3-axis - ± 2g/± 8g smart digital output “piccolo” accelerometer
Feature
■ 2.16 V to 3.6 V supply voltage
■ 1.8 V compatible IOs
■ <1 mW power consumption
■ ± 2g/± 8g dynamically selectable full-scale
2
■ I
C/SPI digital output interface
■ Programmable multiple interrupt generator
■ Click and double click recognition
■ Embedded high pass filter
■ Embedded self test
■ 10000g high shock survivability
■ ECOPACK® RoHS and “Green” compliant
(see Section 9)
Description
The LIS302DL is an ultra compact low-power
three axes linear accelerometer. It includes a
sensing element and an IC interface able to
provide the measured acceleration to the external
world through I
The sensing element, capable of detecting the
acceleration, is manufactured using a dedicated
process developed by ST to produce inertial
sensors and actuators in silicon.
The IC interface is manufactured using a CMOS
process that allows to design a dedicated circuit
which is trimmed to better match the sensing
element characteristics.
2
C/SPI serial interface.
LIS302DL
MEMS motion sensor
LGA 14
The LIS302DL has dynamically user selectable
full scales of ± 2g/± 8g and it is capable of
measuring accelerations with an output data rate
of 100 Hz or 400 Hz.
A self-test capability allows the user to check the
functioning of the sensor in the final application.
The device may be configured to generate inertial
wake-up/free-fall interrupt signals when a
programmable acceleration threshold is crossed
at least in one of the three axes. Thresholds and
timing of interrupt generators are programmable
by the end user on the fly.
The LIS302DL is available in plastic Thin Land
Grid Array package (TLGA) and it is guaranteed
to operate over an extended temperature range
from -40 °C to +85 °C.
The LIS302DL belongs to a family of products
suitable for a variety of applications:
– Free-fall detection
– Motion activated functions
– Gaming and virtual reality input devices
– Vibration monitoring and compensation
(3x5x0.9mm)
Table 1.Device summary
Part numberTemp range, ° CPackagePacking
LIS302DL-40 to +85LGATray
LIS302DLTR-40 to +85LGATape and reel ( 5000 pcs/reel )
LIS302DLTR8-40 to +85LGATape and reel ( 8000 pcs/reel )
I
SPI Serial Data Input (SDI)
3-wire Interface Serial Data Output (SDO)
2
C Serial Clock (SCL)
I
SPI Serial Port Clock (SPC)
9/42
Mechanical and electrical specificationsLIS302DL
2 Mechanical and electrical specifications
2.1 Mechanical characteristics
Table 3.Mechanical characteristics
(1)
(All the parameters are specified @ Vdd=2.5 V, T = 25°C unless otherwise noted)
SymbolParameterTest conditionsMin.Typ.
FSMeasurement range
SoSensitivity
(3)
FS bit set to 0±2.0±2.3
FS bit set to 1±8.0±9.2
FS bit set to 016.21819.8
FS bit set to 164.87279.2
TCSO
Ty Of f
TCOff
Sensitivity change vs
temperature
Typical zero-g level offset
accuracy
(4),(5)
Zero-g level change vs
temperature
FS bit set to 0±0.01%/°C
FS bit set to 0±40mg
FS bit set to 1±60mg
Max delta from 25°C
FS bit set to 0
STP bit used
-32-3LSb
X axis
FS bit set to 0
STP bit used
Y axis
332LSb
Vst
Self test output
(6),(7),(8),(9)
change
FS bit set to 0
STP bit used
332LSb
Z axis
BWSystem bandwidth
(10)
TopOperating temperature range-40+85°C
WhProduct weight30mgram
1. The product is factory calibrated at 2.5V. The device can be used from 2.16V to 3.6V
2. Typical specifications are not guaranteed
3. Verified by wafer level test and measurement of initial offset and sensitivity
4. Typical zero-g level offset value after MSL3 preconditioning
5. Offset can be eliminated by enabling the built-in high pass filter
6. If STM bit is used values change in sign for all axes
7. Self Test output changes with the power supply. Vst at 3.3V is typically in the range [-74; -7] LSb for X axis and [7;74] LSb for Y
and Z axes.
8.
“Self Test Output Change” is defined as OUTPUT[LSb]
1LSb=4.6g/256 at 8bit representation, ±2.3g Full-Scale
9. Output data reach 99% of final value after 3/ODR when enabling Self-Test mode due to device filtering
10. ODR is output data rate. Refer to Table 4 for specifications
(Self-test bit on ctrl_reg1=1)
-OUTPUT[LSb]
(2)
Max.Unit
±0.5mg/°C
ODR/2Hz
(Self-test bit on ctrl_reg1=0)
.
mg/digit
g
10/42
LIS302DLMechanical and electrical specifications
2.2 Electrical characteristics
Table 4.Electrical characteristics
(1)
(All the parameters are specified @ Vdd=2.5 V, T= 25°C unless otherwise noted)
SymbolParameterTest conditionsMin.Typ.
