3-axis - ±2g/±6g digital output low voltage linear accelerometer
Features
■ 2.16 V to 3.6 V single supply operation
■ 1.8 V compatible IOs
2
■ I
C/SPI digital output interfaces
■ Programmable 12 or 16 bit data representation
■ Interrupt activated by motion
■ Programmable interrupt threshold
■ Embedded self test
■ High shock survivability
■ ECOPACK® compliant (see Section 9)
Description
LIS3LV02DL
MEMS inertial sensor
LGA-16
The LIS3LV02DL has a user selectable full scale
of ±2g, ±6g and it is capable of measuring
acceleration over a bandwidth of 640 Hz for all
axes. The device bandwidth may be selected
accordingly to the application requirements.
The self-test capability allows the user to check
the functioning of the device.
The LIS3LV02DL is a three axes digital output
linear accelerometer that includes a sensing
element and an IC interface able to take the
information from the sensing element and to
provide the measured acceleration signals to the
external world through an I
2
C/SPI serial interface.
The sensing element, capable of detecting the
acceleration, is manufactured using a dedicated
process developed by ST to produce inertial
sensors and actuators in silicon.
The IC interface instead is manufactured using a
CMOS process that allows high level of
integration to design a dedicated circuit which is
factory trimmed to better match the sensing
element characteristics.
The device may be also configured to generate an
inertial wake-up/free-fall interrupt signal when a
programmable acceleration threshold is crossed
at least in one of the three axes.
The LIS3LV02DL is available in plastic SMD
package and it is specified over a temperature
range extending from -40°C to +85°C.
The LIS3LV02DL belongs to a family of products
suitable for a variety of applications:
– Free-Fall detection
– Motion activated functions in portable
terminals
– Antitheft systems and Inertial navigation
– Gaming and virtual reality input devices
– Vibration monitoring and compensation
1. The product is factory calibrated at 3.3 V. The device can be used from 2.16 V to 3.6 V
2. Typical specifications are not guaranteed
3. Digital filter cut-off frequency
4. Time to obtain valid data after exiting Power-Down mode
mA
V
V
Hz
14/48
LIS3LV02DLMechanical and electrical specifications
t
t
t
t
t
t
t
t
2.3 Communication interface characteristics
2.3.1 SPI - serial peripheral interface
Subject to general operating conditions for Vdd and Top.
Table 6.SPI Slave Timing Values
(1)
Val ue
SymbolParameter
MinMax
tc(SPC)SPI clock cycle125ns
fc(SPC)SPI clock frequency8MHz
tsu(CS)CS setup time5
th(CS)CS hold time10
tsu(SI)SDI input setup time5
Unit
th(SI)SDI input hold time15
ns
tv(SO)SDO valid output time55
th(SO)SDO output hold time7
tdis(SO)SDO output disable time50
1. Values are guaranteed at 8 MHz clock frequency for SPI with both 4 and 3 wires, based on characterization
results, not tested in production
(2)
h(SI)
v(SO)
(3)
c(SPC)
h(SO)
h(CS)
LSB IN
LSB OUT
(3)
(3)
dis(SO)
(3)
Figure 3.SPI slave timing diagram
CS
(3)
su(CS)
SPC
(3)
su(SI)
SDI
SDO
(3)
(3)
MSB IN
MSB OUT
2. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both input and output port
3. When no communication is on-going, data on CS, SPC, SDI and SDO are driven by internal pull-up
resistors
15/48
Mechanical and electrical specificationsLIS3LV02DL
t
t
t
t
t
t
t
t
t
t
t
2.3.2 I2C - Inter IC control interface
Subject to general operating conditions for Vdd and Top.
Table 7.I2C slave timing values
SymbolParameter
I2C standard mode
(1)
I2C fast mode
MinMaxMinMax
(1)
Unit
f
(SCL)
t
w(SCLL)
t
w(SCLH)
t
su(SDA)
t
h(SDA)
t
r(SDA) tr(SCL)
t
f(SDA) tf(SCL)
t
h(ST)
t
su(SR)
t
su(SP)
t
w(SP:SR)
SCL clock frequency01000400KHz
SCL clock low time4.71.3
SCL clock high time4.00.6
SDA setup time250100ns
SDA data hold time
(2)
0
3.45
SDA and SCL rise time1000
SDA and SCL fall time300
(2)
0
20 + 0.1C
20 + 0.1C
0.9µs
(3)
b
(3)
b
300
300
START condition hold time40.6
Repeated START condition
setup time
4.70.6
STOP condition setup time40.6
Bus free time between STOP
and START condition
4.71.3
1. Data based on standard I2C protocol requirement, not tested in production
2. A device must internally provide an hold time of at least 300ns for the SDA signal (referred to VIHmin of the SCL signal) to
bridge the undefined region of the falling edge of SCL
3. Cb = total capacitance of one bus line, in pF
Figure 4.I
2
C slave timing diagram
(4)
µs
ns
µs
START
SDA
su(SDA)
r(SCL)tf(SCL)
SCL
f(SDA)
h(ST)
w(SCLL)
r(SDA)
w(SCLH)
4.Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both port
16/48
h(SDA)
su(SR)
su(SP)
w(SP:SR)
REPEATED
START
START
STOP
LIS3LV02DLMechanical and electrical specifications
2.4 Absolute maximum ratings
Stresses above those listed as “absolute maximum ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Table 8.Absolute maximum ratings
SymbolRatingsMaximum ValueUnit
VddSupply voltage-0.3 to 6V
Vdd_IOI/O pins Supply voltage-0.3 to Vdd +0.1V
Vin
A
POW
A
UNP
T
T
STG
ESDElectrostatic discharge protection
Input voltage on any control pin
(CS, SCL/SPC, SDA/SDI/SDO, CK)
Acceleration (Any axis, Powered, Vdd=3.3 V)
Acceleration (any axis, unpowered)
Operating temperature range-40 to +85°C
OP
Storage temperature range-40 to +125°C
-0.3 to Vdd_IO +0.3V
3000g for 0.5 ms
10000g for 0.1 ms
3000g for 0.5 ms
10000g for 0.1 ms
4.0 (HBM)kV
200 (MM)V
1.5 (CDM)kV
Note:Supply voltage on any pin should never exceed 6.0 V.
