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Features
■ Low conduction and reverse losses
■ Negligible switching losses
■ Low forward and reverse recovery times
■ Extremely fast switching
■ Surface mount device
■ Low capacitance diode
Description
The BAT54 series uses 40 V Schottky barrier
diodes packaged in SOD- 23, SOD-323,
SOD-523, SOT-23, SOT-323, or SOT-666.
BAT54
Small signal Schottky diodes
BAT54ZFILM
(Single)
SOD-123
BAT54JFILM
BAT54JFILM-H
SOD-323
SOD-523
SOT-23
(Single)
BAT54KFILM
(Single)
BAT54FILM
(Single)
BAT54AFILM
(Common anode)
BAT54SFILM
(Series)
Table 1. Device summary
Symbol Value
I
F
V
RRM
(typ) 7 pF
C
(max) 150 °C
T
j
300 mA
40 V
SOT-323
SOT-666
Configurations in top view
BAT54CFILM
(Common cathode)
BAT54WFILM
(Single)
BAT54CWFILM
(Common cathode)
BAT54AWFILM
(Common anode)
BAT54SWFILM
(Series)
BAT54-07P6FILM
(2 parallel diodes)
BAT54-09P6FILM
(2 opposite diodes)
October 2009 Doc ID 5505 Rev 10 1/13
www.st.com
13
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Characteristics BAT54
1 Characteristics
Table 2. Absolute ratings (limiting values at Tj = 25 °C, unless otherwise specified)
Symbol Parameter Value Unit
V
I
T
Table 3. Thermal parameters
Repetitive peak reverse voltage 40 V
RRM
I
Continuous forward current 300 mA
F
Surge non repetitive forward current tp = 10 ms Sinusoidal 1 A
FSM
Storage temperature range -65 to +150 °C
stg
T
Operating junction temperature range -40 to +150 °C
j
T
Maximum soldering temperature 260 °C
L
Symbol Parameter Value Unit
R
Junction to ambient
th(j-a)
(1)
SOT-23, SOD-123 500
SOT-323, SOD-323, 550
°C/W
SOD-523, SOT-666 600
1. Epoxy printed circuit board with recommended pad layout
Table 4. Static electrical characteristics
Symbol Parameter Test conditions Min. Typ. Max. Unit
T
= 25 °C
(1)
I
Reverse leakage current
R
j
= 100 °C 100
T
j
V
R
= 30 V
1
IF = 0.1 mA 240
= 1 mA 320
I
F
(2)
V
1. Pulse test: tp = 5 ms, δ < 2 %
2. Pulse test: tp = 380 µs, δ < 2 %
Table 5. Dynamic characteristics
Symbol Parameter
Forward voltage drop Tj = 25 °C
F
Test conditions
I
= 10 mA 400
F
= 30 mA 500
I
F
= 100 mA 900
I
F
Min. Typ. Max. Unit
µA
mV
Diode
C
t
rr
capacitance
Reverse
recovery time
V
= 1 V, F = 1 MHz 7 10 pF
R
IF = 10 mA, IR = 10 mA, Tj = 25 °C
I
= 1 mA, RL = 100 Ω
rr
2/13 Doc ID 5505 Rev 10
5ns
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BAT54 Characteristics
Figure 1. Average forward power dissipation
versus average forward current
P(W)
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
0.00 0.05 0.10 0.15 0.20 0.25 0.30 0.35
δ=0.05
δ=0.2
δ=0.1
I
F(AV)
δ=0.5
(A)
δ
=tp/T
δ=1
T
tp
Figure 3. Reverse leakage current versus
reverse applied voltage
(typical values)
IR(µA)
1.E+02
Tj=100°C
1.E+01
1.E+00
1.E-01
1.E-02
0 5 10 15 20 25 30
Tj=50°C
Tj=25°C
VR(V)
Figure 2. Average forward current versus
ambient temperature (δ = 1)
I
(A)
F(AV)
0.35
0.30
0.25
0.20
0.15
δ
=tp/T
T
tp
T
(°C)
amb
0.10
0.05
0.00
0 25 50 75 100 125 150
Figure 4. Reverse leakage current versus
junction temperature
IR[Tj]/IR[Tj=25°C]
1.E+04
VR=3V
1.E+03
1.E+02
1.E+01
1.E+00
1.E-01
0 25 50 75 100 125 150
Tj(°C)
Figure 5. Junction capacitance versus
reverse applied voltage
(typical values)
C(pF)
10
1
1 10 100
VR(V)
V
F=1MHz
OSC
Tj=25°C
=30mV
Figure 6. Forward voltage drop versus
forward current (typical values)
IFM(A)
1.E+00
RMS
1.E-01
1.E-02
1.E-03
1.E-04
0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 1.3
Doc ID 5505 Rev 10 3/13
Tj=100°CTj=100°C
Tj=50°CTj=50°C
Tj=25°CTj=25°C
Tj=-40 °CTj=-40 °C
VFM(V)
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Characteristics BAT54
Figure 7. Thermal resistance junction to
ambient versus copper surface
under each lead (SOD-323)
R
(°C/W)
th(j-a)
600
Epoxy FR4
=35 µm
e
CU
500
400
300
200
0 5 10 15 20 25 30 35 40 45 50
SCU(mm²)
Figure 9. Relative variation of thermal
impedance junction to ambient
versus pulse duration (SOT-23)
Z
th(j-a)/Rth(j-a)
1.E+00
Single pulse
SOT23
Figure 8. Relative variation of thermal
impedance junction to ambient
versus pulse duration (SOD-323)
Z
th(j-a)/Rth(j-a)
1.E+00
Single pulse
SOD323
1.E-01
1.E-02
Epoxy FR4
=2.25 mm²
S
CU
=35 µm
e
1.E-03
1.E-03 1.E-02 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03
tP(s)
CU
Figure 10. Relative variation of thermal
impedance junction to ambient
versus pulse duration (SOD-523)
Z
th(j-a)/Rth(j-a)
1.E+00
Single pulse
SOD523
1.E-01
1.E-01
1.E-02
Alumine substrate
1.E-02
1.E-03 1.E-02 1.E-01 1.E+00 1.E+01 1.E+02
tP(s)
10 x 8 x 0.5 mm
1.E-03
1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
tP(s)
Epoxy FR4
e
=35 µm
CU
Figure 11. Relative variation of thermal impedance junction to ambient versus pulse duration
Z
th(j-a)/Rth(j-a)
1.E+00
Single pulse
SOT666
1.E-01
Epoxy FR4
e
=35 µm
1.E-02
1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
tP(s)
CU
4/13 Doc ID 5505 Rev 10