Sony ICX412AQF Datasheet

ICX412A QF
Diagonal 8.933mm (Type 1/1.8) Frame Readout CCD Image Sensor with a Square Pixel for Color Cameras
Description
This chip features an electronic shutter with variable charge-storage time.
R, G, B primary color mosaic filters are used as the color filters, and at the same time high sensitivity and low dark current are achieved through the adoption of Super HAD CCD technology.
This chip is suitable for applications such as electronic still cameras, etc.
Features
Supports frame readout
High horizontal and vertical resolution
Supports high frame rate readout mode: 30 frames/s,
AF1 mode: 60 frames/s, 50 frames/s,
AF2 mode: 120 frames/s, 100 frames/s
Square pixel
Horizontal drive frequency: 22.5MHz
No voltage adjustments (reset gate and substrate bias are not adjusted.)
R, G, B primary color mosaic filters on chip
High sensitivity, low dark current
Continuous variable-speed shutter
Excellent anti-blooming characteristics
Exit pupil distance recommended range –20 to –100mm
20-pin high-precision plastic package
20 pin SOP (Plastic)
V
4
Pin 11
H
Optical black position
(T op View)
Pin 1
2
8
48
Device Structure
Interline CCD image sensor
Total number of pixels: 2140 (H) × 1560 (V) approx. 3.34M pixels
Number of effective pixels: 2088 (H) × 1550 (V) approx. 3.24M pixels
Number of active pixels: 2080 (H) × 1542 (V) approx. 3.21M pixels diagonal 8.933mm
Number of recommended recording pixels:
2048 (H) × 1536 (V) approx. 3.15M pixels diagonal 8.832mm aspect ratio 4:3
Chip size: 8.10mm (H) × 6.64mm (V)
Unit cell size: 3.45µm (H) × 3.45µm (V)
Optical black: Horizontal (H) direction: Front 4 pixels, rear 48 pixels
Vertical (V) direction: Front 8 pixels, rear 2 pixels
Number of dummy bits: Horizontal 28
Vertical 1 (even fields only)
Substrate material: Silicon
Super HAD CCD is a trademark of Sony Corporation. The Super HAD CCD is a version of Sony's high performance CCD HAD (Hole-
Accumulation Diode) sensor with sharply improved sensitivity by the incorporation of a new semiconductor technology developed by
Sony Corporation.
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
– 1 –
E01657-PS
Block Diagram and Pin Configuration
(Top View)
OUT
V
GND
TEST
TEST
10 9 8 7 6 5 4 3 2 1
ICX412AQF
4
Vφ1BVφ1AVφ2Vφ3BVφ3AVφ
Gb
Gb
R
Gb
R
Gb
Vertical register
11 12 13 14 15 16 17 18 19 20
φRG
2Hφ1
Hφ
DD
V
B
φSUB
R
Gb
R
Gb
SUB
C
Gr
B
Gr
B
Horizontal register
GND
B
Gr
B
Gr
B
GrRGrR
Note)
Note) : Photo sensor
L
V
2
Hφ1Hφ
Pin Description
Pin No. Description Pin No. Symbol Description
1 2 3 4
Symbol Vφ4 Vφ3A Vφ3B Vφ2
Vertical register transfer clock Vertical register transfer clock Vertical register transfer clock Vertical register transfer clock
11 12 13 14
VDD φRG Hφ2 Hφ1
Supply voltage Reset gate clock Horizontal register transfer clock
Horizontal register transfer clock 5 6 7 8 9
10
1
Leave this pin open
2
DC bias is generated within the CCD, so that this pin should be grounded externally through a capacitance
Vφ1A Vφ1B TEST TEST GND VOUT
Vertical register transfer clock Vertical register transfer clock
1
Test pin Test pin
1
GND Signal output
15 16 17 18 19 20
GND φSUB CSUB VL Hφ1 Hφ2
GND
Substrate clock
2
Substrate bias
Protective transistor bias
Horizontal register transfer clock
Horizontal register transfer clock
of 0.1µF.
– 2 –
Absolute Maximum Ratings
ICX412AQF
Item
DD, VOUT, φRG – φSUB
V Vφ
1A, Vφ1B, Vφ3A, Vφ3BφSUB
Against φSUB
Vφ2, Vφ4, VLφSUB Hφ1, Hφ2, GND – φSUB CSUBφSUB VDD, VOUT, φRG, CSUB – GND
Against φGND
Vφ1A, Vφ1B, Vφ2, Vφ3A, Vφ3B, Vφ4 – GND Hφ1, Hφ2 – GND Vφ1A, Vφ1B, Vφ3A, Vφ3B – VL
Against φVL
Vφ2, Vφ4, Hφ1, Hφ2, GND – VL
Voltage difference between vertical clock input pins Between input clock pins
Hφ1 – Hφ2
Hφ1, Hφ2 – Vφ4 Storage temperature Guaranteed temperature of performance Operating temperature
Ratings Unit Remarks –40 to +12 –50 to +15
–50 to +0.3 –40 to +0.3 –25 to –0.3 to +22
–10 to +18
–10 to +6.5 –0.3 to +28 –0.3 to +15
to +15
–6.5 to +6.5
–10 to +16 –30 to +80 –10 to +60 –10 to +75
V V V V V V V V V V V V
V °C °C °C
1
1
+24V (Max.) when clock width < 10µs, clock duty factor < 0.1%. +16V (Max.) is guaranteed for turning on or off power supply.
