Silicon Labs Si53258, Si53254 User Manual

Si53258/Si53254 数据表
8/4 输出 PCIe Gen1/2/3/4/5 时钟缓冲器
Si53258/54 是业界性能高、功耗低的汽车级 PCI Express 扇出缓冲器,适用于 PCIe Gen 1/2/3/4/5
公共时钟和/ SRIS 应用。Si53258 Si53254 分别提供 8 路和 4 100 MHz PCIe 差分时钟输 出。所有时钟输出均符合 PCIe Gen 1/2/3/4/5 公共时钟和单独参考时钟体系结构规格。
硬件控制引脚可用于使能和禁用输出,以及为具有双输入功能的设备进行输入选择。
要详细了解 PCI ExpressSilicon Labs 的完整 PCIe 产品组合、应用说明和设计工具,包括符合 PCI Express 标准的 Silicon Labs PCIe 时钟抖动工具,请访问 Silicon Labs PCI Express 学习中心。
信息娱乐
ADAS ECU
雷达传感器
• LiDar 传感器
• 8/4 输出,带内部终端
符合 PCIe Gen 1/2/3/4/5 标准
汽车级 2-40 +105 °C
内部 100 Ω 85 Ω 线匹配
出色的附加抖动性能
• 0.05 ps RMS (Gen3/4)
• 0.025 ps RMS (Gen5)
支持扩频,以对输入时钟进行扩频直通,实 EMI 降低
独立硬件控制引脚,用于输出使能
可选双输入功能,带 MUX
• 1.8–3.3 V 电源
无铅、符合 RoHS-6
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Table of Contents
1. Features List ...............................
3
2. Ordering Guide ..............................4
3. Functional Description............................5
3.1 Functional Block Diagrams ..........................5
3.1.1 Si53258A-D01AM Functional Block Diagram ..................5
3.1.2 Si53254A-D01AM Functional Block Diagram ..................5
3.1.3 Si53258A-D02AM Functional Block Diagram ..................6
3.1.4 Si53254A-D02AM Functional Block Diagram ..................6
3.2 HCSL Differential Output Terminations ......................7
3.3 Output Enable/Disable ...........................7
3.4 Loss of Signal (LOS) ............................7
4. Power Supply Filtering Recommendations ....................8
5. Electrical Specifications ...........................9
6. Pin Descriptions .............................14
6.1 Si53258A-D01AM Pin Descriptions (40-QFN) ...................14
6.2 Si53258A-D02AM Pin Descriptions (40-QFN) ...................18
6.3 Si53254A-D01AM Pin Descriptions (32-QFN) ...................22
6.4 Si53254A-D02AM Pin Descriptions (40-QFN) ...................25
7. Package Outline .............................29
7.1 6x6 mm 40-QFN Package Diagram .......................29
7.2 5x5 mm 32-QFN Package Diagram .......................31
8. PCB Land Pattern ............................33
8.1 40-QFN Land Pattern............................33
8.2 32-QFN Land Pattern............................35
9. Top Marking ............................... 37
10. Revision History............................. 38
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1. 功能列表

• 8/4-HCSL 输出,带内部终端
符合 PCIe Gen1/2/3/4/5 标准
汽车级 2-40 +105 °C
内部 100 Ω 85 Ω 线匹配
出色的附加抖动性能
0.05 ps RMS (Gen3/4)
0.025 ps RMS (Gen5)
支持扩频,以对输入时钟进行扩频直通,实现 EMI 降低
信号丢失 (LOS) 输出引脚
独立硬件控制引脚,用于输出使能
可选双输入功能,带 MUX
• 1.8–3.3 V 电源
无铅、符合 RoHS-6
Si53258/Si53254 数据表
功能列表
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2. Ordering Guide

Si53258/Si53254 Data Sheet
Ordering Guide
Number of
Outputs
8
4
Number of
Inputs
1
2
1
2
Part Number Package Type Temperature
Si53258A-D01AM 40-QFN
Si53258A-D01AMR 40-QFN, Tape and Reel
Si53258A-D02AM 40-QFN
Si53258A-D02AMR 40-QFN, Tape and Reel
Automotive, –40 to 105 °C
Si53254A-D01AM 32-QFN
Si53254A-D01AMR 32-QFN, Tape and Reel
Si53254A-D02AM 40-QFN
Si53254A-D02AMR 40-QFN, Tape and Reel
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3. Functional Description