This is a Mechanical Shock sensitive device, improper handling can cause
permanent damages to the part
This is an ESD sensitive device, improper handling can cause permanent damages
to the part
17/48
Mechanical and electrical specificationsLIS3LV02DL
2.5 Terminology
2.5.1 Sensitivity
Sensitivity describes the gain of the sensor and can be determined e.g. by applying 1g
acceleration to it. As the sensor can measure DC accelerations this can be done easily by
pointing the axis of interest towards the center of the Earth, noting the output value, rotating
the sensor by 180 degrees (point to the sky) and noting the output value again. By doing so,
±1g acceleration is applied to the sensor. Subtracting the larger output value from the
smaller one and dividing the result by 2 leads to the actual sensitivity of the sensor. This
value changes very little over temperature and also very little over time. The Sensitivity
Tolerance describes the range of Sensitivities of a large population of sensors.
2.5.2 Zero-g level
Zero-g level Offset (Off) describes the deviation of an actual output signal from the ideal
output signal if there is no acceleration present. A sensor in a steady state on a horizontal
surface will measure 0g in X axis and 0g in Y axis whereas the Z axis will measure 1g. The
output is ideally in the middle of the dynamic range of the sensor (content of OUT registers
00h, 00h with 16 bit representation, data expressed as 2’s complement number). A deviation
from ideal value in this case is called Zero-g offset. Offset is to some extent a result of stress
to a precise MEMS sensor and therefore the offset can slightly change after mounting the
sensor onto a printed circuit board or exposing it to extensive mechanical stress. Offset
changes little over temperature, see “Zero-g level change vs. temperature”. The Zero-g level
of an individual sensor is stable over lifetime. The Zero-g level tolerance describes the range
of Zero-g levels of a population of sensors.
2.5.3 Self test
Self Test allows to test the mechanical and electric part of the sensor, allowing the seismic
mass to be moved by means of an electrostatic test-force. The Self Test function is off when
the self-test bit of CTRL_REG1 (control register 1) is programmed to ‘0‘. When the self-test
bit of CTRL_REG1 is programmed to ‘1‘ an actuation force is applied to the sensor,
simulating a definite input acceleration. In this case the sensor outputs will exhibit a change
in their DC levels which is related to the selected full scale and depending on the Supply
Voltage through the device sensitivity. When Self Test is activated, the device output level is
given by the algebraic sum of the signals produced by the acceleration acting on the sensor
and by the electrostatic test-force. If the output signals change within the amplitude
specified inside Ta bl e 3 or 4 then the sensor is working properly and the parameters of the
interface chip are within the defined specification.
18/48
LIS3LV02DLFunctionality
3 Functionality
The LIS3LV02DL is a high performance, low-power, digital output 3-axis linear
accelerometer packaged in an LGA package. The complete device includes a sensing
element and an IC interface able to take the information from the sensing element and to
provide a signal to the external world through an I
3.1 Sensing element
A proprietary process is used to create a surface micro-machined accelerometer. The
technology allows to carry out suspended silicon structures which are attached to the
substrate in a few points called anchors and are free to move in the direction of the sensed
acceleration. To be compatible with the traditional packaging techniques a cap is placed on
top of the sensing element to avoid blocking the moving parts during the moulding phase of
the plastic encapsulation.
When an acceleration is applied to the sensor the proof mass displaces from its nominal
position, causing an imbalance in the capacitive half-bridge. This imbalance is measured
using charge integration in response to a voltage pulse applied to the sense capacitor.
At steady state the nominal value of the capacitors are few pF and when an acceleration is
applied the maximum variation of the capacitive load is up to 100fF.
2
C/SPI serial interface.
3.2 IC interface
The complete measurement chain is composed by a low-noise capacitive amplifier which
converts into an analog voltage the capacitive unbalancing of the MEMS sensor and by
three Σ∆ analog-to-digital converters, one for each axis, that translate the produced signal
into a digital bitstream.
The Σ∆ converters are coupled with dedicated reconstruction filters which remove the high
frequency components of the quantization noise and provide low rate and high resolution
digital words.
The charge amplifier and the Σ∆ converters are operated respectively at 61.5 kHz and
20.5 kHz.
The data rate at the output of the reconstruction depends on the user selected Decimation
Factor (DF) and spans from 40 Hz to 2560 Hz.
The acceleration data may be accessed through an I
device particularly suitable for direct interfacing with a microcontroller.
The LIS3LV02DL features a Data-Ready signal (RDY) which indicates when a new set of
measured acceleration data is available thus simplifying data synchronization in digital
system employing the device itself.
The LIS3LV02DL may also be configured to generate an inertial Wake-Up, Direction
Detection and Free-Fall interrupt signal accordingly to a programmed acceleration event
along the enabled axes.