– 3 –
Bias Conditions
ICX412AQF
Item Supply voltage Protective transistor bias Substrate clock Reset gate clock
1
VL setting is the VVL voltage of the vertical clock waveform, or the same voltage as the VL power supply for
Symbol
VDD VL
φSUB φRG
Min.
14.55 15.45
15.0
1
2
2
Unit RemarksTyp. Max.
V
the V driver should be used.
2
Do not apply a DC bias to the substrate clock and reset gate clock pins, because a DC bias is generated within the CCD.
DC Characteristics
Item Supply current
Symbol
IDD
Min. Unit RemarksTyp. Max.
7.5
mA9.55.5
Clock V olta ge Conditions
V
Waveform Diagram
1
Remarks
Item
Readout clock voltage
VVT
Symbol
Min.
14.55
Typ.
15.0
Max. Unit
15.45
Vertical transfer clock voltage
Horizontal transfer clock voltage
Reset gate clock voltage
Substrate clock voltage
VVH1, VVH2 VVH3, VVH4 VVL1, VVL2,
VVL3, VVL4 VφV VVH3 – VVH VVH4 – VVH VVHH VVHL VVLH VVLL VφH VHL VCR VφRG VRGLH – VRGLL VRGL – VRGLm VφSUB
–0.05
–0.2 –8.0
6.8 –0.25 –0.25
4.0 –0.05
0.8
3.0
21.5
0 0
–7.5
7.5
5.0 0
2.5
3.3
22.5
0.05
0.05 –7.0
8.05
0.1
0.1
0.8
0.9
0.9
0.8
5.25
0.05
5.25
0.4
0.5
23.5
2
V V
V V
V V V V V V V V V V V V V
VVH = (VVH1 + VVH2)/2
2 2
VVL = (VVL3 + VVL4)/2
2
VφV = VVHn – VVLn (n = 1 to 4) 2 2 2
High-level coupling 2
High-level coupling 2
Low-level coupling 2
Low-level coupling 3 3 3
Cross-point voltage 4 4
Low-level coupling 4
Low-level coupling 5
– 4 –
Clock Equivalent Circuit Constants
ICX412AQF
Item Min. Typ. Max.
Capacitance between vertical transfer clock and GND
Capacitance between vertical transfer clocks
Capacitance between horizontal transfer clock and GND
Capacitance between horizontal transfer clocks
Capacitance between reset gate clock and GND
Symbol CφV1A, CφV3A CφV1B, CφV3B CφV2, CφV4 CφV1A2, CφV3A4 CφV1B2, CφV3B4 CφV23A, CφV41A CφV23B, CφV41B CφV1A3A CφV1B3B CφV1A3B, CφV1B3A CφV24 CφV1A1B, CφV3A3B
CφH1, CφH2
CφHH
CφRG
1500 5600 2700
390 470 120 180
39
220
62 75 68
36.5
88.5
8
Unit Remarks
pF pF pF pF pF pF pF pF pF pF pF pF
pF
pF
pF
Capacitance between substrate clock and GND
Vertical transfer clock series resistor Vertical transfer clock ground resistor
Horizontal transfer clock series resistor
Vφ
2
R
GND
2
Cφ
V1A3A
Cφ
V23A
Cφ
V3B4
V3A4
Cφ
R
4
Cφ
Vφ
Cφ
Cφ
Cφ
Cφ
Vφ
1A
V1B2
V1A
Cφ
V1B3A
V1B
V41A
1B
V1A1B
R
1B
Cφ
V24
Cφ
V1A2
R
1A
Cφ
V4
Cφ
V41B
R
Cφ
V1B3B
CφSUB R1A, R1B, R2,
R3A, R3B, R4 RGND RφH
Cφ
V23B
R
3A
Cφ Cφ
Cφ
V3A3B
Cφ
Cφ
R
3B
Vφ
Vφ
3A
V2 V3A
V1A3B V3B
3B
1000
62 18
15
Hφ1 Hφ2
CφHH
Hφ1 Hφ2
CφH1
pF
Ω Ω
RφHRφH
RφHRφH
CφH2
Vφ
4
Vertical transfer clock equivalent circuit Horizontal transfer clock equivalent circuit
– 5 –
Drive Clock Waveform Conditions
(1) Readout clock waveform
100%
90%
V
VT
10%
0%
tr tf
twh
(2) Vertical transfer clock waveform
Vφ1A, Vφ1B Vφ3A, Vφ3B
V
VH1
V
VHH
V
VH
V
VHH
φM
ICX412AQF
φM
2
0V
V
V
VHH
VHH
V
VH
V
VHL
V
VHL
V
VL1
V
VLH
V
VLL
V
VL
V
Vφ2 Vφ4
V
VHH
V
VHL
V
VH2
V
VHH
V
VH
V
VHL
VL3
V
VHL
V
V
VH
V
VHL
V
VH3
VL
V
VHL
V
VLH
V
VLL
V
V
VHH
V
VH4
VHH
V
VHL
V
V
VL
VVH = (VVH1 + VVH2)/2 VVL = (VVL3 + VVL4)/2 VφV = VVHn – VVLn (n = 1 to 4)
VLL
V
V
VLH
V
VL2
V
VL4
VLH
V
VLL
V
VL
– 6 –
ICX412AQF
(3) Horizontal transfer clock waveform
tf
VCR
twl
VHL
Hφ
90%
10%
Hφ
tr
2
1
twh
Vφ
H
VφH
2
two
Cross-point voltage for the Hφ1 rising side of the horizontal transfer clocks Hφ1 and Hφ2 waveforms is VCR. The overlap period for twh and twl of horizontal transfer clocks Hφ1 and Hφ2 is two.
