The various sensing elements are manufactured
by using specialized micromachining processes,
while the IC interfaces are realized using a CMOS
technology that allows the design of a dedicated
circuit which is trimmed to better match the
sensing element characteristics. The
LSM303DLM has a linear acceleration full-scale
of ±2 g / ±4 g / ±8 g and a magnetic field full-scale
of±1.3 / ±1.9 / ±2.5 / ±4.0 / ±4.7 / ±5.6 / ±8.1
gauss, both fully selectable by the user.
The LSM303DLM includes an I
interface that supports standard mode (100 kHz)
and fast mode (400 kHz). The system can be
configured to generate an interrupt signal by
inertial wakeup/free-fall events, as well as by the
position of the device itself. Thresholds and timing
of interrupt generators are programmable on the
fly by the end user.
Magnetic and accelerometer parts can be
enabled or put into power-down mode separately.
The LSM303DLM is available in a plastic land grid
array package (LGA), and is guaranteed to
operate over an extended temperature range from
-40 to +85 °C.
Table 1.Device summary
Temp.
Part number
range
[°C]
2
C serial bus
PackagePacking
The LSM303DLM is a system-in-package
featuring a 3D digital linear acceleration sensor
and a 3D digital magnetic sensor.
April 2011Doc ID 018725 Rev 11/38
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to
change without notice.
Linear acceleration signal I2C less significant bit of the device
address (SA0)
5NCInternally not connected
6VddPower supply
7ReservedConnect to Vdd
8ReservedLeave unconnected
9ReservedLeave unconnected
10ReservedLeave unconnected
11ReservedLeave unconnected
12SET2S/R capacitor connection (C2)
13ReservedLeave unconnected
14ReservedLeave unconnected
15C1Reserved capacitor connection (C1)
16SET1S/R capacitor connection(C2)
17ReservedConnect to GND
18DRDY_MMagnetic signal interface data ready
2
19SDA_MMagnetic signal interface I
C serial data (SDA)
Doc ID 018725 Rev 17/38
Block diagram and pin descriptionLSM303DLM
Table 2.Pin description (continued)
Pin#NameFunction
20SCL_MMagnetic signal interface I2C serial clock (SCL)
21NCInternally not connected
22Vdd_IOSignal interface power supply for I/O pins
23ReservedConnect to Vdd_IO
24SCL_ALinear acceleration signal interface I2C serial clock (SCL)
2
25SDA_ALinear acceleration signal interface I
26INT1Inertial Interrupt 1
27INT2Inertial Interrupt 2
28ReservedConnect to GND
C serial data (SDA)
8/38Doc ID 018725 Rev 1
LSM303DLMModule specifications
2 Module specifications
2.1 Sensor characteristics
@ Vdd = 2.5 V, T = 25 °C unless otherwise noted
Table 3.Sensor characteristics
SymbolParameterTest conditionsMin.Typ.
FS bit set to 00±2.0
LA_FS
M_FSMagnetic measurement range
LA_SoLinear acceleration sensitivity
M_GNMagnetic gain setting
Linear acceleration
measurement range
(2)
FS bit set to 11±8.0
GN bits set to 001±1.3
GN bits set to 010±1.9
GN bits set to 011±2.5
GN bits set to 100±4.0
GN bits set to 101±4.7
GN bits set to 110±5.6
GN bits set to 111±8.1
FS bit set to 00
12-bit representation
FS bit set to 01
12-bit representation
FS bit set to 11
12-bit representation
GN bits set to 001 (X,Y)1100
GN bits set to 001 (Z)980
GN bits set to 010 (X,Y)855
GN bits set to 010 (Z)760
GN bits set to 011 (X,Y)670
GN bits set to 011 (Z)600
GN bits set to 100 (X,Y)450
GN bits set to 100 (Z)400
GN bits set to 101 (X,Y)400
GN bits set to 101 (Z)355
GN bits set to 110 (X,Y)330
GN bits set to 110 (Z)295
GN bits set to 111
GN bits set to 111
(a)
.
(2)
(X,Y)230
(2)
(Z)205
1
2
3.9
(1)
Max.Unit
gFS bit set to 01±4.0
gauss
g/digit
m
LSB/
gauss
a. The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V.
