SPT SPT1175ACN, SPT1175ACP, SPT1175ACS, SPT1175ACU Datasheet
SPT1175
8-BIT, 20 MSPS CMOS A/D CONVERTER
FEATURES
• 20 MSPS Maximum Conversion Rate
• Internal Sample-and-Hold Function
• 90 mW Power Dissipation
• Internal Voltage Reference
• Single +5.0 V Power Supply
• Three-State TTL-Outputs
• CMOS Compatible Clock
GENERAL DESCRIPTION
The SPT1175 is a CMOS two-step A/D converter capable of
digitizing full scale analog input signals into 8-bit digital words
at a sample rate of 20 MSPS.
For most applications, no external sample-and-hold or
video driving amplifiers are required due to the device's
narrow aperture time, wide bandwidth, and low input capacitance.
BLOCK DIAGRAM
RB
V
RBS
V
APPLICATIONS
• Video Digitizing
• Image Scanners
• Personal Computer Video
• Medical Ultrasound
• Multimedia
• Digital Television
The SPT1175 operates from a single +5.0 V power supply
and has an internal voltage reference which eliminates the
need for external reference circuitry. All digital inputs are
CMOS compatible and the tri-state outputs are TTL-compatible. The SPT1175 is ideal for most video and image processing applications that require low power dissipation and
low cost. The SPT1175 is available in 24-lead plastic SOIC,
plastic DIP, and PLCC packages over the commercial temperature range (0 to +70 °C). It is also available in die form.
DV
DD
DGND
OE
Coarse
Sampling
Amplifier
Fine
Fine
V
RTS
Reference Matrix
Analog
Mux
AGND
V
IN
Sampling
Amplifier
Sampling
Amplifier
V
RT
AV
Latch
Latch
D
Encoder
Encoder
Error
Correction
Circuit
Timing
Generator
DV
DD
Data
Latches
and
3-State
Output
Buffer
AGND
DØ (LSB)
D1
D2
D3
D4
D5
D6
D7 (MSB)
CLK
Signal Processing Technologies, Inc.
4755 Forge Road, Colorado Springs, Colorado 80907, USA
Phone: (719) 528-2300 FAX: (719) 528-2370
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)
(1)
25 °C
Supply Voltages
VDD........................................................... -0.5 to +7.0 V
Input Voltages
Analog Input.............................................. AGND to V
Reference Input Voltage ........................... AGND to V
(2)
ESD Susceptibility
.................................................
±1,500 V
DD
DD
Temperature
Operating Temperature ................................. 0 to +70 °C
Junction Temperature ........................................... 175 °C
Lead Temperature, (soldering 10 seconds).......... 300 °C
Storage Temperature................................-55 to +125 °C
Notes: 1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal
applied conditions in typical applications.
2. 100 pF discharged through a 1.5 kΩ resistor (human body model).
ELECTRICAL SPECIFICATIONS
TA= +25 °C, AVDD=DVDD=+5.0 V, AGND=DGND=0.0 V, VRB=+0.6 V and VRT=+2.6 V, unless otherwise specified.
TEST TEST SPT1175
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS
Resolution 8 Bits
DC Accuracy (+25 °C)
Integral Nonlinearity I ±0.8 ±1.2 LSB
Differential Nonlinearity I ±0.6 ±1.0 LSB
No Missing Codes I Guaranteed
Analog Input
Input Voltage Range I V
Input Bias Current I ±5.0 µA
Input Resistance VI 100 200 kΩ
Input Capacitance V 15 pF
Input Bandwidth V 12 MHz
Reference Input
Reference Ladder Resistance I 200 300 400 Ω
Reference Current I 5.0 6.7 10.0 mA
Reference Input Voltage V
Internal Bias V
Offset Voltage Error
Top I -18 -25 -68 mV
Bottom I 0 10 40 mV
Timing Characteristics
Maximum Conversion Rate 1 MHz Input Sine Wave I 20 30 MSPS
Output Data Delay (td) IV 18 30 ns
Output Data Delay (High Z) IV 100 ns
(Tdish, Tdisl)
Data Valid Time Tri-State Circuit IV 100 ns
(Teneh, Tenel)
Sampling Time Offset IV 5 10 ns
RB
V
RT
RB
VRT-V
RB
Short VRT and V
Short VRB and V
RTS
RBS
IV 0 0.6 - V
IV - 2.6 2.8 V
I 0.55 0.60 0.65 V
I 1.9 2.0 2.1 V
RB
V
RT
V
NOTE: It is strongly recommended that all of the supply pins (AVDD, DVDD) be powered from the same source.
SPT
2 6/24/97
SPT1175
ELECTRICAL SPECIFICATIONS
TA=+25 °C, AVDD=DVDD=+5.0 V, AGND=DGND=0.0 V, VRB=+0.6 V and VRT=+2.6 V, unless otherwise specified.
TEST TEST SPT1175
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS
Dynamic Performance
Signal-To-Noise Ratio f
fIN=1.0 MHz I 44 46 dB
fIN=3.58 MHz I 43 45 dB
fIN=10 MHz V 39 dB
Spurious Free
Dynamic Range fS= 20 MSPS
fIN=1.0 MHz I 44 47 dB
fIN=3.58 MHz I 41 44 dB
fIN=10 MHz V 33 dB
Differential Phase NTSC 20 IRE Mod Ramp V 0.7 Degrees
Differential Gain fS = 14.3 MSPS V 1.0 %
Digital Inputs
Input Current, Logic High V
Input Current, Logic Low VDD = 5.25 V, VIL = DGND I 1.0 µA
Pulse Width High (CLK) IV 15 ns
Pulse Width Low (CLK) IV 15 ns
Voltage, Logic High I 4.0 V
Voltage, Logic Low I 1.0 V
Digital Outputs
Output Current, High VDD = 4.75 V IV -1.1 mA
Output Current, Low VDD = 4.75 V IV 3.5 mA
Output Current, High Z VDD = 5.25 V, OE= V
Voltage High I 4.0 V
Voltage Low I 0.4 V
Power Supply Requirements
Analog Supply Voltage (AVDD) IV +4.75 +5.0 +5.25 V
Digital Supply Voltage (DVDD) IV +4.75 +5.0 +5.25 V
Supply Voltage Difference (AVDD -DVDD) IV -0.1 0.0 0.1 V
Supply Current fS=20 MSPS I 18 27 mA
Power Dissipation I 90 135 mW
= 20 MSPS
S
= 5.25 V, VIH = V
DD
DD
DD
I 1.0 µA
IV 16 µA
TEST LEVEL CODES
All electrical characteristics are subject to the following
conditions:
All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific
device testing actually performed during production
and Quality Assurance inspection. Any blank section in
the data column indicates that the specification is not
tested at the specified condition.
SPT
TEST LEVEL
I
II
III
IV
V
VI
3 6/24/97
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested
at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at T
guaranteed over specified temperature range.
= +25 °C. Parameter is
A
SPT1175
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