2
C/SPI interface thus making the
19/48
FunctionalityLIS3LV02DL
3.3 Factory calibration
The IC interface is factory calibrated for sensitivity (So) and Zero-g level (Off).
The trimming values are stored inside the device by a non volatile structure. Any time the
device is turned on, the trimming parameters are downloaded into the registers to be
employed during the normal operation. This allows the user to employ the device without
further calibration.
20/48
LIS3LV02DLApplication hints
4 Application hints
Figure 5.LIS3LV02DL electrical connection
Vdd_IO
CS
SCL/SPC
6
7
8
GND
Digital signal from/to signal controller.Signal’s levels are defined by proper selection of Vdd_IO
LIS3LV02DL
(TOP VIEW)
9
SDO
SDA/SDI/SDO
RDY/INT
1
16
15
14
100nF
Z
1
X
DIRECTION OF THE
DETECTABLE
ACCELERATIONS
Vdd
10uF
Y
The device core is supplied through Vdd line while the I/O pads are supplied through
Vdd_IO line. Power supply decoupling capacitors (100 nF ceramic, 10 µF Al) should be
placed as near as possible to the pin 13 of the device (common design practice).
All the voltage and ground supplies must be present at the same time to have proper
behavior of the IC (refer to Figure 7). It is possible to remove Vdd maintaining Vdd_IO
without blocking the communication busses. In this condition the measurement chain is
powered off.
The functionality of the device and the measured acceleration data is selectable and
accessible through the I
2
C/SPI interface.When using the I2C, CS must be tied high while
SDO must be left floating. Refer to dedicated application note for further information on
device usage.
The functions, the trasholds and the timing of the interrupt pin (INT) can be completely
programmed by the user through the I
2
C/SPI interface.
4.1 Soldering Information
The LGA-16 package is compliant with the ECOPACK®, RoHS and “Green” standard.
It is qualified for soldering heat resistance according to JEDEC J-STD-020C.
Leave “Pin 1 Indicator” unconnected during soldering.
Land pattern and soldering recommendations are available at www.st.com/mems
21/48
.
Digital interfacesLIS3LV02DL
5 Digital interfaces
The registers embedded inside the LIS3LV02DL may be accessed through both the I2C and
SPI serial interfaces. The latter may be SW configured to operate either in 3-wire or 4-wire
interface mode.
The serial interfaces are mapped onto the same pads. To select/exploit the I
line must be tied high (i.e connected to Vdd_IO).
C Serial Data (SDA)
SPI Serial Data Input (SDI)
3-wire Interface Serial Data Output (SDO)
5.1 I2C serial interface
The LIS3LV02DL I2C is a bus slave. The I2C is employed to write the data into the registers
whose content can also be read back.
The relevant I
Table 10.Serial interface pin description
TermDescription
TransmitterThe device which sends data to the bus
ReceiverThe device which receives data from the bus
2
C terminology is given in the table below.
Master
SlaveThe device addressed by the master
The device which initiates a transfer, generates clock signals and terminates a
transfer
There are two signals associated with the I2C bus: the Serial Clock Line (SCL) and the
Serial DAta line (SDA). The latter is a bidirectional line used for sending and receiving the
data to/from the interface. Both the lines are connected to Vdd_IO through a pull-up resistor
embedded inside the LIS3LV02DL. When the bus is free both the lines are high.
2
The I
C interface is compliant with Fast Mode (400 kHz) I2C standards as well as the
Normal Mode.
22/48
LIS3LV02DLDigital interfaces
5.1.1 I2C operation
The transaction on the bus is started through a START (ST) signal. A START condition is
defined as a HIGH to LOW transition on the data line while the SCL line is held HIGH. After
this has been transmitted by the Master, the bus is considered busy. The next byte of data
transmitted after the start condition contains the address of the slave in the first 7 bits and
the eighth bit tells whether the Master is receiving data from the slave or transmitting data to
the slave. When an address is sent, each device in the system compares the first seven bits
after a start condition with its address. If they match, the device considers itself addressed
by the Master. The Slave ADdress (SAD) associated to the LIS3LV02DL is 0011101b.
Data transfer with acknowledge is mandatory. The transmitter must release the SDA line
during the acknowledge pulse. The receiver must then pull the data line LOW so that it
remains stable low during the HIGH period of the acknowledge clock pulse. A receiver which
has been addressed is obliged to generate an acknowledge after each byte of data
received.
2
The I
C embedded inside the LIS3LV02DL behaves like a slave device and the following
protocol must be adhered to. After the start condition (ST) a salve address is sent, once a
slave acknowledge (SAK) has been returned, a 8-bit sub-address will be transmitted: the 7
LSb represent the actual register address while the MSB enables address auto increment. If
the MSb of the SUB field is 1, the SUB (register address) will be automatically incremented
to allow multiple data read/write.
The slave address is completed with a Read/Write bit. If the bit was ‘1’ (Read), a repeated
START (SR) condition will have to be issued after the two sub-address bytes; if the bit is ‘0’
(Write) the Master will transmit to the slave with direction unchanged.
