SPT SPT7910SCJ, SPT7910SCU Datasheet

SPT7910
12-BIT, 10 MSPS, ECL, A/D CONVERTER
FEATURES
Monolithic
• 12-Bit 10 MSPS Converter
• 67 dB SNR @ 500 kHz Input
• On-Chip Track/Hold
• Bipolar ±2.0 V Analog Input
• Low Power (1.4 W Typical)
5 pF Input Capacitance
• ECL Outputs
GENERAL DESCRIPTION
The SPT7910 analog-to-digital converter is industry's first 12-bit monolithic analog-to-digital converter capable of sample rates greater than 10 MSPS. On board input buffer and track/ hold function assures excellent dynamic performance with­out the need for external components. Drive requirement problems are minimized with an input capacitance of only 5 pF.
Inputs and outputs are ECL to provide a higher level of noise immunity in high speed system applications. An overrange
APPLICATIONS
• Radar Receivers
• Professional Video
• Instrumentation
• Medical Imaging
• Electronic Warfare
• Digital Communications
• Digital Spectrum Analyzers
• Electro-Optics
output signal is provided to indicate overflow conditions. Output data format is straight binary. Power dissipation is very low at only 1.4 watts with power supply voltages of +5.0 and -5.2 volts. The SPT7910 also provides a wide input voltage range of ±2.0 volts.
The SPT7910 is available in a 32-lead ceramic sidebrazed DIP package and in die form. A commercial temperature range of 0 to +70 °C is currently offered.
BLOCK DIAGRAM
V
IN
INPUT
BUFFER
ANALOG GAIN
COMPRESSION
PROCESSOR
Signal Processing Technologies, Inc.
4-BIT FLASH
CONVERTER
TRACK AND HOLD
AMPLIFIERS
ASYNCHRONOUS
SAR
4
CORRECTION,
OUTPUT ECL
8
4755 Forge Road, Colorado Springs, Colorado 80907, USA
Phone: (719) 528-2300 FAX: (719) 528-2370
ERROR
DECODING
AND
DRIVERS
DIGITAL
OUTPUT
12
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages
VCC............................................................... -0.3 to +6 V
Output
Digital Outputs .............................................. 0 to -30 mA
VEE............................................................... +0.3 to -6 V
Temperature
Input Voltages
Analog Input............................................... VFB≤VIN≤V
VFT, VFB. ................................................... +3.0 V, -3.0 V
Reference Ladder Current .....................................12 mA
FT
Operating Temperature ................................... 0 to 70 °C
Junction Temperature ........................................... 175 °C
Lead Temperature, (soldering 10 seconds).......... 300 °C
Storage Temperature................................-65 to +150 °C
Note: 1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal
applied conditions in typical applications.
ELECTRICAL SPECIFICATIONS
TA=T unless otherwise specified.
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS
Resolution 12 Bits DC Accuracy (+25 °C)
Analog Input
Reference Input
Timing Characteristics
Dynamic Performance
to T
MIN
Integral Nonlinearity ± Full Scale V ±2.0 LSB Differential Nonlinearity 250 kHz Sample Rate V ±0.8 LSB No Missing Codes VI Guaranteed
Input Voltage Range VI ±2.0 V Input Bias Current VI 30 60 µA Input Resistance VIN=0 V VI 100 300 k Input Capacitance V 5 pF Input Bandwidth 3 dB Small Signal V 120 MHz +FS Error V ±5.0 LSB
-FS Error V ±5.0 LSB
Reference Ladder Resistance VI 500 800 Reference Ladder Tempco V 0.8 /°C
Maximum Conversion Rate VI 10 MHz Overvoltage Recovery Time V 20 ns Pipeline Delay (Latency) IV 1 Clock Cycle Output Delay V 5 ns Aperture Delay Time V 1 ns Aperture Jitter Time V 5 ps-RMS
Effective Number of Bits fIN=500 kHz 10.2 Bits fIN=1.0 MHz 10.0 Bits fIN=3.58 MHz 9.5 Bits
, VCC=+5.0 V, VEE=-5.2 V, DVCC=+5.0 V, VIN=±2.0 V, VSB=-2.0 V, VST=+2.0 V, f
MAX
TEST TEST SPT7910
10 MHz, 50% clock duty cycle,
CLK=
SPT
SPT7910
2 3/11/97
ELECTRICAL SPECIFICATIONS
TA=T
MIN
to T
, VCC=+5.0 V, VEE=-5.2 V, DVCC=+5.0 V, VIN=±2.0 V, VSB=-2.0 V, VST=+2.0 V, f
MAX
10 MHz, 50% clock duty cycle,
CLK=
unless otherwise specified.
