Silicon Storage Technology Inc SST39VF800A-55-4E-EN, SST39VF800A-55-4E-EK, SST39VF800A-55-4E-B3N, SST39VF800A-55-4E-B3K, SST39VF800A-55-4C-UK Datasheet

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©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
1
The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc.
MPF is a trademark of Silicon Storage Technology, Inc.
These specifications are subject to change without notice.
Data Sheet
FEATURES:
• Single Voltage Read and Write Operations
– 3.0-3.6V for SST39LF200A/400A/800A – 2.7-3.6V for SST39VF200A/400A/800A
Superior Reliability
Endurance: 100,000 Cycles (typical)Greater than 100 years Data Retention
Low Power Consumption
Ac ti ve Current: 20 mA (typical)Standby Current: 3 µA (typical)
Sector-Erase Capability
Uniform 2 KWord sectors
Block-Erase Capability
Uniform 32 KWord blocks
Fast Read Access Time
45 and 55 ns for SST39LF200A /400 A55 ns for SST39LF800A70 and 90 ns for SST39VF200A /40 0A /800 A
Latched Address and Data
Fast Erase and Word-Program
Sector-Erase Time: 18 ms (typical)Block-Erase Time: 18 ms (typical)Chip-Erase Time: 70 ms (typical)Word-Program Time: 14 µs (typical)Chip Rewrite Time:
2 seconds (typical) for SST39LF/VF200A 4 seconds (typical) for SST39LF/VF400A 8 seconds (typical) for SST39LF/VF800A
Automatic Write Timing
– Internal V
PP
Generation
End-of-Write Detection
Toggle BitData# Polling
CMOS I/O Compatibility
JEDEC Standard
Flash EEPROM Pinouts and command sets
Packages Available
48-lead TSOP (12mm x 20mm)48-ball TFBGA (6mm x 8mm)
PRODUCT DESCRIPTION
The SST39LF200A/400A/800A and SST39VF200A/400A/ 800A devices are 128K x16 / 256K x16 / 512K x16 CMOS Multi-Pur pose Flash (M PF) manufactured with S STs pro­prietar y, high performance CMOS Super Flash te chnology. The split-gate c el l d es ig n a nd thick oxide tunneling in je ct or attain better reliability and manufacturability compared with alternate approaches. The SST39LF200A/400A/800A write (Program or Erase) with a 3.0-3.6V power supply. The SST39VF200A/400A/800A write (Program or Erase) with a
2.7-3.6V power supply. These devices conform to JEDEC standard pinouts for x16 memories.
Featuring high performance Word-Program, the SST39LF200A/400A/800A and SST39VF200A/400A/ 800A devices provide a typical Word-Program time of 14 µsec. The devices use T oggle Bit or Data# Polling to detect the completion of the Pr ogram or Erase o perati on. To pro­tect against inadvertent write, they have on-chip hardware and software data protect ion schemes. Designed, manu­factured, and tested for a wide spectrum of applications, these devices are offered with a guaran teed enduranc e of 10,000 cycles. Data ret ention is rated at greater than 100 years.
The SST39LF200A/400A/800A and SST39VF200A/400A/ 800A devices are suited for applications that require conve­nient and economic al updating of program, confi guration, or data memory. For all system applications, they signifi-
cantly improve performanc e and reliability, while lowering power consumption. Th ey inherently use less e nergy dur­ing Erase and Program than alternative flash technologies. When programming a flash device, the total energy con­sumed is a function of the applied voltage, current, and time of application. Since for any given voltage range, the SuperFlash techn ology uses less current to pr ogram and has a shorter erase time, the total energy consumed during any Erase or Program operation is less than alternative flash technologies. These devices also improve flexibility while lowering the cost for program, data, and configuration storage applications.
The SuperFlash te ch no logy pr ovid es fi xed Erase an d P r o­gram times, independent o f the num be r of Erase/ Pro gram cycles that have occurred. Therefore the system software or hardware does not have to be modified or de-rated as is necessary with alternative flash technologies, whose Erase and Program times inc rease with accumul ated Erase/P ro­gram cycles .
To meet s urface mount requireme nts, the SST39LF20 0A/ 400A/800A and SST39 VF200A/400A/800 A are offered in both 48-lead TSOP packages and 48-ball TFBGA pack­ages. See Figures 1 and 2 for pinouts.
