3-axis - ±2g/±8g smart digital output “nano” accelerometer
Features
■ 2.16 V to 3.6 V supply voltage
■ 1.8 V compatible IOs
■ <1 mW power consumption
■ ±2g / ±8g dynamically selectable full-scale
2
■ I
C/SPI digital output interface
■ Programmable interrupt generator
■ Embedded click and double click recognition
■ Embedded free-fall and motion detection
■ Embedded high pass filter
■ Embedded self test
■ 10000 g high shock survivability
■ ECOPACK
(see Section 9)
®
RoHS and “Green” compliant
LIS331DL
MEMS motion sensor
LGA 16
process developed by ST to produce inertial
sensors and actuators in silicon.
The IC interface is manufactured using a CMOS
process that allows to design a dedicated circuit
which is trimmed to better match the sensing
element characteristics.
(3x3x1 mm)
Applications
■ Free-Fall detection
■ Motion activated functions
■ Gaming and virtual reality input devices
■ Vibration monitoring and compensation
Description
The LIS331DL, belonging to the “nano” family of
ST motion sensors, is the smallest consumer low-
power three axes linear accelerometer. The
device features digital I
standard output and smart embedded functions.
The sensing element, capable of detecting the
acceleration, is manufactured using a dedicated
Table 1.Device summary
Order codeTemp range [°C]PackagePacking
LIS331DL-40 to +85LGATray
LIS331DLTR-40 to +85LGATape and reel
2
C/SPI serial interface
The LIS331DL has dynamically user selectable
full scales of ±2g/±8g and it is capable of
measuring accelerations with an output data rate
of 100 Hz or 400 Hz.
A self-test capability allows the user to check the
functioning of the sensor in the final application.
The device may be configured to generate inertial
wake-up/free-fall interrupt signals when a
programmable acceleration threshold is crossed
at least in one of the three axes. Thresholds and
timing of interrupt generators are programmable
by the end user on the fly.
The LIS331DL is available in plastic Land Grid
Array package (LGA) and it is guaranteed to
operate over an extended temperature range from
1. The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V.
2. Typical specification are not guaranteed
3. It is possible to remove Vdd maintaining Vdd_IO without blocking the communication busses, in this condition the
measurement chain is powered off.
4. Filter cut-off frequency
5. Time to obtain valid data after exiting Power-Down mode
Hz
°C
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Mechanical and electrical specificationsLIS331DL
t
t
t
t
t
t
t
t
2.3 Communication interface characteristics
2.3.1 SPI - serial peripheral interface
Subject to general operating conditions for Vdd and top.
Table 5.SPI slave timing values
(1)
Val ue
SymbolParameter
MinMax
tc(SPC)SPI clock cycle100ns
fc(SPC)SPI clock frequency10MHz
tsu(CS)CS setup time5
th(CS)CS hold time8
tsu(SI)SDI input setup time5
Unit
th(SI)SDI input hold time15
ns
tv(SO)SDO valid output time50
th(SO)SDO output hold time6
tdis(SO)SDO output disable time50
1. Values are guaranteed at 10 MHz clock frequency for SPI with both 4 and 3 wires, based on characterization results, not
tested in production
(2)
c(SPC)
h(CS)
LSB IN
h(SO)
LSB OUT
dis(SO)
CS
SPC
SDI
SDO
Figure 3.SPI slave timing diagram
(3)
su(CS)
(3)
h(SI)
MSB OUT
(3)
(3)
su(SI)
MSB IN
v(SO)
(3)
(3)
(3)
(3)
2. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both Input and Output port
3. When no communication is on-going, data on CS, SPC, SDI and SDO are driven by internal pull-up resistors
12/42
LIS331DLMechanical and electrical specifications
t
t
t
t
t
t
t
t
t
t
t
t
2.3.2 I2C - Inter IC control interface
Subject to general operating conditions for Vdd and top.
