SPT SPT7852SCT, SPT7852SCU, SPT7852SIT Datasheet

SPT7852
DUAL 10-BIT, 20 MSPS, 160 mW A/D CONVERTER
FEATURES
• Dual 10-Bit/20 MSPS Analog-to-Digital Converter
• Monolithic CMOS
• Low Power Dissipation: 160 mW
• 4 Vp-p Analog Input Range for Each ADC
• Single +5 Volt Power Supply with Option for 3.3 V Digital Outputs
• Tri-State, TTL-Compatible Outputs
• Overrange Bit
• Selectable Two’s Complement or Straight Binary Output
GENERAL DESCRIPTION
The SPT7852 has two 10-Bit CMOS analog-to-digital con­verters that can sample data at speeds up to 20 MSPS. It has excellent low noise performance with a very low typical power dissipation of only 160 mW—that’s the total power for
both
converters. The SPT7852 uses a dual configuration of the proprietary circuit design found in our 10-bit CMOS single converter family, to achieve its high performance in a CMOS process.
The SPT7852 is specifically designed for video decoding applications and is ideal for S-video decoding and decoding of multiple composite video sources. It is the ADC for the
APPLICATIONS
• SPT NTSC/PAL Video Chip Set
• Video Set-Top Boxes
• Cellular Base Stations
• QPSK/QAM RF Demodulation
• S-Video Digitizers
• Composite Video Digitizers
• Portable and Handheld Instrumentation
SPT NTSC/PAL video decoder chip set that includes the SPT9210 analog video processor and the SPT2110 video decoder. It also has excellent application in the area of coherent I/Q demodulation in such applications as QAM demodulation and TV set-top box converters.
Inputs and outputs are TTL/CMOS-compatible to interface with TTL/CMOS-logic systems. Output data format is select­able for either straight binary or two’s complement. The SPT7852 is available in a 44L TQFP package in commercial and industrial temperature ranges. It is also available in die form. For availability of extended temperature ranges, please contact the factory.
BLOCK DIAGRAM
Reference In
Signal Processing Technologies, Inc.
Phone: (719) 528-2300 FAX: (719) 528-2370 Website: http://www.spt.com E-Mail: sales@spt.com
MSB
Invert
V
INA
V
INB
Clock
Reset
Output
Enable
10
T/H
T/H
ADC
Reference
Ladder
ADC
Timing
Generation
A
B
10
Output
Buffer
Output
Buffer
4755 Forge Road, Colorado Springs, Colorado 80907, USA
Overrange D
A0-9
Overrange D
B0-9
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages
AVDD.........................................................................+6 V
Output
Digital Outputs .......................................................10 mA
DVDD.........................................................................+6 V
Temperature
Input Voltages
Analog Input................................. –0.5 V to AVDD +0.5 V
V
.............................................. –1.5 V to AVDD +0.8 V
Ref
CLK Input ...................................................................V
AV
– DVDD......................................................±100 mV
DD
DD
Operating Temperature ...................................0 to 70 °C
Junction Temperature ........................................... 175 °C
Lead Temperature, (soldering 10 seconds).......... 300 °C
Storage Temperature............................... –65 to +150 °C
Note: 1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal
applied conditions in typical applications.
ELECTRICAL SPECIFICATIONS FOR EACH CHANNEL
TA = T
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS
Resolution 10 Bits DC Accuracy
Analog Input
Reference Input
Conversion Characteristics
Dynamic Performance
MIN
to T
, AVDD = DVDD = +5.0 V, V
MAX
=0 to 4 V, ƒS =20 MSPS, ƒ
IN
=40 MHz, V
CLK
RHS
=4.0 V, V
=0.0 V, unless otherwise specified.
RLS
TEST TEST
Integral Nonlinearity IV ±1.0 LSB Differential Nonlinearity IV ±1.0 LSB
Input Voltage Range V V
RLS
V
RHS
V Input Resistance V 50 k Input Capacitance V 5.0 pF Input Bandwidth Full Power V 35 MHz Offset VI ±2.0 LSB Gain Error VI ±2.0 LSB
Resistance V
RHS
– V
RLS
VI 350 425 500
Voltage Range
V
RLS
V
RHS
V
– V
(V(V
RHS RHF RLS
RLS
– V
– V
) V 150 mV
RHS
) V 150 mV
RLF
Maximum Conversion Rate Minimum Conversion Rate
1
1
IV 0 - 2.0 V IV 3.0 - AV
DD
V
V 1.0 4.0 5.0 V
VI 20 MHz
IV 100 kHz Pipeline Delay (Latency) IV 12 Clock Cycles Aperture Delay Time V 5 ns Aperture Jitter Time V 15 ps
Effective Number of Bits
ƒ
=3.58 MHz VI 8.4 8.9 Bits
IN
ƒIN= 10 MHz VI 7.9 8.4 Bits
1
2X Clock required.
