ST EMIF07-LCD03F3 User Manual

7-line IPAD™, EMI filter and ESD protection
Features
High attenuation in the mobile frequency range
(typically better than -40 dB from 900 MHz to 2GHz)
Low line capacitance (30 pF max) suitable for
high-speed interfaces
Maximum rise and fall time: 6 ns (10% - 90%)
Compliant with high speed data rate
Lead-free Flip-Chip package in 400 µm pitch
Very thin package: 0.6 mm thickness
Benefits
EMIF07-LCD03F3
Flip Chip
(18 bumps)
Description
The EMIF07-LCD03F3 is a 7-line highly integrated L/C filter designed to suppress EMI/RFI noise in all systems subjected to electromagnetic interference.
High efficiency in EMI filtering
High bandwidth: typically 200 MHz at -3 dB
80% space saving versus discrete solution
(BOM reduction)
High reliability offered by monolithic integration
High reduction of parasitic elements through
integration and wafer level packaging
Complies with the following standards
IEC 61000-4-2 level 4 on inputs and outputs:
– 15 kV (air discharge) – 8 kV (contact discharge)
Applications
Displays and cameras where EMI filtering in ESD sensitive equipment is required:
Mobile phones and PDAs
Personal and home entertainment (portable
Audio, DVD players, LCD TVs)
Portable navigation devices
Digital still cameras
Portable gaming systems
TM: IPAD is a trademark of STMicroelectronics.
The EMIF07-LCD03F3 Flip-Chip packaging means the package size is equal to the die size.
This LC filter includes ESD protection circuitry, which prevents damage to the protected device when subjected to ESD surges up ±15 kV.

Figure 1. Pin layout (bump side)

Figure 2. Device configuration

December 2008 Rev 1 1/7
www.st.com
7
Characteristics EMIF07-LCD03F3

1 Characteristics

Table 1. Absolute maximum ratings (T
Symbol Parameter and test conditions Value Unit
Input and output pins:
V
ESD discharge IEC 610000-4-2, air discharge
pp
ESD discharge IEC 610000-4-2, contact discharge
amb
= 25 °C)
±15 ±15
kV
T
T
T
Table 2. Electrical characteristics (T
Maximum junction temperature 125 °C
j
Operating temperature range -40 to +85 °C
op
Storage temperature range -55 to 150 °C
stg
Symbol Parameters
V
BR
I
RM
V
RM
R
I/O
C
line
Breakdown voltage
Leakage current @ V
RM
Stand-off voltage
Series resistance between input and output
Line capacitance
Symbol Test conditions Min Typ Max Unit
V
BR
I
RM
R
I/O
C
line
IR = 1 mA 14 V
VRM = 3 V per line 200 nA
Tolerance ± 20% 100 125 150 Ω
Vline = 0 V, V
= 30 mV, F =1 MHz 30 pF
OSC
Figure 3. Attenuation versus frequency (all
GND bumps connected)
S21 (dB)
0
-5
-10
-15
-20
-25
-30
-35
-40
-45
-50
-55
-60 100k 1M 10M 100M 1G
I1-
O1
-
I3
O3
-
I5
O5
-
I7 O7
F (Hz)
-
I2
O2
-
I4
O4
-
O6
I6
= 25 °C)
amb
Figure 4. Analog cross talk versus frequency
(all GND bumps connected)
XTalk (dB)
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110 100k 1M 10M 100M 1G
I1-O2 I1- O7
F (Hz)
2/7
EMIF07-LCD03F3 Characteristics
Figure 5. ESD response under IEC61000-4-2
Figure 6. ESD response under IEC61000-4-2 conditions, VPP = +15 kV air discharge

Figure 7. Line capacitance versus applied voltage

C
(pF)
line
30.00
25.00
20.00
15.00
10.00
5.00
0.00 012345
V
line
(V)
conditions, VPP = -15 kV air discharge
F=1 MHz
V
= 30 mV
OSC
TJ= 25° C
RMS
Figure 8. Typical rise and fall time: input
voltage
INPUT VOLTAGE
X: 10 ns/DIV Y:1 V/DIV
t
10% -90% = 3.34 ns
rise
t
90%-10% = 3.65 ns
fall
Figure 9. Typical rise and fall time: output
voltage
OUTPUT VOLTAGE
X: 10ns/DIV Y: 1V/DIV t
10% -90% = 3.45 ns
rise t
90%-10% = 4.09 ns
fall
3/7
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