Datasheet EMIF06-10006F2 Datasheet (ST)

IPAD™

Main product characteristics

EMIF06-10006F2

6 line EMI filter and ESD protection

Where EMI filtering in ESD sensitive equipment is required:
Computers, printers and MCU Boards
Description
The EMIF06-10006F2 is a highly integrated device designed to suppress EMI/RFI noise in all systems subjected to electromagnetic interference. The EMIF06 Flip-Chip packaging means the package size is equal to the die size.
This filter includes an ESD protection circuitry which prevents damage to the application when subjected to ESD surges up 15 kV. This device includes 6 EMIF filters.
Benefits
EMI symmetrical (I/O) low-pass filter
High efficiency in EMI filtering
Lead free package
Very low PCB space consumption
2.92 mm x 1.29 mm
Very thin package: 0.65 mm
High efficiency in ESD suppression
(IEC 61000-4-2 level 4)
High reliability offered by monolithic integration
High reduction of parasitic elements through
integration and wafer level packaging
®
Flip-Chip
(15 Bumps)
Order code
Part Number Marking
EMIF06-10006F2 FT

Figure 1. Pin configuration (bump side)

987 654 321
I6
I5
Gnd Gnd Gnd
O5
O4
O6
Complies with the following standards:
IEC 61000-4-2 level 4:
15 kV (air discharge)
8 kV (contact discharge)
MIL STD 883E - Method 3015-6 Class 3: 30 kV
I3
I4
O3
I2
O2
I1
O1
A
B
C
TM: IPAD is a trademeark of STMicroelectronics
November 2006 Rev 4 1/9
www.st.com
9
Characteristics EMIF06-10006F2

1 Characteristics

Figure 2. Basic cell configuration

Input 1
100 Ω
Output 1 Input 4
30 pF 30 pF
100 Ω
Output 4
30 pF 30 pF
Input 2 Output 2
Input 3 Output 3

Table 1. Absolute Ratings (limiting values)

100 Ω
30 pF 30 pF
100 Ω
30 pF 30 pF
Input 5
Input 6
100 Ω
Output 5
30 pF 30 pF
100 Ω
Output 6
30 pF 30 pF
Symbol Parameter and test conditions Value Unit
P
P
T
T
Table 2. Electrical Characteristics (T
Symbol Parameter
V
I
RM
V
V
R
I
PP
R
C
DC power per resistance 0.1 W
R
Total DC power per package 0.6 W
T
Maximum junction temperature 125 ° C
T
j
Operating temperature range - 40 to + 85 ° C
op
Storage temperature range 125 ° C
stg
= 25 °C)
amb
I
Breakdown voltage
BR
I
F
Leakage current @ VRM
Stand-off voltage
RM
Clamping voltage
CL
Dynamic impedance
d
VCL
VRMVBR
IRM IR
Peak pulse current
Series resistance between Input and output
I/O
Capacitance per line
line
IPP
VF
Symbol Test conditions Min. Typ. Max. Unit
V
V
I
RM
R
C
IR = 1 mA 5.5 7 9 V
BR
VRM = 3.3 V per line 500 nA
I = 10 mA 80 100 120 Ω
I/O
VR = 2.5 V, F = 1 MHz, 30 mV (on filter cells) 50 60 70 pF
line
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EMIF06-10006F2 Characteristics
Figure 3. S21 (db) attenuation measurements