2 Mbit / 4 Mbit / 8 Mbit (x16) Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SS T39VF800A
SST39LF/VF200A / 400A / 800A3.0 & 2.7V 2Mb / 4Mb / 8Mb (x16) MPF memories
2
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
Device Operation
Commands are used to initiate the memory operation func­tions of the device. Commands ar e written to the device using standard mi croprocessor write sequen ces. A com­mand is written by asse r ting WE# low whil e keeping CE# low. The address bus is latched on the falling edge of WE# or CE#, whichever occurs last. T he data bus is latche d on the rising edge of WE# or CE#, whichever occurs first.
Read
The Read oper at io n of th e SST 3 9LF 2 00 A/ 400 A /80 0 A and SST39VF200A/400A/800A is controlled by CE# and OE#, both have to be low for the system to obtain data from the outputs. CE# is use d for device selection. W hen CE# is high, the chip is deselected and only standby power is con­sumed. OE# is the out put co ntr o l a nd i s used to gate data from the output p ins. The data bus is in hi gh impedance state when either CE# or OE# is high. Refer to the Rea d cycle timing diagram for further details (Figure 3).
Word-Program Operation
The SST39LF200A/400A/800A and SST39VF200A/400A/ 800A are programmed on a word-by-word basis. Before programming, one must ens ure that the sector, in which the word which is being programmed exists, is fully erased. The Program operation consists of three steps. The f irst step is the three-byte load sequence for Software Data Pro­tection. The second step is to load word address and word data. During the Word-Program operation, the addres ses are latched on the falling edge of either CE# or WE#, whichever occurs last. The data is latched on the rising edge of either CE# or WE#, whichever occurs first. The third step is the internal Program operatio n which is initi­ated after the rising edge of the fourth WE# or CE#, which­ever occurs first. The Program operation, once initiated, will be completed with in 20 µs. See Figures 4 and 5 for WE # and CE# controlled Program operation timing diagrams and Figure 16 for flowchar ts. During the Program ope ra­tion, the only valid reads are Dat a# Polling and Toggle Bit. During the inte rnal Program operat ion, the host is fre e to perform additional tasks. Any commands issued during the internal Program operation are ignored.
Sector/Block-Erase Operation
The Sector- (or Block-) Erase operation allows the system to erase the device on a sector-by-sector (or block-by­block) basis. The SST39LF200A/400A/800A and SST39VF200A/400A/800A offers both Sector-Erase and Block-Erase mode. The sector architecture is based on uniform sector size of 2 K Word. The Block-Era se mode is based on uniform block size of 32 KWord. The Sector-
Erase operation is initiated by executing a six-byte com­mand sequence with Sector-Erase command (30H) and sector address (SA) in the last bus cycle. The Block-Erase operation is initiated by executing a six-byte command sequence with Block-Erase command (50H) and block address (BA) in the last bus cycle. The sector or block address is latched on the falling edge of the sixth WE# pulse, while the comm and (30H or 50H) is latched on th e rising edge of the sixth WE# pulse. The internal Erase operation begins a fter the sixth WE# pulse. The End -of­Erase operation can be determined using either Data# Polling or Toggle Bit methods. See Figures 9 and 10 for tim­ing waveforms. Any commands issued d uring the Sector­or Block-Erase operation are ignored.
Chip-Erase Operation
The SST39LF200A/400A/800A and SST39VF200A/400A/ 800A provide a Chip-Erase operation, which allows the user to erase the entire memory array to the “1” state . Thi s is useful when t he entir e de vice must be quic kly era sed.
The Chip-Erase operation is initiated by executing a six­byte command sequence with Chip-Erase command (10H) at address 5555H in the last byte sequence. The Eras e operation begins with the rising edge of the sixt h WE# or CE#, whichever occurs first. During the Erase operation, the only valid read is T oggle Bit or Data# Polling. See Table 4 for the command sequence, Figure 8 for timing diagram, and Figure 19 for the flowchart. Any commands issued dur­ing the Chip-Erase operation are ignored.
