74LVX273
LOW VOLTAGE CMOS OCTAL D-TYPE FLIP-FLOP
WITH CLEAR (5V TOLERANT INPUTS)
■ HIGH SPEED:
f
= 150 MHz (TYP.) at VCC = 3.3V
MAX
■ 5V TOLERANT INPUTS
■ POWER-DOWN PROTECTION ON INPUTS
■ INPUT VOLTAGE LEVEL:
V
= 0.8V, VIH = 2V at VCC =3V
IL
■ LOW POWER DISSIPATION:
I
= 4 µA (MAX.) at TA=25°C
CC
■ LOW NOISE:
V
= 0.3V (TYP.) at VCC =3.3V
OLP
■ SYMMETRICAL OUTPUT IMPEDANCE:
|I
| = IOL = 4 mA (MIN) at VCC =3V
OH
■ BALANCED PROPAGATION DELAYS:
t
≅ t
PLH
PHL
■ OPERATING VOL TAGE R AN GE:
V
(OPR) = 2V to 3.6V (1.2V Data Retention)
CC
■ PIN AND FUNCTION COMPATIBLE WITH
74 SERIES 273
■ IMPROVED LATCH-UP IMMU N ITY
DESCRIPTION
The 74LVX273 is a low voltage CMOS OCTAL
D-TYPE FLIP-FLOP WITH CLEAR fabricated with
sub-micron silicon gate and double-layer metal
wiring C
2
MOS technology. It is ideal for low
power, battery operated and low noise 3.3V
applications.
Information signals applied to D inputs are
TSSOPSOP
Table 1: Order Codes
PACKAGE T & R
SOP 74LVX273MTR
TSSOP 74LVX273TTR
transferred to the Q o utputs on the positive going
edge of the clock pulse.
When the CLE AR
input is held low, the Q outputs
are held low independently of the other inputs.
Power down protection is provided on all inputs
and 0 to 7V can be accepted on inputs with no
regard to the supply voltage.
This device can be used to interface 5V to 3V. It
combines high speed performance with the true
CMOS low power consumption.
All inputs and outputs are equipped with
protection circuits against static disc harge, giving
them 2KV ESD immunity and transient excess
voltage.
Figure 1: Pin Con nection An d I E C Logic Symb ols
Rev. 3
1/12August 2004
74LVX273
Figure 2: Input Equivalent Circuit Table 2: Pin Description
PIN N° SYMBOL NAME AND FUNCTION
Table 3: Truth Tabl e
1CLEAR
2, 5, 6, 9, 12,
15, 16,19
3, 4, 7, 8, 13,
14, 17, 18
1 1 CLOCK Clock Input (LOW-to-HIGH
10 GND Ground (0V)
20 V
Q0 to Q7 Flip-Flop Outputs
D0 to D7 Data Inputs
CC
Asynchronous Master
Reset (Active LOW)
Edge Triggered)
Positive Supply Voltage
CLEAR
L X X L CLEAR
HL L
HH H
HX
X : Don’t Care
Figure 3: Logic Diagram
INPUTS OUTPUT
DBQ
Q
n
FUNCTION
NO CHANGE
This logi c di agram has not be used to est i m ate propagation delays
2/12
74LVX273
Table 4: Absolute Maximum Ratings
Symbol Parameter Value Unit
V
V
V
I
I
OK
I
or I
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
Table 5: Recommended Operating Conditions
Symbol Parameter Value Unit
V
V
V
T
dt/dv
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage -0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current
DC Output Current
O
DC VCC or Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
Supply Voltage (note 1)
CC
Input Voltage
I
Output Voltage 0 to V
O
Operating Temperature
op
Input Rise and Fall Time (note 2) (V
CC
= 3V)
-0.5 to +7.0 V
-0.5 to +7.0 V
- 20 mA
± 20 mA
± 25 mA
± 50 mA
-65 to +150 °C
300 °C
2 to 3.6 V
0 to 5.5 V
CC
-55 to 125 °C
0 to 100 ns/V
V
V
1) Truth T abl e guarante ed: 1.2V to 3.6V
from 0.8V to 2.0V
2) V
IN
Table 6: DC Specifications
Symbol Parameter
V
V
V
High Level Input
IH
Voltage
V
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
I
Input Leakage
I
Current
I
Quiescent Supply
CC
Current
Test Condition Value
V
(V)
CC
T
A
Min. Typ. Max. Min. Max. Min. Max.
