SGS Thomson Microelectronics VNV49N04, VNP49N04FI, VNB49N04 Datasheet

VNP49N04FI
FULLY AUTOPROTECTED POWER MOSFET
TYPE V
VNP49N04FI VNB49N04 VNV49N04
n LINEAR CURRENT LIMITATION n THERMAL SHUT DOWN n SHORT CIRCUIT PROTECTION n INTEGRATED CLAMP n LOW CURRENT DRAWN FROM INPUT PIN n DIAGNOSTIC FEEDBACK THROUGH INPUT
CLAMP
42 V 20 m 49 A
PIN
n ESD PROTECTION n DIRECT ACCESS TO THE GATE OF THE
POWER MOSFET (ANALOG DRIVING)
n COMPATIBLE WITH STANDARD POWER
MOSFET
DESCRIPTION
The VNP49N04FI, VNB49N04, VNV49N04 are monolithic devices designed in STMicroelectronics VIPower M0 Technology, intended for replacement of standard Power
R
DS(ON)
I
LIM
/ VNB49N04 / VNV49N04
“OMNIFET”:
ISOWATT220
3
2
1
3
1
TO-263 (D2PAK)
ORDER CODES:
ISOWATT220 VNP49N04FI PowerSO-10 TO-263 (D2PAK) VNB49N04
TM
MOSFETS from DC up to 50KHz applications. Built-in thermal shutdown, linear current limitation and overvoltage clamp protect the chip in harsh environments. Fault feedback can be detected by monitoring the voltage at the input pin.
10
PowerSO-10
VNV49N04
1
TM
BLOCK DIAGRAM
DRAIN
Overvoltage
Clamp
INPUT
October 1999 1/14
Gate
Control
Linear
Current
Limiter
Over
Temperature
Status
SOURCE
1
VNP49N04FI / VNB49N04 / VNV49N04
ABSOLUTE MAXIMUM RATING
Symbol Parameter
V
DS
V
IN
I
D
I
R
V
ESD
P
tot
T
T
T
stg
CONNECTION DIAGRAM (TOP VIEW)
Drain-source Voltage (VIN=0V) Internally Clamped V Input Voltage 18 V Drain Current Internally Limited A Reverse DC Output Current -50 A Electrostatic Discharge (R=1.5K, C=100pF) 2000 V Total Dissipation at Tc=25°C 125 125 40 W Operating Junction Temperature Internally limited °C
j
Case Operating Temperature Internally limited °C
c
Storage Temperature -55 to 150 °C
PowerSO-10
Value
TM
D2PAK ISOWATT220
Unit
INPUT INPUT INPUT INPUT INPUT
6 7 8 9
10
DRAIN
PowerSO-10
5 4 3
2 1
11
TM
SOURCE SOURCE N.C. SOURCE SOURCE
SOURCE
3
DRAIN
2 1
INPUT
D2PAK
3 2
1
SOUR CE DRAIN INPUT
ISOWATT220
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1
VNP49N04FI / VNB49N04 / VNV49N04
THERMAL DATA
Symbol Parameter
R
thj-case
R
thj-amb
Thermal Resistance Junction-case}}} MAX 1 1 3.12 °C/W Thermal Resistance Junction-ambient MAX 50 62.5 62.5 °C/W
PowerSO-10 D2PAK ISOWATT220
ELECTRICAL CHARACTERISTICS (-40°C<Tj< 125°C, unless otherwise specified)
OFF
Symbol Parameter Test Conditions Min Typ Max Unit
V
CLAMP
V
CLTH
V
INCL
I
DSS
I
ISS
Drain-source Clamp Voltage Drain-source Clamp
Threshold Voltage Input-Source Reverse
Clamp Voltage Zero Input Voltage Drain
Current (V
IN
=0V)
Supply Current fromInput Pin
=200 mA; VIN=0 34 42 50 V
I
D
=2mA; VIN=0 33 V
I
D
= -1mA -1.2 -0.1 V
I
IN
=13V; VIN=0V
V
DS
=25V; VIN=0V
V
DS
=0V; VIN=10V 250 550 µA
V
DS
ON (*)
Symbol Parameter Test Conditions Min Typ Max Unit
V
R
DS(on)
IN(th)
Input Threshold Voltage VDS=V
=10V; ID=25A
Static Drain-source On Resistance
V
IN
=5V; ID=25A
V
IN
IN;ID+IIN
=1mA 0.8 3 V
Value
70
220
0.04
0.05
Unit
µA µA
Ω Ω
DYNAMIC
Symbol Parameter Test Conditions Min Typ Max Unit
g
fs
C
OSS
Forward
(*)
Transconductance
=13V; ID=25A; T
V
DS
Output Capacitance VDS=13V; f=1MHz; VIN=0V; T
=25°C 25 30 S
c
=25°C 1100 1500 pF
c
SWITCHING (**)
Symbol Parameter Test Conditions Min Typ Max Unit
t
d(on)
t
t
d(off)
t
t
d(on)
t
t
d(off)
t
(di/dt)
Q
Turn-on Delay Time Rise Time 1300 3600 ns
r
Turn-off Delay Time 800 2400 ns Fall Time 300 900 ns
f
Turn-on Delay Time Rise Time 3.8 10.4 µs
r
Turn-off Delay Time 12 24 µs Fall Time 6.1 17 µs
