5.1.5 ECC (Error Correction Code) and Write cycling
The Error Correction Code (ECC) is an internal logic function which is transparent for the
2
I
C communication protocol.
The ECC logic is implemented on each group of four EEPROM bytes
single bit out of the four bytes happens to be erroneous during a Read operation, the ECC
detects this bit and replaces it with the correct value. The read reliability is therefore much
improved.
Even if the ECC function is performed on groups of four bytes, a single byte can be
written/cycled independently. In this case, the ECC function also writes/cycles the three
other bytes located in the same group
(a)
. As a consequence, the maximum cycling budget is
defined at group level and the cycling can be distributed over the 4 bytes of the group: the
sum of the cycles seen by byte0, byte1, byte2 and byte3 of the same group must remain
below the maximum value defined in Table 11: Cycling performance by groups of four bytes.
(a)
. Inside a group, if a
a. A group of four bytes is located at addresses [4*N, 4*N+1, 4*N+2, 4*N+3], where N is an
First byte of instruction
with RW = 0 already
decoded by the device
YESNO
StartCondition
Continue the
Write operation
Continue the
Random Read operation
5.1.6 Minimizing Write delays by polling on ACK
The maximum Write time (tw) is shown in AC characteristics tables in Section 8: DC and AC
parameters, but the typical time is shorter. To make use of this, a polling sequence can be
used by the bus master.
The sequence, as shown in Figure 9, is:
●Initial condition: a Write cycle is in progress.
●Step 1: the bus master issues a Start condition followed by a device select code (the
first byte of the new instruction).
●Step 2: if the device is busy with the internal Write cycle, no Ack will be returned and
the bus master goes back to Step 1. If the device has terminated the internal Write
cycle, it responds with an Ack, indicating that the device is ready to receive the second
part of the instruction (the first byte of this instruction having been sent during Step 1).
Figure 9.Write cycle polling flowchart using ACK
1. The seven most significant bits of the Device Select code of a Random Read (bottom right box in the
figure) must be identical to the seven most significant bits of the Device Select code of the Write (polling
instruction in the figure).
Read operations are performed independently of the state of the Write Control (WC) signal.
After the successful completion of a Read operation, the device internal address counter is
incremented by one, to point to the next byte address.
For the Read instructions, after each byte read (data out), the device waits for an
acknowledgment (data in) during the 9th bit time. If the bus master does not acknowledge
during this 9th time, the device terminates the data transfer and switches to its Standby
mode.
Figure 10. Read mode sequences
5.2.1 Random Address Read
A dummy Write is first performed to load the address into this address counter (as shown in
Figure 10) but without sending a Stop condition. Then, the bus master sends another Start
condition, and repeats the device select code, with the RW
acknowledges this, and outputs the contents of the addressed byte. The bus master must
not acknowledge the byte, and terminates the transfer with a Stop condition.
For the Current Address Read operation, following a Start condition, the bus master only
sends a device select code with the R/W
outputs the byte addressed by the internal address counter. The counter is then
incremented. The bus master terminates the transfer with a Stop condition, as shown in
Figure 10, without acknowledging the byte.
bit set to 1. The device acknowledges this, and
5.2.3 Sequential Read
This operation can be used after a Current Address Read or a Random Address Read. The
bus master does acknowledge the data byte output, and sends additional clock pulses so
that the device continues to output the next byte in sequence. To terminate the stream of
bytes, the bus master must not acknowledge the last byte, and must generate a Stop
condition, as shown in Figure 10.
The output data comes from consecutive addresses, with the internal address counter
automatically incremented after each byte output. After the last memory address, the
address counter “rolls-over”, and the device continues to output data from memory address
00h.
5.3 Read Identification Page (M24256-D only)
The Identification Page (64 bytes) is an additional page which can be written and (later)
permanently locked in Read-only mode.
The Identification Page can be read by issuing an Read Identification Page instruction. This
instruction uses the same protocol and format as the Random Address Read (from memory
array) with device type identifier defined as 1011b. The MSB address bits A15/A6 are don't
care, the LSB address bits A5/A0 define the byte address inside the Identification Page. The
number of bytes to read in the ID page must not exceed the page boundary (e.g.: when
reading the Identification Page from location 10d, the number of bytes should be less than
or equal to 54, as the ID page boundary is 64 bytes).