VddSupply voltage2.162.53.6V
Vdd_IOI/O pins supply voltage
(3)
1.71Vdd+0.1V
IddSupply currentT = 25°C, ODR=100Hz0.30.4mA
IddPdn
VIH
Current consumption in
power-down mode
Digital high level input
voltage
T = 25°C15µA
0.8*Vdd
_IO
VILDigital low level input voltage
VOHHigh level output voltage
0.9*Vdd
_IO
VOLLow level output voltage
DR=0100
ODROutput data rate
DR=1400
BWSystem bandwidth
TonTurn-on time
(4)
(5)
TopOperating temperature range-40+85
1. The product is factory calibrated at 2.5V. The device can be used from 2.16V to 3.6V
2. Typical specification are not guaranteed
3. It is possible to remove Vdd maintaining Vdd_IO without blocking the communication busses, in this condition the
measurement chain is powered off.
4. Filter cut-off frequency
5. Time to obtain valid data after exiting Power-Down mode
(2)
Max.Unit
0.2*Vdd
_IO
0.1*Vdd
_IO
ODR/2Hz
3/ODRs
V
V
V
V
Hz
°C
11/42
Mechanical and electrical specificationsLIS302DL
t
t
t
t
t
t
t
t
2.3 Communication interface characteristics
2.3.1 SPI - Serial Peripheral Interface
Subject to general operating conditions for Vdd and Top.
Table 5.SPI slave timing values
(1)
Val ue
SymbolParameter
Min.Max.
tc(SPC)SPI clock cycle100ns
fc(SPC)SPI clock frequency10MHz
tsu(CS)CS setup time5
th(CS)CS hold time8
tsu(SI)SDI input setup time5
Unit
th(SI)SDI input hold time15
tv(SO)SDO valid output time50
th(SO)SDO output hold time6
tdis(SO)SDO output disable time50
(2)
c(SPC)
h(SO)
CS
SPC
SDI
SDO
Figure 3.SPI slave timing diagram
(3)
su(CS)
(3)
h(SI)
MSB OUT
(3)
(3)
su(SI)
MSB IN
v(SO)
h(CS)
LSB IN
LSB OUT
ns
(3)
(3)
(3)
dis(SO)
(3)
1. Values are guaranteed at 10MHz clock frequency for SPI with both 4 and 3 wires, based on characterization results, not
tested in production
2. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both Input and Output port
3. When no communication is on-going, data on CS, SPC, SDI and SDO are driven by internal pull-up resistors
12/42
LIS302DLMechanical and electrical specifications
t
t
t
t
t
t
t
t
t
t
t
t
2.3.2 I2C - inter IC control interface
Subject to general operating conditions for Vdd and Top.
Table 6.I
2
C slave timing values
SymbolParameter
f
(SCL)
t
w(SCLL)
t
w(SCLH)
t
su(SDA)
t
h(SDA)
t
r(SDA) tr(SCL)
t
f(SDA) tf(SCL)
t
h(ST)
t
su(SR)
t
su(SP)
t
w(SP:SR)
SCL clock frequency01000400KHz
SCL clock low time4.71.3
SCL clock high time4.00.6
SDA setup time250100ns
SDA data hold time0
SDA and SCL rise time1000
SDA and SCL fall time300
START condition hold time40.6
Repeated START condition
setup time
STOP condition setup time40.6
Bus free time between STOP
and START condition
I2C standard mode
(1)
I2C fast mode
MinMaxMinMax
3.45
(2)
0
20 + 0.1C
20 + 0.1C
(3)
b
(3)
b
4.70.6
4.71.3
(1)
0.9
300
300
(2)
Unit
µs
µs
ns
µs
SDA
Figure 4.I
f(SDA)
START
2
C Slave timing diagram
r(SDA)
su(SDA)
(4)
h(SDA)
su(SR)
su(SP)
w(SP:SR)
REPEATED
START
START
STOP
SCL
h(ST)
1. Data based on standard I
2. A device must internally provide an hold time of at least 300ns for the SDA signal (referred to VIHmin of the SCL signal) to
bridge the undefined region of the falling edge of SCL
3. Cb = total capacitance of one bus line, in pF
4. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both port
w(SCLL)
2
C protocol requirement, not tested in production
w(SCLH)
r(SCL)
f(SCL)
13/42
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