Write Operation Status Detection
The SST39LF200A/400A/800A and SST39VF200A/400A/ 800A provi d e tw o sof tw ar e me ans t o det ect t he comp leti on of a write (Program or Erase) cycle, in order to optimize the system write cycle time. The software detection includes two status bits: Data# Polling (DQ
7
) and Toggle Bit (DQ6). The End-of- Write detecti on mode is enab led afte r the rising edge of WE#, which initiates the internal Program or Erase operation.
The actual comple tion of the nonvolatile wr ite is as ynchr o­nous with the system ; therefore, either a Data# Polling or Toggle Bit read may be simultan eous with the c ompletion of the write cycle. If this occurs, the system may possibly get an erroneous result, i.e., valid data may appear to con­flict with either DQ
7
or DQ6. In order to prevent spurious rejection, if an erroneous result occurs, the software routine should include a loop to read the accessed location an additional two (2) times. If bo th reads are valid, then the device has completed the write cycle, otherwise the rejec­tion is valid.
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash SST39LF200A / SST39LF400A / SST39LF800A SST39VF200A / SST39VF400A / SST39VF800A
3
©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
Data# Polling (DQ7)
When the SST39LF200A/400A/800A and SST39VF200A/ 400A/800A are in the internal Program operation, any attempt to read DQ
7
will produce the complement of the
true data. Onc e the Pr ogram operati on is c ompl eted, D Q
7
will produce true data. The device is then ready for the next operation. Duri ng inter nal Eras e operation, any attempt t o read DQ
7
will produce a ‘0’. Once the internal Erase opera-
tion is completed, DQ
7
will produce a ‘1’. The Data# Polling is valid after the r ising edg e of four th WE# (or CE#) p ulse for Program operation. For Sector-, Block- or Chip- Erase, the Data# Polling is valid after the rising edge of sixth WE# (or CE#) pulse. See Fi gure 6 for Data# Polling timing dia­gram and F igur e 17 f or a flo wcha rt.
Toggle Bit (DQ6)
During the inter nal Program or Erase ope ration, any con­secutive attempts to read DQ
6
will produce alter nating 1s and 0s, i.e., toggling between 1 and 0. W hen the internal Program or Erase operat ion is c omplete d, the DQ
6
bit will stop toggling. The device is the n re ady for the next ope ra­tion. The Toggle Bit is valid after the rising edge of fourth WE# (or CE#) pulse for Program operat ion. For Sector-, Block- or Chip-Erase, the Toggle Bit is valid after the rising edge of sixth WE# (or CE#) pulse. See Figure 7 for Toggle Bit timing diag ram and Figu re 17 f or a fl owc hart.
Data Protection
The SST39LF200A/400A/800A and SST39VF200A/400A/ 800A provide both hardware and software features to pro­tect nonvolatile data from inadvertent writes.
Hardware Data Protection
Noise/Glitch Protection: A WE# or CE# pulse of le ss than 5 ns will not init iate a write cycle .
V
DD
Power Up/Down Detection: The Write operation is
inhibited when V
DD
is less than 1.5V.
Write Inhibit Mode
: Forcing OE# low, CE# high, or WE# high will inhibit the W r it e operation. This prevents inadvert­ent writes during p owe r-up o r pow er- down.
Software Data Protection (SDP)
The SST39LF200A/400A/800A and SST39VF200A/400A/ 800A provide the JEDEC approved Software Data Protec­tion scheme for all data alteration operations, i.e., Program and Erase. Any Program operation requires the inclusion of the three-byte sequen ce. The thr ee-byte l oad se quenc e is used to initiate the Program operation, providing optimal protection from inadver tent Write operations, e.g., during the system power-up or power-down. Any Erase operation requires the inclus ion of six-byte sequence. Thi s group of devices are shipped with the Software Data Protection per­manently enabled. See Table 4 for the specific software command codes. During SDP command sequence, invalid commands will abort the device to Read mode within TRC. The contents of DQ
15
-DQ8 can be VIL or VIH, but no other
value, during any SDP command sequence.
Common Flash Memory Interface (CFI)
The SST39LF200A/400A/800A and SST39VF200A/400A/ 800A also contain the CFI information to describe the char­acteristics of th e device. In order to enter the CFI Query mode, the system must writ e three-byte sequence, same as Software ID Entry command with 98H (CFI Query com­mand) to address 5555H in the last byte sequence. Once the device enters the CFI Query mode, the system can read CFI data at the addresses given in Tab les 5 through 9. The system must wri te th e CFI E xit c omman d to retur n to Read mode fr om the CFI Query mode .