Table 11.Transfer when master is writing one byte to slave
MasterSTSAD + WSUBDATASP
SlaveSAKSAKSAK
Table 12.Transfer when master is writing multiple bytes to slave
MasterSTSAD + WSUBDATADATASP
SlaveSAKSAKSAKSAK
Table 13.Transfer when master is receiving (reading) one byte of data from slave
MasterSTSAD + WSUBSRSAD + RNMAKSP
SlaveSAKSAKSAKDATA
Table 14.Transfer when master is receiving (reading) multiple bytes of data from slave
Master ST SAD+WSUBSR SAD+RMAKMAKNMAK SP
SlaveSAKSAKSAKDATADATADATA
23/48
Digital interfacesLIS3LV02DL
Data are transmitted in byte format (DATA). Each data transfer contains 8 bits. The number
of bytes transferred per transfer is unlimited. DATA is transferred with the Most Significant bit
(MSb) first. If a receiver can’t receive another complete byte of data until it has performed
some other function, it can hold the clock line, SCL LOW to force the transmitter into a wait
state. Data transfer only continues when the receiver is ready for another byte and releases
the data line. If a slave receiver doesn’t acknowledge the slave address (i.e. it is not able to
receive because it is performing some real time function) the data line must be left HIGH by
the slave. The Master can then abort the transfer. A LOW to HIGH transition on the SDA line
while the SCL line is HIGH is defined as a STOP condition. Each data transfer must be
terminated by the generation of a STOP (SP) condition.
In order to read multiple bytes, it is necessary to assert the most significant bit of the subaddress field. In other words, SUB(7) must be equal to ‘1’ while SUB(6-0) represents the
address of first register to read.
In the presented communication format MAK is Master Acknowledge and NMAK is No
Master Acknowledge.
5.2 SPI bus interface
The LIS3LV02DL SPI is a bus slave. The SPI allows to write and read the registers of the
device.
The serial interface interacts with the outside world with 4 wires: CS, SPC, SDI and SDO.
Figure 6.Read and write protocol
CS
SPC
SDI
DI7DI6DI5DI4DI3DI2DI1DI0
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0
SDO
RW
MS
AD5 AD4 AD3 AD2 AD1 AD0
CS is the Serial Port Enable and it is controlled by the SPI master. It goes low at the start of
the transmission and goes back high at the end.
SPC is the Serial Port Clock and it is controlled by the SPI master. It is stopped high when
CS is high (no transmission).
SDI and SDO are respectively the Serial Port Data Input and Output. Those lines are driven
at the falling edge of SPC and should be captured at the rising edge of SPC.
Both the Read Register and Write Register commands are completed in 16 clock pulses or
in multiple of 8 in case of multiple byte read/write. Bit duration is the time between two falling
edges of SPC. The first bit (bit 0) starts at the first falling edge of SPC after the falling edge
of CS while the last bit (bit 15, bit 23, ...) starts at the last falling edge of SPC just before the
rising edge of CS.
24/48
LIS3LV02DLDigital interfaces
bit 0: RW bit. When 0, the data DI(7:0) is written into the device. When 1, the data DO(7:0)
from the device is read. In latter case, the chip will drive SDO at the start of bit 8.
bit 1: MS
When 1, the address will be auto incremented in multiple read/write commands.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DI(7:0) (write mode). This is the data that will be written into the device (MSb
first).
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
In multiple read/write commands further blocks of 8 clock periods will be added. When MS
bit is 0 the address used to read/write data remains the same for every block. When MS
is ‘1’ the address used to read/write data is incremented at every block.
The function and the behavior of SDI and SDO remain unchanged.
5.2.1 SPI read
Figure 7.SPI read protocol
bit. When 0, the address will remain unchanged in multiple read/write commands.
bit
CS
SPC
SDI
RW
MS
AD5 AD4 AD3 AD2 AD1 AD0
SDO
DO7 DO6DO5 DO4DO3 DO2 DO1DO0
The SPI Read command is performed with 16 clock pulses. Multiple byte read command is
performed adding blocks of 8 clock pulses at the previous one.
bit 0: READ bit. The value is 1.
bit 1: MS
bit. When 0 do not increment address, when 1 increment address in multiple
reading.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
bit 16-... : data DO(...-8). Further data in multiple byte reading.
3-wires mode is entered by setting to ‘1’ bit SIM (SPI Serial Interface Mode selection) in
CTRL_REG2.
Figure 11. SPI read protocol in 3-wires mode
CS
SPC
SDI/O
RW
MS
AD5 AD4 AD3 AD2 AD1 AD0
The SPI Read command is performed with 16 clock pulses:
bit 0: READ bit. The value is 1.
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0
bit 1: MS
bit. When 0 do not increment address, when 1 increment address in multiple
reading.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
Multiple read command is also available in 3-wires mode.
27/48
Register mappingLIS3LV02DL
6 Register mapping
The table given below provides a listing of the 8 bit registers embedded in the device and
the related addresses.
Table 15.Registers address map
Register address
Register nameType
BinaryHex
rw0000000 - 000111000 - 0EReserved
WHO_AM_Ir00011110F00111010Dummy register
rw0010000 - 001010110-15Reserved
OFFSET_Xrw001011016CalibrationLoaded at boot
OFFSET_Yrw001011117CalibrationLoaded at boot
OFFSET_Zrw001100018CalibrationLoaded at boot
GAIN_Xrw001100119CalibrationLoaded at boot
GAIN_Yrw00110101ACalibrationLoaded at boot
GAIN_Zrw00110111BCalibrationLoaded at boot
0011100 -00111111C-1FReserved
DefaultComment
CTRL_REG1rw01000002000000111
CTRL_REG2rw01000012100000000
CTRL_REG3rw01000102200001000
HP_FILTER RESETr010001123dummyDummy register
0100100-010011024-26Not Used
STATUS_REGrw01001112700000000
OUTX_Lr010100028output
OUTX_Hr010100129output
OUTY_Lr01010102Aoutput
OUTY_Hr01010112Boutput
OUTZ_Lr01011002Coutput
OUTZ_Hr01011012Doutput
r01011102EReserved
01011112FNot Used
FF_WU_CFGrw01100003000000000
FF_WU_SRCrw01100013100000000
FF_WU_ACKr011001032dummyDummy register
011001133Not Used
FF_WU_THS_Lrw01101003400000000
28/48
LIS3LV02DLRegister mapping
Table 15.Registers address map (continued)
Register address
Register nameType
BinaryHex
FF_WU_THS_Hrw01101013500000000
FF_WU_DURATIONrw01101103600000000
011011137Not Used
DD_CFGrw01110003800000000
DD_SRCrw01110013900000000
DD_ACKr01110103AdummyDummy register
01110113BNot Used
DD_THSI_Lrw01111003C00000000
DD_THSI_Hrw01111013D00000000
DD_THSE_Lrw01111103E00000000
DD_THSE_Hrw01111113F00000000
1000000-111111140-7FReserved
DefaultComment
Registers marked as Reserved must not be changed. The writing to those registers may
cause permanent damages to the device.