SPT
SPT7852
2 1/12/00
ELECTRICAL SPECIFICATIONS
TA=T
MIN
to T
, AVDD = DVDD = +5.0 V, V
MAX
=0 to 4 V, ƒS =20 MSPS, ƒ
IN
=40 MHz, V
CLK
RHS
= 4.0 V, V
=0.0 V, unless otherwise specified.
RLS
TEST TEST
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS
Dynamic Performance
Signal-to-Noise Ratio (without Harmonics)
=3.58 MHz VI 53 57 dB
ƒ
IN
ƒIN=10 MHz VI 52 56 dB
Harmonic Distortion
ƒIN=3.58 MHz VI 56 59 dB ƒIN=10 MHz VI 52 54 dB
Signal-to-Noise and Distortion
(SINAD) ƒIN=3.58 MHz VI 52 55 dB
ƒIN=10 MHz VI 49 52 dB Channel-to-Channel Crosstalk ƒIN=3.58 MHz IV 70 dB Channel-to-Channel Gain Matching Full Scale IV 0.04 dB Spurious Free Dynamic Range ƒIN=3.58 MHz @ –3 dB FS V 66 dB Differential Phase V 0.2 Degree Differential Gain V 0.3 %
Digital Inputs
Logic "1" Voltage VI 2.0 V Logic "0" Voltage VI 0.8 V Maximum Input Current Low V
=0 V VI –10 +10 µA
IL
Maximum Input Current High VIH=5 V VI –10 +10 µA Input Capacitance V 5 pF
Digital Outputs
Logic "1" Voltage IOH=0.5 mA VI OVDD–0.5 V Logic "0" Voltage IOS=1.6 mA VI 0.4 V t
RISE/tFALL
15 pF Load V 10 ns
Output Enable to Data Output Delay 20 pF Load, TA=+25 °C V 10 ns
50 pF Load Over Temp. V 22 ns
Power Supply Requirements
Voltages DV
AV OV
Currents AI
DI
DD DD
DD DD
DD
Total for Both Converter VI 15 18 mA Channels VI 17 20 mA
IV 4.75 5.0 5.25 V IV 4.75 5.0 5.25 V IV 2.7 5.0 5.25 V
Power Dissipation VI 160 190 mW
TEST LEVEL CODES
All electrical characteristics are subject to the follow­ing conditions:
All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition.
SPT
TEST LEVEL
I
II
III IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature. 100% production tested at T
=+25 °C, and sample tested at
A
the specified temperatures. QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design and char-
acterization data. Parameter is a typical value for information purposes only. 100% production tested at T
= +25 °C. Parameter is guaran-
A
teed over specified temperature range.
SPT7852
3 1/12/00
Figure 1 –Typical Interface Circuit
+A5
+A5
3-st
EN
Ref In
(+4 V)
V
IN1
V
IN2
Clock
V
RHF
V
RHS
V
RLS
V
RLF
V
CAL
V
INA
V
INB
CLK
MSBINV Reset
SPT7852
AV
DD
DV
DD
.1 µF .1 µF
4.7 µF 4.7 µF
+A5
GND OV
EN
Digital
Output A
DAV
Digital
Output B
DD
11
Interfacing
Logic
11
FB
*
FB
*
3.3 V/5 V
1. Place the ferrite bead (*) as close to the ADC as possible.
2. Place 0.1 µF decoupling capacitors as close to the ADC as possible.
3. All capacitors are 0.1 µF surface-mount unless otherwise specified.
4. All analog input pins (references, analog input, clock input) must be protected. (See absolute maximum ratings.)
TYPICAL INTERFACE CIRCUIT
Very few external components are required to achieve the stated device performance. Figure 1 shows the typical inter­face requirements when using the SPT7852 in normal circuit operation. The following sections provide descrip­tions of the major functions and outline critical performance criteria to consider for achieving the optimal device perfor­mance.
POWER SUPPLIES AND GROUNDING
SPT suggests that both the digital and the analog supply voltages on the SPT7852 be derived from a single analog supply as shown in figure 1. A separate digital supply must be used for all interface circuitry. SPT suggests using this power supply configuration to prevent a possible latch-up condition on powerup.
SPT
SPT7852
4 1/12/00
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