The SPT7921 A/D converter is the industry's first 12-bit
monolithic analog-to-digital converter capable of sample
rates greater than 20 MSPS. On board input buffer and
track/hold function assures excellent dynamic performance without the need for external components. Drive
requirement problems are minimized with an input capacitance of only 5 pF.
Logic inputs and outputs are TTL. An overrange output signal
is provided to indicate overflow conditions. Output data
APPLICATIONS
• Radar Receivers
• Professional Video
• Instrumentation
• Medical Imaging
• Electronic Warfare
• Digital Communications
• Digital Spectrum Analyzers
• Electro-Optics
format is straight binary. Power dissipation is very low at only
1.1 watts with power supply voltages of +5.0 and -5.2 volts.
The SPT7921 also provides a wide input voltage range of
±2.0 volts.
The SPT7921 is available in 32-lead ceramic sidebrazed DIP
and 44-lead cerquad packages over the commercial temperature range. Consult the factory for availability of die,
military temperature and /883 versions.
BLOCK DIAGRAM
V
Input
IN
Buffer
Analog Gain
Compression
Processor
Signal Processing Technologies, Inc.
4-Bit Flash
Converter
Track-and-Hold
Amplifiers
Asynchronous
SAR
4
Error
Correction,
Decoding
and
Output TTL
Drivers
8
4755 Forge Road, Colorado Springs, Colorado 80907, USA
Phone: (719) 528-2300 FAX: (719) 528-2370
12
Digital
Output
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages
VCC...........................................................................+6 V
Output
Digital Outputs .............................................. 0 to -30 mA
VEE............................................................................ -6 V
Temperature
Input Voltages
Analog Input................................................ VFB≤VIN≤V
VFT, VFB. ....................................................+3.0 V, -3.0 V
Reference Ladder Current .....................................12 mA
CLK IN .......................................................................V
FT
CC
Operating Temperature ................................. 0 to +70 °C
Junction Temperature .........................................+175 °C
Lead Temperature, (soldering 10 seconds)........+300 °C
Storage Temperature................................ -65 to +150 °C
Note:1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal
applied conditions in typical applications.
ELECTRICAL SPECIFICATIONS
TA=T
unless otherwise specified.
PARAMETERSCONDITIONSLEVELMINTYPMAXUNITS
Resolution12Bits
DC Accuracy+25 °C
Analog Inputf
Reference Inputf
Timing Characteristics
Dynamic Performance
to T
MIN
Integral Nonlinearity± Full ScaleV±2.0LSB
Differential Nonlinearity100 kHz Sample RateV±0.8LSB
No Missing CodesVIGuaranteed
Input Voltage RangeVI±2.0V
Input Bias CurrentTA=+25 °CI3060µA
Input ResistanceT
Input CapacitanceV5pF
Input Bandwidth3 dB Small SignalV120MHz
+FS ErrorV±5.0LSB
Power DissipationVI1.11.3W
Power Supply Rejection 5 V ±0.25 V, -5.2 ±0.25 VV1.0LSB
Typical thermal impedances (unsoldered, in free air):
32L sidebrazed DIP:
θ
= +50 °C/W
ja
44L cerquad:
θ
= +78 °C/W
ja
at 1 M/s airflow = +58 °C/W
θ
ja
θ
= +3.3 °C/W
jc
1
fIN = 1 MHz.
2
fIN = 3.58 and 4.35 MHz.
SPT
SPT7921
33/10/97
TEST LEVEL CODES
TEST LEVEL
TEST PROCEDURE
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
Figure 1A: Timing Diagram
N
tt
pwHpwL
II
III
IV
V
VI
I
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
N+1
N+2
CLK
t
d
OUTPUT
DATA
N-2N-1
DATA VALID
N
DATA VALID
N+1
Figure 1B: Single Event Clock
CLK
t
d
OUTPUT
DATA
DATA VALID
Table I - Timing Parameters
PARAMETERSDESCRIPTIONMINTYPMAXUNITS
t
d
t
pwH
CLK to Data Valid Prop Delay-1418ns
CLK High Pulse Width20-300ns
t
pwL
SPT
CLK Low Pulse Width20--ns
SPT7921
43/10/97
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