5.4 Read the lock status (M24256-D only)
The locked/unlocked status of the Identification page can be checked by transmitting a
specific truncated command [Identification Page Write instruction + one data byte] to the
device. The device returns an acknowledge bit if the Identification page is unlocked,
otherwise a NoAck bit if the Identification page is locked.
Right after this, it is recommended to transmit to the device a Start condition followed by a
Stop condition, so that:
●Start: the truncated command is not executed because the Start condition resets the
device internal logic,
●Stop: the device is then set back into Standby mode by the Stop condition.
Stressing the device outside the ratings listed in Ta bl e 5 may cause permanent damage to
the device. These are stress ratings only, and operation of the device at these, or any other
conditions outside those indicated in the operating sections of this specification, is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Table 5.Absolute maximum ratings
SymbolParameterMin.Max.Unit
Ambient operating temperature–40130°C
T
STG
T
LEAD
V
IO
I
OL
V
CC
V
ESD
1. Compliant with JEDEC Std J-STD-020D (for small body, Sn-Pb or Pb assembly), the ST ECOPACK®
7191395 specification, and the European directive on Restrictions on Hazardous Substances (RoHS)
2002/95/EU.
2. Positive and negative pulses applied on different combinations of pin connections, according to AEC-
Q100-002 (compliant with JEDEC Std JESD22-A114, C1=100 pF, R1=1500 Ω).
3. 3000 V for previous devices (process letters KA).
Storage temperature–65150°C
Lead temperature during solderingsee note
(1)
°C
Input or output range–0.506.5V
DC output current (SDA = 0)-5mA
Supply voltage–0.506.5V
Electrostatic pulse (Human Body model)
(2)
-4000
(3)
V
Doc ID 6757 Rev 2723/41
DC and AC parametersM24256-BW M24256-BR M24256-BF M24256-DR M24256-DF
-36
6
##
6
##
6
##
6
##
)NPUTANDOUTPUT
4IMINGREFERENCELEVELS
)NPUTVOLTAGELEVELS
8 DC and AC parameters
This section summarizes the operating and measurement conditions, and the DC and AC
characteristics of the device.
Table 6.Operating conditions (voltage range W)
SymbolParameterMin.Max.Unit
V
CC
T
f
C
Supply voltage2.55.5V
Ambient operating temperature–4085°C
A
Operating clock frequency-1MHz
Table 7.Operating conditions (voltage range R)
SymbolParameterMin.Max.Unit
V
CC
T
f
C
Table 8.Operating conditions (voltage range F)
Supply voltage1.85.5V
Ambient operating temperature–4085°C
A
Operating clock frequency-1MHz
SymbolParameterMin.Max.Unit
V
CC
T
f
C
Supply voltage1.75.5V
Ambient operating temperature–4085°C
A
Operating clock frequency-1MHz
Table 9.AC measurement conditions
SymbolParameterMin.Max.Unit
C
bus
Load capacitance100pF
SCL input rise/fall time, SDA input fall time50ns
Input levels0.2 V
Input and output timing reference levels0.3 V
Figure 11. AC measurement I/O waveform
24/41Doc ID 6757 Rev 27
to 0.8 V
CC
to 0.7 V
CC
CC
CC
V
V
M24256-BW M24256-BR M24256-BF M24256-DR M24256-DFDC and AC parameters
Table 10.Input parameters
SymbolParameter
(1)
Test conditionMin.Max.Unit
C
C
Z
Z
1. Characterized only, not tested in production.
2. E2, E1, E0 input impedance when the memory is selected (after a Start condition).
Table 11.Cycling performance by groups of four bytes
SymbolParameterTest condition
Ncycle
1. Cycling performance for products identified by process letter KB.
2. The Write cycle endurance is defined for groups of four data bytes located at addresses [4*N, 4*N+1,
4*N+2, 4*N+3] where N is an integer. The Write cycle endurance is defined by characterization and
qualification.