The content of the registers that are loaded at boot should not be changed. They contain the
factory calibration values. Their content is automatically restored when the device is
powered-up.
29/48
Register descriptionLIS3LV02DL
7 Register description
The device contains a set of registers which are used to control its behavior and to retrieve
acceleration data. The registers 7.2 to 7.7 contain the factory calibration values, it is not
necessary to change their value for normal device operation.
7.1 WHO_AM_I (0Fh)
Table 16.Register (0Fh)
W7W6W5W4W3W2W1W0
Table 17.Register description (0Fh)
W7, W0LIS3LV02DL Physical Address equal to 3Ah
Addressing this register the physical address of the device is returned. For LIS3LV02DL the
physical address assigned in factory is 3Ah.
7.2 OFFSET_X (16h)
Table 18.Register (16h)
OX7OX6OX5OX4OX3OX2OX1OX0
Table 19.Register description (16h)
OX7, OX0Digital Offset Trimming for X-Axis
7.3 OFFSET_Y (17h)
Table 20.Register (17h)
OY7OY6OY5OY4OY3OY2OY1OY0
Table 21.Register description (17h)
OY7, OY0Digital Offset Trimming for Y-Axis
7.4 OFFSET_Z (18h)
Table 22.Register (18h)
OZ7OZ6OZ5OZ4OZ3OZ2OZ1OZ0
30/48
LIS3LV02DLRegister description
Table 23.Register description (18h)
OZ7, OZ0Digital Offset Trimming for Z-Axis
7.5 GAIN_X (19h)
Table 24.Register (19h)
GX7GX6GX5GX4GX3GX2GX1GX0
Table 25.Register description (19h)
GX7, GX0Digital Gain Trimming for X-Axis
7.6 GAIN_Y (1Ah)
Table 26.Register (1Ah)
GY7GY6GY5GY4GY3GY2GY1GY0
Table 27.Register description (1Ah)
GY7, GY0Digital Gain Trimming for Y-Axis
7.7 GAIN_Z (1Bh)
Table 28.Register (1Bh)
GZ7GZ6GZ5GZ4GZ3GZ2GZ1GZ0
Table 29.Register description (1Bh)
GZ7, GZ0Digital Gain Trimming for Z-Axis
7.8 CTRL_REG1 (20h)
Table 30.Register (20h)
PD1PD0DF1DF0STZenYenXen
Table 31.Register description (20h)
PD1, PD0
Power Down Control
(00: power-down mode; 01, 10, 11: device on)
DF1, DF0
Decimation Factor Control
(00: decimate by 512; 01: decimate by 128; 10: decimate by 32; 11: decimate by 8)
31/48
Register descriptionLIS3LV02DL
Table 31.Register description (continued) (20h)
ST
Zen
Ye n
Xen
Self Test Enable
(0: normal mode; 1: self-test active)
Z-axis enable
(0: axis off; 1: axis on)
Y-axis enable
(0: axis off; 1: axis on)
X-axis enable
(0: axis off; 1: axis on)
PD1, PD0 bit allows to turn the device out of power-down mode. The device is in powerdown mode when PD1, PD0= “00” (default value after boot). The device is in normal mode
when either PD1 or PD0 is set to 1.
DF1, DF0 bit allows to select the data rate at which acceleration samples are produced. The
default value is “00” which corresponds to a data-rate of 40 Hz. By changing the content of
DF1, DF0 to “01”, “10” and “11” the selected data-rate will be set respectively equal to
160 Hz, 640 Hz and to 2560 Hz.
ST bit is used to activate the self test function. When the bit is set to one, an output change
will occur to the device outputs (refer to table 2 and 3 for specification) thus allowing to
check the functionality of the whole measurement chain.
Zen bit enables the Z-axis measurement channel when set to 1. The default value is 1.
Yen bit enables the Y-axis measurement channel when set to 1. The default value is 1.
Xen bit enables the X-axis measurement channel when set to 1. The default value is 1.
7.9 CTRL_REG2 (21h)
Table 32.Register (21h)
FSBDUBLEBOOTIENDRDYSIMDAS
Table 33.Register description (21h)
FS
BDU
BLE
BOOTReboot memory content
IEN
Full Scale selection
(0: ±2g; 1: ±6g)
Block Data Update
(0: continuous update; 1: output registers not updated between MSB and LSB
reading)
Big/Little Endian selection
(0: little endian; 1: big endian)
Interrupt ENable
(0: data ready on RDY pad; 1: interrupt events on RDY pad)
Data Alignment Selection
(0: 12 bit right justified; 1: 16 bit left justified)
FS bit is used to select Full Scale value. After the device power-up the default full scale
value is +/-2g. In order to obtain a +/-6g full scale it is necessary to set FS bit to ‘1’.