3.1 Functional Block Diagrams

3.1.1 Si53258A-D01AM Functional Block Diagram

Si53258/Si53254 Data Sheet
Functional Description
OE1:0
OUT0
OUT1
OE2
OUT2
CLKIN
IMP_SEL
LOS
Figure 3.1. Si53258A-D01AM Functional Block Diagram

3.1.2 Si53254A-D01AM Functional Block Diagram

Control
OE3
OUT3
OE4
OUT4
OE5
OUT5
OE6
OUT6
OE7
OUT7
OE1:0
OUT0
OUT1
CLKIN
OE2
OUT2
IMP_SEL
LOS
Control
OE3
OUT3
Figure 3.2. SSi53254A-D01AM Functional Block Diagram
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3.1.3 Si53258A-D02AM Functional Block Diagram

Si53258/Si53254 Data Sheet
Functional Description
OE1:0
OUT0
OUT1
OE3:2
CLKIN1
CLKIN2
SEL
IMP_SEL
Control
LOS
Figure 3.3. Si53258A-D02AM Functional Block Diagram

3.1.4 Si53254A-D02AM Functional Block Diagram

OUT2
OUT3
OE5:4
OUT4
OUT5
OE7:6
OUT6
OUT7
OE0
OUT0
CLKIN1
CLKIN2
CLK_SEL
IMP_SEL
Control
LOS
Figure 3.4. Si53254A-D02AM Functional Block Diagram
OE1
OUT1
OE2
OUT2
OE3
OUT3
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3.2 HCSL Differential Output Terminations

Termination for HCSL Outputs
Si53258/Si53254 Data Sheet
Functional Description
The Si52254/8 ports both 100 Ω and 85 Ω transmission line options, and can be selected using the IMP_SEL hardware input pin.
HCSL driver features integrated termination resistors to simplify interfacing to an HCSL receiver. The HCSL driver sup-
1.71 V to 3.465 V Zo = 42.5 Ω or 50 Ω
OUTx
HCSL Output
Driv
er
HCSL
Receiver
Zo = 42.5 Ω or 50 Ω
OUTxb
Figure 3.5. HCSL Internal Termination Mode

3.3 Output Enable/Disable

An output all designated outputs will be disabled. When held low, the designated outputs will be enabled.

3.4 Loss of Signal (LOS)

The LOS indicator is used to check for the presence of an input reference source (crystal or clock). LOS will assert when the reference source frequency drops below approximately 10 MHz.
enable pin provides a convenient method of disabling or enabling the output drivers. When the output enable pin is held high,
The LOS pin must be checked prior to selecting the clock input or should be polled to check for the presence of the currently selected input clock. In the event that a reference source is not present, the associated LOS pin will assume a logic low (LOS = 0) state. When a reference source is present at the associated input clock pin, the LOS pin will assume a logic high (LOS = 1) state.
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Si53258/Si53254 Data Sheet
Power Supply Filtering Recommendations

4. Power Supply Filtering Recommendations

The Si53258/4 features internal LDOs on each power supply pin, providing excellent power supply noise rejection. As a guideline, each power supply pin should use a parallel combination of a 1 μf and a 0.1 μF bypass capacitor placed as close to the supply pin as possi­ble.
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5. Electrical Specifications

