su pplied with all the bi ts erased
(set to ’1’).
supply for the circuitry and
DD
supply for the Input/Out put
DDQ
power supply is provid-
PP
PP
≤ V
all blocks are pro-
PPLK
M28W640FCT, M28W640FCB
In addition to the standard version, the pac kages
are also available in Lead-free version, in compliance with JEDEC St d J-STD-020B, the ST ECOPACK 7191395 Specification, and the RoHS
(Restriction of Hazardous Substances) directive.
All packages are compliant with Lead-free soldering processes.
Figure 2. Logic Diagram
V
V
DDQVPP
DD
22
A0-A21
W
E
G
RP
WP
M28W640FCT
M28W640FCB
V
SS
Table 1. Signal Names
A0-A21Address Inputs
DQ0-DQ15Data Input/Output
E
G
W
RP
WP
V
DD
V
DDQ
V
PP
V
SS
NCNot Connected Inter na lly
Chip Enable
Output Enable
Write Enable
Reset
Write Protect
Core Power Supply
Power Supply for
Input/Output
Optional Supply Voltage for
Fast Program & Erase
Ground
16
DQ0-DQ15
AI09903
5/55
Page 6
M28W640FCT, M28W640FCB
Figure 3. TSOP Connections
A15
A14
A13
A12
A11
1
48
A16
V
DDQ
V
SS
DQ15
DQ7
A10DQ14
A21
A20
RP
V
PP
WP
A19
A18
A17
A9
A8
W
A7
A6
A5
A4
A3
A2
A1
12
M28W640FCT
M28W640FCB
13
2425
AI09904b
37
36
DQ6
DQ13
DQ5
DQ12
DQ4
V
DD
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
G
V
SSQ
E
A0
6/55
Page 7
Figure 4. TFBGA Connections (Top view through package)
M28W640FCT, M28W640FCB
87654321
A
B
C
D
E
F
V
A13
A14
DDQ
SS
DQ15
DQ7V
A8A11
DQ13
PP
RPA18
A21
DQ11
DQ12
DQ4
WPA19
A20
DQ2
DD
A7V
A5A17WA10
DQ0DQ9DQ3DQ6
DQ1DQ10V
V
A4
A2
A1A3A6A9A12A15
A0EDQ8DQ5DQ14A16
SSQ
G
AI04380b
7/55
Page 8
M28W640FCT, M28W640FCB
Figure 5. Block Addresses
M28W640FCT
Top Boot Block Addresses
3FFFFF
3FF000
3F8FFF
3F8000
3F7FFF
3F0000
00FFFF
008000
007FFF
000000
Note: Also see APPENDIX A., Tables 24 and 25 for a full listing of the Block Addresses.
4 KWords
Total of 8
4 KWord Blocks
4 KWords
32 KWords
Total of 127
32 KWord Blocks
32 KWords
32 KWords
Bottom Boot Block Addresses
3FFFFF
3F8000
3F7FFF
3F0000
00FFFF
008000
007FFF
007000
000FFF
000000
M28W640FCB
32 KWords
32 KWords
Total of 127
32 KWord Blocks
32 KWords
4 KWords
Total of 8
4 KWord Blocks
4 KWords
AI09905
Figure 6. Protection Register Memory Map
PROTECTION REGISTER
8Ch
User Programmable OTP
85h
84h
81h
80h
Unique device number
Protection Register Lock10
AI05520b
8/55
Page 9
SIGNAL DESCRIPTIONS
See Figure 2., Logic Diagram and Table 1., Signal
Names, for a brief overview of the signals connect-
ed to this device.
Address Inputs (A0-A21). The Address Inputs
select the cells in the memory array to access during Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the internal state machine.
Data Input/Output (DQ0-DQ15). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation or inputs a command
or the data to be progra mmed d uring a Write Bus
operation.
Chip Enable (E
vates the memory control lo gic, input buffers, de coders and sense amplifiers. When Chip Enable is
at V
and Reset is at VIH the device is in active
IL
mode. When Chip Enable i s at V
deselected, the outputs a re high impedance and
the power consumption is reduced to the stand-by
level.
Output Enable (G
data outputs during the Bus Read operation of the
memory.
Write Enable (W
Bus Write operation of the memory’s Command
Interface. The data and address inputs are latched
on the rising edge of Chip En abl e, E
able, W
, whichever occurs first.
Write Protect (WP
that gives an additional hardware protection for
each block. When Write Protect is at V
Down is enabled and the protection status of the
block cannot be changed. When Write Protect is at
V
, the Lock-Down is disa bled an d the bl ock c an
IH
be locked or unlocked. (refer to Table 7., Read
Protection Register and Lock Register).
Reset (RP
ware reset of the memory. When Re set is at V
the memory is in reset mode: the outputs are high
impedance and the curre nt consumption is minimized. After Reset all blocks are in the Locked
). The Chip Enable input acti-
the memory is
IH
). The Output Enable controls
). The Write Enabl e contro ls the
, or Write En-
). Write Protect is an input
, the Lock-
IL
). The Reset input provides a hard-
IL
M28W640FCT, M28W640FCB
state. When Reset is a t V
operation. Exiting reset mode the device enters
read array mode, but a negative transi tion of Chip
Enable or a change of th e address is require d to
ensure valid data outputs.
V
Supply Voltage. VDD provides the power
DD
supply to the internal core of the memory device.
It is the main power supply for all operations
(Read, Program and Erase).
V
Supply Voltage. V
DDQ
supply to the I/O pins and enable s all Outputs to
be powered independently from V
tied to V
Program Supply Voltage. VPP is both a
V
PP
or can use a separate supply.
DD
control input and a power supply pin. The two
functions are selected by the voltage range applied to the pin . The Supply Voltage V
Program Supply Voltage V
any order.
If V
is kept in a low voltage range (0V to 3.6V)
PP
V
is seen as a co ntrol inpu t. In th is ca se a v olt-
PP
age lower than V
PPLK
against program or erase, whi le V
ables these function s (see T able 15., DC Charac-
teristics, for the relevant values). V
sampled at the beginning of a program or erase; a
change in its valu e afte r the o per ati on has st ar ted
does not have any effect on Program or Erase,
however for Double or Quadr uple Word Program
the results are uncertain.
If V
is in the range 1 1.4V to 12.6V it acts as a
PP
power supply pin. In this condition V
stable until the Pr ogram/Erase algorithm is com pleted (see Table 17. and Table 18.).
V
Ground. VSS is the reference for al l voltage
SS
measurements.
Note: Each device in a system should have
V
,
DD, VDDQ
pacitor close to the pin. See Figure 8., AC Mea-
and VPP decoupled with a 0.1µF ca-
surement Load Circuit. The PCB track widths
should be sufficient to carry the required V
program and erase currents.
, the device is in normal
IH
provides the power
DDQ
. V
DD
can be applied in
PP
gives an absolute protection
PP
DDQ
and the
DD
> V
is only
PP
must be
PP
can be
en-
PP1
PP
9/55
Page 10
M28W640FCT, M28W640FCB
BUS OPERATIONS
There are six standard bus operations that control
the device. These are Bus Read, Bus Writ e, Output Disable, Standby, Automatic Standby and Reset. See Table 2., Bus Op erations, for a summary.
Typically glitches of les s th an 5ns on C hip Enab le
or Write Enable are ignored by the memory and do
not affect bus operations.