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Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
Product Identification
The Product Id entification mode ide ntifies the devices as the SST39LF/VF2 00A, SST39LF/VF400A and SST39LF/ VF800A and manufacturer as SST. This mode may be accessed by software operations. Users may use the Software Product Identification operation to identify the part (i.e., using the device ID) when using multiple manufacturers in the same socket. For details, see Table 4 for software operation, Fi gure 11 for the Software ID En try and Read timing d iagram, and Fi gure 18 for the So ftware ID Entry command sequence flowchart.
Product Identification Mode Exit/ CFI Mode Exit
In order to return to the standard Read mode, the Software Product Identifica tion mode must be exited. Exi t is acco m­plished by issuing the Software ID Exit command sequence, which returns the device to the Read mode. This command may also be used to reset the device to the Read mode after any inadvertent transient condition that apparently causes the device to behave abnorma lly, e.g., not read correctly. Please note that the Soft ware ID Exit/ CFI Exit command is ignored during an internal Program or Erase operation. See Table 4 for software command codes, Figure 13 for timing waveform and Figure 18 for a flowchart.
TABLE 1: P
RODUCT IDENTIFICATION TABLE
Address Data
Manufacturers ID 0000H 00BFH Device ID
SST39LF/VF200A 0001H 2789H SST39LF/VF400A 0001H 2780H SST39LF/VF800A 0001H 2781H
T1.3 360
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash SST39LF200A / SST39LF400A / SST39LF800A SST39VF200A / SST39VF400A / SST39VF800A
5
©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
FIGURE 1: PIN ASSIGNMENTS FOR 48-LEAD TSOP
Y-Decoder
I/O Buffers and Data Latches
360 ILL B1.2
Address Buffer & Latches
X-Decoder
DQ15 - DQ
0
Memory Address
OE#
CE#
WE#
SuperFlash
Memory
Control Logic
FUNCTIONAL BLOCK DIAGRAM
A15 A14 A13 A12 A11 A10
A9
A8 NC NC
WE#
NC NC NC NC NC NC
A7
A6
A5
A4
A3
A2
A1
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
A16 NC V
SS
DQ15 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 V
DD
DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# V
SS
CE# A0
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
360 ILL F01.2
Standard Pinout
T op Vie w
Die Up
SST39LF200A/400A/800A SST39VF200A/400A/800A
SST39LF/VF200A
A15 A14 A13 A12 A11 A10
A9
A8 NC NC
WE#
NC NC NC NC NC
A17
A7
A6
A5
A4
A3
A2
A1
SST39LF/VF400A
A15 A14 A13 A12 A11 A10
A9
A8 NC NC
WE#
NC NC NC NC
A18 A17
A7
A6
A5
A4
A3
A2
A1
SST39LF/VF800A SST39LF/VF200A
A16 NC V
SS
DQ15 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 V
DD
DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# V
SS
CE# A0
SST39LF/VF400A
A16 NC V
SS
DQ15 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 V
DD
DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# V
SS
CE# A0
SST39LF/VF800A
6
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
FIGURE 2: PIN ASSIGNMENTS FOR 48-BALL TFBGA
A13
A9
WE#
NC A7 A3
A12
A8 NC NC NC A4
A14 A10 NC NC
A6 A2
A15 A11
NC NC A5 A1
A16 DQ7 DQ5 DQ2 DQ0
A0
NC DQ14 DQ12 DQ10
DQ8 CE#
DQ15 DQ13
V
DD
DQ11
DQ9 OE#
V
SS
DQ6 DQ4 DQ3 DQ1 V
SS
360 ILL F02_2.0
SST39LF/VF200A
TOP VIEW (balls facing down)
6 5 4 3 2 1
A B C D E F G H
A13
A9
WE#
NC A7 A3
A12
A8 NC NC
A17
A4
A14 A10
NC NC A6 A2
A15 A11
NC NC A5 A1
A16 DQ7 DQ5 DQ2 DQ0
A0
NC DQ14 DQ12 DQ10
DQ8 CE#
DQ15 DQ13
V
DD
DQ11
DQ9 OE#
V
SS
DQ6 DQ4 DQ3 DQ1 V
SS
360 ILL F02_4.0
SST39LF/VF400A
TOP VIEW (balls facing down)
6 5 4 3 2 1
A B C D E F G H
A13
A9
WE#
NC A7 A3
A12
A8 NC NC
A17
A4
A14 A10
NC
A18
A6 A2
A15 A11
NC NC A5 A1
A16 DQ7 DQ5 DQ2 DQ0
A0
NC DQ14 DQ12 DQ10
DQ8 CE#
DQ15 DQ13
V
DD
DQ11
DQ9 OE#
V
SS
DQ6 DQ4 DQ3 DQ1
V
SS
360 ILL F02_8.0
SST39LF/VF800A
TOP VIEW (balls facing down)
6 5 4 3 2 1
A B C D E F G H
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash SST39LF200A / SST39LF400A / SST39LF800A SST39VF200A / SST39VF400A / SST39VF800A
7
©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
TABLE 2: PIN DESCRIPTION
Symbol Pin Name Functions
A
MS
1
-A
0
Address Inputs To provide memory addresses. During Sector-Erase AMS-A11 address lines w ill s ele ct the
sector. During Block-Erase A
MS-A15
address lines will select the block.