TEST TEST SPT7910
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS
Dynamic Performance
Signal-To-Noise Ratio (without Harmonics) f
=500 kHz +25 °C I 64 67 dB
IN
to T
T
MIN
=1 MHz +25 °C I 64 66 dB
f
IN
T
MIN
=3.58 MHz +25 °C I 62 64 dB
f
IN
T
MIN
Harmonic Distortion
1
to T
to T
MAX
MAX
MAX
IV 58 61 dB
IV 58 60 dB
IV 58 60 dB
fIN=500 kHz +25 °C I 63 66 dB
to T
T
MIN
=1.0 MHz +25 °C I 63 65 dB
f
IN
T
MIN
=3.58 MHz +25 °C I 59 61 dB
f
IN
T
MIN
to T
to T
MAX
MAX
MAX
IV 59 62 dB
IV 59 61 dB
IV 57 59 dB
Signal-to-Noise and Distortion
=500 kHz +25 °C I 60 63 dB
f
IN
T
to T
MIN
=1.0 MHz +25 °C I 60 62 dB
f
IN
T
MIN
=3.58 MHz +25 °C I 57 59 dB
f
IN
T
MIN
Spurious Free Dynamic Range Differential Phase Differential Gain
3
3
2
+25 °C V 74 dB +25 °C V 0.2 Degree +25 °C V 0.7 %
to T
to T
MAX
MAX
MAX
IV 55 58 dB
IV 55 57 dB
IV 54 56 dB
Digital Inputs
Logic 1 Voltage VI -1.1 V Logic 0 Voltage VI -1.5 V Maximum Input Current Low VI -500 ±200 +750 µA Maximum Input Current High VI -500 ±300 +750 µA Pulse Width Low (CLK) IV 30 ns Pulse Width High (CLK) IV 30 300 ns
Digital Outputs
Logic 1 Voltage 50 to -2 V VI -1.1 -0.8 V Logic 0 Voltage 50 to -2 V VI -1.8 -1.5 V
Power Supply Requirements
Voltages V
Currents I
-V
-I
CC
EE
CC
EE
IV +4.75 +5.25 V IV -4.95 -5.45 V VI 150 190 mA
VI 125 160 mA Power Dissipation Outputs Open VI 1.4 1.8 W Power Supply Rejection Ratio (5 V±0.25 V, -5.2 V ±0.25 V) V 1.0 LSB
Typical thermal impedances (unsoldered, in free air): 32L sidebrazed DIP. θja = 50 °C/W.
1
64 distortion BINS from 4096 pt FFT.
2
fIN = 1 MHz.
3
fIN = 3.58 and 4.35 MHz.
SPT
3 3/11/97
SPT7910
A
A
A
A
TEST LEVEL CODES
TEST LEVEL
TEST PROCEDURE
All electrical characteristics are subject to the following conditions:
All parameters having min/max specifications are guaranteed. The Test Level column indi­cates the specific device testing actually per­formed during production and Quality Assur­ance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition.
Figure 1A: Timing Diagram
N
tt
pwH pwL
CLK
III IV
VI
I
II
V
N+1
100% production tested at the specified temperature. 100% production tested at TA=25 °C, and sample
tested at the specified temperatures. QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design
and characterization data. Parameter is a typical value for information purposes
only. 100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
N+2
CLK
OUTPUT DATA
Figure 1B: Single Event Clock
CLK
CLK
OUTPUT DATA
Table I - Timing Parameters
PARAMETERS DESCRIPTION MIN TYP MAX UNITS
t
d
t
pwH
t
pwL
t
d
N-2 N-1
CLK to Data Valid Prop Delay - 5 ns CLK High Pulse Width 30 - 300 ns CLK Low Pulse Width 30 - - ns
DATA VALID
N
t
d
DATA VALID
N+1
DATA VALID
SPT
SPT7910
4 3/11/97
Loading...
+ 7 hidden pages