74VHC02
QUAD 2- INPUT NOR GATE
■ HIGH SPEED: t
■ LOW POWER DISSIPATION:
I
= 2 µA (MAX.) at TA=25°C
CC
■ HIGH NOISE IMMUNITY:
V
= V
NIH
■ POWER DOWN PROTECTION ON INPUTS
■ SYMMETRICAL OUTPUT IMPEDANCE:
|I
OH
■ BALANCED PROPAGATION DELAYS:
t
PLH
■ OPERATING VOLTAGE RANGE:
V
CC
■ PIN AND FUNCTION COMPATIBLE WITH
NIL
| = IOL = 8mA (MIN)
≅ t
PHL
(OPR) = 2V to 5.5V
= 3.6ns (TYP.) at VCC = 5V
PD
= 28% VCC (MIN.)
74 SERIES 02
■ IMPROVED LATCH-UP IMMUN ITY
■ LOW NOISE: V
= 0.8V (MAX.)
OLP
DESCRIPTION
The 74VHC02 is an advanced high-speed CMOS
QUAD 2-INPUT NOR GATE fabricated with
sub-micron silicon gate and double-layer metal
wiring C
2
MOS technology.
The internal circuit is composed of 3 stages
including buffer ou tput, whi ch provid es hig h no ise
immunity and stable output.
TSSOPSOP
Table 1: Order Codes
PACKAGE T & R
SOP 74VHC02MTR
TSSOP 74VHC02TTR
Power down protection is provided on all inputs
and 0 to 7V can be accepted on inputs with no
regard to the supply voltage. This device can be
used to interface 5V to 3V.
All inputs and outputs are equipped with
protection circuits against static disc harge, giving
them 2KV ESD immunity and transient excess
voltage.
Figure 1: Pin Connection An d I E C Logic Symbols
Rev. 5
1/11November 2004
74VHC02
Figure 2: Input Equivalent Circuit Table 2: Pin Description
PIN N° SYMBOL NAME AND FUNCTION
2, 5, 8, 11 1A to 4A Data Inputs
3, 6, 9, 12 1B to 4B Data Inputs
1, 4, 10, 13 1Y to 4Y Data Outputs
7 GND Ground (0V)
14
Table 3: Truth Table
ABY
LLH
LHL
HLL
HHL
Table 4: Absolute Maximum Ratings
Symbol Parameter Value Unit
V
V
V
I
I
OK
I
or I
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage -0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current
DC Output Current
O
DC VCC or Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
Table 5: Recommended Operating Conditions
V
CC
Positive Supply Voltage
-0.5 to +7.0 V
-0.5 to +7.0 V
- 20 mA
± 20 mA
± 25 mA
± 50 mA
-65 to +150 °C
300 °C
V
Symbol Parameter Value Unit
V
V
V
T
dt/dv
1) VIN from 30 % t o 70% of V
Supply Voltage
CC
Input Voltage
I
Output Voltage 0 to V
O
Operating Temperature
op
Input Rise and Fall Time (note 1) (V
(V
CC
= 3.3 ± 0.3V)
CC
= 5.0 ± 0.5V)
CC
2 to 5.5 V
0 to 5.5 V
CC
-55 to 125 °C
0 to 100
0 to 20
2/11
V
ns/V
Table 6: DC Specifications
Symbol Parameter
V
V
V
High Level Input
IH
Voltage
V
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
I
Input Leakage
I
Current
I
Quiescent Supply
CC
Current
V
3.0 to
3.0 to
0 to
74VHC02
Test Condition Value
= 25°C
T
CC
(V)
A
Min. Typ. Max. Min. Max. Min. Max.
2.0 1.5 1.5 1.5
0.7V
5.5
CC
2.0 0.5 0.5 0.5
5.5
2.0
3.0
4.5
3.0
4.5
2.0
3.0
4.5
3.0
4.5
VI = 5.5V or GND
5.5
V
5.5
IO=-50 µA
I
=-50 µA
O
=-50 µA
I
O
=-4 mA
I
O
=-8 mA
I
O
IO=50 µA
=50 µA
I
O
=50 µA
I
O
=4 mA
I
O
=8 mA
I
O
= VCC or GND
I
1.9 2.0 1.9 1.9
2.9 3.0 2.9 2.9
4.4 4.5 4.4 4.4
2.58 2.48 2.4
3.94 3.8 3.7
0.3V
0.0 0.1 0.1 0.1
0.0 0.1 0.1 0.1
0.0 0.1 0.1 0.1
-40 to 85°C -55 to 125°C
CC
0.7V
CC
0.3V
CC
0.7V
CC
0.3V
0.36 0.44 0.55
0.36 0.44 0.55
± 0.1 ± 1 ± 1 µA
22020µA
CC
Unit
V
V
V
V
Table 7: AC Electrical Characteristics (Input t
Test Condition Value
Symbol Parameter
t
PLH tPHL
(*) Voltage range is 3.3V ± 0.3V
(**) Voltage range is 5.0V ±
Propagation Delay
Time
0.5V
V
3.3
3.3
5.0
5.0
C
CC
(V)
L
(pF)
(*)
15 5.6 7.9 1.0 9.5 1.0 9.5
(*)
50 8.1 11.4 1.0 13.0 1.0 13.0
(**)
15 3.6 5.5 1.0 6.5 1.0 6.5
(**)
50 4.5 7.5 1.0 8.5 1.0 8.5
= tf = 3ns)
r
= 25°C
T
A
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
Unit
ns
3/11
74VHC02
Table 8: Capacitive Characteristics
Test Condition Value
= 25°C
Symbol Parameter
T
A
Min. Typ. Max. Min. Max. Min. Max.
C
C
Input Capacitance
IN
Power Dissipation
PD
Capacitance
610 10 10pF
19 pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
Table 9: Dynamic Switching Characteristics
Test Condition Value
= 25°C
Symbol Parameter
V
V
Dynamic Low
OLP
Voltage Quiet
OLV
Output (note 1, 2)
Dynamic High
V
IHD
Voltage Input
(note 1, 3)
Dynamic Low
V
ILD
Voltage Input
(note 1, 3)
V
CC
(V)
5.0
= 50 pF
5.0 3.5 V
C
L
5.0 1.5 V
T
A
Min. Typ. Max. Min. Max. Min. Max.
0.3 0.8
-0.8 -0.3
-40 to 85°C -55 to 125°C
= CPD x VCC x fIN + ICC/4 (per gate)
CC(opr)
-40 to 85°C -55 to 125°C
Unit
Unit
V
1) Worst case package.
2) Max number of outp ut s defined as (n). Data inpu t s are driven 0V to 5.0V, (n-1) outputs switc hi ng and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (V
(V
), f=1MHz.
IHD
ILD
Figure 3: Test Circuit
CL =15/ 50pF or e qui valent (includes jig an d probe capacit ance)
= Z
R
of pulse generator (typically 50Ω)
T
OUT
), 0V to thresho l d
4/11