SPT SPT7710AIG, SPT7710AIJ, SPT7710AIQ, SPT7710BCU, SPT7710BIG Datasheet

SPT7710

8-BIT, 150 MSPS, FLASH A/D CONVERTER

TECHNICAL DATA

AUGUST 17, 2001

FEATURES

• Metastable errors reduced to 1 LSB

• Low input capacitance: 10 pF

• Wide input bandwidth: 210 MHz

• 150 MSPS conversion rate

• Typical power dissipation: 2.2 watts

GENERAL DESCRIPTION

The SPT7710 is a monolithic flash A/D converter capable
of digitizing a two volt analog input signal into 8-bit digital
words at a 150 MSPS (typ) update rate.

For most applications, no external sample-and-hold is re­quired for accurate conversion due to the device’s narrow
aperture time, wide bandwidth, and low input capacitance.
A single standard –5.2 volt power supply is required for
operation of the SPT7710, with nominal power dissipation

BLOCK DIAGRAM

Analog Input

(Force or Sense)

V

RTS

V

RTF

AGND DGND V

Preamp Comparator

256

255

EE

Clock

Buffer

APPLICATIONS

• Digital oscilloscopes

• Transient capture

• Radar, EW, ECM

• Direct RF down-conversion

• Medical electronics: ultrasound, CAT instrumentation

of 2.2 W. A proprietary decoding scheme reduces meta­stable errors to the 1 LSB lev el.

The SPT7710 is available in 42-lead ceramic sidebrazed
DIP, surface-mount 44-lead cerquad and 46-lead PGA
packages; the cerquad and PGA packages allow access
to additional reference ladder taps, an ov errange bit, and a
data ready output. The SPT7710 is available in the indus­trial temperature range.

LINV MINV

DRINV

MSB D7

DREAD

V

Convert

R3

V

R2

V

R1

V

RBF

V

RBS

CLK
CLK

(Sense or Force)

152

151

128

256 to

127

64

63

2

1

2

8-Bit

Encoder

V

EE

D6

D5

D4

D3

D2

D1

LSB D0

AGNDAnalog Input

ECL

Latches

and

Buffers

Overrange

D7 MSB

D6

D5

These functions are

D4

available in the PGA and
cerquad packages only.

D3

D2

D1

D0 LSB

Signal Processing Technologies, Inc.

4755 Forge Road, Colorado Springs, Colorado 80907, USA

Phone: [phone] Fax: [phone] Web Site: http://www .spt.com e-mail: [e-mail]

ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C

Supply Voltages

Negative Supply Voltage (VEE TO GND) –7.0 to +0.5 V

Ground Voltage Differential .................... –0.5 to +0.5 V

Input Voltage

Analog Input Voltage ...............................V

to +0.5 V

EE

Temperature

Operating Temperature,ambient.............–25 to +85 °C

junction ...................... +150 °C

Lead Temperature, (soldering 10 seconds) .....+300 °C

Storage Temperature............................ –65 to +150 °C

Reference Input Voltage..........................VEE to +0.5 V

Digital Input Voltage ................................VEE to +0.5 V

Reference Current V

Output

Digital Output Current ...............................0 to –30 mA

RTF

to V

........................25 mA

RBF

Note: 1. Operation at any Absolute Maximum Rating is not implied. See

Electrical Specifications for proper nominal applied conditions
in typical applications.

ELECTRICAL SPECIFICATIONS

TA= T

PARAMETERS CONDITIONS LEVEL MIN TYP MAX MIN TYP MAX UNITS
DC Accuracy

Analog Input

to T

MIN

, VEE=–5.2 V , R

MAX

Source

=50 Ω, V

=–2.00 V , VR2=–1.00 V , V

RBF

=0.00 V , ƒ

RTF

=125 MHz, Duty Cycle=50%, unless otherwise specified.