Table 6.I
SymbolParameter
2
C slave timing values
I2C Standard mode
(1)
I2C Fast mode
(1)
Unit
MinMaxMinMax
f
(SCL)
t
w(SCLL)
t
w(SCLH)
t
su(SDA)
t
h(SDA)
t
r(SDA) tr(SCL)
t
f(SDA) tf(SCL)
t
h(ST)
t
su(SR)
t
su(SP)
t
w(SP:SR)
1. Data based on standard I2C protocol requirement, not tested in production
2. A device must internally provide an hold time of at least 300ns for the SDA signal (referred to VIHmin of the SCL signal) to
bridge the undefined region of the falling edge of SCL
3. Cb = total capacitance of one bus line, in pF
SCL clock frequency01000400KHz
SCL clock low time4.71.3
SCL clock high time4.00.6
SDA setup time250100ns
SDA data hold time
(2)
0
3.450
SDA and SCL rise time1000
SDA and SCL fall time300
(2)
20 + 0.1C
20 + 0.1Cb
0.9
(3)
b
(3)
300
300
START condition hold time40.6
Repeated START condition
setup time
4.70.6
STOP condition setup time40.6
Bus free time between STOP
and START condition
Figure 4.I
2
C slave timing diagram
4.71.3
(4)
µs
µs
ns
µs
START
SDA
f(SDA)
r(SDA)
su(SDA)
h(SDA)
SCL
w(SCLL)
w(SCLH)
r(SCL)
f(SCL)
h(ST)
4. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both ports
13/42
su(SR)
su(SP)
w(SP:SR)
REPEATED
START
START
STOP
Mechanical and electrical specificationsLIS331DL
2.4 Absolute maximum ratings
Stresses above those listed as “absolute maximum ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Table 7.Absolute maximum ratings
SymbolRatingsMaximum valueUnit
VddSupply voltage-0.3 to 6V
Vdd_IOI/O pins Supply voltage-0.3 to 6V
Vin
A
POW
A
UNP
T
T
STG
ESDElectrostatic discharge protection
Input voltage on any control pin
(CS, SCL/SPC, SDA/SDI/SDO)
Acceleration (any axis, powered, Vdd=2.5 V)
Acceleration (any axis, unpowered)
Operating temperature range-40 to +85°C
OP
Storage temperature range-40 to +125°C
-0.3 to Vdd_IO +0.3V
3000 g for 0.5 ms
10000 g for 0.1 ms
3000 g for 0.5 ms
10000 g for 0.1 ms
4 (HBM)kV
1.5 (CDM)kV
200 (MM)V
Note:Supply voltage on any pin should never exceed 6.0 V
This is a mechanical shock sensitive device, improper handling can cause permanent
damages to the part
This is an ESD sensitive device, improper handling can cause permanent damages to
the part
14/42
LIS331DLMechanical and electrical specifications
2.5 Terminology
2.5.1 Sensitivity
Sensitivity describes the gain of the sensor and can be determined e.g. by applying 1 g
acceleration to it. As the sensor can measure DC accelerations this can be done easily by
pointing the axis of interest towards the center of the Earth, noting the output value, rotating
the sensor by 180 degrees (pointing to the sky) and noting the output value again. By doing
so, ±1 g acceleration is applied to the sensor. Subtracting the larger output value from the
smaller one, and dividing the result by 2, leads to the actual sensitivity of the sensor. This
value changes very little over temperature and also over time. The Sensitivity Tolerance
describes the range of sensitivities of a large population of sensors.
2.5.2 Zero-g level
Zero-g level Offset (TyOff) describes the deviation of an actual output signal from the ideal
output signal if no acceleration is present. A sensor in a steady state on a horizontal surface
will measure 0 g in X axis and 0 g in Y axis whereas the Z axis will measure 1 g. The output
is ideally in the middle of the dynamic range of the sensor (content of OUT registers 00h,
data expressed as 2’s complement number). A deviation from ideal value in this case is
called Zero-g offset. Offset is to some extent a result of stress to MEMS sensor and
therefore the offset can slightly change after mounting the sensor onto a printed circuit
board or exposing it to extensive mechanical stress. Offset changes little over temperature,
see “Zero-g level change vs. temperature”. The Zero-g level tolerance (TyOff) describes the
Standard Deviation of the range of Zero-g levels of a population of sensors.
2.5.3 Self test
Self Test allows to check the sensor functionality without moving it. The self test function is
off when the self-test bit of CTRL_REG1 (control register 1) is programmed to ‘0‘. When the
self-test bit of ctrl_reg1 is programmed to ‘1‘ an actuation force is applied to the sensor,
simulating a definite input acceleration. In this case the sensor outputs will exhibit a change
in their DC levels which are related to the selected full scale through the device sensitivity.
When Self Test is activated, the device output level is given by the algebraic sum of the
signals produced by the acceleration acting on the sensor and by the electrostatic test-force.
If the output signals change within the amplitude specified inside Tab le 3 , then the sensor is
working properly and the parameters of the interface chip are within the defined
specifications.
2.5.4 Click and double click recognition
The click and double click recognition functions help to create man-machine interface with
little software overload. The device can be configured to output an interrupt signal on
dedicated pin when tapped in any direction.
If the sensor is exposed to a single input stimulus it generates an interrupt request on inertial
interrupt pins (INT1 and/or INT2). A more advanced feature allows to generate an interrupt
request when a “double click” stimulus is applied. A programmable time between the two
events allows a flexible adaption to the application requirements. Mouse-button like
application, like clicks and double clicks, can be implemented.
This function can be fully programmed by the user in terms of expected amplitude and
timing of the stimuli.
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FunctionalityLIS331DL
3 Functionality
The LIS331DL is a nano, low-power, digital output 3-axis linear accelerometer packaged in
an LGA package. The complete device includes a sensing element and an IC interface able
to take the information from the sensing element and to provide a signal to the external
world through an I
3.1 Sensing element
A proprietary process is used to create a surface micro-machined accelerometer. The
technology allows to carry out suspended silicon structures which are attached to the
substrate in a few points called anchors and are free to move in the direction of the sensed
acceleration. To be compatible with the traditional packaging techniques a cap is placed on
top of the sensing element to avoid blocking the moving parts during the moulding phase of
the plastic encapsulation.
When an acceleration is applied to the sensor the proof mass displaces from its nominal
position, causing an imbalance in the capacitive half-bridge. This imbalance is measured
using charge integration in response to a voltage pulse applied to the capacitor.
At steady state the nominal value of the capacitors are few pF and when an acceleration is
applied the maximum variation of the capacitive load is in the fF range.
2
C/SPI serial interface.
3.2 IC interface
The complete measurement chain is composed by a low-noise capacitive amplifier which
converts the capacitive unbalancing of the MEMS sensor into an analog voltage that is
finally available to the user by an analog-to-digital converter.
The acceleration data may be accessed through an I
device particularly suitable for direct interfacing with a microcontroller.
