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74V2T00
DUAL 2-INPUT NAND GATE
■ HIGH SPEED: t
■ LOW POWER DISSIPATION:
I
=1µA(MAX.) at TA=25°C
CC
■ COMPATIBLE WITHTTL OUTPUTS:
V
=2V(MIN),VIL=0.8V(MAX)
IH
■ POWER DOWN PROTECTION ON INPUTS
= 5ns (TYP.) at VCC=5V
PD
SYMMETRICAL OUTPUT IMPEDANCE:
|I
|=IOL=8mA(MIN)
OH
■ BALANCED PROPAGATION DELAYS:
t
≅ t
PLH
PHL
■ OPERATING VOLTAGE RANGE:
V
(OPR) = 4.5V to 5.5V
CC
■ IMPROVED LATCH-UP IMMUNITY
DESCRIPTION
The 74V2T00 is an advanced high-speed CMOS
DUAL 2-INPUT NAND GATE fabricated with
sub-micron silicon gate and double-layer metal
wiring C
2
MOS technology.
SOT23-8L
ORDER CODES
PACKAGE T & R
SOT23-8L 74V2T00STR
The internal circuit i s composed of 3 stages
including buffer output, which provide high noise
immunity and stable output.
Power down protection is provided on all inputs
and 0 to 7V can be accepted on inputs with no
regard to the supply voltage. This device can be
usedto interface 5V to 3V.
PIN CONNECTION AND IEC LOGIC SYMBOLS
1/7June 2003
74V2T00
INPUT AND OUTPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
PIN N° SYMBOL NAME QND FUNCTION
1, 5 1A, 2A Data Input
2, 6 1B, 2B Data Input
7, 3 1Y, 2Y Data Output
4 GND Ground (0V)
8
TRUTH TABLE
ABY
LLH
LHH
HLH
HHL
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
V
V
I
I
OK
I
or I
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these condition is
not implied
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage -0.5 to VCC+ 0.5
O
DC Input Diode Current
IK
DC Output Diode Current
DC Output Current
O
DC VCCor Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
V
CC
Positive Supply Voltage
-0.5 to +7.0 V
-0.5 to +7.0 V
-20 mA
± 20 mA
± 25 mA
± 50 mA
-65 to +150 °C
300 °C
V
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Value Unit
V
V
V
T
dt/dv
1) VINfrom0.8V to 2V
2/7
Supply Voltage
CC
Input Voltage
I
Output Voltage 0 to V
O
Operating Temperature
op
Input Rise and Fall Time (note 1) (V
=5.0±0.5V)
CC
4.5 to 5.5 V
0 to 5.5 V
CC
-55 to 125 °C
0 to 20 ns/V
V
DC SPECIFICATION
Symbol Parameter
V
V
V
∆I
High Level Input
IH
Voltage
V
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
Input Leakage
I
I
Current
Quiescent Supply
I
CC
Current
Additional Worst
CC
Case Supply
Current
Test Condition Value
= 25°C
T
V
CC
(V)
4.5to
A
Min. Typ. Max. Min. Max. Min. Max.
222V
5.5
4.5to
5.5
4.5
4.5
4.5
4.5
0to
5.5
5.5
IO=-50 µA 4.4 4.5 4.4 4.4 V
=-8 mA 3.94 3.8 3.7
I
O
IO=50 µA 0.0 0.1 0.1 0.1 V
=8 mA 0.36 0.44 0.55
I
O
VI= 5.5V or GND
V
I=VCC
or GND
One Input at 3.4V,
other input at V
5.5
CC
or GND
74V2T00
-40 to 85°C -55 to 125°C
0.8 0.8 0.8 V
± 0.1 ± 1.0 ± 1.0 µA
11020µA
1.35 1.5 1.5 mA
Unit
AC ELECTRICAL CHARACTERISTICS (Input t
r=tf
=3ns)
Test Condition Value
Symbol Parameter
t
t
(*) Voltage range is5.0V ± 0.5V
Propagation Delay
PLH
Time
PHL
T
V
CC
(V)
C
(pF)
L
A
Min. Typ. Max. Min. Max. Min. Max.
5.0 (*) 15 5.0 7.0 1.0 8.0 1.0 8.0
5.0 (*) 50 5.5 8.0 1.0 9.0 1.0 9.0
-40 to 85°C -55 to 125°C
Unit
ns
= 25°C
CAPACITANCE CHARACTERISTICS
Test Condition Value
= 25°C
Symbol Parameter
T
A
Min. Typ. Max. Min. Max. Min. Max.
C
C
Input Capacitance
IN
Power Dissipation
PD
Capacitance
410 10 10pF
10.5 pF
(note 1)
1) CPDis defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average current can be obtained by the following equation. I
CC(opr)=CPDxVCCxfIN+ICC
-40 to 85°C -55 to 125°C
/2
Unit
3/7