ST 74VHCT08A User Manual

74VHCT08A
QUAD 2-INPUT AND GATE
HIGH SPEED: t
LOW POWER DISSIPATION:
I
= 2 µA (MAX.) at TA=25°C
CC
COMPATIBLE WITH TTL OUTP U TS:
V
= 2V (M IN.), V
IH
POWER DOWN PROTECTION ON INPUTS
= 4.7 ns (TYP.) at VCC = 5V
PD
= 0.8V (MAX)
IL
& OUTPUTS
SYMMETRICAL OUTPUT IMPEDANCE:
|I
| = IOL = 8 mA (MIN)
OH
BALANCED PROPAGATION DELAYS:
t
t
PLH
OPERATING VOLTAGE RANGE:
V
CC
PIN AND FUNCTION COMPATIBLE WITH
PHL
(OPR) = 4.5V to 5.5V
74 SERIES 08
IMPROVED LATCH-UP IMMUNITY
LOW NOISE: V
= 0.8V (MAX.)
OLP
DESCRIPTION
The 74VHCT08A is an advanced high-speed CMOS QUAD 2-INPUT AND GATE fabricated with sub-micron silicon gate and double-layer metal wiring C
2
MOS technology. The internal circuit is composed of 2 stages including buffer ou tput, whi ch provid es hig h no ise immunity and stable output.
TSSOPSOP

Table 1: Order Codes

PACKAGE T & R
SOP 74VHCT08AMTR
TSSOP 74VHCT08ATTR
Power down protection is provided on all inputs and outputs and 0 to 7V can be accepted on inputs with no regard to the supply voltage. This device can be used t o interf ace 5V to 3V s ince al l inputs are equipped with TTL threshold. All inputs and outputs are equipped with protection circuits against static disc harge, giving them 2KV ESD immunity and transient excess voltage.

Figure 1: Pin Connection And IEC Logic Symbols

Rev. 4
1/11December 2004
74VHCT08A

Figure 2: Input Equivalent Circuit Table 2: Pin Description

PIN N° SYMBOL NAME AND FUNCTION
1, 4, 9, 12 1A to 4A Data Inputs
2, 5, 10, 13 1B to 4B Data Inputs
3, 6, 8, 11 1Y to 4Y Data Outputs
7 GND Ground (0V)
14

Table 3: Truth Table

ABY
LLL
LHL HLL HHH

Table 4: Absolute Maximum Ratings

Symbol Parameter Value Unit
V
V V V
I
I
OK
I
or I
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is not implied
1) V
CC
2) High or Low State
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage (see note 1)
O
DC Output Voltage (see note 2) -0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current DC Output Current
O
DC VCC or Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
= 0V

Table 5: Recommended Operating Conditions

V
CC
Positive Supply Voltage
-0.5 to +7.0 V
-0.5 to +7.0 V
-0.5 to +7.0 V
- 20 mA
± 20 mA ± 25 mA ± 50 mA
-65 to +150 °C 300 °C
V
Symbol Parameter Value Unit
V
V V V T
dt/dv
1) V
CC
2) High or Low State
3) VIN from 0.8V to 2V
Supply Voltage
CC
Input Voltage
I
Output Voltage (see note 1)
O
Output Voltage (see note 2) 0 to V
O
Operating Temperature
op
Input Rise and Fall Time (see note 3) (V
= 0V
= 5.0 ± 0.5V)
CC
4.5 to 5.5 V 0 to 5.5 V 0 to 5.5 V
CC
-55 to 125 °C 0 to 20 ns/V
2/11
V

Table 6: DC Specifications

Symbol Parameter
V
V
V
+I
I
High Level Input
IH
Voltage Low Level Input
V
IL
Voltage High Level Output
OH
Voltage Low Level Output
OL
Voltage
I
Input Leakage
I
Current
I
Quiescent Supply
CC
Current Additional Worst
CC
Case Supply Current
Output Leakage
OPD
Current
4.5 to
4.5 to
Test Condition Value
= 25°C
T
V
CC
(V)
5.5
5.5
4.5
4.5
4.5
4.5
0 to
VI = 5.5V or GND
5.5 V
5.5
=-50 µA
I
O
=-8 mA
I
O
=50 µA
I
O
=8 mA
I
O
= VCC or GND
I
A
Min. Typ. Max. Min. Max. Min. Max.
222V
0.8 0.8 0.8 V
4.4 4.5 4.4 4.4
3.94 3.8 3.7
0.0 0.1 0.1 0.1
0.36 0.44 0.55
± 0.1 ± 1.0 ± 1.0 µA
One Input at 3.4V, other input at V
5.5
CC
1.35 1.5 1.5 mA
or GND
= 5.5V
0
V
OUT
0.5 5.0 5.0 µA
74VHCT08A
-40 to 85°C -55 to 125°C
22020µA
Unit
V
V
Table 7: AC Electrical Characteristics (Input t
= tf = 3ns)
r
Test Condition Value
Symbol Parameter
t
Propagation Delay
PLH PHL
Time
t
(*) Voltage range is 5.0V ± 0.5V
T
(*)
(V)
C
(pF)
L
V
CC
A
Min. Typ. Max. Min. Max. Min. Max.
5.0 15 5.0 6.9 1.0 8.0 1.0 8.0
5.0 50 5.5 7.9 1.0 9.0 1.0 9.0
-40 to 85°C -55 to 125°C
Unit
ns
= 25°C

Table 8: Capacitive Characteristics

Test Condition Value
= 25°C
Symbol Parameter
T
A
Min. Typ. Max. Min. Max. Min. Max.
C
C
Input Capacitance
IN
Power Dissipation
PD
Capacitance
610 10 10pF
18 pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
-40 to 85°C -55 to 125°C
= CPD x VCC x fIN + ICC/4 (per gate)
CC(opr)
Unit
3/11
74VHCT08A

Table 9: Dynamic Switching Characteristics

Test Condition Value
= 25°C
Symbol Parameter
V V
Dynamic Low
OLP
Voltage Quiet
OLV
Output (note 1, 2)
V
CC
(V)
5.0
T
A
Min. Typ. Max. Min. Max. Min. Max.
0.4 0.8
-0.8 -0.4
Dynamic High
V
IHD
Voltage Input
5.0 2.0
= 50 pF
C
L
(note 1, 3) Dynamic Low
V
ILD
Voltage Input
5.0 0.8
(note 1, 3)
1) Worst case package.
2) Max number of outp ut s defined as (n). Data inpu t s are driven 0V to 3.0V, (n-1) outputs switc hi ng and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.0V. Inputs under test switching: 3.0V to threshold (V (V
), f=1MHz.
IHD

Figure 3: Test Circuit

-40 to 85°C -55 to 125°C
ILD
Unit
V
), 0V to thresho l d
CL =15/50pF or equivalent (i ncludes jig an d probe capac i tance)
= Z
R
of pulse generator (typically 50Ω)
T
OUT
4/11
Loading...
+ 7 hidden pages