Read. Read Bus operation s are used to output
the contents of the Mem ory Array, the Electr onic
Signature, the Status Regi ster and the Common
Flash Interface. Both Chip Enable and Output Enable must be at V
eration. The Chip E nable inp ut should be used to
enable the devi ce. Ou tput E nab le should be us ed
to gate data onto the output. The data read depends on the previous command written to the
memory (see Command Interface section). See
Figure 9., Read AC Waveforms, and Table
16., Read AC Characteristics, for details of wh en
the output becomes valid.
Read mode is the default state of the device when
exiting Reset or after power-up.
Write. Bus Write oper ations write Commands to
the memory or latch Input Data to be programmed.
A write operation is initiated when Chip Enable
and Write Enable are at V
V
. Commands, Input Data and Addresses are
IH
latched on the rising edge of Write Enable or Chip
Enable, whichever occurs first.
See Figure 10. and Figure 11., Write AC Wave-
forms, and Table 17. and Table 18., Write AC
in order to perform a read op-
IL
with Output Enable at
IL
Characteristics, for details of the timing requirements.
Output Disable. The data outputs are high impedance when the Output Enable is at V
IH
.
Standby. Standby disables most o f the internal
circuitry allowing a substantial reduction of the current consumption. The memory is in stand-by
when Chip Enable is at V
and the device is in
IH
read mode. The power consumption is reduced to
the stand-by level and the ou tputs are set to high
impedance, independently from the Output Enable
or Write Enable inpu ts. If Chi p E nab le swi tc hes to
V
vides a low power consumption state during Read
mode. Following a read operation, the device enters Automatic Standby after 150ns of bus inactivity even if Chip Enable is Low, V
current is reduced to I
. The data Inputs/Out-
DD1
, and the supply
IL
puts will st ill ou tp ut dat a if a bus Read ope rati on is
in progress.
Reset. During Reset mode w hen Output E nable
is Low, V
, the memory is deselected and the out-
IL
puts are high impedance. The memory is in Reset
mode when Reset is at V
. The power consump-
IL
tion is reduced to the Standby level, independently
from the Chip Enable, Output Enabl e or Write En able inputs. If Reset is pulled to V
during a Pro-
SS
gram or Erase, this operation is aborted and the
memory content is no longer valid.
Table 2. Bus Operations
OperationEGWRPWP
Bus Read
Bus Write
Output Disable
Standby
ResetXXX
Note: X = VIL or VIH, V
10/55
V
V
V
V
= 12V ± 5%.
PPH
IL
IL
IL
IH
V
IL
V
IH
V
IH
XX
V
IH
V
IL
V
IH
V
IH
V
IH
V
IH
V
IH
V
IL
V
PP
XDon't CareData Output
V
X
XDon't CareHi-Z
XDon't CareHi-Z
XDon't CareHi-Z
DD
or V
PPH
DQ0-DQ15
Data Input
Page 11
COMMAND INTERFACE
All Bus Write operations to the memory are interpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. An internal Program /Erase Control ler handles all timings and veri fies the correct executi on
of the Program and Eras e commands. The Program/Erase Controlle r provides a Status Registe r
whose output may be read at any time dur ing, to
monitor the progress of the operation, or the Pro gram/Erase states. See Table 3., Command
Codes, for a summary of the c ommands and s ee
APPENDIX D., Table 32., Write State Machine
Current/Next, sheet 1 of 2., for a summary of the
Command Interface.
The Command Interface is reset to Read mode
when power is first applied, when exiting from Reset or whenever V
mand sequences must be followed exactly. Any
invalid combination of commands will reset the device to Read mode. Refer to Table 4., Commands,
in conjunction with the text descriptions below.
Read Memory Array Command
The Read command returns the memory to its
Read mode. One Bus Write cycle is required to issue the Read Memory Array command and return
the memory to Read mode. Subseque nt read operations will read t he address ed lo catio n a nd out put the data. When a device Reset occurs, the
memory defaults to Read mode.
Read Status Register Command
The Status Register indicates w hen a prog ram or
erase operation is complete and the success or
failure of the operation itself. Is sue a Read Status
Register command to read the S tatus Register’s
contents. Subseque nt Bus Read operations re ad
the Status Register at a ny address, until anothe r
command is issued . S ee Tabl e 1 1., Status Regi s-
ter Bits, for details on the definitions of the bits.
The Read Status Regist er command may be issued at any time, even during a Program/Erase
operation. Any Read attempt during a Program/
Erase operation will auto matically o utput the content of the Status Register.
Read Electronic Signature Command
The Read Electronic Signature command reads
the Manufacturer and Device Codes and the Block
Locking Status, or the Protection Register.
The Read Electronic Signature command consists
of one write cycle, a subsequent read wil l output
the Manufacturer Code, the Device Code, the
Block Lock and L ock-Dow n Stat us, or the Pro tection and Lock Regi ster. Se e Tab les 5, 6 and 7 for
the valid address.
is lower than V
DD
LKO
. Com-
M28W640FCT, M28W640FCB
Table 3. Command Codes
Hex CodeCommand
01h
10hProgram
20hErase
2Fh
30hDouble Word Program
40hProgram
50hClear Status Register
56hQuadruple Word Program
The Read Query Command is used to read data
from the Common Flash Interface (CFI) Memory
Area, allowing programming equipment or applications to automatically match their interface to
the characteristics of the device. One Bus Write
cycle is required to issue the Read Query Com mand. Once the comm and is issued subsequent
Bus Read operations read from the Common
Flash Interface Memory Area. See APPENDIX
B., COMMON FLASH INTERFACE (CFI), Tables
26, 27, 28, 29, 30 and 31 for details on the infor-
mation contained in the Com mon Flash Interface
memory area.
Block Erase Command
The Block Erase command can be used to eras e
a block. It sets all the bits within the selected block
to ’1’. All previous data in the bloc k is lost. If the
block is protected then the Erase operation will
abort, the data in the block will not be changed and
the Status Register will output the error.
Two Bus Write cycles are required to issue the
command.
■The first bus cycle sets up the Erase
command.
Block Lock confirm
Block Lock-Down confirm
Block Lock, Block Unlock, Block LockDown
Program/Erase Resume, Block Unlock
confirm
11/55
Page 12
M28W640FCT, M28W640FCB
■The second latches the block address in the
internal state machine and starts the Program/
Erase Controller.
If the second bus cycle is not Write Erase Confirm
(D0h), Status Regist er bits b4 and b5 are s et and
the command aborts.
Erase aborts if Reset turns to V
. As data integrity
IL
cannot be guaranteed when the Erase operation is
aborted, the block must be erased again.
During Erase operations the memo ry will accept
the Read Status Regis ter command a nd the Program/Erase Suspend command, all other commands will be ignored. Typical Erase times are
given in Table 8., Program, Erase Times and Pro-
gram/Erase Endurance Cycles.
See APPENDIX C., Figure 21., Erase Flowchart
and Pseudo Code, for a suggested flowc hart for
using the Erase command.
Program Command
The memory array can be programmed word-byword. Two bus write cycles ar e required to issue
the Program Command.
■The first bus cycle sets up the Program
command.
■The second latches the Address and the Data
to be written and starts the Program/Erase
Controller.
During Program operations the memory will accept the Read Statu s Register comm and and the
Program/Erase Sus pend command. Typical Program times are given in Tabl e 8., Program , Erase
Times and Program/Erase Endurance Cycles.
Programming aborts if Rese t goes to V
. As data
IL
integrity cannot be gu aranteed wh en the p rogram
operation is aborted, the block containing the
memory location must be erased and reprogrammed.
See APPENDIX C., Figure 17., Program Flow-
chart and Pseudo Code, for the flowchart for using
the Program command.