BDU bit is used to inhibit output registers update between the reading of upper and lower
register parts. In default mode (BDU = ‘0’) the lower and upper register parts are updated
continuously. If it is not sure to read faster than output data rate, it is recommended to set
BDU bit to ‘1’. In this way, after the reading of the lower (upper) register part, the content of
that output registers is not updated until the upper (lower) part is read too.
This feature avoids reading LSB and MSB related to different samples.
BLE bit is used to select Big Endian or Little Endian representation for output registers. In
Big Endian’s one MSB acceleration value is located at addresses 28h (X-axis), 2Ah (Y-axis)
and 2Ch (Z-axis) while LSB acceleration value is located at addresses 29h (X-axis), 2Bh (Yaxis) and 2Dh (Z-axis). In Little Endian representation (Default, BLE=‘0‘) the order is
inverted (refer to data register description for more details).
BOOT bit is used to refresh the content of internal registers stored in the flash memory
block. At the device power up the content of the flash memory block is transferred to the
internal registers related to trimming functions to permit a good behavior of the device itself.
If for any reason the content of trimming registers was changed it is sufficient to use this bit
to restore correct values. When BOOT bit is set to ‘1’ the content of internal flash is copied
inside corresponding internal registers and it is used to calibrate the device. These values
are factory trimmed and they are different for every accelerometer. They permit a good
behavior of the device and normally they have not to be changed. At the end of the boot
process the BOOT bit is set again to ‘0’.
IEN bit is used to switch the value present on data-ready pad between Data-Ready signal
and Interrupt signal. At power up the Data-ready signal is chosen. It is however necessary to
modify DRDY bit to enable Data-Ready signal generation.
DRDY bit is used to enable Data-Ready (RDY/INT) pin activation. If DRDY bit is ‘0’ (default
value) on Data-Ready pad a ‘0’ value is present. If a Data-Ready signal is desired it is
necessary to set to ‘1’ DRDY bit. Data-Ready signal goes to ‘1’ whenever a new data is
available for all the enabled axis. For example if Z-axis is disabled, Data-Ready signal goes
to ‘1’ when new values are available for both X and Y axis. Data-Ready signal comes back
to ‘0’ when all the registers containing values of the enabled axis are read. To be sure not to
loose any data coming from the accelerometer data registers must be read before a new
Data-Ready rising edge is generated. In this case Data-ready signal will have the same
frequency of the data rate chosen.
SIM bit selects the SPI Serial Interface Mode. When SIM is ‘0’ (default value) the 4-wire
interface mode is selected. The data coming from the device are sent to SDO pad. In 3-wire
interface mode output data are sent to SDA/SDI pad.
DAS bit permits to decide between 12 bit right justified and 16 bit left justified representation
of data coming from the device. The first case is the default case and the most significant
bits are replaced by the bit representing the sign.
33/48
Register descriptionLIS3LV02DL
7.10 CTRL_REG3 (22h)
Table 34.Register (22h)
ECKHPDDHPFFFDSresresCFS1CFS0
Table 35.Register description (22h)
ECK
External Clock. Default value: 0
(0: clock from internal oscillator; 1: clock from external pad)
HPDD
HPFF
FDS
CFS1, CFS0
FDS bit enables (FDS=1) or bypass (FDS=0) the high pass filter in the signal chain of the
sensor.
CFS1, CFS0 bits defines the coefficient Hpc to be used to calculate the -3dB cut-off
frequency of the high pass filter:
High Pass filter enabled for Direction Detection. Default value: 0
(0: filter bypassed; 1: filter enabled)
High Pass filter enabled for Free-Fall and Wake-Up. Default value: 0
(0: filter bypassed; 1: filter enabled)
Filtered Data Selection. Default value: 0
(0: internal filter bypassed; 1: data from internal filter)
Dummy register. Reading at this address zeroes instantaneously the content of the internal
high pass-filter. Read data is not significant.
0.318
-------------- -
Hpc
ODRx
-----------------
⋅=
2
7.12 STATUS_REG (27h)
Table 36.Register (27h)
ZYXORZORYORXORZYXDAZDAYDAXDA
Table 37.Register description (27h)
ZYXORX, Y and Z axis Data Overrun
ZORZ axis Data Overrun
YORY axis Data Overrun
XORX axis Data Overrun
34/48
LIS3LV02DLRegister description
Table 37.Register description (continued) (27h)
ZYXDAX, Y and Z axis new Data Available
ZDAZ axis new Data Available
YDAY axis new Data Available
XDAX axis new Data Available
The content of this register is updated every ODR cycle, regardless of BDU bit value in
CTRL_REG2.
7.13 OUTX_L (28h)
Table 38.Register (28h)
XD7XD6XD5XD4XD3XD2XD1XD0
Table 39.Register description (28h)
XD7, XD0X axis acceleration data LSB
In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the
MSB acceleration data and depends on bit DAS in CTRL_REG2 register as described in the
following section.
7.14 OUTX_H (29h)
Table 40.Register (29h)
XD15XD14XD13XD12XD11XD10XD9XD8
Table 41.Register description (29h)
XD15, XD8X axis acceleration data MSB
When reading the register in “12 bit right justified” mode the most significant bits (15:12) are
replaced with bit 11 (i.e. XD15-XD12=XD11, XD11, XD11, XD11).
