Sony CXD1261AR Datasheet

Description
The CXD1261AR is an IC which generates the sync signals and timing signals required for a camera system that uses the monochrome CCD image sensor (760H) such as the ICX038/039 and ICX058/059.
Features
Built-in electronic shutter function
Built-in driver for the horizontal (H) clock
Built-in SG and TG functions
Applications
CCD camera systems
Structure
Silicon gate CMOS
Absolute Maximum Ratings (Ta = 25°C, Vss = 0V)
Supply voltage VDD VSS – 0.5 to +7.0 V
Input voltage VI Vss – 0.5 to VDD + 0.5 V
Output voltage VO Vss – 0.5 to VDD + 0.5 V
Operating temperature Topr –20 to +75 °C
Storage temperature Tstg –55 to +150 °C
Recommended Operating Conditions
Supply voltage VDD 5.0 ± 0.25 V
Operating temperature Topr –20 to +75 °C
– 1 –
CXD1261AR
E95735B7Y-PS
Sync Signal, Timing Signal Generator for CCD Cameras
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
64 pin LQFP (PIastic)
– 2 –
CXD1261AR
Pin Configuration
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
49
50
51
52
53 54
55
56 57 58 59
60
63 64
61
62
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
1
40
39
38
37
36
35
34
33
41
42
43
44
45
46
47
48
VSS XV4 XSG2
XV3 XSG1 XV1 XV2 XSUB V
DD
RG V
SS
TST3 H2
TST2 H1 V
DD
VR/FLD
HTSG
V
DD
EXT
V
SS
TST10 TST11
V
DD
TST12 TST13
V
SS
TST14 TST15
TST16
CBLK
SYNC
HD
VD
CL
D1
D2
TST1
TRIG
V
SS
OSCI
OSCO
CKIN
ENB
ED0
ED1
ED2
PS
HR
V
DD
TST9
PBLK
CLP4
CLP3
CLP2
CLP1
V
SS
TST8
TST7
TST6
TST5
TST4
SHD
SHP
Mode name Pin No. PRESET L
H D1 D2 ENB ED0 ED1 ED2 PS EXT TST1 TST13
4
5 12 13 14 15 16 52
6 58
L
L H H H H H
L
— —
EIA CCIR
Field readout Frame readout
Normal Shutter
Shutter speed
Serial input Parallel input
Internal External
Normally High
Normally Low
Note) Normally open for TST except as shown in the above table.
During frame accumulation (readout), low-speed shutter does not operate normally.
∗ ∗
– 3 –
CXD1261AR
Pin
No.
Symbol
1 2 3 4 5 6 7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
I/O Description
HD VD CL D1 D2 TST1 TRIG VSS OSCI OSCO CKIN ENB ED0 ED1 ED2 PS VDD H1 TST2 H2 TST3 VSS RG VDD XSUB XV2 XV1 XSG1 XV3 XSG2 XV4 VSS
O O O
I I I I
I
O
I I I I I I
O
I
O
I
O
O O O O O O O
Horizontal drive pulse Vertical drive pulse CKIN 2 frequency divided output (EIA: 14.318MHz, CCIR: 14.1875MHz) Mode switching; low: EIA; high: CCIR (with pull-down resistor) Mode switching; low: field readout; high: frame readout∗(with pull-down resistor) Test input, fixed to high Shutter speed setting pulse (with pull-up resistor) GND Oscillating cell input Oscillating cell output Clock input (EIA: 28.636MHz, CCIR: 28.375MHz) Shutter switching; low: normal; high: shutter (with pull-up resistor) Shutter speed control (with pull-up resistor) Shutter speed control (with pull-up resistor) Shutter speed control (with pull-up resistor) Shutter speed setting method switching; low: serial; high: parallel (with pull-up resistor) Power supply Horizontal register drive clock Test input, normally open (with pull-down resistor) Horizontal register drive clock Test input, normally open (with pull-down resistor) GND Reset gate pulse Power supply Discharge pulse Vertical register drive clock Vertical register drive clock Sensor charge readout pulse Vertical register drive clock Sensor charge readout pulse Vertical register drive clock GND
Pin Description
The CCD image sensor characteristics are guaranteed for field accumulation operation.
