ST 74LVX594 User Manual

74LVX594
LOW VOLTAGE CMOS 8 BIT SHIFT REGISTER
WITH OUTPUT REGISTER (5V TOLERANT INPUTS)
HIGH SPEED:
t
= 5.5ns (TYP.) at V
PD
5V TOLERANT INPUTS
V
=0.8V , VIH=2V at VCC=3V
IL
LOW POWER DISSIPATION:
I
= 4 µA (MAX.) at TA=25°C
CC
LOW NOISE:
V
= 0.3V (TYP.) at VCC = 3.3V
OLP
SYMMETRICAL OUTPUT IMPEDANCE:
|I
| = IOL = 4mA (MIN)
OH
BALANCED PROPAGATION DELAYS:
t
t
PLH
OPERATING VOLTAGE RANGE:
V
CC
PIN AND FUNCTION COMPATIBLE WITH
PHL
(OPR) = 2V to 3.6V (1.2V Data Retention)
CC
= 3.3V
74 SERIES 594
IMPROVED LATCH-UP IMMUN ITY
POWER DOWN PROTECTION ON INPUTS
DESCRIPTION
The 74LVX594 is a low voltage CMOS 8 BIT SHIFT REGISTER WITH OUTPUT REGISTER fabricated with sub-micron silicon gate and double-layer metal wiring C
2
MOS technology. It is ideal for low power, battery operated and low noise 3.3V applications. This device contains an 8-bit serial-in, parallel-out shift register that feeds an 8-bit D-type storage register. Separate clocks and direct overriding clear (SCLR,
RCLR) are provided for both the shift

Figure 1: Pin Connection An d I E C Logic Symbols

TSSOPSOP

Table 1: Order Codes

PACKAGE T & R
SOP 74LVX594MTR
TSSOP 74LVX594TTR
register and the storage register. A serial (QH’) output is provided for cascading purposes.
Both
the shift register and storage register use positive-edge triggered clocks. If the clocks are connected together, the shift register state will always be one clock pulse ahead of the storage register. Power down protection is provided on all inputs and 0 to 7V can be accepted on inputs with no regard to the supply voltage. This device can be used to interface 5V to 3V system. It combines high speed performance w ith the true CMOS low powe r consumption. All inputs and outputs are equipped with protection circuits against static disc harge, giving them 2KV ESD immunity and transient excess voltage.
Rev. 5
1/14August 2004
74LVX594

Figure 2: Input Equivalent Circuit Table 2: Pin Description

PIN N° SYMBOL NAME AND FUNCTION
1, 2, 3, 4, 5,
6, 7, 15
9 QH’ Serial Data Output 10 SCLR 11 SCK Shift Register Clock Input 13 RCLR
14 SI Serial Data Input 12 RCK Storage Register Clock
8 GND Ground (0V) 16 V

Table 3: Truth Table

QA to QH Data Outputs
Shift Register Clear Input
Storage Register Clear Input
Input
CC
Positive Supply Voltage
INPUTS
SI SCK SCLR RCK RCLR
X X L X X SHIFT REGISTER IS CLEAR
FIRST STAGE OF SHIFT REGISTER GOES LOW
LHXX
HHXX
L H X X SHIFT REGISTER STATE IS NOT CHANGED X X X X L STORAGE REGISTER IS CLEARED
XXX H X X X H STORAGE REGISTER STATE IS NOT CHANGED
X : Don’t Care
OTHER STAGES STORE THE DATA OF PREVI-
OUS STAGE, RESPECTIVELY
FIRST STAGE OF SHIFT REGISTER GOES HIGH
OTHER STAGES STORE THE DATA OF PREVI-
OUS STAGE, RESPECTIVELY
SHIFT REGISTER DATA IS STORED IN THE
OUTPUTS
STORAGE REGISTER
2/14

Figure 3: Logic Diagram

74LVX594
This logic diagram has not be used to estimate propagation delays
3/14
74LVX594

Figure 4: Timing Chart

Table 4: Absolute Maximum Ratings

Symbol Parameter Value Unit
V
V
V
I
I
OK
I
or I
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is not implied.
4/14
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage -0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current DC Output Current
O
DC VCC or Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
-0.5 to +7.0 V
-0.5 to +7.0 V V
- 20 mA
± 20 mA ± 25 mA ± 50 mA
-65 to +150 °C
300 °C
74LVX594

Table 5: Recommended Operating Conditions

Symbol Parameter Value Unit
V
V V T
dt/dv
1) Truth T abl e guarante ed: 1.2V to 3.6V
2) V
from 0.8V to 2.0V
IN

Table 6: DC Specifications

Symbol Parameter
V
IH
V
IL
V
OH
V
OL
I
I
I
off
I
CC
Supply Voltage (note 1)
CC
Input Voltage
I
Output Voltage 0 to V
O
Operating Temperature
op
Input Rise and Fall Time (note 2) (V
= 3.3V)
CC
Test Condition Value
= 25°C
T
A
Min. Typ. Max. Min. Max. Min. Max.
High Level Input
V
CC
(V)
2.0 1.5 1.5 1.5
Voltage
3.6 2.4 2.4 2.4
Low Level Input
2.0 0.5 0.5 0.5
Voltage
3.6 0.8 0.8 0.8
High Level Output Voltage
Low Level Output Voltage
Input Leakage Current
Power Off Leakage Current
Quiescent Supply Current
2.0
3.0
2.0
3.0
3.6
0
3.6
IO=-50 µA I
=-50 µA
O
=-4 mA
I
O
=50 µA
I
O
=50 µA
I
O
=4 mA
I
O
= 5V or GND
V
I
= 0 to 5V
V
I
= VCC or GND
V
I
1.9 2.0 1.9 1.9
2.9 3.0 2.9 2.9
2.58 2.48 2.4
0.0 0.1 0.1 0.1
0.0 0.1 0.1 0.1
0.36 0.44 0.55
± 0.1 ± 1 ± 1 µA
± 0.1 ± 5 ± 5 µA
44040µA
2 to 3.6 V 0 to 5.5 V
CC
-55 to 125 °C 0 to 100 ns/V
-40 to 85°C -55 to 125°C
V
Unit
V3.0 2.0 2.0 2.0
V3.0 0.8 0.8 0.8
V3.0
V3.0

Table 7: Dynamic Switching Characteristics

Test Condition Value
= 25°C
Symbol Parameter
V
CC
(V)
V V
V
V
1) Worst case package.
2) Max number of outp ut s defined as (n). Data inp ut s are driven 0V to 3.3V, (n-1) outputs switc hi ng and one out put at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (V (V
IHD
Dynamic Low Voltage
OLP
Quiet Output (note 1, 2)
OLV
Dynamic High Voltage
IHD
Input (note 1, 3) Dynamic Low Voltage
ILD
Input (note 1, 3)
), f=1MHz.
3.3
3.3 2
= 50 pF
C
L
3.3 0.8
T
A
Min. Typ. Max. Min. Max. Min. Max.
0.3 0.5
-0.5 -0.3
-40 to 85°C -55 to 125°C
ILD
Unit
V
), 0V to thresho l d
5/14
Loading...
+ 9 hidden pages