CLK

TEST TEST SPT7710A SPT7710B

Integral Linearity Error ƒ
Differential Linearity Error ƒ

= 100 kHz VI –0.75 ±0.60 +0.75 –0.95 ±0.80 +0.95 LSB

CLK

= 100 kHz VI –0.75 +0.75 –0.95 +0.95 LSB

CLK

No missing codes Guaranteed Guaranteed

Offset Error V
Offset Error V

RT
RB

VI –30 +30 –30 +30 mV

VI –30 +30 –30 +30 mV
Input Voltage Range VI –2.0 0.0 –2.0 0.0 Volts
Input Capacitance Over full

input range V 10 10 pF
Input Resistance V 15 15 kΩ
Input Current VI 250 500 250 500 µA
Input Slew Rate V 1,000 1,000 V/µs
Large Signal Bandwidth V
Small Signal Bandwidth V

=F.S. V 210 210 MHz

IN

=500 mV

IN

P-P

V 335 335 MHz

Clock Synchronous

Input Currents V 40 40 µA

Reference Input

Ladder Resistance VI 100 200 300 100 200 300 Ω
Reference Bandwidth V 10 10 MHz

Timing Characteristics

Maximum Sample Rate IV 125 150 125 150 MSPS
Clock to Data Delay V 2.4 2.4 ns
Output Delay Tempco V 2 2 ps/°C
CLK-to-Data Ready Delay (t

) V 2.0 2.0 ns

D

Aperture Jitter V 5 5 ps
Acquisition Time V 1.5 1.5 ns

Dynamic Performance

Signal-to-Noise Ratio ƒ

= 3.58 MHz VI 46 48 45 47 dB

IN

= 50 MHz VI 42 46 40 44 dB

ƒ

IN

Total Harmonic Distortion ƒIN = 3.58 MHz VI –52 –48 –50 –46 dB

= 50 MHz VI –44 –40 –43 –39 dB

ƒ

IN

Signal-to-Noise and Distortion ƒ

= 3.58 MHz VI 45 48 43 46 dB

IN

(SINAD) ƒIN = 50 MHz VI 39 42 37 40 dB

SPT

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SPT7710

ELECTRICAL SPECIFICATIONS

TA= T

MIN

to T

MAX

, VEE=–5.2 V , R

Source

=50 Ω, V

=–2.00 V , VR2=–1.00 V , V

RBF

=0.00 V , ƒ

RTF

=125 MHz, Duty Cycle=50%, unless otherwise specified.

CLK

TEST TEST SPT7710A SPT7710B

PARAMETERS CONDITIONS LEVEL MIN TYP MAX MIN TYP MAX UNITS
Digital Inputs

Digital Input High Voltage
(MINV, LINV) VI –1.1 –0.7 –1.1 –0.7 Volts
Digital Input Low Voltage
(MINV, LINV) VI –2.0 –1.5 –2.0 –1.5 Volts
Clock Low Width, t
Clock High Width, t

PWL

PWH

VI 45 45ns
VI 45 45ns

Digital Outputs

Digital Output High Voltage 50 Ω to –2 V V I –1.1 –1.1 Volts
Digital Output Low Voltage 50 Ω to –2 V VI –1.5 –1.5 Volts

Power Supply Requirements

Supply Current +25 °C VI 425 550 425 550 mA
Power Dissipation +25 °C VI 2.2 2.9 2.2 2.9 W

TEST LEVEL CODES

All electrical characteristics are subject to the
following conditions:

All parameters having min/max specifications
are guaranteed. The Test Level column indi­cates the specific device testing actually per­formed during production and Quality Assur­ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.

LEVEL TEST PROCEDURE

I 100% production tested at the specified temperature.

II 100% production tested at TA = +25 °C, and sample tested at the

specified temperatures.
III QA sample tested only at the specified temperatures.
IV Parameter is guaranteed (but not tested) by design and characteri-

zation data.

V Parameter is a typical value for information purposes only.

VI 100% production tested at TA = +25 °C. Parameter is guaranteed

over specified temperature range.

Unless otherwise noted, all test are pulsed
tests; therefore, T

= TC = TA.

J

SPT

SPT7710

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TYPICAL PERFORMANCE CHARACTERISTICS

SNR vs Input Frequency

52

50

48

46

44

42

40

Signal-to-Noise Ratio (dB)

38

36

34

1 10 100

S = 125 MSPS

Input Frequency (MHz)

SINAD vs Input Frequency SNR, THD, SINAD vs Temperature

THD vs Input Frequency

52

50

48

46

44

42

40

38

Total Harmonic Distortion (dB)

36

34

S = 125 MSPS

110100

Input Frequency (MHz)

52

50

S = 125 MSPS

48

46

44

42

40

38

Signal-to-Noise and Distortion (dB)

36

34

1 10 100

Input Frequency (MHz)

50

45

40

S = 125 MSPS

IN = 50 MHz

SNR, THD, SINAD (dB)

35

30

40 20 0 20 40 60 80

SNR

THD

SINAD

Temperature (°C)

SPT

SPT7710

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