In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the LSB
acceleration data.
7.15 OUTY_L (2Ah)
Table 42.Register (2Ah)
YD7YD6YD5YD4YD3YD2YD1YD0
35/48
Register descriptionLIS3LV02DL
Table 43.Register description (2Ah)
YD7, YD0Y axis acceleration data LSB
In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the
MSB acceleration data and depends on bit DAS in CTRL_REG2 register as described in the
following section.
7.16 OUTY_H (2Bh)
Table 44.Register (2Bh)
YD15YD14YD13YD12YD11YD10YD9YD8
Table 45.Register description (2Bh)
YD15, YD8Y axis acceleration data MSB
When reading the register in “12 bit right justified” mode the most significant bits (15:12) are
replaced with bit 11 (i.e. YD15-YD12=YD11, YD11, YD11, YD11).
In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the LSB
acceleration data.
7.17 OUTZ_L (2Ch)
Table 46.Register (2Ch)
ZD7ZD6ZD5ZD4ZD3ZD2ZD1ZD0
Table 47.Register description (2Ch)
ZD7, ZD0Z axis acceleration data LSB
In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the
MSB acceleration data and depends on bit DAS in CTRL_REG2 register as described in the
following section.
7.18 OUTZ_H (2Dh)
Table 48.Register (2Dh)
ZD15ZD14ZD13ZD12ZD11ZD10ZD9ZD8
Table 49.Register description (2Dh)
ZD15, ZD8Z axis acceleration data MSB
When reading the register in “12 bit right justified” mode the most significant bits (15:12) are
replaced with bit 11 (i.e. ZD15-ZD12=ZD11, ZD11, ZD11, ZD11).
36/48
LIS3LV02DLRegister description
In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the LSB
acceleration data.
7.19 FF_WU_CFG (30h)
Table 50.Register (30h)
AOILIRZHIEZLIEYHIEYLIEXHIEXLIE
Table 51.Register description (30h)
And/Or combination of Interrupt events. Default value: 0.
AOI
LIR
ZHIE
ZLIE
(0: OR combination of interrupt events;
1: AND combination of interrupt events)
Enable Interrupt request on Z High event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable Interrupt request on Z Low event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Enable Interrupt request on Y High event. Default value: 0.
YHIE
YLIE
XHIE
XLIE
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable Interrupt request on Y Low event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Enable Interrupt request on X High event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable Interrupt request on X Low event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Free-fall and inertial wake-up configuration register.
7.20 FF_WU_SRC (31h)
Table 52.Register (31h)
X IA ZHZLYHYLXHXL
37/48
Register descriptionLIS3LV02DL
Table 53.Register description (31h)
Interrupt Active. Default value: 0
IA
(0: no interrupt has been generated;
1: one or more interrupt events have been generated)
ZH
ZL
YH
YL
XH
XL
Z High. Default value: 0
(0: no interrupt; 1: Z High event has occurred)
Z Low. Default value: 0
(0: no interrupt; 1: Z Low event has occurred)
Y High. Default value: 0
(0: no interrupt; 1: Y High event has occurred)
Y Low. Default value: 0
(0: no interrupt; 1: Y Low event has occurred)
X High. Default value: 0
(0: no interrupt; 1: X High event has occurred)
X Low. Default value: 0
(0: no interrupt; 1: X Low event has occurred)
7.21 FF_WU_ACK (32h)
Dummy register. If LIR bit in FF_WU_CFG register is set to ‘1’, a reading at this address
allows the FF_WU_SRC register refresh. Read data is not significant.
7.22 FF_WU_THS_L (34h)
Table 54.Register (34h)
THS7THS6THS5THS4THS3THS2THS1THS0
Table 55.Register description (34h)
THS7, THS0Free-fall / Inertial Wake Up Acceleration Threshold LSB
7.23 FF_WU_THS_H (35h)
Table 56.Register (35h)
THS15THS14THS13THS12THS11THS10THS9THS8
Table 57.Register description (35h)
THS15, THS8Free-fall / Inertial Wake Up Acceleration Threshold MSB
38/48
LIS3LV02DLRegister description
7.24 FF_WU_DURATION (36h)
Table 58.Register (36h)
FWD7FWD6FWD5FWD4FWD3FWD2FWD1FWD0
Table 59.Register description (36h)
FWD7, FWD0Minimum duration of the Free-fall/Wake-up event
This register sets the minimum duration of the free-fall/wake-up event to be recognized.
7.25 DD_CFG (38h)
Table 60.Register (38h)
IENDLIRZHIEZLIEYHIEYLIEXHIEXLIE
Table 61.Register description (38h)
Interrupt enable on Direction change. Default value: 0
IEND
LIR
ZHIE
ZLIE
YHIE
YLIE
(0: disabled;
1: interrupt signal enabled)
Latch Interrupt request into DD_SRC reg with the DD_SRC reg cleared by reading
DD_ACK reg. Default value: 0.
(0: interrupt request not latched;
1: interrupt request latched)
Enable interrupt generation on Z High event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on Z Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Enable interrupt generation on Y High event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on Y Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Enable interrupt generation on X High event. Default value: 0
XHIE
XLIE
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on X Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Direction-detector configuration register.
7.26 DD_SRC (39h)
Table 62.Register (39h)
X IA ZHZLYHYLXHXL
Table 63.Register description (39h)
Interrupt event from direction change.
