The 74LVC374A is an advanced high-speed
CMOS OCT AL D- TYP E FL I P FL O P wi th 3 S TAT E
OUTPUTS NON INVERTING fabricated with
sub-micron silicon gate and double-layer metal
wiring C
2
MOS technology.
These 8 bit D-Type latch are controlled by a clock
input (CK) and an output enable input (OE
).
On the positive transition of the clock, the Q
outputs will be set to the logic state that were
setup at the D inputs.
Figure 1: Pin C onnection And I EC Logic Symbol s
TSSOPSOP
Table 1: Order Codes
PACKAGET & R
SOP74LVC374AMTR
TSSOP74LVC374ATTR
While the (OE
) input is low, the 8 outputs will be in
a normal logic state (high or low logic level) and
while high level the outputs will be in a high
impedance state.
The Output control does not affect the internal
operation of flip flops; that is, the old data can be
retained or the new data can be entered even
while the outputs are off. Power down protection is
provided on all inputs and 0 to 7V can be accepted
on inputs with no regard to the supply voltage.
This device can be used to interface 5V to 3V.
All inputs and outputs are equipped with
protection circuits against static disc harge, giving
them 2KV ESD immunity and transient excess
voltage.
Rev. 2
1/14July 2004
74LVC374A
Figure 2: Input An d Output Equival e n t Ci rcui t
Table 2: Pin Description
PIN N°SYMBOLNAME AND FUNCTION
1OE3 State Output Enable Input (Active LOW)
2, 5, 6, 9, 12, 15, 16,19Q0 to Q7 3-State Outputs
3, 4, 7, 8, 13, 14, 17, 18D0 to D7Data Inputs
11CKClock
10GNDGround (0V)
20V
CC
Positive Supply Voltage
Table 3: Truth Table
OE
HXXZ
LXNO CHANGE
LLL
LHH
X : Don’t Care
Z :High Imp edance
INPUTSOUTPUT
CKDQ
2/14
74LVC374A
Table 4: Absolute Maximum Ratings
SymbolParameterValueUnit
V
V
V
V
I
I
OK
I
or I
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
absolute maximum rating must be observed
1) I
O
2) V
< GND
O
Table 5: Recommended Operating Conditions
SymbolParameterValueUnit
V
V
V
V
I
OH
I
OH
I
OH
I
OH
T
dt/dvInput Rise and Fall Time (note 2)0 to 10ns/V
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage (VCC = 0V)
O
DC Output Voltage (High or Low State) (note 1)-0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current (note 2)
DC Output Current
O
DC VCC or Ground Current per Supply Pin
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
Supply Voltage (note 1)
CC
Input Voltage
I
Output Voltage (VCC = 0V)
O
Output Voltage (High or Low State)0 to V
O
, I
High or Low Level Output Current (VCC = 3.0 to 3.6V)
OL
, I
High or Low Level Output Current (VCC = 2.7 to 3.0V)
OL
, I
High or Low Level Output Current (VCC = 2.3 to 2.7V)
OL
, I
High or Low Level Output Current (VCC = 1.65 to 2.3V)
OL
Operating Temperature
op
-0.5 to +7.0V
-0.5 to +7.0V
-0.5 to +7.0V
V
- 50mA
- 50mA
± 50mA
± 100mA
-65 to +150°C
300°C
1.65 to 3.6V
0 to 5.5V
0 to 5.5V
CC
V
± 24mA
± 12mA
± 8mA
± 4mA
-55 to 125°C
1) Truth T abl e guarante ed: 1.2V to 3.6V
2) V
from 0.8V to 2V at VCC = 3.0V
I
3/14
74LVC374A
Table 6: DC Specifications
Test ConditionValue
SymbolParameter
V
V
V
V
I
I
OZ
High Level Input
IH
Voltage
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
Input Leakage
I
I
Current
Power Off Leakage
off
Current
High Impedance
Output Leakage
Current
I
CC
∆I
Quiescent Supply
Current
ICC incr. per Input
CC
V
CC
(V)
1.65 to 1.95
-40 to 85 °C-55 to 125 °C
Min.Max.Min.Max.
0.65V
CC
0.65V
CC
2.3 to 2.71.71.7
2.7 to 3.622
1.65 to 1.95
0.35V
CC
0.35V
2.3 to 2.70.70.7
2.7 to 3.60.80.8
=-100 µAVCC-0.2VCC-0.2
1.65 to 3.6
1.65
2.3
2.7
3.0
3.0
1.65 to 3.6
1.65
2.3
2.7
3.0
3.6
0
3.6VI = VIH or VIL
3.6
2.7 to 3.6
I
O
=-4 mA
I
O
I
=-8 mA
O
I
=-12 mA
O
=-18 mA
I
O
=-24 mA
I
O
IO=100 µA
I
=4 mA
O
=8 mA
I
O
=12 mA
I
O
=24 mA
I
O
= 0 to 5.5V
V
I
or VO = 5.5V
V
I
V
= 0 to 5.5V
O
VI = VCC or GND
or VO = 3.6 to
V
I
5.5V
VIH = VCC-0.6V
1.21.2
1.71.7
2.22.2
2.42.4
2.22.2
0.20.2
0.450.45
0.70.7
0.40.4
0.550.55
± 5± 5µA
1010µA
± 10± 10µA
1010
± 10± 10
500500µA
Unit
V
CC
V
V
V
µA
Table 7: Dynamic Switching Characteristics
Test ConditionValue
= 25 °C
SymbolParameter
V
CC
(V)
V
OLP
V
OLV
1) Number of output de fined as "n". M easured with "n -1" outputs switching fr om HI GH to LOW or LOW to HIGH. The rem ai ning output is
measur ed i n the LOW state.