The LIS331DL features a Data-Ready signal (RDY) which indicates when a new set of
measured acceleration data is available thus simplifying data synchronization in the digital
system that uses the device.
The LIS331DL may also be configured to generate an inertial Wake-Up and Free-Fall
interrupt signal accordingly to a programmed acceleration event along the enabled axes.
Both Free-Fall and Wake-Up can be available simultaneously on two different pins.
3.3 Factory calibration
The IC interface is factory calibrated for sensitivity (So) and Zero-g level (TyOff).
The trimming values are stored inside the device in a non volatile memory. Any time the
device is turned on, the trimming parameters are downloaded into the registers to be used
during the normal operation. This allows to use the device without further calibration.
2
C/SPI interface thus making the
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LIS331DLApplication hints
4 Application hints
Figure 5.LIS331DL electrical connection
Vdd
10µF
100nF
GND
Digital signal from/to signal controller.Signal’s levels are defined by proper selection of Vdd_IO
Vdd_IO
1
TOP VIEW
59
SCL/SPC
SDA/SDI/SDO
SDO/SA0
13
INT 1
INT 2
CS
The device core is supplied through Vdd line while the I/O pads are supplied through
Vdd_IO line. Power supply decoupling capacitors (100 nF ceramic, 10 µF Al) should be
placed as near as possible to the pin 14 of the device (common design practice).
All the voltage and ground supplies must be present at the same time to have proper
behavior of the IC (refer to Figure 5). It is possible to remove Vdd maintaining Vdd_IO
without blocking the communication bus, in this condition the measurement chain is
powered off.
The functionality of the device and the measured acceleration data is selectable and
accessible through the I
2
C/SPI interface.When using the I2C, CS must be tied high.
The functions, the threshold and the timing of the two interrupt pins (INT 1 and INT 2) can be
completely programmed by the user through the I
4.1 Soldering information
The LGA package is compliant with the ECOPACK®, RoHS and “Green” standard. It is
qualified for soldering heat resistance according to JEDEC J-STD-020C.
Leave “Pin 1 Indicator” unconnected during soldering.
Land pattern and soldering recommendation are available at www.st.com/mems
2
C/SPI interface.
.
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Digital interfacesLIS331DL
5 Digital interfaces
The registers embedded inside the LIS331DL may be accessed through both the I2C and
SPI serial interfaces. The latter may be SW configured to operate either in 3-wire or 4-wire
interface mode.
The serial interfaces are mapped onto the same pads. To select/exploit the I
line must be tied high (i.e connected to Vdd_IO).
C Serial Data (SDA)
SPI Serial Data Input (SDI)
3-wire Interface Serial Data Output (SDO)
SPI Serial Data Output (SDO)
2
C less significant bit of the device address (SA0)
I
5.1 I2C serial interface
The LIS331DL I2C is a bus slave. The I2C is employed to write data into registers whose
content can also be read back.
The relevant I
Table 9.Serial interface pin description
TransmitterThe device which sends data to the bus
ReceiverThe device which receives data from the bus
2
C terminology is given in the table below.
TermDescription
Master
SlaveThe device addressed by the master
The device which initiates a transfer, generates clock signals and terminates a
transfer
There are two signals associated with the I2C bus: the serial clock line (SCL) and the Serial
DAta line (SDA). The latter is a bidirectional line used for sending and receiving the data
to/from the interface. Both the lines are connected to Vdd_IO through a pull-up resistor
embedded inside the LIS331DL. When the bus is free both the lines are high.
2
The I
C interface is compliant with fast mode (400 kHz) I2C standards as well as with the
normal mode.
18/42
LIS331DLDigital interfaces
5.1.1 I2C operation
The transaction on the bus is started through a START (ST) signal. A START condition is
defined as a HIGH to LOW transition on the data line while the SCL line is held HIGH. After
this has been transmitted by the Master, the bus is considered busy. The next byte of data
transmitted after the start condition contains the address of the slave in the first 7 bits and
the eighth bit tells whether the Master is receiving data from the slave or transmitting data to
the slave. When an address is sent, each device in the system compares the first seven bits
after a start condition with its address. If they match, the device considers itself addressed
by the Master.
The Slave ADdress (SAD) associated to the LIS331DL is 001110xb. SDO/SA0 pad can be
used to modify less significant bit of the device address. If SDO pad is connected to voltage
supply LSb is ‘1’ (address 0011101b) else if SDO pad is connected to ground LSb value is
‘0’ (address 0011100b). This solution permits to connect and address two different
accelerometers to the same I
Data transfer with acknowledge is mandatory. The transmitter must release the SDA line
during the acknowledge pulse. The receiver must then pull the data line LOW so that it
remains stable low during the HIGH period of the acknowledge clock pulse. A receiver which
has been addressed is obliged to generate an acknowledge after each byte of data
received.
2
The I
C embedded inside the LIS331DL behaves like a slave device and the following
protocol must be adhered to. After the start condition (ST) a slave address is sent, once a
slave acknowledge (SAK) has been returned, a 8-bit sub-address will be transmitted: the 7
LSb represent the actual register address while the MSB enables address auto increment. If
the MSb of the SUB field is 1, the SUB (register address) will be automatically incremented
to allow multiple data read/write.
2
C bus.
The slave address is completed with a Read/Write bit. If the bit was ‘1’ (Read), a repeated
START (SR) condition will have to be issued after the two sub-address bytes; if the bit is ‘0’
(Write) the Master will transmit to the slave with direction unchanged. Tab le 1 0 explains how
the SAD+Read/Write bit pattern is composed, listing all the possible configurations.
