ST 74VHCT541A User Manual

74VHCT541A
OCTAL BUS BUFFER
WITH 3 STATE OUTPUTS (NON INVERTED)
HIGH SPEED: t
LOW POWER DISSIPATION:
I
= 4 µA (MAX.) at TA=25°C
CC
COMPATIBLE WITH TTL OUTP U TS:
V
= 2V (M IN.), V
IH
POWER DOWN PROTECTION ON INPUTS
= 4.1 ns (TYP.) at VCC = 5V
PD
= 0.8V (MAX)
IL
& OUTPUTS
SYMMETRICAL OUTPUT IMPEDANCE:
|I
| = IOL = 8 mA (MIN)
OH
BALANCED PROPAGATION DELAYS:
t
t
PLH
PHL
OPERATING VOLTAGE RANGE:
V
(OPR) = 4.5V to 5.5V
CC
PIN AND FUNCTION COMPATIBLE WITH
74 SERIES 541
IMPROVED LATCH-UP IMMUNITY
LOW NOISE: V
= 0.9V (MAX.)
OLP
DESCRIPTION
The 74VHCT541A is an advanced high-speed CMOS OCTAL BUS BUFFER (3-STATE) fabricated with sub-micron silicon gate and double-layer metal wiring C
2
MOS technology. The 3 STATE control gate opera tes as two input AND such that if either G1
and G2 are high, all
eight outputs are in the high impedance state.
TSSOPSOP

Table 1: Order Codes

PACKAGE T & R
SOP 74VHCT541AMTR
TSSOP 74VHCT541ATTR
In order to enhance PC board layout, the 74VHCT541 offers a pinout having inputs and outputs on opposite sides of the package. Power down protection is provided on all inputs and outputs and 0 to 7V can be accepted on inputs with no regard to the supply voltage. This device can be used t o interf ace 5V to 3V s ince al l inputs are equipped with TTL threshold. All inputs and outputs are equipped with protection circuits against static disc harge, giving them 2KV ESD immunity and transient excess voltage.

Figure 1: Pin Connection And IEC Logic Symbols

Rev. 4
1/12December 2004
74VHCT541A

Figure 2: Input Equivalent Circuit Table 2: Pin Description

PIN N° SYMBOL NAME AND FUNCTION
1, 19 G1
2, 3, 4, 5, 6,
7, 8, 9
18, 17, 16, 15, 14, 13,
12, 11
10 GND Ground (0V) 20 V

Table 3: Truth Table

INPUT OUTPUT
, G2 Output Enable Inputs
A1 to A8 Data Inputs
Y1 to Y8 Data Outputs
CC
Positive Supply Voltage
G1
G2 An Yn
HXXZ XHXZ
LLHH LLLL
X : Don’t Care Z : High impedance

Table 4: Absolute Maximum Ratings

Symbol Parameter Value Unit
V
V V V
I
I
OK
I
I
or I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is not implied
1) Output in OFF State
2) High or Low State
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage (see note 1)
O
DC Output Voltage (see note 2) -0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current DC Output Current
O
DC VCC or Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
-0.5 to +7.0 V
-0.5 to +7.0 V
-0.5 to +7.0 V V
- 20 mA
± 20 mA ± 25 mA ± 50 mA
-65 to +150 °C
300 °C
2/12
74VHCT541A

Table 5: Recommended Operating Conditions

Symbol Parameter Value Unit
V
V V V T
dt/dv
1) Output in OFF State
2) High or Low State
3) VIN from 0. 8V to 2V

Table 6: DC Specifications

Symbol Parameter
V
IH
V
IL
V
OH
V
OL
I
OZ
I
I
I
CC
+I
CC
I
OPD
Supply Voltage
CC
Input Voltage
I
Output Voltage (see note 1)
O
Output Voltage (see note 2) 0 to V
O
Operating Temperature
op
Input Rise and Fall Time (see note 3) (V
= 5.0 ± 0.5V)
CC
Test Condition Value
= 25°C
T
A
Min. Typ. Max. Min. Max. Min. Max.
222V
0.8 0.8 0.8 V
4.4 4.5 4.4 4.4
3.94 3.8 3.7
0.0 0.1 0.1 0.1
0.36 0.44 0.55
±0.25 ± 2.5 ± 2.5 µA
± 0.1 ± 1.0 ± 1.0 µA
44040µA
1.35 1.5 1.5 mA
0.5 5.0 5.0 µA
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
Low Level Output Voltage
High Impedance Output Leakage Current
Input Leakage Current
Quiescent Supply Current
Additional Worst Case Supply Current
Output Leakage Current
V
CC
(V)
4.5 to
5.5
4.5 to
5.5
4.5
4.5
4.5
4.5
4.5 to
5.5
0 to
5.5
5.5
5.5
0
=-50 µA
I
O
=-8 mA
I
O
IO=50 µA
I
=8 mA
O
= VIH or V
V
I
IL
VO = 0V to 5.5V
V
= 5.5V or GND
I
= VCC or GND
V
I
One Input at 3.4V, other input at V
CC
or GND
= 5.5V
V
OUT
4.5 to 5.5 V 0 to 5.5 V 0 to 5.5 V
CC
-55 to 125 °C 0 to 20 ns/V
-40 to 85°C -55 to 125°C
V
Unit
V
V
Table 7: AC Electrical Characteristics (Input t
Test Condition Value
Symbol Parameter
t
Propagation Delay
PLH PHL
PZL
PZH
PLZ
PHZ
Time Output Disable
Time Output Enable
Time
t t
t t
t
(*) Voltage range is 5.0V ± 0.5V
V
(*)
(V)
C
(pF)
L
CC
5.0 15 4.1 6.0 1.0 6.5 1.0 6.5
5.0 50 6.2 8.5 1.0 9.5 1.0 9.5
5.0 15
5.0 50 7.5 10.0 1.0 12.0 1.0 12.0
RL = 1K
5.0 50 RL = 1K
= tf = 3ns)
r
= 25°C
T
A
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
7.0 10.0 1.0 12.0 1.0 12.0 ns
5.0 7.0 1.0 8.0 1.0 8.0
Unit
ns
ns
3/12
74VHCT541A

Table 8: Capacitive Characteristics

Test Condition Value
= 25°C
Symbol Parameter
T
A
Min. Typ. Max. Min. Max. Min. Max.
C
C
C
Input Capacitance
IN
Output
OUT
Capacitance Power Dissipation
PD
Capacitance
610 10 10pF 8pF
16 pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I

Table 9: Dynamic Switching Characteristics

Test Condition Value
= 25°C
Symbol Parameter
V V
Dynamic Low
OLP
Voltage Quiet
OLV
Output (note 1, 2) Dynamic High
V
IHD
Voltage Input (note 1, 3)
Dynamic Low
V
ILD
Voltage Input (note 1, 3)
V
CC
(V)
5.0
= 50 pF
5.0 2.0
C
L
5.0 0.8
T
A
Min. Typ. Max. Min. Max. Min. Max.
0.9 1.1
-1.1 -0.9
-40 to 85°C -55 to 125°C
= CPD x VCC x fIN + ICC/8 (per c ircuit )
CC(opr)
-40 to 85°C -55 to 125°C
Unit
Unit
V
1) Worst case package.
2) Max number of outp ut s defined as (n). Data inpu t s are driven 0V to 3.0V, (n-1) outputs switc hi ng and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.0V. Inputs under test switching: 3.0V to threshold (V (V
), f=1MHz.
IHD
ILD
), 0V to thresho l d
4/12
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