Dynamic Low Level Quiet
Output (note 1)
3.3
= 50pF
C
L
V
= 0V, VIH = 3.3V
IL
4/14
T
A
Min.Typ.Max.
0.8
-0.8
Unit
V
Table 8: AC Electrical Characteristics
Test ConditionValue
74LVC374A
SymbolParameter
t
PLH tPHL
t
PLH tPHL
t
PZL tPZH
t
PLZ tPHZ
t
t
t
Propagation Delay
Time D to Q
Propagation Delay
Time LE to Q
Output Enable Time 1.65 to 1.953010002.0TBDTBD
Output Disable Time 1.65 to 1.953010002.0TBDTBD
LE Pulse Width
W
HIGH
Setup Time D to LE
s
(HIGH to LOW)
Hold Time D to
h
CLOCK, HIGH or
LOW
t
OSLH
t
OSHL
Output To Output
Skew Time (note1,
2)
-40 to 85 °C-55 to 125 °C
V
(V)
CC
C
(pF)
R
L
(Ω)
= t
t
L
s
r
(ns)
Min.Max.Min.Max.
1.65 to 1.953010002.0TBDTBD
2.3 to 2.7305002.0TBDTBD
2.7505002.51.57.81.59.4
3.0 to 3.6505002.516.818.2
1.65 to 1.953010002.0TBDTBD
2.3 to 2.7305002.0TBDTBD
2.7505002.51.57.81.59.4
3.0 to 3.6505002.516.818.2
2.3 to 2.7305002.0TBDTBD
2.7505002.518.7110.4
3.0 to 3.6505002.517.719.2
2.3 to 2.7305002.0TBDTBD
2.7505002.527.629.1
3.0 to 3.6505002.527.028.4
1.65 to 1.953010002.0TBDTBD
2.3 to 2.7305002.0TBDTBD
2.7505002.53.33.3
3.0 to 3.6505002.53.33.3
1.65 to 1.953010002.0TBDTDB
2.3 to 2.7305002.0TBDTBD
2.7505002.522
3.0 to 3.6505002.522
1.65 to 1.953010002.0TBDTBD
2.3 to 2.7305002.0TBDTBD
2.7505002.51.51.5
3.0 to 3.6505002.51.51.5
2.7 to 3.611ns
Unit
ns
ns
ns
ns
ns
ns
ns
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switching in the sa me directio n, either HIGH or LOW (t
2) Param eter guaran teed by design
OSLH
= | t
PLHm
- t
PLHn
|, t
OSHL
= | t
PHLm
- t
PHLn
|
Table 9: Capacitive Characteristics
Test ConditionValue
= 25 °C
SymbolParameter
V
CC
(V)
C
C
Input Capacitance
IN
Power Dissipation Capacitance
PD
(note 1)
1.8fIN = 10MHz28
3.334
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
CC(opr)
T
A
Min.Typ.Max.
4pF
= CPD x VCC x fIN + ICC/n (per c ircuit )
Unit
pF2.530
5/14
74LVC374A
Figure 3: Test Circuit
RT = Z
of pulse generator (typically 50Ω)
OUT
Table 10: Test Circuit And Waveform Symbol Value
Symbol
C
L
R
L = R1
V
S
V
IH
V
M
V
OH
V
X
V
Y
= t
t
r
r
1.65 to 1.95V2.3 to 2.7V2.7V3.0 to 3.6V
30pF30pF50pF50pF
1000Ω500Ω500Ω500Ω
2 x V
V
CC
CC
2 x V
V
CC
CC
VCC/2VCC/21.5V1.5V
V
CC
V
+ 0.15VV
OL
V
- 0.15VV
OH
V
CC
+ 0.15VV
OL
- 0.15VV
OH
<2.0ns<2.0ns<2.5ns<2.5ns
V
CC
6V7V
2.7V3.0V
3.0V3.5V
+ 0.3VV
OL
- 0.3VV
OH
OL
OH
+ 0.3V
- 0.3V
6/14
74LVC374A
Figure 4: Waveform - Propagation Delay, Setup And Hold Times (f=1MHz; 50% duty cycle)
Figure 5: Waveform - Output Enable And Disable Times (f=1MHz; 50% duty cycle)
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