Double Word Program Command
This feature is offered to improve the programming
throughput, writing a page of two adjacent words
in parallel.The two wor ds must differ only for the
address A0. Programm ing shoul d not be attempt ed when V
is not at V
PP
PPH
.
Three bus write cy cles ar e ne ce ss ar y to i ss ue the
Double Word Program command.
■The first bus cycle sets up the Double Word
Program Command.
■The second bus cycle latches the Address and
the Data of the first word to be written.
■The third bus cycle latches the Address and
the Data of the second word to be written and
starts the Program/Erase Controller.
Read operations output the Status Register content after the programming has s tarted. Program ming aborts if Reset goes to V
. As data integrit y
IL
cannot be guaranteed when the program operation is aborted, the blo ck containing the memory
location must be erased and reprogrammed.
See APPENDIX C., Figure 18., Double Word Pro-
gram Flowchart and Pseudo Code for the flow-
chart for using the Double Word Program
command.
Quadruple Word Program Command
This feature is offered to improve the programming
throughput, writing a page of four adjacent words
in parallel.The fou r words must differ on ly for the
addresses A0 and A1. Programming should not be
attempted when V
is not at V
PP
PPH
.
Five bus write cycles are necessary to issue the
Quadruple Word Program command.
■The first bus cycle sets up the Quadruple
Word Program Command.
■The second bus cycle latches the Address and
the Data of the first word to be written.
■The third bus cycle latches the Address and
the Data of the second word to be written.
■The fourth bus cycle latches the Address and
the Data of the third word to be written.
■The fifth bus cycle latches the Address and the
Data of the fourth word to be written and starts
the Program/Erase Controller.
Read operations output the Status Register content after the programming has s tarted. Program ming aborts if Reset goes to V
. As data integrit y
IL
cannot be guaranteed when the program operation is aborted, the blo ck containing the memory
location must be erased and reprogrammed.
See APPENDIX C., Figure 19., Quadruple Word
Program Flowchart and Pseudo Code, for the
flowchart for using the Q uadruple Word Program
command.
Clear Status Register Command
The Clear Status Regist er co mm and ca n be used
to reset bits 1, 3, 4 and 5 in the Status Register to
‘0’. One bus write cycle is required to issue the
Clear Status Register command.
The bits in the Status Register do not automatically return to ‘0’ when a new Program or Erase command is issued. The error bits in the Status
Register should be cleared before attempting a
new Program or Erase command.
Program/Erase Suspend Command
The Program/Erase Suspend command is used to
pause a Program or Erase operation. One bus
write cycle is required to issue the Program/Erase
command and pause the Program/Erase controller.
12/55
Page 13
M28W640FCT, M28W640FCB
During Program/Erase Suspend the Command Interface will accept the Program/Erase Resume,
Read Array, Read Status Register, Read Electronic Signature and Read CFI Query commands. Additionally, if the suspend operation was Erase then
the Program, Double Word Program, Quadruple
Word Program, Block Lock, Block Lock-Down or
Protection Program commands will also be accepted. The block being erased may be protected
by issuing the Block Protect, Block Lock or Protection Program commands. When the Program/
Erase Resume command is issued the operation
will complete. Only the blocks not being erased
may be read or programmed correctly.
During a Program/Erase Suspend, the device can
be placed in a pseudo-standby mode by taking
Chip Enable to V
Reset turns to V
. Program/Erase is aborted if
IH
.
IL
See APPENDIX C., Figure 20., Program Suspend
& Resume Flowchart and Pseudo Cod e, and Figure 22., Erase Suspend & Resume Flowchart and
Pseudo Code, for flowcharts for using the Pro-
gram/Erase Suspend command.
Program/Erase Resume Command
The Program/Erase Resume command can be
used to restart the Program/E rase Controller after
a Program/Erase Sus pend operation has paused
it. One Bus Write cycle is required to issue the
command. Once the command is issu ed subsequent Bus Read opera tions read th e Status Register.
See APPENDIX C., Figure 20., Program Suspend
& Resume Flowchart and Pseudo Cod e, and Figure 22., Erase Suspend & Resume Flowchart and
Pseudo Code, for flowcharts for using the Pro-
gram/Erase Resume command.
Protection Register Program Command
The Protection Register Program command is
used to Program the 128 bit u ser One-Time-Programmable (OTP) segment of the Protection Register. The segment is programmed 16 bits at a
time. When shipped all bits in the segment are set
to ‘1’. The user can only program the bits to ‘0’.
Two write cycles are re quire d to is su e th e Pr o tec tion Register Program command.
■The first bus cycle sets up the Protection
Register Program command.
■The second latches the Address and the Data
to be written to the Protection Register and
starts the Program/Erase Controller.
Read operations output the Status Register content after the programming has started.
The segment can be protected by programming bit
1 of the Protection Lock Register (see Figure
6., Protection Register Memory Map). Attem pting
to program a previously protected Protection Reg-
ister will result in a Status Register error. The protection of the Protection Register is not reversible.
The Protection Register Progra m cannot be suspended.
Block Lock Command
The Block Lock comma nd is used to loc k a block
and prevent Program or Erase operations from
changing the data in it. All blocks are locked at
power-up or reset.
Two Bus Write cycles are required to issue the
Block Lock command.
■The first bus cycle sets up the Block Lock
command.
■The second Bu s Writ e cycl e latc hes t he b lock
address.
The lock status can be mo nitored for each block
using the Read Electronic Signature command.
Table 10. shows the protection status after issuing
a Block Lock command.
The Block Lock bits are vol atile, onc e set th ey re-
main set until a hardware reset or power-down/
power-up. They are cleared by a Blocks Unlock
command. Refer to the section, Block Locking, for
a detailed explanation.
Block Unlock Command
The Block Unlock c ommand is used to unlock a
block, allowing the block to be programmed or
erased. Two Bus Wr ite cycles are required to issue the Block Unlock command.
■The first bus cycle sets up the Block Unlock
command.
■The second Bu s Writ e cycl e latc hes t he b lock
address.
The lock status can be mo nitored for each block
using the Read Electronic Signature command.
Table 10. shows the protection status after issuing
a Block Unlock command. Refer to the section,
Block Locking, for a detailed explanation.
Block Lock-Down Command
A locked block cannot be Programmed or Erased,
or have its protection s tatu s cha nge d whe n W P
low, V
. When WP is high, V
IL
the Lock-Down
IH,
is
function is disabl ed and the locked blocks c an be
individually unlocked by the Block Unlock command.
Two Bus Write cycles are required to issue the
Block Lock-Down command.
■The first bus cycle sets up the Block Lock
command.
■The second Bu s Writ e cycl e latc hes t he b lock
address.
The lock status can be mo nitored for each block
using the Read Electronic Signature command.
Locked-Down blocks revert to the locked (and not
13/55
Page 14
M28W640FCT, M28W640FCB
locked-down) state when the device is reset on
power-down. Table 10. shows the protection sta-
Refer to the section, Block Loc king, for a deta iled
explanation.
Block Lock2 WriteX60hWrite
Block Unlock2 W ri teX60hWrite
Block Lock-Down 2 Wri teX60hWrite
Protection
Register Program
Note: 1. X = Don't Care, RA=Read Address, RD=Read Data, SRD=Status Register Data, ID=Identifier (Manufacture and Device Code),
(3)
(4)
QA=Query Address, QD=Q uery Data, BA =Block Addr ess, PA=Progr am Addres s, PD=Progra m Data, PRA= Protection Re gister Address, PRD =P r otection Regi ster Data.