DQ
15
-DQ
0
Data Input/output To output data during Read cycles and receive input data during Write cycles.
Data is internally latched during a Write cycle.
The outputs are in tri-state when OE# or CE# is high. CE# Chip Enable To activate the device when CE# is low. OE# Output Enable To gate the data output buffers. WE# Write Enable To control the Write operations. V
DD
Power Supply To provide power supply voltage: 3.0-3.6V for SST39LF200A/400A/800A
2.7-3.6V for SST39VF200A/400A/ 800 A
V
SS
Ground
NC No Connection Unconnected pins.
T2.2 360
1. AMS = Most significant address A
MS
= A16 for SST39LF/VF200A, A17 for SST39LF/VF400A, and A18 for SST39LF/VF800A
TABLE 3: OPERATION MODES SELECTION
Mode CE# OE# WE# DQ Address
Read V
IL
V
IL
V
IH
D
OUT
A
IN
Program V
IL
V
IH
V
IL
D
IN
A
IN
Erase V
IL
V
IH
V
IL
X
1
1. X can be VIL or VIH, but no other value.
Sector or Block address, XXH for Chip-Erase
Standby V
IH
XXHigh Z X
Write Inhibit X V
IL
XHigh Z/ D
OUT
X
XXV
IH
High Z/ D
OUT
X Product Identification Software Mode V
IL
V
IL
V
IH
See Table 4
T3.4 360
8
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
SST39LF200A / SST39LF400A / SST39LF800A
SST39VF200A / SST39VF400A / SST39VF800A
©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
TABLE 4: SOFTWARE COMMAND SEQUENCE
Command Sequence
1st Bus
Write Cycle
2nd Bus
Write Cycle
3rd Bus
Write Cycle
4th Bus
Write Cycle
5th Bus
Write Cycle
6th Bus
Write Cycle
Addr1Data2Addr1Data2Addr1Data2Addr1Data2Addr1Data2Addr1Data
2
Word-Program 5555H AAH 2AAAH 55H 5555H A0H WA3Data Sector-Erase 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H SA
X
4
30H
Block-Erase 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H BA
X
4
50H Chip-Erase 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H 5555H 10H Software ID Entry
5,6
5555H AAH 2AAAH 55H 5555H 90H
CFI Query Entry
5
5555H AAH 2AAAH 55H 5555H 98H
Software ID Exit
7
/
CFI Exit
XXH F0H
Software ID Exit
7
/
CFI Exit
5555H AAH 2AAAH 55H 5555H F0H
T4.2 360
1. Addres s format A14-A0 (Hex), Addresses A
15
and A16 can be VIL or VIH, but no other value, for the Command sequence for SST39LF/VF200A.
Addresses A
15
, A16, and A17 can be VIL or VIH, but no other value, for the Command sequence for SST39LF/VF400A.
Addresses A
15
, A16, A17, and A18 can be VIL or VIH, but no other value, for the Command sequence for SST39LF/VF800A.