3. A Write cycle is executed when either a Page Write, a Byte Write, a Write Identification Page or a Lock
Identification Page instruction is decoded. When using the Byte Write, the Page Write or the Write
Identification Page, refer also to Section 5.1.5: ECC (Error Correction Code) and Write cycling.
Table 12.Memory cell data retention
Input capacitance (SDA)8pF
IN
Input capacitance (other pins)6pF
IN
L
Input impedance (E2, E1, E0, WC)
H
Write cycle
endurance
TA ≤ 25 °C, VCC(min) < VCC < VCC(max)4,000,000
(2)
TA = 85 °C, VCC(min) < VCC < VCC(max)1,200,000
(2)
VIN < 0.3 V
VIN > 0.7 V
(1)
CC
CC
30kΩ
500kΩ
Max.Unit
Write cycle
ParameterTest conditionMin.Unit
Data retention
1. For products identified by process letter K. The data retention behavior is checked in production. The 200-
year limit is defined from characterization and qualification results.
(1)
TA = 55 °C200Year
(3)
Doc ID 6757 Rev 2725/41
DC and AC parametersM24256-BW M24256-BR M24256-BF M24256-DR M24256-DF
DC and AC parametersM24256-BW M24256-BR M24256-BF M24256-DR M24256-DF
3#,
3$!/UT
3#,
3$!)N
$ATAVALID
T#,16T#,18
T#($(
3TOP
CONDITION
T#($,
3TART
CONDITION
7RITECYCLE
T7
!)G
$ATAVALID
T1,1,
3$!)N
T#($,
3TART
CONDITION
T$8#(T#,$8
3$!
)NPUT
3$!
#HANGE
T#($(T$($,
3TOP
CONDITION
3TART
CONDITION
T8(8(
3#,
T#(#,
T$,#,
T#,#(
T8(8(
T8,8,
T8,8,
7#
T7,$,
T$(7(
Figure 14. AC waveforms
32/41Doc ID 6757 Rev 27
M24256-BW M24256-BR M24256-BF M24256-DR M24256-DFPackage mechanical data
9 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK
®
packages, depending on their level of environmental compliance. ECOPACK®
Identification Page (M24256-D only), Section 3.18: Reading the lock
status (M24256-D only), Table 10: AC test measurement conditions,
Section 8: Part numbering.
Updated the following according to the I²C_bus specification:
Table 17: 400 kHz AC characteristics, Table 18: 1 MHz AC characteristics,
Figure 13: AC waveforms.
Added caution under Figure 3: WLCSP connections (top view, marking
side, with balls on the underside).
Updated:
– Description
– Section 3.5: Addressing the memory array
– Section 3.17: Reading the Identification Page (M24256-D only)
– Section 3.18: Reading the lock status (M24256-D only)
– Table 2: Most significant address byte
– Table 6: Absolute maximum ratings
– Table 17: 400 kHz AC characteristics
– Table 18: 1 MHz AC characteristics
Moved:
– Table 2: Most significant address byte from Section 2.6.4 to Section 3.5
Deleted:
– Table 3: Device select code to access the Identification page (M24256-
DR only)
– Table 25: Available M24256-BR, M24256-BW, M24256-BF products
(package, voltage range, temperature grade)
– Table 26: Available M24256-DR products (package, voltage range,
Updated UFDFPN8 silhouette on cover page, Figure 16: UFDFPN8
16-Nov-201125
22-Jun-201226
02-Aug-201227
(MLP8) 8-lead ultra thin fine pitch dual flat package no lead 2 x 3 mm,
outline and Table 21: UFDFPN8 (MLP8) 8-lead ultra thin fine pitch dual
flat package no lead 2 x 3 mm, mechanical data to add MC version.
datasheet) for standard products (range 6).
Added:
– Reference M24256-DF
– Table 1: Signal names, Table 12: Memory cell data retention
Updated:
– Table 16: 400 kHz AC characteristics and Table 17: 1 MHz AC
characteristics: added set up and hold timing conditiions on WC
on the underside) and Figure 18: M24256-DFCS6TP/K, WLCSP 8-bump
wafer-level chip scale package outline.
40/41Doc ID 6757 Rev 27
M24256-BW M24256-BR M24256-BF M24256-DR M24256-DF
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