2. The signature addresses are listed in Tables 5, 6 and 7.
3. Program Addresses 1 and 2 must be consecutive Addresses differing only for A0.
4. Program Addresses 1,2,3 and 4 must be consecutive Addresses differing only for A0 and A1.
1+ WriteXFFh
1+ WriteX70hRead XSRD
1+ WriteX90h Read
1st Cycle2nd Cycle3rd Cycle4th Cycle5th Cycle
Cycles
Op. Add Data Op. Add Data Op. Add Data Op. Add Data Op. Add Data
Note: 1. A Locked-Down Block can be locked "DQ0 = 1" or unlocked "DQ0 = 0"; see Blo ck Locking section .
Table 7. Read Protection Register and Lock Register
WordE
Lock
Unique ID 0
Unique ID 1
Unique ID 2
Unique ID 3
OTP 0
OTP 1
OTP 2
OTP 3
OTP 4
OTP 5
OTP 6
OTP 7
V
ILVILVIHVILVIH
V
ILVILVIHVILVIH
V
ILVILVIHVILVIH
0Don't Care Block Address1000h
0Don't Care Block Address0000h
0Don't Care Block Address
X
(1)
100h
GWA0-A7A8-A21DQ0DQ1DQ2DQ3-DQ7 DQ8-DQ15
V
ILVILVIH
V
ILVILVIH
VILVILV
VILVILV
V
ILVILVIH
VILVILV
VILVILV
V
ILVILVIH
VILVILV
VILVILV
VILVILV
V
ILVILVIH
VILVILV
80hDon't Care0
81hDon't CareID dataID dataID dataID dataID data
82hDon't CareID dataID dataID dataID dataID data
IH
83hDon't CareID dataID dataID dataID dataID data
IH
84hDon't CareID dataID dataID dataID dataID data
85hD on't C areOTP dataOTP da taOTP dataOT P data OTP da ta
IH
86hD on't C areOTP dataOTP da taOTP dataOT P data OTP da ta
IH
87hD on't C areOTP dataOTP da taOTP dataOT P data OTP da ta
88hD on't C areOTP dataOTP da taOTP dataOT P data OTP da ta
IH
89hD on't C areOTP dataOTP da taOTP dataOT P data OTP da ta
IH
8AhDon' t C areOT P dataOTP dataOTP d ataOTP data OTP d a ta
IH
8BhDon' t C areOT P dataOTP dataOTP d ataOTP data OTP d a ta
8ChD on't C areOTP dataO TP dataOTP dataOT P data OTP da ta
IH
OTP Prot.
data
000h00h
15/55
Page 16
M28W640FCT, M28W640FCB
Table 8. Program, Erase Times and Program/Erase Endurance Cycles
ParameterTest Conditions
V
Word Pr ogram
Double Word Program
Quadruple Word Program
Main Block Program
Parameter Block Program
Main Block Erase
PP
V
= 12V ±5%
PP
= 12V ±5%
V
PP
= 12V ±5%
V
PP
V
PP
= 12V ±5%
V
PP
V
PP
V
= 12V ±5%
PP
V
PP
= V
= V
= V
= V
DD
DD
DD
DD
VPP = 12V ±5%
Parameter Block Erase
= V
V
PP
DD
Program/Erase Cycles (per Block)100,000cycles
Note: 1. Typical time to program a Main or Parameter Block us ing the Doubl e Word Pro gram and t he Q uadruple Word Prog ram comman ds
respectively.
M28W640FCT, M 2 8W 64 0F CB
MinTyp Max
10200µ s
10200µ s
10200µ s
0.16/0.08
(1)
5s
0.325s
0.02/0.01
(1)
4s
0.044s
110s
110s
0.410s
0.410s
Unit
16/55
Page 17
BLOCK LOCKING
The M28W640FCT and M28W640FCB feature an
instant, individual block locking scheme that allows any block to be locked or unlocked with no latency. This locking scheme has three levels of
protection.
■Lock/Unlock - this first level allows software-
only control of block locking.
■Lock-Down - this second level requires
hardware interaction before locking can be
changed.
■V
The protection status of each block can be set to
Locked, Unlocked, and Lock-Down. Table 10., defines all of the possible protection states (WP
DQ1, DQ0) , and APPENDIX C., Figure 23., shows
a flowchart for the locking operations.
Reading a Block’s Lock Status
The lock status of every block can be read in the
Read Electronic Signature mode of the device. To
enter this mode write 90h to the device. Subsequent reads at the address specified in Table 6.,
will output the protec tion sta tus of tha t block. T he
lock status is represen ted b y D Q0 and DQ 1. DQ0
indicates the Block Lock/Unlock sta tus and is set
by the Lock command and cleared by the Unl ock
command. It is als o au tom ati ca ll y s et when entering Lock-Down. DQ1 indicates the Lock-Down status and is set by the Lock-Down command. It
cannot be cleared by software, only by a hardware
reset or power-down.
The following sections explain the operation of the
locking system.
Locked State
The default status of all blo cks on po wer -up o r af ter a hardware reset is Locked (states (0,0,1) o r
(1,0,1)). Locked blocks are fully protected from
any program or erase. Any program or erase operations attempted on a locke d block will return an
error in the Status Register. The Status of a
Locked block can be changed to Unlocked or
Lock-Down using the appropriate software commands. An Unlocked block can be Locked by issuing the Lock command.
Unlocked State
Unlocked blocks (states (0,0,0), (1,0,0) (1,1,0)),
can be programmed or erased. All unlocked
blocks return to the Locked state after a hardware
reset or when the device is powered-down. The
status of an unlocked block can be changed to
Locked or Locked-Down using the appropriate
PP
≤ V
- the third level offers a complete
PPLK
hardware protection against program and
erase on all blocks.
M28W640FCT, M28W640FCB
software commands. A locked block can be unlocked by issuing the Unlock command.
Lock-Dow n St a t e
Blocks that are Locked-Down (state (0,1,x))are
protected from program an d erase operati ons (as
for Locked blocks) but the ir prote ction stat us can not be changed using so ftware comman ds alone.
A Locked or Unlocked block can be Locked-Down
by issuing the Lock-Down command. LockedDown blocks revert to the Lock ed state whe n the
device is reset or powered-down.
The Lock-Down function is depend ent on the W P
input pin. When WP=0 (VIL), the blocks in the
Lock-Down state (0,1,x) are protected from program, erase and protection status changes. When
WP
,
=1 (VIH) the Lock-Down function is disabled
(1,1,1) and Locked-Down blocks can be i ndividually unlocked to the (1,1,0) state by issuing the
software command, where they can be erased and
programmed. These bl ocks can th en be reloc ked
(1,1,1) and unlock ed (1,1,0) as desired whi le WP
remains high. When WP is low , blocks that were
previously Locked-Down re turn to the Lock-Down
state (0,1,x) regardless of any changes made
while WP
was high. Device reset or power-down
resets all blocks , including those in Lock-Down, to
the Locked state.
Locking Operations During Erase Suspend
Changes to block lock status can be performed
during an erase suspend by using the standard
locking command sequences to unlock, lock or
lock-down a bl oc k. T his is u se fu l in t h e c a se whe n
another block needs to be updated while an erase
operation is in progress.
To change block loc king during an erase operation, first write the Erase Suspend command, then
check the status register unti l it indicates that the
erase operation h as been suspended. Next write
the desired Lock command s equence to a block
and the lock status will be changed. After completing any desired lock, read, or program operations,
resume the erase operation with the Erase Resume command.