Table 10.SAD+Read/Write patterns
CommandSAD[6:1]SAD[0] = SDO/SA0R/WSAD+R/W
Read0011100100111001 (39h)
Write0011100000111000 (38h)
Read0011101100111011 (3Bh)
Write0011101000111010 (3Ah)
Table 11.Transfer when Master is writing one byte to slave
MasterSTSAD + WSUBDATASP
SlaveSAKSAKSAK
Table 12.Transfer when Master is writing multiple bytes to slave
MasterSTSAD + WSUBDATADATASP
SlaveSAKSAKSAKSAK
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Digital interfacesLIS331DL
Table 13.Transfer when Master is receiving (reading) one byte of data from slave
MasterSTSAD + WSUBSRSAD + RNMAKSP
SlaveSAKSAKSAKDATA
Table 14.Transfer when Master is receiving (reading) multiple bytes of data from slave
Master ST SAD+WSUBSR SAD+RMAKMAKNMAK SP
SlaveSAKSAKSAKDATADATADATA
Data are transmitted in byte format (DATA). Each data transfer contains 8 bits. The number
of bytes transferred per transfer is unlimited. Data is transferred with the Most Significant bit
(MSb) first. If a receiver can’t receive another complete byte of data until it has performed
some other function, it can hold the clock line, SCL LOW to force the transmitter into a wait
state. Data transfer only continues when the receiver is ready for another byte and releases
the data line. If a slave receiver doesn’t acknowledge the slave address (i.e. it is not able to
receive because it is performing some real time function) the data line must be left HIGH by
the slave. The Master can then abort the transfer. A LOW to HIGH transition on the SDA line
while the SCL line is HIGH is defined as a STOP condition. Each data transfer must be
terminated by the generation of a STOP (SP) condition.
In order to read multiple bytes, it is necessary to assert the most significant bit of the subaddress field. In other words, SUB(7) must be equal to 1 while SUB(6-0) represents the
address of first register to be read.
In the presented communication format MAK is Master Acknowledge and NMAK is No
Master Acknowledge.
5.2 SPI bus interface
The LIS331DL SPI is a bus slave. The SPI allows to write and read the registers of the
device.
The Serial Interface interacts with the outside world with 4 wires: CS, SPC, SDI and SDO.
Figure 6.Read & write protocol
CS
SPC
SDI
RW
MS
SDO
CS is the Serial Port Enable and it is controlled by the SPI master. It goes low at the start of
the transmission and goes back high at the end. SPC is the Serial Port Clock and it is
controlled by the SPI master. It is stopped high when CS is high (no transmission). SDI and SDO are respectively the Serial Port Data Input and Output. Those lines are driven at the
falling edge of SPC and should be captured at the rising edge of SPC.
AD5 AD4 AD3 AD2 AD1 AD0
DI7DI6DI5DI4DI3DI2DI1DI0
DO7DO6DO5DO4DO3DO2DO1DO0
20/42
LIS331DLDigital interfaces
Both the Read Register and Write Register commands are completed in 16 clock pulses or
in multiple of 8 in case of multiple bytes read/write. Bit duration is the time between two
falling edges of SPC. The first bit (bit 0) starts at the first falling edge of SPC after the falling
edge of CS while the last bit (bit 15, bit 23, ...) starts at the last falling edge of SPC just
before the rising edge of CS.
bit 0: RW
from the device is read. In latter case, the chip will drive SDO at the start of bit 8.
bit 1: MS
When 1, the address will be auto incremented in multiple read/write commands.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DI(7:0) (write mode). This is the data that will be written into the device (MSb
first).
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
In multiple read/write commands further blocks of 8 clock periods will be added. When MS
bit is 0 the address used to read/write data remains the same for every block. When MS
is 1 the address used to read/write data is incremented at every block.
The function and the behavior of SDI and SDO remain unchanged.
5.2.1 SPI read
Figure 7.SPI read protocol
bit. When 0, the data DI(7:0) is written into the device. When 1, the data DO(7:0)
bit. When 0, the address will remain unchanged in multiple read/write commands.
bit
CS
SPC
SDI
RW
MS
AD5 AD4 AD3 AD2 AD1 AD0
SDO
DO7 DO6 DO5DO4 DO3 DO2 DO1DO0
The SPI Read command is performed with 16 clock pulses. Multiple byte read command is
performed adding blocks of 8 clock pulses at the previous one.
bit 0: READ bit. The value is 1.
bit 1: MS
bit. When 0 do not increment address, when 1 increment address in multiple
reading.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
bit 16-... : data DO(...-8). Further data in multiple byte reading.
3-wires mode is entered by setting to 1 bit SIM (SPI Serial Interface Mode selection) in
CTRL_REG2.
Figure 11. SPI read protocol in 3-wires mode
CS
SPC
SDI/O
RW
MS
AD5 AD4 AD3 AD2 AD1 AD0
The SPI Read command is performed with 16 clock pulses:
bit 0: READ bit. The value is 1.
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0
bit 1: MS
bit. When 0 do not increment address, when 1 increment address in multiple
reading.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
Multiple read command is also available in 3-wires mode.