Figure 4. Analog crosstalk measurements

and Aplac simulation
Aplac 7.62 User: ST Microelectronics
0.00
0.00
dB
dB
-12.50
-12.50
-25.00
-25.00
-37.50
-37.50
-50.00
-50.00
100.0k 1.0M 10.0M 100.0M 1.0G
100.0k 1.0M 10.0M 100.0M 1.0G
Measurement
Measurement
Measurement
Simulation
Simulation
Simulation
f/Hz
f/Hz
00
-25
-50
-75
-100
100k
Aplac 7.62 User: ST Microelectronics
dBdB
1M
i3_o2.s2p
f/Hz
10M 100M 1G
Figure 5. Digital crosstalk measurements Figure 6. ESD response to IEC 61000-4-2
(+15 kV air discharge) on one imput (V
) and one output (V
in
out
)
Figure 7. ESD response to IEC 61000-4-2
(–15 kV air discharge) on one imput (V
) and one output (V
in
out
)
Figure 8. Line capacitance versus applied
voltage for filter
C(pF)
100
90
80
70
60
50
40
30
20
10
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
V (V)
R
3/9
V
osc
F=1MHz
=30mV
Tj=25°C
RMS
Characteristics EMIF06-10006F2

Figure 9. Aplac model

Ii*
Cbump
Rsub
Oi * = Output of each filter cell
Ii* = Input of each filter cell
Rs=100LbumpRbump
Cz=41pF@0V
Cz=41pF@0V
EMIF06-10006F2 model Ground return for each GND bump
Lbump Rbump
sub
sub

Figure 10. Figure 10: Aplac parameters

aplacvar RS
aplacvar Cz
aplacvar Lbump
aplacvar Rbump
aplacvar Cbump
aplacvar Rsub
aplacvar Rgnd
aplacvar Lgnd
aplacvar Cgnd
Rsub
Oi*
Cbump
Ω
100
41 pF
50 pH
20 m
1.2 pF
100 m
100 m
100 pH
0.15 pF
CgndCgndCgnd
sub
Rsub
Rbump
Lbump
Lgnd
Rgnd
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EMIF06-10006F2 Ordering Information Scheme

2 Ordering Information Scheme

EMIF yy - xxx zz Fx
EMI Filter
Number of lines
Information
x = resistance value (Ohms) z = capacitance value / 10(pF) or 3 letters = application 2 digits = version
Package
F = Flip-Chip x = 2: Lead free Pitch = 500 µm, Bump = 315 µm
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Package information EMIF06-10006F2

3 Package information

Figure 11. Flip-Chip Package dimensions

315 µm ± 50
500 µm ± 50
250 µm ± 50
501 µm ± 50
2.92 mm ± 50 µm
435 µm ± 50
1.29 mm ± 50 µm
Figure 12. Foot print recommendations Figure 13. Marking
Dot, ST logo
Copper pad Diameter:
250 µm recommended , 300 µm max
Solder stencil opening: 330 µm
Solder mask opening recommendation:
340 µm min for 300 µm copper pad diameter
xx = marking z = manufacturing location yww = datecode
(y = year
ww = week)
x y
650 µm ± 65
E
z
wxw
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EMIF06-10006F2 Package information

Figure 14. Flip-Chip Tape and reel specification

Dot identifying Pin A1 location
8 +/- 0.3
ST
yww
xxz
E
4 +/- 0.1
yww
xxz
ST
E
Ø 1.5 +/- 0.1
ST
yww
xxz
E
1.75 +/- 0.1 3.5 +/- 0.1
0.73 +/- 0.05
All dimensions in mm
User direction of unreeling
4 +/- 0.1
In order to meet environmental requirements, ST offers these devices in ECOPACK® packages. These packages have a lead-free second level interconnect. The category of second level interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com.
Note: Note: More packing information is available in the application notes:
AN1235: “Flip-Chip: Package description and recommendations for use”
AN1751: "EMI Filters: Recommendations and measurements"
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Ordering Information EMIF06-10006F2

4 Ordering Information

Ordering code Marking Package Weight Base qty Delivery mode
EMIF06-10006F2 FT Flip-Chip 5.4 mg 5000 Tape and reel 7”

5 Revision History

Date Revision Description of Changes
Sep-2004 1 First issue
19-Nov-2004 2
11-Apr-2006 3
17-Nov-2006 4 Ordering code in ordering information corrected.
Figure 2 on page 2: Basic cell configuration corrected for I/O5 and I/O6.
Reformated to current standard. Marking corrected in ordering information.
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EMIF06-10006F2
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