If a block is locked or locked-down during an erase
suspend of the same block, the locking status bits
will be changed immedi ately, but when the er ase
is resumed, the erase operation will complete.
Locking operations cann ot be perfor med during a
program suspend. Re fer to APPENDIX D., Command Interface and Program/Erase Controller
State, for detailed information on which commands are valid during erase suspend.
Note: 1. The lock status is defined by the write p rot ect pin and by DQ1 (‘1’ for a lo cked-do wn blo ck) and DQ0 ( ‘1’ f or a locked block) as read
in the Read Electronic Signature command with A1 = V
2. All blocks are locked at power-up, so the default configuration is 001 or 101 according to WP
3. A WP
transition to VIH on a locked block will restore the previou s DQ0 value, giving a 111 or 110.
and A0 = VIL.
IH
(1)
status.
LOCK
After WP
transition
1,1,1 or 1,1,0
(3)
18/55
Page 19
STATUS REGISTER
The Status Register p rovides information on the
current or previo us Program or Erase operati on.
The various bits convey in formation and errors on
the operation. To read the Status register the
Read Status Register command can be issued, refer to Read Status Register Command section. To
output the contents, the Status Register is latched
on the falling edge of the Chip Enable or Output
Enable signals, and can be read until Chip Enable
or Output Enable returns to V
able or Output Ena ble must be toggled to update
the latched data.
Bus Read operations from any address always
read the Status Register during Program and
Erase operations.
The bits in the Status R egi st er are s umm ar iz ed in
Table 11., Status Register Bits. Refer to Table 11.
in conjunction with the following text descriptions.
Program/Erase Controller Status (Bit 7). The
Program/Erase Controller Status bit indicates
whether the Program/Er as e Cont ro ller is a ct ive o r
inactive. When the Program /Er as e Con troll er Sta tus bit is Low (set to ‘0’ ), the Program/Erase Controller is active; when the bit is High (set to ‘1’), the
Program/Erase Con troller is inacti ve, and the device is ready to process a new command.
The Program/Erase Control ler Status is Low immediately after a Program/Erase Suspend command is issued until the Program/Erase Controller
pauses. After the Program/E ras e Contr ol le r paus es the bit is High .
During Program, Erase, op erations the Program/
Erase Controller Status bit can be polled to find the
end of the operation. Other bits in the Status Register should not be tested until the Program/Erase
Controller completes th e operation and the bit is
High.
After the Program/Eras e Controller completes its
operation the Erase S tatus, Program Status , V
Status and Block Lock Status bits should be tested
for errors.
Erase Suspend Status (Bit 6). The Erase Suspend Status bit indica tes that an Erase op eration
has been suspended or is going to be suspended.
When the Erase Suspend Status bit is High (set to
‘1’), a Program/Erase Suspend command has
been issued and the memor y is waitin g for a Pro gram/Erase Resume command.
The Erase Suspend Status should only be considered valid when the Program/Erase Controller Status bit is High (Program/Erase Controller inactive).
Bit 7 is set within 30µs of the Program/Erase Suspend command being issued therefore the memory may still complete the operation rather than
entering the Suspend mode.
. Either Chip En-
IH
PP
M28W640FCT, M28W640FCB
When a Program/Erase Resume command is issued the Erase Suspend Status bit returns Low.
Erase Status (Bit 5). The Erase St atus bit can be
used to identify if the memory has faile d to verify
that the block has erased correctly. When the
Erase Status bit is High (set to ‘1 ’), the Program/
Erase Controller has appli ed the maximum number of pulses to th e block and still fa iled to verify
that the block has erased correctly. The Erase Status bit should be read once the Program/Erase
Controller Status bit is High (Program/Erase Con troller inactive).
Once set High, the Erase Status bit can only be reset Low by a Clear Status Register command or a
hardware reset. If set High it should be r eset before a new Program or Erase comm and is is su ed,
otherwise the new command will appear to fail.
Program Status (Bit 4). The Progr am Status bit
is used to identify a Program failure. When the
Program Status bit is High (set to ‘1’), the Program/Erase Controller has applied the maximum
number of pulses to the byte and still failed to verify that it has programmed correctly. The Program
Status bit should be read once the Program/Erase
Controller Status bit is High (Program/Erase Con troller inactive).
Once set High, the Program Status bit can only be
reset Low by a Clear Status Register command or
a hardware reset. If set High it should be reset before a new command is issued, otherwise the new
command will appear to fail.
V
Status (Bit 3). The VPP Status bit can be
PP
used to identify an invali d voltage on the V
during Program and Erase operations. The V
pin is only sampled at the beginning of a Program
or Erase operation. Indeterminate res ults can oc cur if V
When the V
age on the V
when the V
becomes invalid during an operation.
PP
Status bit is Low (set to ‘0’), the volt-
PP
pin was sampled at a valid voltage;
PP
Status bit is High (set to ‘1’), the V
PP
pin has a voltage that is belo w the VPP Lockout
Voltage, V
, the memory is protect ed a n d Pro-
PPLK
gram and Erase operations cannot be performed.
Once set High, the V
Status bit can only be reset
PP
Low by a Clear Status Register command or a
hardware reset. If set High it should be r eset before a new Program or Erase comm and is is su ed,
otherwise the new command will appear to fail.
Program Suspend Status (Bit 2). The Program
Suspend S t atu s bit indica tes that a Program ope ration has been suspended. When the Program
Suspend Status bit is High (s et to ‘1’ ), a Pr og r am/
Erase Suspend command has been issued and
the memory is waiting for a Program/Erase Resume command. The Program Suspend Status
should only be considered valid when the Pro-
PP
pin
PP
PP
19/55
Page 20
M28W640FCT, M28W640FCB
gram/Erase Controller Status bit is High (Program/
Erase Controller inactive). Bit 2 is set within 5µs of
the Program/Erase Susp end command being issued therefore the memory may still complete the
operation rather than entering the Suspend mode.
When a Program/Erase Res ume command is issued the Program Suspend Status bit returns Low.
Block Protection Status (Bit 1). The Block Protection Status bi t can be used to ide ntify if a Program or Erase operation has tried to modify the
contents of a locked block.
When the Block Protect ion Status bit is Hi gh (set
to ‘1’), a Program or Erase operation has been attempted on a locked block.
Once set High, the Block Protection Status bit can
only be reset Low by a Clear Status Register command or a hardware reset. If s et Hi gh it sho uld be
reset before a new command is is su ed, otherwise
the new command will appear to fail.
Reserved (Bit 0). Bit 0 of the Status Register i s
reserved. Its value must be masked.
'1'
'0'
'1'Suspended
'0'In Progress or Completed
'1'Program/Erase on protected Block, Abort
'0'No operation to protected blocks
Invalid, Abort
PP
V
OK
PP
20/55
Page 21
M28W640FCT, M28W640FCB
MAXIMUM RATING
Stressing the device above the ra ting l isted in the
Absolute Maximum Ratin gs table ma y cause permanent damage to the device. Thes e are stress
ratings only and operation of the device at these or
any other conditions abo ve those indica ted in the
Operating sections of this specification is not im-
Table 12. Absolute Maximum Ratings
SymbolParameter
T
A
T
BIAS
T
STG
T
LEAD
V
IO
, V
V
DD
DDQ
V
PP
Note: 1. Depends on range.
2. Compliant with the JEDEC Std J-STD-020B (for small body, Sn-Pb or Pb assermbly), the ST ECOPACK
and the European directive on Restr i ctions on Hazardous Substances (RoHS) 2002/95/EU.
