Silicon Laboratories C8051F312 Technical data
C8051F312
25 MIPS, 8 kB Flash, 10-Bit ADC, 32-Pin Mixed-Signal MCU
Analog Peripherals
10-Bit ADC
- ±1 LSB INL; no missing codes
- Programmable throughput up to 200 ksps
- Up to 21 external inputs; programmable as single-ended or differential
- Data-dependent windowed interrupt generator
- Built-in temperature sensor (±3 °C)
Two Comparators
- Programmable hysteresis and response time
- Configurable to generate interrupts or reset
- Low current (0.4 µA)
POR/Brown-out Detector
On-Chip Debug
- On-chip debug circuitry facilitates full speed, non-intrusive in-system
debug (no emulator required)
- Provides breakpoints, single stepping
- Inspect/modify memory and registers
- Superior performance to emulation systems using ICE-chips, target
pods, and sockets
Supply Voltage: 2.7 to 3.6 V
- Typical Operating Current: 7 mA at 25 MHz
15 µA at 32 kHz
- Typical Stop Mode Current: <0.1 µA
High-Speed 8051 µC Core
- Pipelined instruction architecture; executes 70% of instructions in 1 or 2
system clocks
- Up to 25 MIPS throughput with 25 MHz system clock
- Expanded interrupt handler
Memory
- 1280 bytes data RAM
- 8 kB Flash; in-system programmable in 512-byte sectors (512 bytes are
reserved)
Digital Peripherals
- 29 port I/O; all are 5 V tolerant
- Hardware SMBus™ (I2C™ compatible), SPI™, and UART serial ports
available concurrently
- Programmable 16-bit counter/timer array with five capture/compare
modules, WDT
- 4 general-purpose 16-bit counter/timers
- Realtime clock mode using timer or PCA
Clock Sources
- Internal oscillator: 24.5 MHz, 2% accuracy supports UART operation
- External oscillator: Crystal, RC, C, or Clock (1 or 2 pin modes)
- Can switch between clock sources on-the-fly
32-Pin LQFP
Temperature Range: –40 to +85 °C
VDD
GND
RST/C2CK
Analog/Digital
Power
C2D
XTAL1
XTAL2
POR
External
Oscillator
Circuit
2%
Internal
Oscillator
Debug HW
Brown-
Out
Reset
System Clock
8
0
5
1
C
o
r
e
8 kB
FLASH
256 Byte
SRAM
1 kB
XRAM
SFR Bus
Port 0
Latch
Port 1
Latch
UART
Timer
0,1,2,3 /
RTC
PCA/
WDT
SMBus
SPI
Port 2
Latch
Port 3
Latch
VDD
10-bit
200 ksps
ADC
VREF
CP0
CP1
VDD/
VREF
Temp
A
M
U
X
+
-
+
-
C
R
O
S
S
B
A
R
P
0
D
r
v
P
1
D
r
v
P
2
D
r
v
P
3
D
r
v
AIN0-AIN20
P0.0/VREF
P0.1
P0.2/XTAL1
P0.3/XTAL2
P0.4/TX
P0.5/RX
P0.6/CNVST
P0.7
P1.0
P1.1
P1.2
P1.3
P1.4
P1.5
P1.6
P1.7
P2.0
P2.1
P2.2
P2.3
P2.4
P2.5
P2.6
P2.7
P3.0/C2D
P3.1
P3.2
P3.3
P3.4
Small Form Factor Copyright © 2004 by Silicon Laboratories 8.26.2004
C8051F312
25 MIPS, 8 kB Flash, 10-Bit ADC, 32-Pin Mixed-Signal MCU
Selected Electrical Specifications
(TA = –40 to +85 C°, VDD = 2.7 V unless otherwise specified)
PARAMETER CONDITIONS MIN TYP MAX UNITS
GLOBAL CHARACTERISTICS
Supply Voltage 2.7 3.6 V
Supply Current Clock = 25 MHz
Clock =1 MHz
Supply Current
(shutdown)
Clock = 32 kHz; V
Oscillator off; VDD Monitor Enabled
Oscillator off; V
Monitor Disabled
DD
Monitor Disabled
DD
Clock Frequency Range DC 25 MHz
INTERNAL OSCILLATOR
Frequency 24.0 24.5 25.0 MHz
A/D CONVERTER
Resolution 10 bits
Integral Nonlinearity
Differential Nonlinearity Guaranteed Monotonic
Signal-to-Noise Plus
53 dB
Distortion
Throughput Rate 200 ksps
COMPARATORS
Mode0 Response Time (CP+) – (CP-) = 100 mV 0.10 µs
Mode0 Supply Current 7.6 µA
Mode1 Response Time (CP+) – (CP-) = 100 mV 0.18 µs
Mode1 Supply Current 3.2 µA
Mode2 Response Time (CP+) – (CP-) = 100 mV 0.32 µs
Mode2 Supply Current 1.3 µA
Mode3 Response Time (CP+) – (CP-) = 100 mV 1.0 µs
Mode3 Supply Current 0.40 µA
7
0.5
15
10
<0.1
mA
mA
µA
µA
µA
±1
±1
LSB
LSB
32
PIN 1
IDENTIFIER
A2
Package Information
D
D1
E1
1
A
A1
eb
C8051F310DK Development Kit
MIN
NOM
(mm)
A
A1
0.05
A2
E
1.35
b
0.30
D
D1
e
E
E1
MAX
(mm)
(mm)
-
-
1.60
-
0.15
1.40
1.45
0.37
0.45
-
9.00
-
-
7.00
-
-
0.80
-
-
9.00
-
-
7.00
-
Small Form Factor Copyright © 2004 by Silicon Laboratories 8.26.2004
Silicon Laboratories and Silicon Labs are trademarks of Silicon Laboratories Inc.
Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders
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