(4) Reset gate clock waveform
RG waveform
V
RGLH
V
RGLL
V
RGLm
tr twh
Vφ
RG
tf
V
RGH
twl
Point A
V
RGL
VRGLH is the maximum value and VRGLL is the minimum value of the coupling waveform during the period from Point A in the above diagram until the rising edge of RG. In addition, VRGL is the average value of VRGLH and VRGLL.
VRGL = (VRGLH + VRGLL)/2
Assuming VRGH is the minimum value during the interval with twh, then:
VφRG = VRGH – VRGL
Negative overshoot level during the falling edge of RG is VRGLm.
(5) Substrate clock waveform
100%
90%
10%
V
(A bias generated within the CCD)
SUB
0%
Vφ
SUB
tr tftwh
7
φM
φM
2
Clock Switching Characteristics (Horizontal drive frequency: 22.5MHz)
ICX412AQF
Item
Readout clock
Vertical transfer clock
Horizontal transfer clock
Reset gate clock
Substrate clock
Symbol
VT Vφ1A, Vφ1B,
Vφ2, Vφ3A, Vφ3B, Vφ4
Hφ1 Hφ2
φRG
φSUB
Horizontal transfer clock
Min.
2.63
12 12
6
2.5
Symbol
Hφ1, Hφ2
twh
twl tr tf
Typ. Max.Min. Typ. Max.Min. Typ. Max.Min. Typ. Max.
2.83
16 16
8
3.02
121216
16 31
0.5
6.5
6.5 3
10.5
10.5
0.5
15
0.5
6.5
6.5 3
350
10.5
10.5
0.5
two
UnitnsRemarksItem
Min.
Typ. Max.
10 16
Unit
µs
ns
ns
ns
µs
Remarks
During readout
When using CXD3400N
tf tr – 2ns
During drain charge
Spectral Sensitivity Characteristics (excludes lens characteristics and light source characteristics)
1.0
0.9
0.8
0.7
0.6
0.5
0.4
Relative Response
0.3
0.2
0.1
0
400 450 500 550 600 650 700
B
G
R
Wave Length [nm]
– 8 –
ICX412AQF
Image Sensor Characteristics (horizontal drive frequency: 22.5MHz) (Ta = 25°C)
Item
G Sensitivity Sensitivity
comparison Saturation signal
Smear
R
B
Symbol
Sg Rr Rb Vsat
Sm
Min.
364
0.4
0.35 500
Typ. 455
92
82.5
Max.
546
0.7
0.65
84
74.5
20
Video signal shading
SHg
25 Dark signal Dark signal shading Line crawl G Line crawl R Line crawl B Lag
1
After closing the mechanical shutter, the smear can be reduced to below the detection limit by performing
Vdt Vdt Lcg Lcr Lcb Lag
10
5
3.8
3.8
3.8
0.5
Measurement
Unit
method
mV
mV
dB
%
mV mV
% % % %
Remarks
1
1/30s accumulation 1 1 2
Ta = 60°C
Frame readout mode
1
3
High frame rate readout mode
Zone 0 and I 4
Zone 0 to II' 5 6
Ta = 60°C, 5.0 frame/s
Ta = 60°C, 5.0 frame/s, 7 7 7 8
vertical register sweep operation.
2
Excludes vertical dark signal shading caused by vertical register high-speed transfer.
2
Zone Definition of Video Signal Shading
4
H
8
2088 (H)
V
10
V
10
4
H 8
Zone 0, I
Zone II, II'
Ignored region
Effective pixel region
Measurement System
CCD signal output [∗A]
CCD C.D.S
AMP
4
1550 (V)
4
S/H
S/H
Gr/Gb channel signal output [∗B]
R/B channel signal output [∗C]
Note) Adjust the amplifier gain so that the gain between [∗A] and [∗B], and between [∗A] and [∗C] equals 1.
– 9 –
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