The A3G4250D is a low-power 3-axis angular rate
sensor able to provide unprecedented stability at
zero rate level and sensitivity over temperature
and time. It includes a sensing element and an IC
interface capable of providing the measured
angular rate to the external world through a
standard SPI digital interface. An I
interface is also available.
The sensing element is manufactured using a
dedicated micro-machining process developed by
STMicroelectronics to produce inertial sensors
and actuators on silicon wafers.
The IC interface is manufactured using a CMOS
process that allows a high level of integration to
design a dedicated circuit which is trimmed to
better match the sensing element characteristics.
The A3G4250D has a full scale of ±245 dps and
is capable of measuring rates with a userselectable bandwidth.
The A3G4250D is available in a plastic land grid
array (LGA)package and can operate within a
temperature range of -40 °C to +85 °C.
The vibration of the structure is maintained by drive circuitry in a feedback loop. The sensing
signal is filtered and appears as a digital signal at the output.
1.1 Pin description
Figure 2.Pin connection
(TOP VIEW)
DIRECTIONS OF THE
DETECTABLE
ANGULAR RATES
1
+Ω
PLLFILT
Z
X
+Ω
Y
RES
RES
GND
1316
12
BOTTOM
RES
Vdd
1
Vdd_IO
SCL/SPC
VIEW
RES
+Ω
X
Doc 022768 Rev 37/44
RES
8
INT
RES
5
DRDY/INT2
CS
SDA/SDI/SDO
49
SDO/SA0
AM07226v1
Block diagram and pin descriptionA3G4250D
Table 2.Pin description
Pin#NameFunction
1Vdd_IOPower supply for I/O pins
2
SCL
SPC
SDA
3
SDI
SDO
4
SDO
SA0
I2C serial clock (SCL)
SPI serial port clock (SPC)
2
I
C serial data (SDA)
SPI serial data input (SDI)
3-wire interface serial data output (SDO)
SPI serial data output (SDO)
2
I
C least significant bit of the device address (SA0)
SPI enable
5CS
2
I
C/SPI mode selection (1: SPI idle mode / I2C communication
enabled; 0: SPI communication mode / I
6DRDY/INT2Data ready/FIFO interrupt
7INT1Programmable interrupt
8ReservedConnect to GND
9ReservedConnect to GND
10ReservedConnect to GND
11ReservedConnect to GND
12ReservedConnect to GND
13GND0 V supply
14PLLFILTPhase-locked loop filter (see Figure 3)
2
C disabled)
15ReservedConnect to Vdd
16VddPower supply
Figure 3.A3G4250D external low-pass filter values
#APACITORFOR
,OWPASSFILTER
TOPIN
#
2#
a. Pin 14 PLLFILT maximum voltage level is equal to Vdd.
(a)
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8/44Doc 022768 Rev 3
A3G4250DBlock diagram and pin description
Table 3.Filter values
ParameterTypical value
C110 nF
C2470 nF
R210 kΩ
Doc 022768 Rev 39/44
Mechanical and electrical characteristicsA3G4250D
2 Mechanical and electrical characteristics
2.1 Mechanical characteristics
@ Vdd = 3.0 V, T = -40... +85 °C, unless otherwise noted
Table 4.Mechanical characteristics
SymbolParameterTest conditionMin. Typ.
FSMeasurement range
SoSensitivity
SoDr
DVoffDigital zero-rate level
OffDr
NLNon linearity
DSTSelf-test output change55130245dps
RnRate noise densityBW = 50 Hz0.030.15
ODRDigital output data rate
Top
1. Typical specifications are not guaranteed; typical values at +25 °C.
2. Guaranteed by design.
3. Across temperature and after MSL3 preconditioning.
(2)
(3)
Sensitivity change vs.
temperature
(3)
Zero-rate level change
vs. temperature
(2)
Operating temperature
range
7.48.7510.1mdps/digit
-25+25dps
Best fit straight line-50.2+5% FS
89/176/
357/714
-40+85°C
(b)
.
(1)
Max.Unit
±245dps
±2%
±0.03dps/°C
sqrt(Hz)
105/208/
420/840
121/239/
483/966
dps/
Hz
b. The product is factory calibrated at 3.0 V. The operational power supply range is specified in Table 5.