-40 to 85°C -55 to 125°C
= 25°C
2.0 1.5 1.5 1.5
2.0 2.0 2.0
3.6
2.4 2.4 2.4
2.0 0.5 0.5 0.5
3.6 0.8 0.8 0.8
=-50 µA
2.0
3.0
2.0
3.0
3.6
3.6
I
O
=-50 µA
I
O
I
=-4 mA
O
IO=50 µA
=50 µA
I
O
=4 mA
I
O
= 5V or GND
V
I
= VCC or GND
V
I
1.9 2.0 1.9 1.9
2.9 3.0 2.9 2.9
2.58 2.48 2.4
0.0 0.1 0.1 0.1
0.0 0.1 0.1 0.1
0.36 0.44 0.55
± 0.1 ± 1 ± 1 µA
44040µA
Unit
V3.0
V3.0 0.8 0.8 0.8
V3.0
V3.0
3/12
74LVX273
Table 7: Dynamic Switching Characteristics
Test Condition Value
= 25°C
Symbol Parameter
V
CC
(V)
V
V
V
V
1) Worst case package.
2) Max number of outp ut s defined as (n). Data inp ut s are driven 0V to 3.3V, (n-1) outputs switc hi ng and one out put at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (V
(V
IHD
Dynamic Low Voltage
OLP
Quiet Output (note 1, 2)
OLV
Dynamic High Voltage
IHD
Input (note 1, 3)
Dynamic Low Voltage
ILD
Input (note 1, 3)
), f=1MHz.
3.3
= 50 pF
C
3.3 2.0
L
3.3 0.8
T
A
Min. Typ. Max. Min. Max. Min. Max.
0.3 0.8
-0.8 -0.3
Table 8: AC Electrical Characteristics (Input tr = tf = 3ns)
Test Condition Value
= 25°C
Symbol Parameter
t
Propagation Delay
PLH
t
t
t
t
f
t
OSLH
t
OSHL
Time
PHL
CK to Q
Propagation Delay
PHL
Time
CLEAR
CLEAR pulse Width,
W(L)
HIGH
CLOCK pulse Width,
t
W
HIGH
Setup Time Q to
t
S
CLOCK HIGH or LOW
Hold Time Q to
t
h
CLOCK HIGH or LOW
Recovery Time
REM
CLEAR
Maximum Clock
MAX
Frequency
Output to Output
Skew Time (note 1,2)
to Q
to Q
C
V
CC
(V)
L
(pF)
2.7 15 9.0 16.9 1.0 20.5 1.0 22.0
2.7 50 11.5 20.4 1.0 24.0 1.0 25.5
(*)
3.3
3.3
3.3
3.3
5.0
5.0
3.3
3.3
3.3
3.3
3.3
15 7.1 11.0 1.0 13.0 1.0 14.5
(*)
50 9.6 14.5 1.0 16.5 1.0 18.0
(*)
15 9.3 17.6 1.0 20.5 1.0 22.0
(*)
50 11.8 21.1 1.0 24.0 1.0 25.5
(**)
15 7.3 11.5 1.0 13.5 1.0 15.5
(**)
50 9.8 15.0 1.0 17.0 1.0 18.0
2.7
50
(*)
2.7
50
(*)
2.7
50
(*)
2.7
50
(*)
2.7
50
(*)
2.7 15 55 110 55 50
2.750 45604035
(*)
3.3
3.3
15 95 150 80 75
(*)
50 60 90 55 50
2.7 50 0.5 1.0 1.5 1.5
(*)
3.3
50 0.5 1.0 1.5 1.5
T
A
Min. Typ. Max. Min. Max. Min. Max.
-40 to 85°C -55 to 125°C
ILD
-40 to 85°C -55 to 125°C
5.0 6.0 6.0
5.0 5.0 5.0
5.5 6.5 6.5
5.0 5.0 5.0
5.5 6.5 6.5
4.5 4.5 4.5
1.0 1.0 1.0
1.0 1.0 1.0
2.5 2.5 2.5
2.0 2.0 2.0
Unit
V
), 0V to thresho l d
Unit
ns
ns
ns
ns
ns
ns
ns
MHz
ns
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switching in the sa m e di rection, ei ther HIGH or LOW
2) Param eter guaran teed by design
(*) Voltage range is 3.3V ±
0.3V
4/12