Doc ID 018725 Rev 19/38
Module specificationsLSM303DLM
Table 3.Sensor characteristics (continued)
SymbolParameterTest conditionsMin.Typ.
(1)
Max.Unit
LA_TCSo
Linear acceleration sensitivity
change vs. temperature
FS bit set to 00±0.01%/°C
Linear acceleration typical
LA_TyOff
LA_TCOff
Zero-g level offset
accuracy
(3),(4)
Linear acceleration Zero-g level
change vs. temperature
M_CASMagnetic cross-axis sensitivity
M_EFMaximum exposed field
FS bit set to 00±60mg
Max. delta from 25 °C±0.5mg/°C
Cross field = 0.5 gauss
H applied = ±3 gauss
No permitting effect on
zero reading
±1
10000gauss
M_RMagnetic resolution5mgauss
Sensitivity starts to
M_DFDisturbing field
degrade. Use S/R pulse to
20gauss
restore sensitivity
TopOperating temperature range-40+85°C
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Typical Zero-g level offset value after MSL3 preconditioning.
4. Offset can be eliminated by enabling the built-in high-pass filter.
%FS/
gauss
2.2 Electrical characteristics
@ Vdd = 2.5 V, T = 25 °C unless otherwise noted.
Table 4.Electrical characteristics
SymbolParameter
VddSupply voltage
Tes t
conditions
Min.Typ.
2.163.6V
Vdd_IOModule power supply for I/O1.711.8Vdd+0.1V
Idd
IddPdn
Current consumption in normal
(2)
mode
Current consumption in powerdown mode
-
TopOperating temperature range-40+85
1. Typical specifications are not guaranteed.
2. Magnetic sensor setting ODR = 7.5 Hz. Accelerometer sensor ODR = 50 Hz.
(1)
Max.Unit
360µA
2µA
°C
10/38Doc ID 018725 Rev 1
LSM303DLMModule specifications
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2.3 Communication interface characteristics
2.3.1 Sensor I2C - inter IC control interface
Subject to general operating conditions for Vdd and top.
Table 5.I2C slave timing values
SymbolParameter
2
C standard mode
I
Min.Max.Min.Max.
(1)
I2C fast mode
(1)
Unit
f
(SCL)
t
w(SCLL)
t
w(SCLH)
t
su(SDA)
t
h(SDA)
t
r(SDA) tr(SCL)
t
f(SDA) tf(SCL)
t
h(ST)
t
su(SR)
t
su(SP)
t
w(SP:SR)
SCL clock frequency01000400KHz
SCL clock low time4.71.3
SCL clock high time4.00.6
SDA setup time250100ns
SDA data hold time0.013.450.010.9µs
SDA and SCL rise time1000
SDA and SCL fall time300
START condition hold time40.6
Repeated START condition
setup time
4.70.6
STOP condition setup time40.6
Bus free time between STOP
and START condition
4.71.3
1. Data based on standard I2C protocol requirement, not tested in production.
2. Cb = total capacitance of one bus line, in pF.
Figure 3.I
2
C slave timing diagram
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20 + 0.1C
µs
(2)
b
(2)
b
300
ns
300
µs
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b. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both ports.
Doc ID 018725 Rev 111/38
Absolute maximum ratingsLSM303DLM
3 Absolute maximum ratings
Stresses above those listed as “absolute maximum ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Table 6.Absolute maximum ratings
SymbolRatingsMaximum valueUnit
VddSupply voltage-0.3 to 4.8V
Vdd_IOI/O pins supply voltage-0.3 to 4.8V
VinInput voltage on any control pin (SCL, SDA) -0.3 to Vdd_IO +0.3V
A
POW
A
UNP
T
OP
T
STG
Acceleration (any axis, powered, Vdd = 2.5 V)
Acceleration (any axis, unpowered)
Operating temperature range-40 to +85°C
Storage temperature range-40 to +125°C
3,000 for 0.5 msg
10,000 for 0.1 msg
3,000 for 0.5 msg
10,000 for 0.1 msg
This is a mechanical shock sensitive device, improper handling can cause permanent
damage to the part.
This is an ESD sensitive device, improper handling can cause permanent damage to
the part.
12/38Doc ID 018725 Rev 1
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