Ambient Operating Temperature
Temperature Under Bias– 40 125°C
Storage Tempera tur e– 55 155°C
Lead Temperature during Soldering(2)°C
Input or Output Voltage– 0.6
Supply Voltage– 0.6 4.1V
Program Voltage– 0.613V
(1)
plied. Exposu re to Abso lute Max imum Rati ng conditions for extended periods may affect device
reliability. Refer also to the STMicroelectronics
SURE Program and o ther relevant quality documents.
MinMax
– 40 85°C
Value
V
+0.6
DDQ
®
7191395 specification,
Unit
V
21/55
Page 22
M28W640FCT, M28W640FCB
DC AND AC PARAMETERS
This section summ arizes the operati ng and measurement conditions , and the D C an d AC charac teristics of the device. The parameters in th e DC
and AC characteri stics Tabl es th at follow , are derived from tests performed under the Measure-
Table 13. Operating and AC Measurement Conditions
ment Conditions summarized in Table
13., Operating and AC Measurement Conditi ons.
Designers should check that the operating conditions in their circuit match the measurement conditions when relying on the quoted parameters.
50505050pF
Input Rise and Fall Times5555ns
Input Pulse Voltages
Input and Output Timing Ref.
Voltages
0 to V
V
DDQ
DDQ
/2V
0 to V
DDQ
DDQ
/2V
0 to V
DDQ
DDQ
/2V
0 to V
DDQ
DDQ
/2
Figure 7. AC Measurement I/O WaveformFigure 8. AC Measurement Load Circuit
V
DDQ
V
DDQ
V
/2
DDQ
0V
AI00610
V
DDQ
V
DD
25kΩ
Units
V
V
DEVICE
UNDER
TEST
0.1µF
0.1µF
CL includes JIG capacitance
CL
Table 14. Capacitance
SymbolParameterTest ConditionMinMaxUnit
V
V
IN
OUT
= 0V
= 0V
6pF
12pF
C
IN
C
OUT
Note: Sampled only, not 100% tested.
Input Capacitance
Output Capacitance
22/55
25kΩ
AI00609C
Page 23
M28W640FCT, M28W640FCB
Table 15. DC Characteristics
SymbolParameterTest ConditionMinTypMaxUnit
I
I
I
I
I
I
I
I
I
V
V
V
V
V
V
I
LI
I
LO
I
DD
DD1
DD2
DD3
DD4
DD5
I
PP
PP1
PP2
PP3
PP4
V
IL
V
IH
OL
OH
PP1
PPH
PPLK
LKO
Input Leakage Current
Output Leakage Current
Supply Current (Read )
Supply Current (Stand-by or
Automatic Stand-by)
Supply Current
(Reset)
Supply Current (Progr am )
Supply Current (Erase )
Supply Current
(Program/Erase Su sp en d)
Program Current
(Read or Stand-by)
Program Current
(Read or Stand-by)
Program Current (Reset)
Program Current (Program)
Program Current (Erase)
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Program Voltage (Program or
Erase operations)
Program Voltage
(Program or Erase
operations)
Program Voltage
(Program and Erase lock-out)
VDD Supply V ol tage (Progr am
and Erase lock-out)
0V≤ V
0V
E
= VSS, G = VIH, f = 5MHz
E
RP
RP
≤ V
IN
≤ V
≤V
OUT
= V
= V
DDQ
DDQ
± 0.2V,
± 0. 2V
= VSS ± 0.2V
DDQ
DDQ
Program in progress
VPP = 12V ± 5%
Program in progress
V
= V
PP
DD
Erase in progress
VPP = 12V ± 5%
Erase in progress
V
= V
PP
DD
E
= V
DDQ
± 0.2V,
Erase suspended
> V
V
PP
DD
≤ V
V
PP
DD
RP
= VSS ± 0.2V
Program in progress
V
= 12V ± 5%
PP
Program in progress
V
= V
PP
DD
Erase in progress
V
= 12V ± 5%
PP
Erase in progress
V
= V
PP
DD
≥ 2.7V
V
DDQ
≥ 2.7V0.7 V
V
DDQ
I
= 100µA, VDD = V
OL
V
= V
DDQ
I
= –100µA, VDD = V
OH
V
DDQ
= V
DDQ
DDQ
min
min
DD
DD
min,
min,
±1µA
±10µA
918mA
1550µ A
1550µ A
510mA
1020mA
520mA
1020mA
1550µ A
400µA
15µA
15µA
110mA
15µA
310mA
15µA
–0.50.4V
–0.50.8V
V
–0.4V
DDQ
DDQ
V
DDQ
DDQ
+0.4
+0.4
0.1V
V
–0.1
DDQ
1.653.6V
11.412.6V
1V
2V
V
V
V
23/55
Page 24
M28W640FCT, M28W640FCB
Figure 9. Read AC Waveforms
tAVAV
A0-A21
tAVQV
E
tELQX
G
tGLQX
DQ0-DQ15
ADDR. VALID
CHIP ENABLE
Table 16. Read AC Characteristics
SymbolAltParameter
t
AVAV
t
AVQV
t
AXQX
t
EHQX
t
EHQZ
t
ELQV
t
ELQX
t
GHQX
t
GHQZ
t
GLQV
t
GLQX
Note: 1. Sampled only, not 100% tested.
2. G
t
Address Valid to Next Address ValidMin7085 90100ns
RC
t
Address Valid to Output ValidMax708590100ns
ACC
(1)
t
(1)
(1)
(2)
(1)
(1)
(1)
(2)
(1)
may be delayed by up to t
Address Transition to Output TransitionMin0000ns
OH
t
Chip Enable High to Outpu t TransitionM in0000ns
OH
t
Chip Enable High to Outpu t Hi-ZMax20202525ns
HZ
t
Chip Enable Low to Output ValidMax708590100ns
CE
t
Chip Enable Low to Output TransitionMin0000ns
LZ
t
Output Enable High to Output TransitionMin0000ns
OH
t
Output Enable High to Output Hi-ZMax20202525ns
DF
t
Output Enable Low to Output ValidMax20203030ns
OE
t
Output Enable Low to Output TransitionMin0000ns
OLZ
ELQV
- t
after the falling edge of E without increas i ng t
GLQV
tELQV
tGLQV
OUTPUTS
ENABLED
VALID
tEHQX
tEHQZ
tGHQX
tGHQZ
VALID
DATA VALIDSTANDBY
M28W640FCT, M28W640FCB
70859010
.
ELQV
tAXQX
AI04387
Unit
24/55
Page 25
Figure 10. Write AC Waveforms, Write Enable Controlled
M28W640FCT, M28W640FCB
AI04388
tWHAX
PROGRAM OR ERASE
tAVAV
VALIDA0-A21
tAVWH
tWHGL
tELQV
tWHEL
tQVWPL
STATUS REGISTER
tQVVPL
READ
1st POLLING
STATUS REGISTER
OR DATA INPUT
E
tELWLtWHEH
WP
tVPHWH
PP
V
SET-UP COMMANDCONFIRM COMMAND
tWPHWH
tWHWL
G
W
tWHDX
tWLWH
tDVWH
DQ0-DQ15COMMANDCMD or DATA
25/55
Page 26
M28W640FCT, M28W640FCB
Table 17. Write AC Characteristics, Write Enable Controlled
SymbolAltParameter
t
AVAV
t
AVWH
t
DVWH
t
ELWL
t
ELQV
t
QVVPL
t
QVWPL
t
VPHWH
t
WHAX
t
WHDX
t
WHEH
t
WHEL
t
WHGL
t
WHWL
t
WLWH
t
WPHWH
Note: 1. Sampled only, not 100% tested.