– 4 –
CXD1261AR
33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49
50 51
52 53 54 55 56 57 58 59 60 61 62 63 64
SHP SHD TST4 TST5 TST6 TST7 TST8 VSS CLP1 CLP2 CLP3 CLP4 PBLK TST9 VDD HR VR/FLD
HTSG VDD
EXT VSS TST10 TST11 VDD TST12 TST13 VSS TST14 TST15 TST16 CBLK SYNC
O O O O O O O
O O O O O O
I I
I
I
I
O
O
I
O O O O O
Precharge level sample-and-hold pulse Data sample-and-hold pulse Test output, normally open Test output, normally open Test output, normally open Test output, normally open Test output, normally open GND Clamp pulse Clamp pulse Clamp pulse Clamp pulse Blanking cleaning pulse Test output, normally open Power supply H reset pulse V reset pulse (FLD output when EXT = low) HTSG input; low: XSG1, 2 on; high: off (valid only when EXT = low)
Fixed to low when EXT = high Power supply Sync mode switching; low: internal; high: external sync (with pull-down resistor) GND Test input, normally open (with pull-down resistor) Test output, normally open Power supply Test output, normally open Test input, fixed to low GND Test output, normally open Test output, normally open Test output, normally open Composite blanking pulse Composite sync pulse
Pin
No.
Symbol I/O Description
– 5 –
CXD1261AR
Block Diagram
18 20
23
25
26
27
28
29
30
31
33
41 42 43
45
63
48 49 50
52
7
12
13 14 15
16
9
10
11
3
4
5
2
64
1
CL
H Counter
1/910 or 1/908
V Counter
1/525 or 1/625
Decoder
Decoder
Pulse Generator
Reset Generator
HTSG
FLD
XSUB
Shutter Control
1/2
High-speed Pulse Generator
Mode Setting
CL
RG H1 H2 SHP
XV3 XV4 XSG1 XSG2
XSUB
XV1 XV2
CLP3
CLP1 CLP2
PBLK
HD VD
CBLK SYNC
VR/FLD
HTSG
EXT
HR
ED0 ED1
ENB
PS
ED2
TRIG
OSCI
OSCO
CKIN
CL
D1
D2
34
SHD
– 6 –
CXD1261AR
Electrical Characteristics
1) DC characteristics (VDD = 5V ± 0.25V, Topr = –20 to +75°C)
2) I/O pin capacitance (VDD = V1 = 0V, fM = 1MHz)
Item
Symbol Conditions Min. Typ. Max. Unit
Supply voltage
Input voltage
Output voltage 1
1
Output voltage 2
2
Output voltage 3
3
Output voltage 4
4
Feedback resistor Pull-up resistor Pull-down resistor
VDD VIH1 VIL1 VOH1 VOL1 VOH2 VOL2 VOH3 VOL3 VOH4 VOL4 RFB RPU RPD
IOH = –2mA IOL = 4mA IOH = –4mA IOL = 8mA IOH = –8mA IOL = 8mA IOH = –2mA IOL = 2mA VIN = VSS or VDD VIL = 0V VIH = VDD
4.75
0.7VDD
VDD – 0.5
VDD – 0.5
VDD – 0.5
VDD/2
500K
40K 40K
5.0
2M 100K 100K
5.25
0.3VDD
0.4
0.4
0.4
VDD/2
5M 250K 250K
V V V V V V V V V V V
Ω Ω Ω
Item
Symbol Min. Typ. Max. Unit
Input pin capacitance Output pin capacitance Input/output pin capacitance
CIN COUT CI/O
9 11 11
pF pF pF
Note)
1
CLP1, CLP2, CLP3, CLP4, PBLK, CBLK, SYNC, VR, HD, VD, XSUB, XSG1, XSG2, XV1, XV2, XV3, XV4
2
CL, RG, SHP, SHD
3
H1, H2
4
OSCO
– 7 –
CXD1261AR
External Reset Description
H Reset (HR)
The reset is performed at the first falling edge of the reset pulse that was input; resets are not performed at subsequent edges as long as they do not deviate by two clock pulses (0.14µs) or more.
The minimum reset pulse width is 0.35µs. In addition, HD immediately after a reset can not be guaranteed. The position at which the reset is performed is 2.31µs advanced after the H reset input.
H reset input
HD output
0.35µs or more
2.31µs
V Reset (VR)
The falling edge of V reset pulse that was input is field identified by the phase difference with the internal signal (field judge pulse) defined by the falling edge of HD. And VD is reset in phase with V reset pulse. When field judge pulse is low and V reset pulse falls,
EIA: VD falling edge after 262.5H is the relation between HD and VD of EVEN field. CCIR: VD falling edge after 313.5H is the relation between HD and VD of ODD field.
Also, when field judge pulse is high and V reset pulse falls,
EIA: VD falling edge after 262.5H is the relation between HD and VD of ODD field. CCIR: VD falling edge after 313.5H is the relation between HD and VD of EVEN field.
The minimum reset pulse width is 64µs.
HD output
Field judge pulse
VR input
VD output (EIA)
VD output (CCIR)
1HD
1 2 3
262
(312)
263
(313)
264
(314)
The value without ( ) is for EIA The value in ( ) is for CCIR
1HD
Note: For CCIR, VD output is delayed 1HD in relation to VR input.
VD timing is genarated after
262.5H with this VR timing
VD timing is genarated after
313.5H with this VR timing
64µs or more
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