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Register mappingLIS331DL
6 Register mapping
The table given below provides a listing of the 8 bit registers embedded in the device and
the related addresses:
Table 15.Register address map
Register address
NameType
HexBinary
Reserved (do not modify)00-0EReserved
WHO_AM_Ir0F000 1111 00111011Dummy register
Reserved (do not modify)10-1FReserved
CTRL_REG1rw20010 0000 00000111
CTRL_REG2rw21010 0001 00000000
CTRL_REG3rw22010 0010 00000000
HP_FILTER_RESETr23010 0011dummyDummy register
Reserved (do not modify)24-26Reserved
STATUS_REGr27010 0111 00000000
DefaultComment
--r28010 1000Not Used
OUT_Xr29010 1001output
--r2A010 1010Not Used
OUT_Yr2B010 1011output
--r2C010 1100Not Used
OUT_Zr2D010 1101output
Reserved (do not modify)2E-2FReserved
FF_WU_CFG_1rw30011 0000 00000000
FF_WU_SRC_1(ack1)r31011 0001 00000000
FF_WU_THS_1rw32011 0010 00000000
FF_WU_DURATION_1rw33011 0011 00000000
FF_WU_CFG_2rw34011 0100 00000000
FF_WU_SRC_2 (ack2)r35011 0101 00000000
FF_WU_THS_2 rw36011 0110 00000000
FF_WU_DURATION_2rw37011 0111 00000000
CLICK_CFGrw38011 1000 00000000
CLICK_SRC (ack)r39011 1001 00000000
--3ANot Used
CLICK_THSY_Xrw3B011 1011 00000000
24/42
LIS331DLRegister mapping
Table 15.Register address map (continued)
Register address
NameType
HexBinary
CLICK_THSZrw3C011 1100 00000000
CLICK_TimeLimitrw3D011 1101 00000000
CLICK_Latencyrw3E011 1110 00000000
CLICK_Windowrw3F011 1111 00000000
DefaultComment
Registers marked as “Reserved” must not be changed. The writing to those registers may
cause permanent damages to the device.
The content of the registers that are loaded at boot should not be changed. They contain the
factory calibration values. Their content is automatically restored when the device is
powered-up.
25/42
Register descriptionLIS331DL
7 Register description
The device contains a set of registers which are used to control its behavior and to retrieve
acceleration data. The registers address, made of 7 bits, is used to identify them and to
write the data through serial interface.
7.1 WHO_AM_I (0Fh)
Table 16.WHO_AM_I register
00111011
Device identification register.
This register contains the device identifier that for LIS331DL is set to 3Bh.
7.2 CTRL_REG1 (20h)
Table 17.CTRL_REG1 register
DRPDFSSTPSTMZenYenXen
Table 18.CTRL_REG1 description
DRData rate selection. Default value: 0
(0: 100 Hz output data rate; 1: 400 Hz output data rate)
PDPower Down Control. Default value: 0
(0: power down mode; 1: active mode)
FSFull Scale selection. Default value: 0
(refer to Ta bl e 3 for typical full scale values)
STP, STMSelf Test Enable. Default value: 0
(0: normal mode; 1: self test P, M enabled)
ZenZ axis enable. Default value: 1
(0: Z axis disabled; 1: Z axis enabled)
YenY axis enable. Default value: 1
(0: Y axis disabled; 1: Y axis enabled)
XenX axis enable. Default value: 1
(0: X axis disabled; 1: X axis enabled)
DR bit allows to select the data rate at which acceleration samples are produced. The
default value is 0 which corresponds to a data-rate of 100 Hz. By changing the content of
DR to “1” the selected data-rate will be set equal to 400 Hz.
PD bit allows to turn the device out of power-down mode. The device is in power-down
mode when PD= ‘0’ (default value after boot). The device is in normal mode when PD is set
to ‘1’.
STP, STM bits are used to activate the self test function. When the bit is set to one, an
output change will occur to the device outputs (refer to Ta bl e 3 and 4 for specifications) thus
allowing to check the functionality of the whole measurement chain.
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LIS331DLRegister description
Zen bit enables the generation of Data Ready signal for Z-axis measurement channel when
set to 1. The default value is 1.
Yen bit enables the generation of Data Ready signal for Y-axis measurement channel when
set to 1. The default value is 1.
Xen bit enables the generation of Data Ready signal for X-axis measurement channel when
set to 1. The default value is 1.
7.3 CTRL_REG2 (21h)
Table 19.CTRL_REG2 register
SIMBOOT0
1. Bit to be kept to “0” for correct device functionality
(1)
FDS
HP
FF_WU2
Table 20.CTRL_REG2 description
SIMSPI Serial Interface Mode selection. Default value: 0
(0: 4-wire interface; 1: 3-wire interface)
BOOTReboot memory content. Default value: 0
(0: normal mode; 1: reboot memory content)
FDSFiltered Data Selection. Default value: 0
(0: internal filter bypassed; 1: data from internal filter sent to output register)
HP
FF_WU2
High Pass filter enabled for Free-Fall/WakeUp # 2. Default value: 0
(0: filter bypassed; 1: filter enabled)
HP
FF_WU1
HPcoeff2HPcoeff1
HP
FF_WU1
HPcoeff2
HPcoeff1
High Pass filter enabled for Free-Fall/Wake-Up #1. Default value: 0
(0: filter bypassed; 1: filter enabled)
High pass filter cut-off frequency configuration. Default value: 00
(See Ta b le 2 1 )
SIM bit selects the SPI Serial Interface Mode. When SIM is ‘0’ (default value) the 4-wire
interface mode is selected. The data coming from the device are sent to SDO pad. In 3-wire
interface mode output data are sent to SDA_SDI pad.
