ST EMIF10-COM01F2 User Manual

EMIF10-COM01F2

10-line IPAD™, EMI filter including ESD protection

Features

EMI symmetrical (I/O) low-pass filter

Lead free package

Very low PCB space consuming: < 6 mm2

Very thin package: 0.65 mm

High efficiency in ESD suppression on both input & output pins

High reliability offered by monolithic integration

Complies with the following standard:

IEC 61000-4-2 level 4

15 kV (air discharge)

8 kV (contact discharge)

Applications

EMI filtering and ESD protection for:

Computers and printers

Communication systems

Mobile phones

Description

The EMIF10-COM01F2 is a highly integrated device designed to suppress EMI / RFI noise in all systems subjected to electromagnetic interferences. The EMIF10 Flip-Chip packaging means the package size is equal to the die size.

Additionally, this filter includes an ESD protection circuitry which prevents damage to the application when subjected to ESD surges up to 15 kV.

Flip Chip (25 bumps)

Figure 1. Pin configuration (bump side)

5

4

3

2

1

 

I5

I4

I3

I2

I1

A

I10

I9

I8

I7

I6

B

GND

GND

GND

GND

GND

C

010

09

08

07

06

D

05

04

03

02

01

E

Figure 2. Basic cell configuration

Low-pass Filter

Input

Output

RI/O = 200Ω

Cline = 45 pF

TM: IPAD is a trademark of STMicroelectronics.

April 2008

Rev 5

1/7

www.st.com

Characteristics

EMIF10-COM01F2

 

 

1 Characteristics

 

Table 1.

 

Absolute ratings (Tamb = 25 °C)

 

 

 

 

 

 

 

 

 

Symbol

 

Parameter and test conditions

 

 

 

Value

Unit

 

 

 

 

 

 

 

 

 

 

 

 

VPP

 

ESD discharge IEC61000-4-2, air discharge

 

 

15

 

kV

 

 

ESD discharge IEC61000-4-2, contact discharge

 

 

8

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Tj

 

Junction temperature

 

 

 

 

125

 

°C

 

Top

 

Operating temperature range

 

 

 

- 40 to + 85

°C

 

Tstg

 

Storage temperature range

 

 

 

- 55 to + 150

°C

 

Table 2.

 

Electrical characteristics (Tamb = 25 °C)

 

 

 

 

 

 

Symbol

 

 

Parameter

 

 

 

 

 

I

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VBR

Breakdown voltage

 

 

 

 

 

 

 

 

 

IRM

Leakage current @ VRM

 

 

 

 

 

 

 

 

 

VRM

Stand-off voltage

 

 

 

 

 

 

 

 

 

 

 

 

 

VCL VBR VRM

 

 

 

 

 

 

VCL

Clamping voltage

 

 

IRM

V

 

 

 

 

 

 

 

Rd

Dynamic impedance

 

 

 

 

 

 

 

 

 

 

 

 

IR

 

 

IPP

Peak pulse current

 

 

 

 

 

 

 

 

 

RI/O

Resistance between Input and Output

 

slope :1 / R d

 

 

 

 

 

 

 

 

 

 

 

IPP

 

 

Cline

Input capacitance per line

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Symbol

 

Test conditions

 

Min.

 

Typ.

 

Max.

 

Unit

 

 

 

 

 

 

 

 

 

 

 

 

 

VBR

IR = 1 mA

 

 

6

 

8

 

10

 

V

 

IRM

VRM = 3 V per line

 

 

 

 

 

500

 

nA

 

Rd

IPP = 10 A, tp = 2.5 µs

 

 

 

1

 

 

 

Ω

 

 

 

 

 

 

 

 

 

 

 

 

 

 

RI/O

 

 

 

 

180

 

200

 

220

 

Ω

 

Cline

At 0 V bias

 

 

 

 

45

 

50

 

pF

 

tLH

Vinput = 2.8 V

Rload = 100 kΩ

 

 

 

 

 

25

 

ns

Figure 3. S21(db) attenuation

Figure 4.

Analog crosstalk

 

measurement(1)

0.00 dB -10.00

-20.00

-30.00

-40.00

-50.00

100.0k 1.0M 10.0M 100.0M 1.0G f/Hz

0.00 dB -10.00

-20.00

-30.00

-40.00

-50.00

-60.00

-70.00

-80.00

-90.00

-100.00

100.0k 1.0M 10.0M 100.0M 1.0G f/Hz

Xtalk 1/2

1. Spikes at high frequencies are induced by the PCB layout

2/7

ST EMIF10-COM01F2 User Manual

EMIF10-COM01F2

 

Characteristics

 

 

 

 

Figure 5.

ESD response to IEC 61000-4-2

Figure 6.

ESD response to IEC 61000-4-2

 

(+15 kV air discharge) on one input

 

(-15 kV air discharge) on one input

 

(Vin) and on one output (Vout)

 

(Vin) and on one output (Vout)

 

 

 

V(in1)

 

V(in1)

 

 

 

V(out1)

 

V(out1)

 

 

 

 

 

 

 

Figure 7.

Rise time measurement

 

 

Square signal Generator Vc = 2.8V

EMIF10-COM01F2

In

Out

 

 

 

 

 

 

 

 

 

Vout

 

 

 

 

 

 

 

 

 

Vin

 

 

 

 

 

100k

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Figure 8. Capacitance versus reverse applied voltage

C(pF)

50

F=1MHz

Vosc=30mV

40

30

20

10

0

1

2

3

4

5

VR(V)

3/7

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