IA
ZH
(0: no direction changes detected;
1: direction has changed from previous measurement)
Z High. Default value: 0
(0: Z below THSI threshold;
1: Z accel. exceeding THSE threshold along positive direction of acceleration axis)
Z Low. Default value: 0
ZL
YH
YL
XH
XL
(0: Z below THSI threshold;
1: Z accel. exceeding THSE threshold along negative direction of acceleration axis)
Y High. Default value: 0
(0: Y below THSI threshold;
1: Y accel. exceeding THSE threshold along positive direction of acceleration axis)
Y Low. Default value: 0
(0: Y below THSI threshold;
1: Y accel. exceeding THSE threshold along negative direction of acceleration axis)
X High. Default value: 0
(0: X below THSI threshold;
1: X accel. exceeding THSE threshold along positive direction of acceleration axis)
X Low. Default value: 0
(0: X below THSI threshold;
1: X accel. exceeding THSE threshold along negative direction of acceleration axis)
Direction detector source register.
40/48
LIS3LV02DLRegister description
7.27 DD_ACK (3Ah)
Dummy register. If LIR bit in DD_CFG register is set to ‘1’, a reading at this address allows
the DD_SRC register refresh. Read data is not significant.
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a lead-free second level interconnect. The category of
second Level Interconnect is marked on the package and on the inner box label, in
compliance with JEDEC Standard JESD97. The maximum ratings related to soldering
conditions are also marked on the inner box label. ECOPACK
ECOPACK
®
specifications are available at: www.st.com.
Figure 28. LGA-16 mechanical data and package dimensions
DIM.
A10.9210.0394
A20.70.0276
A3 0.180 0.220 0.260 0.0071 0.0087 0.0102
D1 4.250 4.400 4.550 0.1673 0.1732 0.1791
E1 7.350 7.500 7.650 0.2894 0.2953 0.3012
e1.00.0394
d0.30.0118
L15.0000.1969
N2.50.0984
N11.20.0472
P1 0.9 65 0.975 0.985 0.0380 0.0384 0.0388
P20.64 0.65 0 .66 0.0252 0.0256 0.0260
T10.750.80.85 0.0295 0.0315 0.0335
T20.450.50.55 0.0177 0.0197 0.0217
R1.2001.600 0.04720.0630
h0.1500.0059
k0.0500.0020
i0.1000.0039
s0.1000.0039
mminch
MIN. TYP. MAX. MIN. TYP. MAX.
LGA16 (4.4x7.5x1mm)
Land Grid Array Package
®
is an ST trademark.
OUTLINE AND
MECHANICAL DATA
A
k
(4 x)
D
D1
E1
B
E
P2
Dk
BACh
Detail A
Metal Pad
BACi
BACi
Solder mask
opening
46/48
Ek
seating plane
P1
BACh
A3
C
i
N1
R
e
A2
A1
Detail A
i
E
N
d
124 56
3
16
15
e
D
7
8
T1
91011121314
s
T2
L1
7863679 B
LIS3LV02DLRevision history
10 Revision history
Table 72.Document revision history
DateRevisionChanges
15-Feb-20061Initial release.
Added two new sections:
15-Jan-20082
Section 2.3: Communication interface characteristics and Section 8:
Typical performance characteristics.
Content reworked to improve readability
47/48
LIS3LV02DL
Please Read Carefully:
Information in this document is provided solely in connection with ST products. STMicroelectronics NV and its subsidiaries (“ST”) reserve the
right to make changes, corrections, modifications or improvements, to this document, and the products and services described herein at any
time, without notice.
All ST products are sold pursuant to ST’s terms and conditions of sale.
Purchasers are solely responsible for the choice, selection and use of the ST products and services described herein, and ST assumes no
liability whatsoever relating to the choice, selection or use of the ST products and services described herein.
No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted under this document. If any part of this
document refers to any third party products or services it shall not be deemed a license grant by ST for the use of such third party products
or services, or any intellectual property contained therein or considered as a warranty covering the use in any manner whatsoever of such
third party products or services or any intellectual property contained therein.
UNLESS OTHERWISE SET FORTH IN ST’S TERMS AND CONDITIONS OF SALE ST DISCLAIMS ANY EXPRESS OR IMPLIED
WARRANTY WITH RESPECT TO THE USE AND/OR SALE OF ST PRODUCTS INCLUDING WITHOUT LIMITATION IMPLIED
WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE (AND THEIR EQUIVALENTS UNDER THE LAWS
OF ANY JURISDICTION), OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT.
UNLESS EXPRESSLY APPROVED IN WRITING BY AN AUTHORIZED ST REPRESENTATIVE, ST PRODUCTS ARE NOT
RECOMMENDED, AUTHORIZED OR WARRANTED FOR USE IN MILITARY, AIR CRAFT, SPACE, LIFE SAVING, OR LIFE SUSTAINING
APPLICATIONS, NOR IN PRODUCTS OR SYSTEMS WHERE FAILURE OR MALFUNCTION MAY RESULT IN PERSONAL INJURY,
DEATH, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE. ST PRODUCTS WHICH ARE NOT SPECIFIED AS "AUTOMOTIVE
GRADE" MAY ONLY BE USED IN AUTOMOTIVE APPLICATIONS AT USER’S OWN RISK.
Resale of ST products with provisions different from the statements and/or technical features set forth in this document shall immediately void
any warranty granted by ST for the ST product or service described herein and shall not create or extend in any manner whatsoever, any
liability of ST.
ST and the ST logo are trademarks or registered trademarks of ST in various countries.
Information in this document supersedes and replaces all information previously supplied.
The ST logo is a registered trademark of STMicroelectronics. All other names are the property of their respective owners.