Si53258/Si53254 Data Sheet
Electrical Specifications
Table 5.1. Recommended Operating Conditions
(VDD = V
DDA
= V
= 1.8 V to 3.3 V +5%/-5%, V
DD_DIG
= 1.8 V ±5%, 2.5 V ±5%, or 3.3 V ±5%, TA = –40 to 105 °C)
DDO
Parameter Symbol Test Condition Min Typ Max Units
DDA
TJ
, V
T
A
MAX
DD_DIG
V
DDO
, V
DD
–40 25 105 °C
125 °C
1.71 3.46 V
1.42
2
3.46 V
Ambient Temperature
Junction Temperature
Core Supply Voltage
Output Driver Supply Voltage
V
Note:
All minimum and maximum specifications are guaranteed and apply across the recommended operating conditions. Typical val-
1. ues apply at nominal supply voltages and an operating temperature of 25 °C unless otherwise noted.
2.
LVCMOS outputs only.
Table 5.2. DC Characteristics
(VDD = V
DDA
= V
= 1.8 V to 3.3 V +5%/-5%, V
DD_DIG
= 1.8 V ±5%, 2.5 V ±5%, or 3.3 V ±5%, TA = –40 to 105 °C)
DDO
Parameter Symbol Test Condition Min Typ Max Units
Core Supply Current
Output Buffer Supply Cur­rent
I
DD
I
DDOx
HCSL Output1 @ 100 MHz
11 18 mA
20 22 mA
Total Power Dissipation
P
d
32-pin 145 215 mW
Notes:
40-pin 530 670 mW
Differential outputs terminated into a 100
1.
Ω load at 3.3 V.
Table 5.3. Clock Input Specifications
(VDD = V
DDA
= V
= 1.8 V to 3.3 V +5%/-5%, V
DD_DIG
= 1.8 V ±5%, 2.5 V ±5%, or 3.3 V ±5%, TA = –40 to 105 °C)
DDO
Parameter Symbol Test Condition Min Typ Max Units
Input Clock (AC-coupled Differential Input Clock on CLKIN_2/CLKIN_2# or CLKIN_3/CLKIN_3#)
Frequency F
Voltage Swing
V
PP_DIFF
IN
3
Differential 100 MHz
0.5 1.8 V
PP_diff
Slew Rate SR/SF 20-80% 0.75 V/ns
Duty Cycle DC 40 60 %
Input Impedance R
Input Capacitance C
IN
IN
10 kΩ
2 3.5 6 pF
Notes:
1.
Imposed for jitter performance.
Rise and fall times can be estimated using the following simplified equation: tr/tf
2.
3. V
PP_DIFF
= 2 x V
PP_SINGLE-ENDED
= ((0.8 - 0.2) * V
80-20
IN_Vpp_se
) / SR.
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Table 5.4. Differential Clock Output Specifications
Si53258/Si53254 Data Sheet
Electrical Specifications
(VDD = V
DDA
= V
= 1.8 V to 3.3 V +5%/-5%, V
DD_DIG
= 1.8 V ±5%, 2.5 V ±5%, or 3.3 V ±5%, TA = –40 to 105 °C)
DDO
Parameter Symbol Test Condition Min Typ Max Units
Output Frequency
f
OUT
100 MHz
Duty Cycle DC With 50% duty cycle input. 48 52 %
V
V
T
SK
SEPP
CM
80 ps
HCSL 0.7 0.8 0.9
V
HCSL 0.35 0.4 0.45 V
Output-Output Skew
Output Voltage Swing
Common Mode Voltage
HCSL Edge Rate Edgr Notes 1, 2, 3 1 4.5 V/ns
HCSL Delta Tr
HCSL Delta Tf
HCSL Vcross Abs
HCSL Delta Vcross
HCSL Vovs
HCSL Vuds
HCSL Vrng
D
tr
D
tf
V
xa
D
vcrs
V
ovs
V
uds
V
rng
Notes 2, 4, 8 140 mV
Notes 2, 4, 9
Notes 2, 4, 10
Notes 2, 4
Notes 2, 4, 5 155 ps
Notes 2, 4, 5 155 ps
Notes 6, 7, 2, 4 250 550 mV
V
V
HIGH
-200
V
V
HIGH
LOW
LOW
+300
-300
+200
mV
mV
mV
PP
Rise and Fall Times (20% to 80%)
tR/t
F
HCSL 420 ps
Notes:
Measure taken from differential waveform on a component test board. The edge (slew) rate is measured from –150 mV to +150
1. mV on the differential waveform . Scope is set to average because the scope sample clock is making most of the dynamic wig­gles along the clock edge Only valid for Rising clock and Falling Clock#. Signal must be monotonic through the Vol to Voh region for Trise and Tfall.