2. DQ
15
- DQ8 can be VIL or VIH, but no other value, for the Command sequence
3. WA = Program word address
4. SA
X
for Sector-Erase; uses AMS-A11 address lines
BA
X
, for Block-Erase; uses AMS-A15 address lines
A
MS
= Most significant address
A
MS
= A16 for SST39LF/VF200A, A17 for SST39LF/VF400A and A18 for SST39LF/VF800A
5. The device does not remain in Software Product ID Mode if powered down.
6. With A
MS-A1
=0; SST Manufacturer’s ID= 00BFH, is read with A0 = 0,
SST39LF/VF200A Device ID = 2789H, is read with A
0
= 1.
SST39LF/VF400A Device ID = 2780H, is read with A
0
= 1.
SST39LF/VF800A Device ID = 2781H, is read with A
0
= 1.
7. Both Software ID Exit operations are equivalent
TABLE 5: CFI QUERY IDENTIFICATION STRING1 FOR SST39LF200A/400A/800A AND SST39VF200A/400A/800A
1. Refer to CFI publication 100 for more details.
Address Data Data
10H 0051H Query Unique ASCII string “QRY” 11H 0052H 12H 0059H 13H 0001H Primary OEM command set 14H 0007H 15H 0000H Address for Primary Extended Table 16H 0000H 17H 0000H Alternate OEM command set (00H = none exists) 18H 0000H 19H 0000H Address for Alternate OEM extended Table (00H = none exits)
1AH 0000H
T5.0 360
Data Sheet
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash SST39LF200A / SST39LF400A / SST39LF800A SST39VF200A / SST39VF400A / SST39VF800A
9
©2001 Silicon Storage Technology, Inc. S71117-04-000 6/01 360
TABLE 6: SYSTEM INTERFACE INFORMATION FOR SST39LF200 A/400A/800A AND S ST39VF200A/4 00A/800A
Address Data Data
1BH 0027H
1
VDD Min. (Program/Erase)
0030H1DQ7-DQ4: Volts, DQ3-DQ0: 100 millivolts
1CH 0036H V
DD
Max. (Program/Erase)
DQ
7
-DQ4: Volts, DQ3-DQ0: 100 millivolts
1DH 0000H V
PP
min. (00H = no VPP pin)
1EH 0000H V
PP
max. (00H = no VPP pin)
1FH 0004H Typical time out for Word-Progra m 2
N
µs (24 = 16 µs)
20H 0000H Typical time out for min. size buffer program 2
N
µs (00H = not supported)
21H 0004H Typical time out for indiv idu al Sec tor/Bl ock-Erase 2
N
ms (24 = 16 ms)
22H 0006H Typical time out for Chip -Erase 2
N
ms (26 = 64 ms) 23H 0001H Maximum time out for Word-Program 2N times typical (21 x 24 = 32 µs) 24H 0000H Maximum time out for buffer program 2N times typical 25H 0001H Maximum time out for individual Sector/Block-Erase 2
N
times typical (21 x 24 = 32 ms)
26H 0001H Maximum time out for Chip-Erase 2N times typical (21 x 26 = 128 ms)
T6.2 360
1. 0030H for SST39LF200A/400A/800A and 0027H for SST39VF200A/400A/800A
TABLE 7: DEVICE GEOMETRY INFORMATION FOR SST39LF/VF200A
Address Data Data
27H 0012H Device size = 2
N
Byte (12H = 18; 218 = 256 KBytes) 28H 0001H Flash Device Interface description; 0001H = x16-only asynchronous interface 29H 0000H
2AH 0000H Maximum number of byte in multi-byte write = 2
N
(00H = not supported) 2BH 2CH 0002H Number of Erase Sector/Block sizes supported by device 2DH 003FH Sector Information (y + 1 = Number of sectors; z x 256B = sector size) 2EH 0000H y = 63 + 1 = 64 sectors (003FH = 63)
2FH 0010H 30H 0000H z = 16 x 256 Bytes = 4 KBytes/sector (0010H = 16) 31H 0003H Block Information (y + 1 = Number of blocks; z x 256B = block size) 32H 0000H y = 3 + 1 = 4 blocks (0003H = 3) 33H 0000H 34H 0001H z = 256 x 256 Bytes = 64 KBytes/block (0100H = 256)
T7.2 360
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