SPT SPT5510SIM Datasheet

SPT5510
16-BIT, 200 MWPS ECL D/A CONVERTER
FEATURES
• 16-Bit, 200 MWPS digital-to-analog converter
• Differential linearity of ±0.6 LSB (typical)
• Integral linearity of ±0.75 LSB (typical)
• Fast settling time: 35 ns to 0.0008%; 25 ns to 0.01%
• Low glitch energy
• On-chip voltage reference
• ECL compatibility
GENERAL DESCRIPTION
The SPT5510 is a 16-bit, 200 MWPS digital-to-analog converter designed for high-resolution waveform synthesis for test and measurement instrumentation applications. It features true 16-bit linearity, with differential non-linearity of typically ±0.6 LSB and integral non-linearity of ±0.75 LSB. It
BLOCK DIAGRAM
REF
IN
D15–D12
MSB
Decoder
16 16
APPLICATIONS
• High-precision arbitrary waveform generation
• Test and measurement instrumentation
• Microwave and satellite modems
• Disk drive test equipment
• Industrial process control
• Military applications
has a very high-speed update rate of up to 200 MHz and is ECL compatible. It has an ultrafast settling time of 25 ns to
0.01% and 35 ns to 0.0008%. The SPT5510 operates over an industrial temperature
range of –40 °C to +85 °C and is available in a 10 x 10 mm, 44-lead metric quad flat pack (MQFP) plastic package.
I
I
OUT
MSB Latch
OUT
I
OUT
Digital Inputs
D15–D0
CLK
BG
OUT
R
SET
AMP
INB
Phone: (719) 528-2300 FAX: (719) 528-2370 Website: http://www.spt.com E-Mail: sales@spt.com
16
Input
Latch
D11–D0
+
Ref
Amp
LSB
Buffer
Bandgap
Reference
Reference
Cell
Bias
12
LSB Latch
Bias
12
Current
Cells
20
10
Signal Processing Technologies, Inc.
4755 Forge Road, Colorado Springs, Colorado 80907, USA
I
OUT
AMP
AMP
OUT
CC
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)
1
Supply Voltages
Negative supply voltage (VEE) .................................–7 V
A/D ground voltage differential................................0.5 V
Input Voltages
Digital input voltage (D15–D0, Clock)... ...........–2.5 to 0 V
Ref amp input voltage range..........................–2.5 to 0 V
Reference input voltage range (Ref In)...... V
to –2.5 V
EE
Output Currents
Bandgap reference output current .....................±500 µA
Ref amplifier output current................................ ±2.5 mA
Temperature
Operating temperature............................... –40 to +85 °C
Junction temperature .......................................... +150 °C
Lead, soldering (10 seconds) ............................. +250 °C
Storage ....................................................–65 to +150 °C
Note: 1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for nominal operating
conditions.
ELECTRICAL SPECIFICATIONS
TA= 25 °C, VEE=–5.2 V ±5%, 50% duty cycle clock, unless otherwise specified.
TEST TEST SPT5510
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS DC Performance
Resolution 16 Bits Differential Linearity VI –1.95 ±0.6 1.95 LSB Differential Linearity T Integral Linearity VI –1.95 ±0.75 1.95 LSB Integral Linearity T Integral Linearity Drift IV –0.2 0.2 LSB/°C Offset Drift T Monotonicity V 15 Bits Output Capacitance V 10 pF Gain Error I –2 0.4 2 % FS Gain Error Tempco With Ext Reference V 50 ppm FS/°C Gain Error Tempco With Internal Bandgap Ref V 50 ppm FS/°C Offset Error I –4 4 µA Compliance Voltage IV –1.2 2 V Output Resistance IV 0.88 1.1 1.32 k
Dynamic Performance
Conversion Rate IV 200 MHz Settling Time t
Delay Time t Glitch Energy V 30 pV-s Full Scale Output Current With On-Chip References V 19 mA Rise Time/Fall Time R Spurious Free Dynamic Range
ƒ
=5 MHz; ƒ
OUT
ƒ
=10 MHz; ƒ
OUT
1
Measured at 0 V output using I-V.
2
Measured as voltage settling for mid-scale transition; RL = 50 Ω.
1
MIN–TMAX
MIN–TMAX
MIN–TMAX
2
ST
Settling to ±0.01% V 25 ns Settling to ±0.0008% V 35 ns
D
= 50 V2ns
L
=30 MHz 10 MHz Span V 84 dB
CLOCK
=100 MHz 10 MHz Span V 76 dB
CLOCK
IV –4.0 ±1.0 4.0 LSB
IV –4.0 ±1.5 4.0 LSB
IV –2.5 2.5 ppm FS/°C
V2ns
SPT
SPT5510
2 9/27/00
ELECTRICAL SPECIFICATIONS
TA= 25 °C, VEE=–5.2 V ±5%, 50% duty cycle clock, unless otherwise specified.
TEST TEST SPT5510
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS Power Supply Requirements
Negative Supply Current (–5.2 V) T Nominal Power Dissipation V 600 800 mW Power Supply Rejection Ratio V Supply = ±5 % I –0.6 ±0.002 0.6 % FS
Voltage Input and Control
Bandgap Reference Voltage V –1.2 V Bandgap Output Current T Ref Amp Bandwidth
3
Ref Amp Input Current V 16 µA Ref Amp Output Current V 200 µA Ref In Operating Voltage V –3.4 V
Digital Inputs
Logic 1 Voltage T Logic 0 Voltage T Logic 1 Current –0.8 V V 2.5 µA Logic 0 Current –1.8 V V 0 µA Input Capacitance V 3 pF Input Setup Time (tS) IV 3.0 ns Input Hold Time (t Clock Pulse Width (t
3
Ref Amp Bandwidth is limited by its compensation network
) IV 0.5 ns
H
) IV 1.5 ns
PWH
–T
MIN
MAX
=25 °C ±10 °C IV –110 16 220 µA
A
VI 115 150 mA
V 40 MHz
MIN MIN
–T –T
MAX MAX
VI –1.0 –0.8 V VI –1.7 –1.5 V
TEST LEVEL CODES
All electrical characteristics are subject to the following conditions:
All parameters having min/max specifi­cations are guaranteed. The Test Level column indicates the specific device testing actually performed during pro­duction and Quality Assurance inspec­tion. Any blank section in the data column indicates that the specification is not tested at the specified condition.
TEST LEVEL TEST PROCEDURE
I 100% production tested at the specified temperature.
II 100% production tested at TA = +25 °C, and sample tested at the specified
temperatures. III QA sample tested only at the specified temperatures. IV Parameter is guaranteed (but not tested) by design and characterization
data.
V Parameter is a typical value for information purposes only.
VI 100% production tested at T
specified temperature range.
= +25 °C. Parameter is guaranteed over
A
SPT
SPT5510
3 9/27/00
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