If you wish to change the default test sengs, you will need to begin by choosing a
memory locaon rst.
1. Press the SET key from the Perform Test screen to select a memory locaon. Use the up
or down arrow keys to select memory locaons 1 – 10.
2. Press the SET key to toggle through the test parameters.
3. Use the up or down arrow keys to edit each parameter.
4. When you are nished eding the test parameters press the EXIT key to save your
sengs and return to the Perform Test Screen.
4.
Editing Test Parameters
Default test type parameters are shown below.
• Input Voltage: 115 or 230 volts AC country specic
• Lock: OFF
• Test: W - I: (2975)
AC Dielectric Withstand Test Mode
• Voltage Output: 1,240 volts AC
• High Current Trip: HI-LMT: 10 mA
• Low Current Trip: LO-LMT: 0 mA
• Ramp Timer: 0.1 second
• Dwell Timer: 1 second
• AC Output Freq.: 60Hz
• Connuity: OFF
DC Dielectric Withstand Test Mode
• Voltage Output: 1,500 volts DC
• High Current Trip: HI-LMT: 5 mA
• Low Current Trip: LO-LMT: 0 mA
• Ramp Timer: 0.1 second
• Dwell Timer: 1 second
• Connuity: OFF
Insulaon Resistance Mode (model 2975)
• Voltage Output: 1,000 volts DC
• High Resistance Trip: I - High: 0 MΩ
• Low Resistance Trip: I - Low: 1 MΩ
• Delay Timer: 2 seconds