The SPT7910 analog-to-digital converter is industry's first
12-bit monolithic analog-to-digital converter capable of sample
rates greater than 10 MSPS. On board input buffer and track/
hold function assures excellent dynamic performance without the need for external components. Drive requirement
problems are minimized with an input capacitance of only
5 pF.
Inputs and outputs are ECL to provide a higher level of noise
immunity in high speed system applications. An overrange
APPLICATIONS
• Radar Receivers
• Professional Video
• Instrumentation
• Medical Imaging
• Electronic Warfare
• Digital Communications
• Digital Spectrum Analyzers
• Electro-Optics
output signal is provided to indicate overflow conditions.
Output data format is straight binary. Power dissipation is
very low at only 1.4 watts with power supply voltages of +5.0
and -5.2 volts. The SPT7910 also provides a wide input
voltage range of ±2.0 volts.
The SPT7910 is available in a 32-lead ceramic sidebrazed
DIP package and in die form. A commercial temperature
range of 0 to +70 °C is currently offered.
BLOCK DIAGRAM
V
IN
INPUT
BUFFER
ANALOG GAIN
COMPRESSION
PROCESSOR
Signal Processing Technologies, Inc.
4-BIT FLASH
CONVERTER
TRACK AND HOLD
AMPLIFIERS
ASYNCHRONOUS
SAR
4
CORRECTION,
OUTPUT ECL
8
4755 Forge Road, Colorado Springs, Colorado 80907, USA
Phone: (719) 528-2300 FAX: (719) 528-2370
ERROR
DECODING
AND
DRIVERS
DIGITAL
OUTPUT
12
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages
VCC............................................................... -0.3 to +6 V
Output
Digital Outputs .............................................. 0 to -30 mA
VEE............................................................... +0.3 to -6 V
Temperature
Input Voltages
Analog Input............................................... VFB≤VIN≤V
VFT, VFB. ................................................... +3.0 V, -3.0 V
Reference Ladder Current .....................................12 mA
FT
Operating Temperature ................................... 0 to 70 °C
Junction Temperature ........................................... 175 °C
Lead Temperature, (soldering 10 seconds).......... 300 °C
Storage Temperature................................-65 to +150 °C
Note:1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal
applied conditions in typical applications.
ELECTRICAL SPECIFICATIONS
TA=T
unless otherwise specified.
PARAMETERSCONDITIONSLEVELMINTYPMAXUNITS
Resolution12Bits
DC Accuracy (+25 °C)
Analog Input
Reference Input
Timing Characteristics
Dynamic Performance
to T
MIN
Integral Nonlinearity± Full ScaleV±2.0LSB
Differential Nonlinearity250 kHz Sample RateV±0.8LSB
No Missing CodesVIGuaranteed
Input Voltage RangeVI±2.0V
Input Bias CurrentVI3060µA
Input ResistanceVIN=0 VVI100300kΩ
Input CapacitanceV5pF
Input Bandwidth3 dB Small SignalV120MHz
+FS ErrorV±5.0LSB
Spurious Free Dynamic Range
Differential Phase
Differential Gain
3
3
2
+25 °CV74dB
+25 °CV0.2Degree
+25 °CV0.7%
to T
to T
MAX
MAX
MAX
IV5558dB
IV5557dB
IV5456dB
Digital Inputs
Logic 1 VoltageVI-1.1V
Logic 0 VoltageVI-1.5V
Maximum Input Current LowVI-500±200+750µA
Maximum Input Current HighVI-500±300+750µA
Pulse Width Low (CLK)IV30ns
Pulse Width High (CLK)IV30300ns
Digital Outputs
Logic 1 Voltage50 Ω to -2 VVI-1.1-0.8V
Logic 0 Voltage50 Ω to -2 VVI-1.8-1.5V
Power Supply Requirements
Voltages V
CurrentsI
-V
-I
CC
EE
CC
EE
IV+4.75+5.25V
IV-4.95-5.45V
VI150190mA
VI125160mA
Power DissipationOutputs OpenVI1.41.8W
Power Supply Rejection Ratio (5 V±0.25 V, -5.2 V ±0.25 V)V1.0LSB
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
Figure 1A: Timing Diagram
N
tt
pwHpwL
CLK
III
IV
VI
I
II
V
N+1
100% production tested at the specified temperature.
100% production tested at TA=25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
N+2
CLK
OUTPUT
DATA
Figure 1B: Single Event Clock
CLK
CLK
OUTPUT
DATA
Table I - Timing Parameters
PARAMETERSDESCRIPTIONMINTYPMAXUNITS
t
d
t
pwH
t
pwL
t
d
N-2N-1
CLK to Data Valid Prop Delay-5ns
CLK High Pulse Width30-300ns
CLK Low Pulse Width30--ns
DATA VALID
N
t
d
DATA VALID
N+1
DATA VALID
SPT
SPT7910
43/11/97
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