2. A p pl i cable if V
(1,2)
(1)
t
Write Cycle TimeM in7 08 590100ns
WC
t
Address Valid to Write Enable HighMin45455050ns
AS
t
Data Valid to Write Enable HighMin45455050ns
DS
t
Chip Enable Low to Write Enable LowMin0000ns
CS
Chip Enable Low to Output ValidMin708590100ns
Output Valid to VPP Low
Min0000ns
Output Valid to Write Protect LowMin0000ns
t
VPSVPP
t
AH
t
DH
t
CH
High to Write Enable High
Min200200200200ns
Write Enable High to Address TransitionMin0000ns
Write Enable High to Data TransitionMin0000ns
Write Enable High to Chip Enabl e HighMin0000ns
Write Enable High to Chip Enabl e LowM in2 52 53030ns
Write Enable High to Output Ena ble LowMin20203030ns
t
Write Enable High to Write Enable LowM in2 52 53030ns
WPH
t
Write Enable Low to Write Enable HighMin45455050ns
WP
Write Protect High to Write Enable HighM in4 54 55050ns
is seen as a logic input (VPP < 3.6V).
PP
M28W640FCT, M28W640FCB
Unit
70859010
26/55
Page 27
Figure 11. Write AC Waveforms, Chip Enable Controlled
M28W640FCT, M28W640FCB
AI04389
tEHAX
PROGRAM OR ERASE
tAVAV
VALIDA0-A21
tAVEH
tEHGL
tELQV
tQVWPL
CMD or DATASTATUS REGISTER
tQVVPL
READ
1st POLLING
STATUS REGISTER
OR DATA INPUT
CONFIRM COMMAND
W
tWLELtEHWH
WP
tVPHEH
PP
V
POWER-UP AND
SET-UP COMMAND
tWPHEH
tEHEL
G
E
tEHDX
tELEH
tDVEH
DQ0-DQ15COMMAND
27/55
Page 28
M28W640FCT, M28W640FCB
Table 18. Write AC Characteristics, Chip Enable Controlled
SymbolAltParameter
t
AVAV
t
AVEH
t
DVEH
t
EHAX
t
EHDX
t
EHEL
t
EHGL
t
EHWH
t
ELEH
t
ELQV
t
QVVPL
t
QVWPL
t
VPHEH
t
WLEL
t
WPHEH
Note: 1. Sampled only, not 100% tested.
2. A p pl i cable if V
(1,2)
(1)
t
Write Cycle TimeMin708590100ns
WC
t
Address Valid to Chip Enable HighMin45455050ns
AS
t
Data Valid to Chip Enable HighMin45455050ns
DS
Chip Enable High to Addre ss
t
AH
Transition
t
Chip Enable High to Data TransitionM in0000ns
DH
t
Chip Enable High to Chip Ena bl e LowMin25253030ns
CPH
Chip Enable High to Outpu t Ena ble
Low
t
Chip Enable High to Write Enable HighM in0000ns
WH
t
Chip Enable Low to Chip Enable HighMin45455050ns
CP
Min0000ns
Min25253030ns
Chip Enable Low to Output ValidMin708590100ns
Output Valid to VPP Low
Min0000ns
Data Valid to Write Protect LowMin0000ns
t
VPSVPP
t
CS
High to Chip Enable High
Min200200200200ns
Write Enable Low to Chip Enable LowMin0000ns
Write Protect High to Chip Enable HighMin45455050ns
is seen as a logic input (VPP < 3.6V).
PP
M28W640FCT, M28W640FCB
Unit
70859010
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Page 29
Figure 12. Power-Up and Reset AC Waveforms
E, G
W,
RP
tPHWL
tPHEL
tPHGL
M28W640FCT, M28W640FCB
tPHWL
tPHEL
tPHGL
tVDHPH
VDD, VDDQ
Power-UpReset
Table 19. Power-Up and Reset AC Characteristics
SymbolParameterTest Condition
t
PHWL
t
PHEL
t
PHGL
t
PLPH
t
VDHPH
Note: 1. The device Reset is possible but not guaranteed if t
Reset High to Write Enable Low, Chip
Enable Low, Output Enable Low
(1,2)
Reset Low to Reset HighMin100100100100ns
(3)
Supply Voltages High to Reset HighMin50505050µs
2. Sampled only, not 100% tested.
3. It is important to assert RP
in order to allow proper CPU initialization during power up or reset.
During Pr ogram
and Erase
othersMin30303030ns
< 100ns.
PLPH
tPLPH
AI03537b
M28W640FCT, M28W640FCB
Unit
70859010
Min50505050µ s
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M28W640FCT, M28W640FCB
PACKAGE MECHANICAL
Figure 13. TSOP48 - 48 lead Plastic Thin Small Outline, 12 x 20mm, Package Outline
1
48
e
D1
24
E1
B
25
L1
A2
E
DIE
LA1α
C
CP
Note: Drawing is not to scale.
TSOP-G
Table 20. TSOP48 - 48 lead Plastic Thin Small Outline, 12 x 20mm, Package Mechanical Data
N = TSOP48: 12 x 20 mm
ZB = TFBGA48: 6.39 x 10.5mm, 0.75 mm pitch
Temperature Range
1 = 0 to 70 °C
6 = –40 to 85 °C
Option
Blank = Standard Package
T = Tape & Reel Packing
E = Lead-Free and RoHS Package, Standard Packing
F = Lead-Free and RoHS Package, Tape & Reel Packing
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M28W640FCT, M28W640FCB
Table 23. Daisy Chain Ordering Scheme
Example:M28W640FC-ZBT
Device Type
M28W640FC
Daisy Chain
-ZB = TFBGA48: 6.39 x 10.5mm, 0.75 mm pitch
Option
Blank = Standard Packing
E = Lead-Free and RoHS Package, Standard Packing
F = Lead-Free and RoHS Package, Tape & Reel Packing, 24mm
T = Tape & Reel Packing, 24mm
Note:Devices are shipped from the factory with the memory content bits erased to ’1’. For a list of available
options (Speed, Package, etc.) or for further information on any aspect of this device, please contact
the ST Sales Office nearest to you.
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the de vice to de termine
various electrical a nd timing parameters, density
information and functions su pported by the mem ory. The system can interface easily with the device, enabling the so ftwar e to u pgr ade it se lf wh en
necessary.
When the CFI Query Comma nd (RCFI) is issued
the device enters CFI Query mode and the data
Table 26. Query Structure Overview
OffsetSub-section NameDescription
00hReservedReserved for algorithm-specific information
10hCF I Que ry Ide nt ific atio n StringCommand set ID and algo rith m data offset
1BhSystem Interface InformationDevice timing & voltage information
Note: Query data are always presented on the lowest order data outputs.
structure is read fro m th e me mor y. T abl es 26, 27,
28, 29, 30 and 31 show the addresses used to re-
trieve the data.
The CFI data structure also contains a security
area where a 64 bit unique security number is written (see Table 31., Security Code Area). This area
can be accessed onl y in Read mode by the final
user. It is imposs ible to chang e the secur ity num ber after it has been written b y ST. Issu e a Read
command to return to Read mode.
