EMIF06-1005M12
6-line IPAD™
low capacitance EMI filter and ESD protection in micro QFN package
Features
■ EMI symmetrical (I/O) low-pass filter
■ High efficiency in EMI filtering: -34 dB at
frequencies from 900 MHz to 1.8 GHz
■ Very low PCB space consumption:
2.5 mm x 1.5 mm
■ Very thin package: 0.6 mm max
■ High efficiency in ESD suppression on inputs
pins (IEC 61000-4-2 level 4)
■ High reliability offered by monolithic integration
■ High reduction of parasitic elements through
integration and wafer level packaging
■ Lead-free package
Complies with following standards:
■ IEC 61000-4-2 level 4 input and output pins
– 15 kV (air discharge)
– 8 kV (contact discharge)
■ MIL STD 883G - Method 3015-7 Class 3B
(all pins)
Applications
12
10
11
GND
9
8
7
1
2
3
4
5
6
Micro QFN 2.5 mm x 1.5 mm
(bottom view)
Figure 1. Pin configuration (top view)
1 Input Output 12
2 Input
3 Input
4 Input
5 Input
6 Input
Output 11
Output 10
Output 9
Output 8
Output 7
Where EMI filtering in ESD sensitive equipment is
required:
■ LCD and camera for mobile phones
■ Computers and printers
■ Communication systems
■ MCU boards
Description
Figure 2. Basic cell configuration
Input
Typical line capacitance = 45 pF @ 0 V
100 Ω
Output
EMIF06-1005M12 is a 6-line, highly integrated
device designed to suppress EMI/RFI noise in all
systems exposed to electromagnetic interference.
This filter includes ESD protection circuitry, which
prevents damage to the application when
subjected to ESD surges up to 15 kV on the input
pins.
February 2008 Rev 3 1/10
TM: IPAD is a trademark of STMicroelectronics
www.st.com
Characteristics EMIF06-1005M12
1 Characteristics
Table 1. Absolute ratings (limiting values at T
= 25 °C unless otherwise specified)
amb
Symbol Parameter Value Unit
V
T
T
Table 2. Electrical characteristics (T
ESD IEC 61000-4-2, air discharge
PP
ESD IEC 61000-4-2, contact discharge
Junction temperature 125 °C
T
j
Operating temperature range -40 to + 85 °C
op
Storage temperature range -55 to +150 °C
stg
Symbol Parameter
V
I
V
V
R
I
R
C
Breakdown voltage
BR
Leakage current @ V
RM
Stand-off voltage
RM
Clamping voltage
CL
Dynamic resistance
d
Peak pulse current
PP
Series resistance between Input & Output
I/O
Input capacitance per line
line
RM
amb
= 25 °C)
I
I
F
V
BR
V
V
RM
CL
I
RM
I
R
I
PP
15
15
V
F
V
Symbol Test conditions Min. Typ. Max. Unit
kV
V
BR
V
F
I
RM
R
I/O
C
line
IR = 1 mA 6 8 10 V
IF = 10 mA 0.5 1.0 1.5
VRM = 3 V per line 200 nA
Tolerance ± 10% 90 100 110 Ω
V
= 0 V dc, V
LINE
= 30 mV, F = 1 MHz 38 45 52 pF
OSC
Figure 3. S21 attenuation measurement Figure 4. Analog cross talk measurements
dB
0.00
-10.00
-20.00
-30.00
F (Hz)
-40.00
100.0k 1.0M 10.0M 100.0M 1.0G
0.00
- 10.00
- 20.00
- 30.00
- 40.00
- 50.00
- 60.00
- 70.00
- 80.00
- 90.00
- 100.00
dB
F (Hz)
1.0M 3.0M 10.0M 30.0M 100.0M 300.0M 1.0G 3.0G
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EMIF06-1005M12 Ordering information scheme
Figure 5. ESD response to IEC 61000-4-2
(+15 kV air discharge) on one input
(V
) and on one output (V
in
out
)
Figure 6. ESD response to IEC 61000-4-2
(- 15 kV air discharge) on one input
(Vin) and on one output (V
Figure 7. Line capacitance versus reverse voltage applied (typical value)
(pF)
C
LINE
50.00
45.00
40.00
35.00
30.00
25.00
20.00
15.00
10.00
5.00
0.00
0123 45
V
(V)
LINE
out
)
2 Ordering information scheme
Figure 8. Ordering information scheme
EMI Filter
Number of lines
Information
x = resistance value (Ohms)
z = capacitance value / 10(pF)
Package
Mx = Micro QFN x leads
EMIF yy - xxx z Mx
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