f
Turn-on Current Slope
on
Total Input Charge VDS=15V; ID=25A; VIN=10V 100 nC
i
=15V; ID=25A
V
DS
=10V; R
V
gen
(see figure 3)
=15V; ID=25A
V
DS
=10V; R
V
gen
(see figure 3)
=15V; ID=25A
V
DS
=10V; R
V
IN
gen
gen
gen
=10
=1000
=10
200 600 ns
1.3 3.8 µs
25 A/µs
3/14
1
VNP49N04FI / VNB49N04 / VNV49N04
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min Typ Max Unit
V
(*) Forward On Voltage ISD=25A; VIN=0V 1.8 V
SD
t
(**) Reverse Recovery Time ISD=25A; di/dt=100A/µs
rr
Q
(**) Reverse Recovery Charge 910 nC
rr
(**) Reverse Recovery Current 7.5 A
I
RRM
=30V; Tj=25°C
V
DS
(see test circuit, figure 5)
PROTECTIONS
Symbol Parameter Test Conditions Min Typ Max Unit
=10V; VDS=13V
V
I
LIM
t
dlim
T
jsh
T
jrs
(**) Fault Sink Current
I
gf
E
as
(*) Pulsed: Pulse duration = 300µs, duty cycle 1.5% (**) Parameters guaranteed by design/characterization
Drain Current Limit Step Response Current
(**)
Limit Overtemperature
(**)
Shutdown
(**) Overtemperature Reset 135 °C
Single Pulse
(**)
Avalanche Energy
IN
=5V; VDS=13V
V
IN
=10V
V
IN
=5V
V
IN
=10V; VDS=13V
V
IN
=5V; VDS=13V
V
IN
Starting T V
IN
=25°C; VDS=20V
j
=10V; R
=1KΩ; L=6mH
gen
28 28
150 °C
4J
250 ns
49 49 35 90
70 70 50
150
50 20
A A
µs µs
mA mA
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2
PROTECTION FEATURES
During normal operation, the INPUT pin is electrically connected to the gate of the internal power MOSFET. The device then behaves like a standard power MOSFET and can be used as a switch from DC up to 50KHz. The only difference from the user’s standpoint is that a small DC current (I supply the internal circuitry.
) flows into the INPUT pin in order to
ISS
The device integrates:
- OVERVOLTAGE CLAMP PROTECTION: internally set at 42V, along with the rugged
avalanche characteristics of the Power MOSFET stage give this device unrivalled ruggedness and energy handling capability. This feature is mainly important when driving inductive loads.
- LINEAR CURRENT LIMITER CIRCUIT: limits the drain current IDto I
INPUT pin voltage. When the current limiter is
whatever the
LIM
active, the device operates in the linear region, so power dissipation may exceed the capability ofthe heatsink. Both case and junction temperatures increase, and if this phase lasts long enough,
VNP49N04FI / VNB49N04 / VNV49N04
junction temperature may reach the overtemperature threshold T
- OVERTEMPERATURE AND SHORT CIRCUIT PROTECTION:
these are based on sensing the chip temperature and are not dependent on the input voltage. The location of the sensing element on the chip in the power stage areaensures fast, accuratedetection of the junction temperature. Overtemperature cutout occurs at minimum 150°C. The device is automatically restarted when the chiptemperature falls below 135°C.
- STATUS FEEDBACK: in the caseof an overtemperaturefaultcondition, a
status feedback is provided through the INPUT pin. The internal protection circuit disconnects the input from the gate and connects it instead to ground via an equivalent resistance of 100 failure can be detected by monitoring the voltage at the INPUT pin, which will be close to ground potential. Additional features of this device are ESD protection according to the Human Body model and the ability to be drivenfrom a TTL Logic circuit (with a small increase in R
jsh
.
DS(ON)
Ω.
The
).
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