Features
1N6640U
Aerospace 0.3 A - 75 V switching diode
■ Surface mount hermetic package
■ High thermal conductivity materials
■ Very small conduction losses
■ Negligible switching losses
■ Extremely fast switching
■ Low forward voltage drop
■ Target radiation qualification:
A
A
LCC-2D
K
K
– 150 krad (Si) low dose rate
– 3 Mrad high dose rate
■ Package weight: 0.12 g
Description
Packaged in LCC-2D this device is intended for
use in low voltage, high frequency inverters, free
wheeling, polarity protection and other aerospace
applications.
Table 1. Device summary
Order code
1N6640UD1 -
1N6640U02D 5101/027/xx Flight part Target
1. Contact ST sales office for information about the specific conditions for products in die form and gold plated version.
ESCC detailed
specification
(1)
Quality level EPPL I
Engineering
model
V
F(AV)
-
0.3 A 75 V 175 °C 1.2 V
RRM
T
j(max)
V
F (max)
September 2011 Doc ID 16971 Rev 2 1/7
www.st.com
7
Characteristics 1N6640U
1 Characteristics
Table 2. Absolute ratings (limiting values)
Symbol Parameter Value Unit
V
RRM
I
F(RMS)
I
F(AV)
I
FSM
T
stg
T
T
sol
1. For all variants at Tc ≥ +155 °C per diode, derate linearly to 0A at +175 °C.
2. Maximum duration 5 s. The same package must not be re-soldered until 3 minutes have elapsed.
Repetitive peak reverse voltage 75 V
Forward rms current 0.5 A
Average forward rectified current
Forward surge current
Storage temperature range -65 to +175 °C
Operating junction temperature range -65 to +175 °C
j
Maximum soldering temperature
(1)
(2)
t
= 8.3 ms sinusoidal,
p
≤ 25 °C
t
amb
300 mA
2A
245 °C
Table 3. Thermal resistance
Symbol Parameter Value Unit
Junction to case
R
th (j-c)
R
Junction to ambient 280
th (j-a)
1. Package mounted on infinite heatsink.
Table 4. Static electrical characteristics
Symbol Parameter Tests conditions Min. Typ. Max. Unit
(1)
V
BR
IR
V
F
1. Pulse test: tp = 10 ms, δ < 2%
2. Pulse test: tp = 680 µs, δ < 2%
Breakdown voltage Tj = 25 °C IR = 10 µA 75 - - V
(1)
Reverse current
(2)
Forward voltage
(1)
60
= 25 °C
T
j
= 150 °C - - 30 µA
T
j
= 25 °C IF = 1 mA 540 - 630
T
j
T
= 25 °C IF = 50 mA 760 - 890
j
= 25 °C IF = 100 mA 820 - 980
T
j
= 25 °C IF = 200 mA 870 - 1100
T
j
= -55 °C IF = 200 mA - - 1200
T
j
V
R
= 50 V
- - 40 nA
°C/W
mV
To evaluate the conduction losses use the following equation:
P = 0.74 x I
2/7 Doc ID 16971 Rev 2
F(AV)
+ 1.00 x I
F2(RMS )
1N6640U Characteristics
Table 5. Dynamic characteristics
Symbol Parameter
IF = IR = 10 mA - - 9
t
V
t
FR
C
Reverse recovery time
rr
Forward recovery voltage IFM = 200 mA - - 5 V
FP
= 1 A, Vr = 30 V, dI/dt = -15 A/µs - - 20
I
F
Forward recovery time IFM = 200 mA - - 20 ns
Diode capacitance VR = 0 V, V = 50 mV, F = 1 MHz - - 3 pF
j
Figure 1. Forward voltage drop versus
forward current (typical values)
I(A
FM
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
Tj=150 °CTj=150 °C
Tj=25 °CTj=25 °C
Tj=-55 °C
V (V)
FM
Test conditions
Min. Typ. Max. Unit
Figure 2. Forward voltage drop versus
forward current (maximum values)
I (A)
FM
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
Tj=150 °CTj=150 °C
Tj=25 °CTj=25 °C
Tj=-55 °C
V (V)
FM
ns
Doc ID 16971 Rev 2 3/7