Additional information specific to the Primary
Algorithm (optional)
Additional information specific to the Alternate
Algorithm (optional)
Typical time-out per single word program = 2n µs
Typical time-out for Double/Quadruple Word Program = 2
Typical time-out per individual block erase = 2
Typical time-out for full chip erase = 2
n
Maximum time-out for Word program = 2
n
ms
n
times typical
ms
n
Maximum time-out for Double/Quadruple Word Program = 2
Maximum time-out per individual block erase = 2
Maximum time-out for chip erase = 2
n
times typical
n
times typical
µs
n
times typical
16µs
16µs
1s
NA
512µs
512µs
8s
NA
40/55
Page 41
Table 29. Device Geometry Definition
Offset Word
Mode
27h0017h
28h
29h
2Ah
2Bh
2Ch0002h
2Dh
2Eh
2Fh
30h
31h
32h
M28W640FCT
33h
34h
2Dh
2Eh
2Fh
30h
31h
32h
M28W640FCB
33h
34h
DataDescriptionValue
Device Size = 2
0001h
0000h
0003h
0000h
007Eh
0000h
0000h
0001h
0007h
0000h
0020h
0000h
0007h
0000h
0020h
0000h
007Eh
0000h
0000h
0001h
Flash Device Interface Code description
Maximum number of bytes in multi-byte program or page = 2
Number of Erase Block Regions within the device.
It specifies the number of regions within the device containing contiguous
Erase Blocks of the same size.
Region 1 Information
Number of identical-size erase block = 007Eh+1
Region 1 Information
Block size in Region 1 = 0100h * 256 byte
Region 2 Information
Number of identical-size erase block = 0007h+1
Region 2 Information
Block size in Region 2 = 0020h * 256 byte
Region 1 Information
Number of identical-size erase block = 0007h+1
Region 1 Information
Block size in Region 1 = 0020h * 256 byte
Region 2 Information
Number of identical-size erase block = 007Eh=1
Region 2 Information
Block size in Region 2 = 0100h * 256 byte
bit 0Chip Erase supported(1 = Yes, 0 = No)
bit 1Suspend Erase supported(1 = Yes, 0 = No)
bit 2Suspend Program supported(1 = Yes, 0 = No)
bit 3Legacy Lock/Unlock supported(1 = Yes, 0 = No)
bit 4Queued Erase supported(1 = Yes, 0 = No)
bit 5Instant individual block locking supported(1 = Yes, 0 = No)
bit 6Protection bits supported(1 = Yes, 0 = No)
bit 7Page mode read supported(1 = Yes, 0 = No)
bit 8Synchronous read supported(1 = Yes, 0 = No)
bit 31 to 9Reserved; undefined bits are ‘0’
No
Yes
Yes
No
No
Yes
Yes
No
No
Read Array, Read Status Register and CFI Query are always supported
during Erase or Program oper ati on
bit 0Program supported after Erase Suspend (1 = Yes, 0 = No)
bit 7 to 1Reserved; undefined bits are ‘0’Yes
Defines which bits in the Block Status Register section of the Query are
implemented.
Address (P+A)h contains less significant byte
bit 0Block Lock Status Register Lock/Unlock bit active(1 = Yes, 0 = No)
bit 1Block Lock Status Register Lock-Down bit active (1 = Yes, 0 = No)
Yes
Yes
bit 15 to 2Reserved for future use; undefined bits are ‘0’
Logic Supply Optimum Program/Erase voltage (highest performance)
DD
3V
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
Supply Optimum Program/Erase voltage
PP
12V
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
01
"00h," indicates that 256 protection bytes are available
80h
This field describes user-available One Time Programmable (OTP)
Protection register bytes. Some are pre-programmed with device unique
serial numbers. Others are user programmable. Bits 0–15 point to the
Protection register Lock byte, the section’s first byte.
The following bytes are factory pre-programmed and user-programmable.
bit 0 to 7 Lock/bytes JEDEC-plane physical low address
bit 8 to 15Lock/bytes JEDEC-plane physical high address
bit 16 to 23 "n" such that 2n = factory pre-programmed bytes
writeToFlash (addressToProgram1, dataToProgram1) ;
/*see note (3) */
writeToFlash (addressToProgram2, dataToProgram2) ;
/*see note (3) */
/*Memory enters read status state after
the Program command*/
do {
status_register=readFlash (any_address) ;
/* E or G must be toggled*/
} while (status_register.b7== 0) ;
if (status_register.b3==1) /*VPP invalid error */
error_handler ( ) ;
if (status_register.b4==1) /*program error */
error_handler ( ) ;
YES
NO
b1 = 0
YES
End
Note: 1. Status check of b1 (Protected Block), b3 (VPP Invalid) and b4 (Program Error) can be made after each program operation or after
a sequence.
2. If an error is found, the Status Register must be cleared before further Program/Erase operations.
3. Address 1 and Address 2 must be consecutive addresses differing only for bit A0.
Program to Protected
Block Error (1, 2)
if (status_register.b1==1) /*program to protect block error */
error_handler ( ) ;
}
AI03539b
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M28W640FCT, M28W640FCB
Figure 19. Quadruple Word Program Flowchart and Pseudo Code
/* read status register to check if
program has already completed */
do {
status_register=readFlash (any_address) ;
/* E or G must be toggled*/
b7 = 1
YES
b2 = 1
YES
Write FFh
Read data from
another address
Write D0h
Program Continues
NO
NO
Program Complete
Write FFh
Read Data
} while (status_register.b7== 0) ;
if (status_register.b2==0) /*program completed */
{ writeToFlash (any_address, 0xFF) ;
read_data ( ) ; /*read data from another block*/
/*The device returns to Read Array
(as if program/erase suspend was not issued).*/
}
else
{ writeToFlash (any_address, 0xFF) ;
read_data ( ); /*read data from another address*/
writeToFlash (any_address, 0xD0) ;
/*write 0xD0 to resume program*/
}
}
writeToFlash (any_address, 0x70) ;
/* read status register to check if
erase has already completed */
do {
status_register=readFlash (any_address) ;
/* E or G must be toggled*/
} while (status_register.b7== 0) ;
if (status_register.b6==0) /*erase completed */
{ writeToFlash (any_address, 0xFF) ;
read_data ( ) ;
/*read data from another block*/
/*The device returns to Read Array
(as if program/erase suspend was not issued).*/
}
else
{ writeToFlash (any_address, 0xFF) ;
read_program_data ( );
/*read or program data from another address*/
writeToFlash (any_address, 0xD0) ;
/*write 0xD0 to resume erase*/
}
}
AI03542b
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Page 50
M28W640FCT, M28W640FCB
Figure 23. Locking Operations Flowchart and Pseudo Code
Figure 3., TSOP Connections and Figure 4., TFBGA Connectio ns ( T op v i ew t hr o ug h
package) updated .
Datasheet maturity changed to PRELIMINARY DATA.
TSOP48 Package Mechanical Data updated in Table 20., TSOP48 - 48 lead Plastic
Thin Small Outline, 12 x 20mm, Package Mechanical Data.
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M28W640FCT, M28W640FCB
Information furnished is be lieved to be a ccur ate and reli able. Howe ver, STMicroele ctronic s assu mes no r esponsib ilit y for th e consequences
of use of such information nor for any infrin gement of patent s or other rights of third parties which ma y result from it s use. No license is granted
by implication or otherwi se under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication ar e subject
to change without not ice. This pub licat ion su persed es and repl aces all in format ion previou sly su pplie d. STMicroele c tronic s prod ucts ar e no t
authorized for use as critical compone nts in life support devices or systems without express written approval of STMicroele ct ronics.
The ST logo is a registered trademark of STMicroelectronics.
ECOPACK is a registered trademark of STMicroelectronics .
All other names are the property of their respective owners