EMIF06-1502M12
6-line IPAD™
low capacitance EMI filter and ESD protection in micro QFN package
Features
■ EMI asymmetrical (I/O) low-pass filter
■ High efficiency in EMI filtering
■ Very low PCB space consuming:
2.5 mm x 1.5 mm
■ Very thin package: 0.6 mm max
■ High efficiency in ESD suppression on inputs
pins (IEC 61000-4-2 level 4)
■ High reliability offered by monolithic integration
■ High reducing of parasitic elements through
integration and wafer level packaging
■ Lead-free package
Complies with following standards:
■ IEC 61000-4-2 level 4 input pins
– 15 kV (air discharge)
– 8 kV (contact discharge)
■ MIL STD 883G - Method 3015-7 Class 3A
(all pins)
Applications
12
10
11
GND
9
8
7
1
2
3
4
5
6
Micro QFN 2.5 mm x 1.5 mm
(bottom view)
Figure 1. Pin configuration (top view)
1 Input Output 12
2 Input
3 Input
4 Input
5 Input
6 Input
Output 11
Output 10
Output 9
Output 8
Output 7
Where EMI filtering in ESD sensitive equipment is
required:
■ LCD and camera for mobile phones
■ Computers and printers
■ Communication systems
■ MCU boards
Description
Figure 2. Basic cell configuration
Input
Typical line capacitance = 14 pF @ 2.5 V
170 Ω
Output
EMIF06-1502M12 is a 6-line, highly integrated
device designed to suppress EMI/RFI noise in all
systems exposed to electromagnetic interference.
This filter includes ESD protection circuitry, which
prevents damage to the application when
subjected to ESD surges up to 15 kV on the input
pins.
February 2008 Rev 4 1/10
TM: IPAD is a trademark of STMicroelectronics
www.st.com
Characteristics EMIF06-1502M12
1 Characteristics
Table 1. Absolute ratings (limiting values at T
= 25 °C unless otherwise specified)
amb
Symbol Parameter Value Unit
ESD IEC 61000-4-2, air discharge on input pins
V
ESD IEC 61000-4-2, contact discharge on input pins
PP
ESD IEC 61000-4-2, contact discharge on output pins
Junction temperature 125 °C
T
j
T
T
Table 2. Electrical characteristics (T
Operating temperature range -40 to + 85 °C
op
Storage temperature range -55 to +150 °C
stg
Symbol Parameter
V
I
V
V
R
I
R
C
BR
RM
RM
CL
PP
I/O
line
Breakdown voltage
Leakage current @ V
RM
Stand-off voltage
Clamping voltage
Dynamic resistance
d
Peak pulse current
Series resistance between Input & Output
Input capacitance per line
amb
= 25 °C)
I
I
F
V
BR
V
V
RM
CL
I
RM
I
R
I
PP
15
8
4
V
F
V
Symbol Test conditions Min. Typ. Max. Unit
kV
V
BR
I
RM
R
I/O
C
line
IR = 1 mA 6 8 10 V
VRM = 3 V per line 100 nA
Tolerance ± 10% 153 170 187 Ω
V
= 2.5 V dc, V
LINE
= 30 mV, F = 1 MHz 12 14 16.5 pF
OSC
Figure 3. S21 attenuation measurement Figure 4. Analog cross talk measurements
dB
0.00
-15.00
-30.00
F (Hz)
-45.00
100.0k 1.0M 10.0M 100.0M 1.0G
2/10
dB
0.00
0.00
-10.00
-10.00
-20.00
-20.00
-30.00
-30.00
-40.00
-40.00
-50.00
-50.00
-60.00
-60.00
-70.00
-70.00
-80.00
-80.00
-90.00
-90.00
-100.00
-100.00
100.0k 1.0M 10.0M 100.0M 1.0G
100.0k 1.0M 10.0M 100.0M 1.0G
F (Hz)
EMIF06-1502M12 Ordering information scheme
Figure 5. ESD response to IEC 61000-4-2
V
in
V
out
(+15 kV air discharge) on one input
(V
) and on one output (V
in
)
out
C1 = 10 V/d
C2 = 5 V/d
100 ns/d
Figure 6. ESD response to IEC 61000-4-2
(- 15 kV air discharge) on one input
(Vin) and on one output (V
V
in
V
out
Figure 7. Line capacitance versus reverse voltage applied (typical value)
C
(pF)
LINE
24
22
20
18
16
14
12
10
8
6
4
2
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
V
(V)
LINE
)
out
C1 = 10 V/d
C2 = 5 V/d
100 ns/d
2 Ordering information scheme
Figure 8. Ordering information scheme
EMIF yy - xxx z Mx
EMI Filter
Number of lines
Information
x = resistance value (Ohms)
z = capacitance value / 10(pF)
Package
Mx = Micro QFN x leads
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