Datasheet EMIF10-1K010F2 Datasheet (ST)

10-line IPAD™, EMI filter including ESD protection

Features
EMI symmetrical (I/O) low-pass filter
High efficiency in EMI filtering
Lead free package
2.42 mm x 2.42 mm
Very thin package: 0.650 mm
High efficiency in ESD suppression on both
input and output pins (IEC 61000-4-2 level 4)
High reliability offered by monolithic integration
High reducing of parasitic elements through
integration & wafer level packaging
Complies with the following standards:
IEC 61000-4-2 level 4
– 15 kV (air discharge) – 8 kV (contact discharge)
MIL STD 883F - Method 3015.7 Class 3
Applications
Where EMI filtering in ESD sensitive equipment is required:
Mobile Phones
Computers and printers
Communication systems
MCU Boards
Description

EMIF10-1K010F2

Flip Chip
(24 bumps)

Figure 1. Pin configuration (bump side)

5
I7
I9
I10 I8 I6
09 07 05 03 01
010 08 06 04 02

Figure 2. Basic cell configuration

Input
3
4
GND GND
GND GND
Low pass filter
I3
I5
I4 I2
12
A
I1
B
C
D
E
Output
The EMIF10-1K010F2 is a highly integrated device designed to suppress EMI / RFI noise in all systems subjected to electromagnetic
R = 1 k
C = 100 pF
line
Ω
I/O
interferences. The EMIF10 Flip-Chip packaging means the package size is equal to the die size.
Additionally, this filter includes an ESD protection circuitry which prevents damage to the application when subjected to ESD surges up to 15 kV.
TM: IPAD is a trademark of STMicroelectronics.
April 2008 Rev 4 1/8
www.st.com
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Characteristics EMIF10-1K010F2

1 Characteristics

Table 1. Absolute ratings (T
Symbol Parameter and test conditions Value Unit
ESD discharge IEC 61000-4-2
V
T
T
Table 2. Electrical characteristics (T
Symbol Parameter
V
BR
I
RM
V
RM
V
CL
R
I
PP
R
I/O
C
line
– Air discharge
PP
– Contact discharge
MIL STD 883F - Method 3015.7 Class 3
Junction temperature 125 °C
T
j
Operating temperature range - 40 to + 85 °C
op
Storage temperature range - 55 to + 150 °C
stg
Breakdown voltage
Leakage current @ V
RM
Stand-off voltage
Clamping voltage
Dynamic impedance
d
Peak pulse current
Resistance between Input and Output
Input capacitance per line
= 25 °C)
amb
= 25 °C)
amb
15
8
kV
25
I
I
F
V
BR
V
V
RM
CL
V
F
I
RM
I
R
I
PP
V
Symbol Test conditions Min. Typ. Max. Unit
V
BRIR
I
RM
R
R
I/O
C
line
= 1 mA 6 8 10 V
VRM = 3 V per line 200 nA
IPP = 10 A, tp = 2.5 µs 1 Ω
d
F = 1 MHz V
= 30 mV V
OSC
= 0 V 80 100 120 pF
line
2/8
900 1000 1100 Ω
EMIF10-1K010F2 Characteristics
Figure 3. S21(db) attenuation measurement Figure 4. Analog cross talk measurements
0.00
dB
- 10.00
- 20.00
- 30.00
- 40.00
- 50.00
Figure 5. ESD response to IEC 61000-4-2
1.0M 3.0M 10.0M 30.0M 100.0M 300.0M 1.0G 3.0G f/Hz
(+15 kV air discharge) on one input
) and on one output (V
(V
in
out
INPUT
)
Figure 6. ESD response to IEC 61000-4-2
(-15 kV air discharge) on one input (Vin) and on one output (V
out
INPUT
)
OUTPUT

Figure 7. Capacitance versus reverse applied voltage

C (pF)
120
100
80
60
40
20
0
0.0 1.0 2.0 3.0 4.0 5.0
V(V)
R
OUTPUT
Input / GND
3/8
Application information EMIF10-1K010F2

2 Application information

Figure 8. Aplac model

50pH 50pHRs Rs50m 50mLs Ls
+ +
Port 15 50
- -
Ii
++
cap_line cap_line
Lgnd
MODEL = demif10
Rgnd
Rseries
MODEL = demif10
sub
Ii
Oi
Rgnd RgndRgnd Lgnd Lgnd Lgnd
+
+
Rsubump
Rsub
Rsubump
Oi
Csubump
Ii
GNDi
Csubump
Oi

Figure 9. Aplac parametersl

Cz 57pF Rseries 960 cap_line 0.8pF Ls 0.6nH Rbump 50m Lbump 50pH Rs 0.15 Csubump 15pF Rsubump 0.15 Rsub 0.1 lhole 1.2nH opt Rhole 0.15 cap_hole 0.15pF Rgnd 0.25 Ignd 0.4nH
Model demif10 BV = 7 IBV = 1m CJO = Cz M = 0.3333 Rs = 1 VJ = 0.6 TT = 100n
Port 16
GNDi
Lbump
50
Rbump
Lhole
+
cap_hole
sub
Rhole
4/8
EMIF10-1K010F2 Ordering information scheme

3 Ordering information scheme

Figure 10. Ordering information scheme

EMIF yy - xxx zz Fx
EMI Filter
Number of lines
Information
x = resistance value (Ohms) z = capacitance value / 100 (pF) or 3 letters = application 2 digits = version
Package
F = Flip Chip X = 2: lead-free pitch = 500 µm, bump = 315 µm

4 Package information

In order to meet environmental requirements, ST offers these devices in ECOPACK® packages. These packages have a lead-free second level interconnect. The category of second level interconnect is marked on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at
www.st.com.

Figure 11. Flip Chip package dimensions

500 µm ± 50
500 µm ± 50
210 µm
310 µm ± 50
2.39 mm ± 30 µm
2.39 mm ± 30 µm
210 µm
650 µm ± 65
250 µm ± 40
5/8
Ordering information EMIF10-1K010F2

Figure 12. Footprint recommendations Figure 13. Marking

Dot, ST logo xx = marking
Copper pad Diameter:
250 µm recommended, 300 µm max
Solder stencil opening: 330 µm
Solder mask opening recommendation:
340 µm min for 310 µm copper pad diameter
z = manufacturing location yww = datecode
(y = year
ww = week)
E
xyxwz
w

Figure 14. Flip Chip tape and reel specification

Dot identifying Pin A1 location
4 ± 0.1
Ø 1.5 ± 0.1
1.75 ± 0.1 3.5 ± 0.1
2.60
yww
xxz
User direction of unreeling
0.73 ± 0.05
All dimensions in mm
8 ± 0.3
yww
ST
xxz
E

5 Ordering information

Table 3. Ordering information

Order code Marking Package Weight Base qty Delivery mode
EMIF10-1K010F2 FD Flip Chip 7.9 mg 5000 Tape and reel
Note: More information is available in the application notes:
AN1235: “Flip Chip: Package description and recommendations for use”
AN1751: "EMI Filters: Recommendations and measurements
ST
E
2.60
4 ± 0.1
yww
ST
xxz
E
6/8
EMIF10-1K010F2 Revision history

6 Revision history

Table 4. Document revision history

Date Revision Description of changes
12-Oct-2004 1 First issue.
28-Aug-2006 2 Die layout upgrade.
18-Sep-2006 3 Added pocket dimensions to Figure 11.
17-Apr-2008 4
Updated ECOPACK statement. Updated Figure 10, Figure 11,
Figure 12. and Figure 14. Reformatted to current standards.
7/8
EMIF10-1K010F2
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