10/44Doc 022768 Rev 3
A3G4250DMechanical and electrical characteristics
2.2 Electrical characteristics
@ Vdd = 3.0 V, T = -40... +85 °C, unless otherwise noted
Table 5.Electrical characteristics
SymbolParameterTest conditionMin.Typ.
VddSupply voltage2.43.03.6V
Vdd_IOI/O pins supply voltage
IddSupply current4.86.17.0mA
(2)
(c)
.
(1)
Max.Unit
1.71Vdd+0.1V
IddSL
IddPdn
To p
1. Typical specifications are not guaranteed; typical values at +25 °C.
2. It is possible to remove Vdd maintaining Vdd_IO without blocking the communication busses, in this condition the
measurement chain is powered off.
3. Sleep mode introduces a faster turn-on time compared to power-down mode.
4. Verified at wafer level.
Supply current
in sleep mode
Supply current in
power-down mode
(3)
(4)
Operating temperature
range
Selectable by digital
interface
Selectable by digital
interface
1.5mA
510µA
-40+85°C
2.3 Temperature sensor characteristics
@ Vdd = 3.0 V, T = 25 °C, unless otherwise noted
Table 6.Temp. sensor characteristics
SymbolParameterTest conditionMin.Typ.
Temperature sensor
TSDr
TODRTemperature refresh rate1Hz
output change vs.
temperature
-
(d)
.
(1)
-1°C/digit
Max.Unit
To p
1. Typical specifications are not guaranteed; typical values at +25 °C.
Operating temperature
range
c. The product is factory calibrated at 3.0 V.
d. The product is factory calibrated at 3.0 V.
Doc 022768 Rev 311/44
-40+85°C
Mechanical and electrical characteristicsA3G4250D
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2.4 Communication interface characteristics
2.4.1 SPI - serial peripheral interface
Subject to general operating conditions for Vdd and Top.
Table 7.SPI slave timing values
(1)
Val ue
SymbolParameter
Min.Max.
tc(SPC)SPI clock cycle100ns
fc(SPC)SPI clock frequency10MHz
tsu(CS)CS setup time5
th(CS)CS hold time8
tsu(SI)SDI input setup time5
th(SI)SDI input hold time15
tv(SO)SDO valid output time50
th(SO)SDO output hold time6
tdis(SO)SDO output disable time50
Unit
ns
1. Values are guaranteed at 10 MHz clock frequency for SPI with both 4 and 3 wires, based on characterization results; not
tested in production.
Figure 4.SPI slave timing diagram
(e)
e. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both input and output ports.
12/44Doc 022768 Rev 3
A3G4250DMechanical and electrical characteristics
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2.4.2 I2C - inter IC control interface
Subject to general operating conditions for Vdd and Top.
Table 8.I2C slave timing values
SymbolParameter
I2C standard mode
(1)
I2C fast mode
Min.Max.Min.Max.
(1)
Unit
f
(SCL)
t
w(SCLL)
t
w(SCLH)
t
su(SDA)
t
h(SDA)
t
h(ST)
t
su(SR)
t
su(SP)
t
w(SP:SR)
1. Data based on standard I2C protocol requirement; not tested in production.
Figure 5.I
SCL clock frequency01000400kHz
SCL clock low time4.71.3
SCL clock high time4.00.6
SDA setup time250100ns
SDA data hold time03.4500.9µs
START condition hold time40.6
Repeated START condition
setup time
4.70.6
STOP condition setup time40.6
Bus free time between STOP
and START condition
2
C slave timing diagram
(f)
4.71.3
µs
µs
f. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both ports.
Doc 022768 Rev 313/44
Mechanical and electrical characteristicsA3G4250D
This is a mechanical shock sensitive device, improper handling can cause permanent
damage to the part
This is an ESD sensitive device, improper handling can cause permanent damage to
the part
2.5 Absolute maximum ratings
Any stress above that listed as “Absolute maximum ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Table 9.Absolute maximum ratings
SymbolRatingsMaximum valueUnit
VddSupply voltage-0.3 to 4.8V
T
ESDElectrostatic discharge protection2 (HBM)kV
Storage temperature range-40 to +125°C
STG
SgAcceleration g for 0.1 ms10,000g
14/44Doc 022768 Rev 3
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