BOOT bit is used to refresh the content of internal registers stored in the flash memory
block. At the device power up the content of the flash memory block is transferred to the
internal registers related to trimming functions to permit a good behavior of the device itself.
If for any reason the content of trimming registers was changed it is sufficient to use this bit
to restore correct values. When BOOT bit is set to ‘1’ the content of internal flash is copied
inside corresponding internal registers and it is used to calibrate the device. These values
are factory trimmed and they are different for every accelerometer. They permit a good
behavior of the device and normally they have not to be changed. At the end of the boot
process the BOOT bit is set again to ‘0’.
FDS bit enables (FDS=1) or bypass (FDS=0) the high pass filter in the signal chain of the
sensor
HPcoeff[2:1]. These bits are used to configure high-pass filter cut-off frequency ft.
27/42
Register descriptionLIS331DL
Table 21.High pass filter cut-off frequency configuration
PP_ODPush-pull/Open Drain selection on interrupt pad. Default value 0.
(0: push-pull; 1: open drain)
I2_CFG2
I2_CFG1
I2_CFG0
I1_CFG2
I1_CFG1
I1_CFG0
Data signal on INT2 pad control bits. Default value 000.
(see table below)
Data signal on INT1 pad control bits. Default value 000.
(see table below)
ft (Hz)
(ODR=400 Hz)
Table 24.Data Signal on INT1(2) pad control bits
I1(2)_CFG2I1(2)_CFG1I1(2)_CFG0INT 1(2) Pad
0 0 0GND
001 FF_WU_1
010 FF_WU_2
011FF_WU_1 OR FF_WU_2
100 Data ready
111Click interrupt
7.5 HP_FILTER_RESET (23h)
Dummy register. Reading at this address zeroes instantaneously the content of the internal
high pass-filter. If the high pass filter is enabled all three axes are instantaneously set to 0 g.
This allows to overcome the settling time of the high pass filter.
28/42
LIS331DLRegister description
7.6 STATUS_REG (27h)
Table 25.STATUS_REG register
ZYXORZORYORXORZYXDAZDAYDAXDA
Table 26.STATUS_REG description
X, Y, Z axis Data Overrun. Default value: 0
ZYXOR
ZOR
YOR
XOR
ZYXDAX, Y and Z axis new Data Available. Default value: 0
ZDAZ axis new Data Available. Default value: 0
YDAY axis new Data Available. Default value: 0
XDAX axis new Data Available. Default value: 0
(0: no overrun has occurred;
1: new data has overwritten the previous one before it was read)
Z axis Data Overrun. Default value: 0
(0: no overrun has occurred;
1: a new data for the Z-axis has overwritten the previous one)
Y axis Data Overrun. Default value: 0
(0: no overrun has occurred;
1: a new data for the Y-axis has overwritten the previous one)
X axis Data Overrun. Default value: 0
(0: no overrun has occurred;
1: a new data for the X-axis has overwritten the previous one)
(0: a new set of data is not yet available; 1: a new set of data is available)
(0: a new data for the Z-axis is not yet available;
1: a new data for the Z-axis is available)
(0: a new data for the Y-axis is not yet available;
1: a new data for the Y-axis is available)
(0: a new data for the X-axis is not yet available;
1: a new data for the X-axis is available)
7.7 OUT_X (29h)
Table 27.OUT_X register
XD7XD6XD5XD4XD3XD2XD1XD0
X axis output data expressed as 2’s complement number.
7.8 OUT_Y (2Bh)
Table 28.OUT_Y register
YD7YD6YD5YD4YD3YD2YD1YD0
Y axis output data expressed as 2’s complement number.
29/42
Register descriptionLIS331DL
7.9 OUT_Z (2Dh)
Table 29.OUT_Z register
ZD7ZD6ZD5ZD4ZD3ZD2ZD1ZD0
Z axis output data expressed as 2’s complement number.
7.10 FF_WU_CFG_1 (30h)
Table 30.FF_WU_CFG_1 register
AOILIRZHIEZLIEYHIEYLIEXHIEXLIE
Table 31.FF_WU_CFG_1 description
AOI
LIR
ZHIE
And/Or combination of Interrupt events. Default value: 0
(0: OR combination of interrupt events; 1: AND combination of interrupt events)
Latch Interrupt request into FF_WU_SRC_1 reg with the FF_WU_SRC_1 reg cleared
by reading FF_WU_SRC_1 reg. Default value: 0
(0: interrupt request not latched; 1: interrupt request latched)
Enable interrupt generation on Z High event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
ZLIE
YHIE
YLIE
XHIE
XLIE
Enable interrupt generation on Z Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Enable interrupt generation on Y High event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on Y Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Enable interrupt generation on X High event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on X Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
30/42
LIS331DLRegister description
7.11 FF_WU_SRC_1 (31h)
Table 32.FF_WU_SRC_1 register
--IAZHZLYHYLXHXL
Table 33.FF_WU_SRC_1 description
IA
Interrupt Active. Default value: 0
(0: no interrupt has been generated; 1: one or more interrupts have been generated)
ZH
ZL
YH
YL
XH
XL
Z High. Default value: 0
(0: no interrupt, 1: Z High event has occurred)
Z Low. Default value: 0
(0: no interrupt; 1: Z Low event has occurred)
Y High. Default value: 0
(0: no interrupt, 1: Y High event has occurred)
Y Low. Default value: 0
(0: no interrupt, 1: Y Low event has occurred)
X High. Default value: 0
(0: no interrupt, 1: X High event has occurred)
X Low. Default value: 0
(0: no interrupt, 1: X Low event has occurred)
Free-fall and wake-up source register. Read only register.