Applies to a 2 pf load with both internal or external 50 Ω or 42.5 Ω Rp.
2.
3. Measurement taken from differential waveform.
4. Measurement taken from Single Ended waveform.
5. Measured with oscilloscope, averaging off, using min max statistics. Variation is the delta between min and max.
OUTx
Vcm
Vcm
OUTx
Vpp_se
Vpp_se
Vcm
Vpp_diff = 2*Vpp_se
6. Measured at crossing point where the instantaneous voltage value of the rising edge of CLK equals the falling edge of CLK#.
7. This measurement refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing.
ΔVcross is defined as the total variation of all crossing voltages of Rising CLOCK and Falling CLOCK#. This is the maximum
8. allowed variance in Vcross for any particular system.
9. Overshoot is defined as the absolute value of the maximum voltage.
10. Undershoot is defined as the absolute value of the minimum voltage.
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Table 5.5. Performance Characteristics
Si53258/Si53254 Data Sheet
Electrical Specifications
(VDD = V
DDA
= V
= 1.8 V to 3.3 V +5%/-5%, V
DD_DIG
= 1.8 V ±5%, 2.5 V ±5%, or 3.3 V ±5%, TA = –40 to 105 °C)
DDO
Parameter Symbol Test Condition Min Typ Max Units
Power Ramp
Clock Stabilization from Power-up
t
VDD
t
STABLE
0 V to V
DDmin
Time for clock outputs to
appear after POR
0.1 10 ms
15 25 ms
Table 5.6. PCI-Express Clock Output Additive Phase Jitter (100 MHz)
(VDD = V
DDA
= V
= 1.8 V to 3.3 V +5%/-5%, V
DD_DIG
= 1.8 V ±5%, 2.5 V ±5%, or 3.3 V ±5%, TA = –40 to 85 °C)
DDO
Parameter Test Condition Typ Max Units
Includes PLL BW 1.5–22 MHz,
PCIe Gen 1.1
Peaking = 3 dB, Td = 10 ns,
Ftrk = 1.5 MHz with BER = 1E-12
1
11 19 ps RMS
Includes PLL BW 5MHz and 8–16 MHz,
Jitter Peaking = 0.01–1 dB and 3 dB,
0.02 0.026 ps RMS
Td=12ns, Low Band, F < 1.5 MHz
PCIe Gen 2.1
Includes PLL BW 5 MHz and 8–16 MHz,
Jitter Peaking = 0.01–1 dB and 3 dB,
Td = 12 ns, High Band, 1.5 MHz < F < Nyquist
1
0.2 0.31 ps RMS
Includes PLL BW 2–4 MHz and 5 MHz, Peaking = 0.01–2 dB and
PCIe Gen 3.0
1 dB,
Td = 12 ns, CDR = 10 MHz
1, 2
0.06 0.1 ps RMS
Includes PLL BW 2–4 MHz and 5 MHz, Peaking = 0.01–2 dB and
PCIe Gen 4.0
Td = 12 ns, CDR = 10 MHz
1dB,
0.05 0.1 ps RMS
1
,
2
PCIe Gen5.0 0.025 0.04 ps RMS
Note:
1.
All output clocks 100 MHz HCSL format. Jitter data taken from Clock Jitter Tool v.1.3.
2. Excludes oscilloscope sampling noise.
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Table 5.7. Thermal Characteristics
Si53258/Si53254 Data Sheet
Electrical Specifications
Parameter Symbol
40 QFN
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Board
32 QFN
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Board
Note:
Based on JEDEC standard 4-layer PCB.
1.
Test Condition
1
Value Units
Still Air 23.1
θ
JA
Air Flow 1 m/s 17.5
Air Flow 2 m/s 16.5
θ
JC
θ
JB
ψ
JB
13.4
8.7
8.4
°C/W
Still Air 28.4
θ
JA
Air Flow 1 m/s 24
Air Flow 2 m/s 23
θ
JC
θ
JB
ψ
JB
15.9
11.5
11.2
°C/W
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