Reading at this address clears FF_WU_SRC_1 register and the FF, WU 1 interrupt and
allows the refreshment of data in the FF_WU_SRC_1 register if the latched option was
chosen.
Most significant bit (DCRM) is used to select the resetting mode of the duration counter. If
DCRM=0 counter is reset when the interrupt is no more active else if DCRM=1 duration
counter is decremented.
31/42
Register descriptionLIS331DL
7.13 FF_WU_DURATION_1 (33h)
Table 36.FF_WU_DURATION_1 register
D7D6D5D4D3D2D1D0
Table 37.FF_WU_DURATION_1 description
D7-D0Duration value. Default value: 0000 0000
Duration register for Free-Fall/Wake-Up interrupt 1. Duration step and maximum value
depend on the ODR chosen. Step 2.5 msec, from 0 to 637.5 msec if ODR=400 Hz, else step
10 msec, from 0 to 2.55 sec when ODR=100 Hz. The counter used to implement duration
function is blocked when LIR=1 in configuration register and the interrupt event is verified
7.14 FF_WU_CFG_2 (34h)
Table 38.FF_WU_CFG_2 register
AOILIRZHIEZLIEYHIEYLIEXHIEXLIE
Table 39.FF_WU_CFG_2 description
AOIAnd/Or combination of Interrupt events. Default value: 0
(0: OR combination of interrupt events; 1: AND combination of interrupt events)
LIRLatch Interrupt request into FF_WU_SRC_2 reg with the FF_WU_SRC_2 reg cleared
by reading FF_WU_SRC_2 reg. Default value: 0
(0: interrupt request not latched; 1: interrupt request latched)
ZHIEEnable interrupt generation on Z High event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
ZLIEEnable interrupt generation on Z Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
YHIEEnable interrupt generation on Y High event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
YLIEEnable interrupt generation on Y Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
XHIEEnable interrupt generation on X High event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
XLIEEnable interrupt generation on X Low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
32/42
LIS331DLRegister description
7.15 FF_WU_SRC_2 (35h)
Table 40.FF_WU_SRC_2 register
--IAZHZLYHYLXHXL
Table 41.FF_WU_SRC_2 description
IAInterrupt Active. Default value: 0
(0: no interrupt has been generated;
1: one or more interrupt events have been generated)
ZHZ High. Default value: 0
(0: no interrupt; 1: Z High event has occurred)
ZLZ Low. Default value: 0
(0: no interrupt; 1: Z Low event has occurred)
YHY High. Default value: 0
(0: no interrupt; 1: Y High event has occurred)
YLY Low. Default value: 0
(0: no interrupt; 1: Y Low event has occurred)
XHX High. Default value: 0
(0: no interrupt; 1: X High event has occurred)
XLX Low. Default value: 0
(0: no interrupt; 1: X Low event has occurred)
Free-fall and wake-up source register. Read only register.
Reading at this address clears FF_WU_SRC_2 register and the FF_WU_2 interrupt and
allows the refreshment of data in the FF_WU_SRC_2 register if the latched option was
chosen.
Most significant bit (DCRM) is used to select the resetting mode of the duration counter. If
DCRM=0 counter is reset when the interrupt is no more active else if DCRM=1 duration
counter is decremented.
33/42
Register descriptionLIS331DL
7.17 FF_WU_DURATION_2 (37h)
Table 44.FF_WU_DURATION_2 register
D7D6D5D4D3D2D1D0
Table 45.FF_WU_DURATION_2 description
D7-D0Duration value. Default value: 0000 0000
Duration register for Free-Fall/Wake-Up interrupt 2. Duration step and maximum value
depend on the ODR chosen. Step 2.5 msec, from 0 to 637.5 msec if ODR=400 Hz, else step
10 msec, from 0 to 2.55 sec when ODR=100 Hz. The counter used to implement duration
function is blocked when LIR=1 in configuration register and the interrupt event is verified.
(0: no interrupt has been generated;
1: one or more interrupt events have been generated)
Double_ZDouble click on Z axis event. Default value: 0
(0: no interrupt; 1: Double Z event has occurred)
Single_ZSingle click on Z axis event. Default value: 0
(0: no interrupt; 1: Single Z event has occurred)
Double_YDouble click on Y axis event. Default value: 0
(0: no interrupt; 1: Double Y event has occurred)
Single_YSingle click on Y axis event.Default value: 0
(0: no interrupt; 1: Single Y event has occurred)
Double_XDouble click on X axis event. Default value: 0
(0: no interrupt; 1: Double X event has occurred)
Single_XSingle click on X axis event. Default value: 0
(0: no interrupt; 1: Single X event has occurred)
7.20 CLICK_THSY_X (3Bh)
Table 51.CLICK_THSY_X register
THSy3THSy2THSy1THSy0THSx3THSx2THSx1THSx0
Table 52.CLICK_THSY_X description
THSy3, THSy0 Click Threshold on Y axis. Default value: 0000
THSx3, THSx0 Click Threshold on X axis. Default value: 0000
From 0.5 g (0001) to 7.5 g (1111) with step of 0.5 g.
35/42
Register descriptionLIS331DL
7.21 CLICK_THSZ (3Ch)
Table 53.CLICK_THSZ register
--------THSz3THSz2THSz1THSz0
Table 54.CLICK_THSZ description
THSz3, THSz0 Click Threshold on Z axis. Default value: 0000
From 0.5 g (0001) to 7.5 g (1111) with step of 0.5 g.
7.22 CLICK_TimeLimit (3Dh)
Table 55.CLICK_TimeLimit register
Dur7Dur6Dur5Dur4Dur3Dur2Dur1Dur0
From 0 to 127.5 msec with step of 0.5 msec,
7.23 CLICK_Latency (3Eh)
Table 56.CLICK_Latency
Lat7Lat6Lat5Lat4Lat3Lat2Lat1Lat0
From 0 to 255 msec with step of 1 msec.
7.24 CLICK_Window (3Fh)
Table 57.CLICK_Window register
Win7Win6Win5Win4Win3Win2Win1Win0
From 0 to 255 msec with step of 1 msec.
36/42
LIS331DLTypical performance characteristics
8 Typical performance characteristics
8.1 Mechanical characteristics at 25 °C
Figure 12. X axis Zero-g level at 2.5 V Figure 13. X axis Sensitivity at 2.5 V
25
20
15
10
Percent of parts [%]
5
0
−150−100−50050100150
Zero−g Level Offset [mg]
25
20
15
10
Percent of parts [%]
5
0
1616.51717.51818.51919.520
Sensitivity [mg/digits]
Figure 14. Y axis Zero-g level at 2.5 VFigure 15. Y axis Sensitivity at 2.5 V
20
18
16
14
12
10
8
Percent of parts [%]
6
4
2
0
−150−100−50050100150
Zero−g Level Offset [mg]
20
18
16
14
12
10
8
Percent of parts [%]
6
4
2
0
1616.51717.51818.51919.520
Sensitivity [mg/digits]
Figure 16. Z axis Zero-g level at 2.5 VFigure 17. Z axis Sensitivity at 2.5 V
25
20
15
10
Percent of parts [%]
5
0
−150−100−50050100150
Zero−g Level Offset [mg]
25
20
15
10
Percent of parts [%]
5
0
1616.51717.51818.51919.520
Sensitivity [mg/digits]
37/42
Typical performance characteristicsLIS331DL
8.2 Mechanical characteristics derived from measurement in the
-40 °C to +85 °C temperature range
Figure 18. X axis Zero-g level change
vs. temperature at 2.5 V
30
25
20
15
Percent of parts [%]
10
5
0
−4−3−2−101234
0−g level drift [mg/oC]
Figure 20. Y axis Zero-g level change
vs. temperature at 2.5 V
35
30
25
20
15
Percent of parts [%]
10
Figure 19. X axis Sensitivity change
vs. temperature at 2.5 V
30
25
20
15
Percent of parts [%]
10
5
0
−0.1−0.0500.050.10.15
Sensitivity drift [%/oC]
Figure 21. Y axis Sensitivity change
vs. temperature at 2.5 V
35
30
25
20
15
Percent of parts [%]
10
5
0
−4−3−2−101234
0−g level drift [mg/oC]
Figure 22. Z axis Zero-g level change
vs. temperature at 2.5 V
30
25
20
15
Percent of parts [%]
10
5
0
−4−3−2−101234
0−g level drift [mg/oC]
5
0
−0.1−0.0500.050.10.15
Sensitivity drift [%/oC]
Figure 23. Z axis Sensitivity change
vs. temperature at 2.5 V
30
25
20
15
Percent of parts [%]
10
5
0
−0.1−0.0500.050.10.15
Sensitivity drift [%/oC]
38/42
LIS331DLTypical performance characteristics
8.3 Electrical characteristics at 25 °C
Figure 24. Current consumption
in normal mode at 2.5 V
20
18
16
14
12
10
8
Percent of parts [%]
6
4
2
0
200 220 240 260 280 300 320 340 360 380 400
Current consumption [uA]
39/42
Package informationLIS331DL
9 Package information
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a lead-free second level interconnect. The category of
second Level Interconnect is marked on the inner box label, in compliance with JEDEC
Standard JESD97. The maximum ratings related to soldering conditions are also marked on
the inner box label. ECOPACK
ECOPACK
®
specifications are available at: www.st.com.
Figure 25. LGA 16: Mechanical data and package dimensions
Dimensions
Ref.
A11.0000.0394
A20.7850.0309
A30.2000.0079
D12.850 3.000 3.150 0.1122 0.1181 0.1240
E12.850 3.000 3.150 0.1122 0.1181 0.1240
L11.000 1.0600.0394 0.0417
L22.000 2.0600.07870.0811
N10.5000.0197
N21.0000.0394
M0.040 0.100 0.160 0.0016 0.0039 0.0063
P10.8750.0344
P21.2750.0502
T10.2900.350 0.410 0.0114 0.0138 0.0161
T20.190 0.250 0.310 0.0075 0.0098 0.0122
d0.1500.0059
k0.0500.0020
mminch
Min. Typ. Max. Min. Typ. Max.
®
is an ST trademark.
Outline and
mechanical data
LGA16 (3x3x1.0mm)
Land Grid Array Package
40/42
7983231
LIS331DLRevision history
10 Revision history
Table 58.Document revision history
DateRevisionChanges
28-Sep-20071Initial release
Updated package specification Figure 25: LGA 16: Mechanical data
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